{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T17:39:56Z","timestamp":1760204396612},"reference-count":8,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2009,9,24]],"date-time":"2009-09-24T00:00:00Z","timestamp":1253750400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2009,12]]},"DOI":"10.1007\/s10836-009-5114-6","type":"journal-article","created":{"date-parts":[[2009,9,23]],"date-time":"2009-09-23T06:57:31Z","timestamp":1253689051000},"page":"343-346","source":"Crossref","is-referenced-by-count":6,"title":["On Built-In Self-Test for Adders"],"prefix":"10.1007","volume":"25","author":[{"given":"Mary D.","family":"Pulukuri","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Charles E.","family":"Stroud","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2009,9,24]]},"reference":[{"key":"5114_CR1","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1023\/A:1008242108853","volume":"12","author":"H Al-Asaad","year":"1998","unstructured":"Al-Asaad H, Hayes J, Murray B (1998) Scalable test generators for high-speed Datapath circuits. J. Electronic Testing: Theory and Applications 12:111\u2013125","journal-title":"J. Electronic Testing: Theory and Applications"},{"key":"5114_CR2","doi-asserted-by":"crossref","unstructured":"Hansen M, Hayes J (1995) High-level test generation using physically-induced faults. Proc. IEEE VLSI Test Symp 20\u201328","DOI":"10.1109\/VTEST.1995.512612"},{"key":"5114_CR3","doi-asserted-by":"crossref","unstructured":"Kajihara S, Sasao T (1997) On the adders with minimum tests. Proc. IEEE VLSI Test Symp 10\u201315","DOI":"10.1109\/ATS.1997.643907"},{"key":"5114_CR4","doi-asserted-by":"crossref","unstructured":"Kim H, Hayes J (2001) Realization-independent ATPG for designs with unimplemented blocks. IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems 20, 290\u2013306","DOI":"10.1109\/43.908472"},{"key":"5114_CR5","unstructured":"Paschalis A, Kranitis N, Psarakis M, Gizopoulus D, Zorian Y (1999) An effective BIST architecture for fast multiplier cores. Proc. Design, Automation and Test in Europe Conf., 117-121."},{"key":"5114_CR6","doi-asserted-by":"crossref","unstructured":"Pulukuri M, Stroud C (2009) Built-in self-test of digital signal processors in Virtex-4 FPGAs. Proc. IEEE Southeastern Symp. on System Theory, 34\u201338","DOI":"10.1109\/SSST.2009.4806783"},{"key":"5114_CR7","unstructured":"Xilinx, \u201cXtremeDSP for Virtex-4 FPGAs,\u201d User Guide UG073 (v2.7), Xilinx Inc., 2008."},{"key":"5114_CR8","unstructured":"Xilinx, \u201cVirtex-5 XtremeDSP Design Considerations,\u201d User Guide UG193 (v3.1), Xilinx Inc., 2008."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-009-5114-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-009-5114-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-009-5114-6","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T21:57:44Z","timestamp":1559253464000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-009-5114-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,9,24]]},"references-count":8,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2009,12]]}},"alternative-id":["5114"],"URL":"https:\/\/doi.org\/10.1007\/s10836-009-5114-6","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,9,24]]}}}