{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T12:08:08Z","timestamp":1759147688178},"reference-count":16,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2009,9,10]],"date-time":"2009-09-10T00:00:00Z","timestamp":1252540800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2009,12]]},"DOI":"10.1007\/s10836-009-5113-7","type":"journal-article","created":{"date-parts":[[2009,9,9]],"date-time":"2009-09-09T04:04:16Z","timestamp":1252469056000},"page":"309-321","source":"Crossref","is-referenced-by-count":14,"title":["On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction"],"prefix":"10.1007","volume":"25","author":[{"given":"Nathan","family":"Kupp","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Petros","family":"Drineas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mustapha","family":"Slamani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiorgos","family":"Makris","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2009,9,10]]},"reference":[{"key":"5113_CR1","unstructured":"Akbay SS, Chatterjee A (2007) Fault-based alternate test of RF components In: Proc. international conference on computer design, pp 517\u2013525"},{"key":"5113_CR2","doi-asserted-by":"crossref","unstructured":"Biswas S, Li P, (Shawn) Blanton RD, Pileggi L (2005) Specification test compaction for analog circuits and MEMS. In: Design, automation and test in Europe, pp 164\u2013169","DOI":"10.1109\/DATE.2005.277"},{"issue":"3","key":"5113_CR3","doi-asserted-by":"crossref","first-page":"104","DOI":"10.1109\/66.29679","volume":"2","author":"JB Brockman","year":"1989","unstructured":"Brockman JB, Director SW (1989) Predictive subset testing: optimizing IC parametric performance testing for quality, cost, and yield. IEEE Trans Semicond Manuf 2(3):104\u2013113","journal-title":"IEEE Trans Semicond Manuf"},{"key":"5113_CR4","doi-asserted-by":"crossref","unstructured":"Cristianini N, Shawe-Taylor J (2000) Support vector machines and other kernel-based learning methods. Cambridge","DOI":"10.1017\/CBO9780511801389"},{"issue":"2","key":"5113_CR5","doi-asserted-by":"crossref","first-page":"182","DOI":"10.1109\/4235.996017","volume":"6","author":"K Deb","year":"2002","unstructured":"Deb K, Pratap A, Agarwal A, Meyarivan T (2002) A fast and elitist multiobjective genetic algorithm: NSGA-II. IEEE Trans Evol Comput 6(2):182\u2013197","journal-title":"IEEE Trans Evol Comput"},{"issue":"1","key":"5113_CR6","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1214\/aos\/1176347963","volume":"19","author":"JH Friedman","year":"1991","unstructured":"Friedman JH (1991) Multivariate adaptive regression splines. Ann Stat 19(1):1\u201367","journal-title":"Ann Stat"},{"issue":"6","key":"5113_CR7","doi-asserted-by":"crossref","first-page":"796","DOI":"10.1109\/43.285252","volume":"13","author":"L Milor","year":"1994","unstructured":"Milor L, Sangiovanni-Vincentelli AL (1994) Minimizing production test time to detect faults in analog circuits. IEEE Trans Comput-Aided Des Integr Circuits Syst 13(6):796\u2013813","journal-title":"IEEE Trans Comput-Aided Des Integr Circuits Syst"},{"key":"5113_CR8","doi-asserted-by":"crossref","DOI":"10.1002\/9780471722199","volume-title":"Linear regression analysis","author":"GAF Seber","year":"2003","unstructured":"Seber GAF, Lee AJ (2003) Linear regression analysis. Wiley, New York"},{"issue":"2","key":"5113_CR9","doi-asserted-by":"crossref","first-page":"406","DOI":"10.1109\/TIM.1987.6312710","volume":"IM-36","author":"GN Stenbakken","year":"1987","unstructured":"Stenbakken GN, Souders TM (1987) Test-point selection and testability measures via QR factorzation of linear models. IEEE Trans Instrum Meas IM-36(2):406\u2013410","journal-title":"IEEE Trans Instrum Meas"},{"issue":"11","key":"5113_CR10","doi-asserted-by":"crossref","first-page":"1760","DOI":"10.1109\/TCAD.2005.855835","volume":"24","author":"H-GD Stratigopoulos","year":"2005","unstructured":"Stratigopoulos H-GD, Makris Y (2005) Non-linear decision boundaries for testing analog circuits. IEEE Trans Comput-Aided Des Integr Circuits Syst 24(11):1760\u20131773","journal-title":"IEEE Trans Comput-Aided Des Integr Circuits Syst"},{"issue":"2","key":"5113_CR11","doi-asserted-by":"crossref","first-page":"339","DOI":"10.1109\/TCAD.2007.907232","volume":"27","author":"H-GD Stratigopoulos","year":"2008","unstructured":"Stratigopoulos H-GD, Makris Y (2008) Error moderation in low-cost machine learning-based analog\/RF testing. IEEE Trans Comput-Aided Des Integr Circuits Syst 27(2):339\u2013351","journal-title":"IEEE Trans Comput-Aided Des Integr Circuits Syst"},{"key":"5113_CR12","unstructured":"Stratigopoulos H-GD, Drineas P, Slamani M, Makris Y (2007) Non-RF to RF test correlation using learning machines: a case study. In: VLSI test symposium, pp 9\u201314"},{"issue":"10","key":"5113_CR13","doi-asserted-by":"crossref","first-page":"1189","DOI":"10.1109\/43.875320","volume":"19","author":"PN Variyam","year":"2000","unstructured":"Variyam PN, Chatterjee A (2000) Specification-driven test generation for analog circuits. IEEE Trans Comput-Aided Des Integr Circuits Syst 19(10):1189\u20131201","journal-title":"IEEE Trans Comput-Aided Des Integr Circuits Syst"},{"issue":"3","key":"5113_CR14","doi-asserted-by":"crossref","first-page":"349","DOI":"10.1109\/43.986428","volume":"21","author":"PN Variyam","year":"2002","unstructured":"Variyam PN, Cherubal S, Chatterjee A (2002) Prediction of analog performance parameters using fast transient testing. IEEE Trans Comput-Aided Des Integr Circuits Syst 21(3):349\u2013361","journal-title":"IEEE Trans Comput-Aided Des Integr Circuits Syst"},{"key":"5113_CR15","unstructured":"Voorakaranam R, Chatterjee A, Cherubal S, Majernik D (2005) Method for using an alternate performance test to reduce test time and improve manufacturing yield. Patent Application Publication #11\/303,406"},{"issue":"5","key":"5113_CR16","doi-asserted-by":"crossref","first-page":"978","DOI":"10.1109\/19.799657","volume":"48","author":"A Wrixon","year":"1999","unstructured":"Wrixon A, Kennedy MP (1999) A rigorous exposition of the LEMMA method for analog and mixed-signal testing. IEEE Trans Instrum Meas 48(5):978\u2013985","journal-title":"IEEE Trans Instrum Meas"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-009-5113-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-009-5113-7\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-009-5113-7","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T21:57:44Z","timestamp":1559253464000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-009-5113-7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,9,10]]},"references-count":16,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2009,12]]}},"alternative-id":["5113"],"URL":"https:\/\/doi.org\/10.1007\/s10836-009-5113-7","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,9,10]]}}}