{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T17:17:51Z","timestamp":1648574271682},"reference-count":27,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2010,1,6]],"date-time":"2010-01-06T00:00:00Z","timestamp":1262736000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2010,4]]},"DOI":"10.1007\/s10836-009-5131-5","type":"journal-article","created":{"date-parts":[[2010,1,5]],"date-time":"2010-01-05T03:19:26Z","timestamp":1262661566000},"page":"177-193","source":"Crossref","is-referenced-by-count":0,"title":["Qualifying Serial Interface Jitter Rapidly and Cost-effectively"],"prefix":"10.1007","volume":"26","author":[{"given":"Yongquan","family":"Fan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zeljko","family":"Zilic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2010,1,6]]},"reference":[{"key":"5131_CR1","unstructured":"Altera Corporation. Mercury programmable logic device family data sheet. San Jose, California, January 2003"},{"key":"5131_CR2","unstructured":"Altera Corporation. Innovating with a full spectrum of 40-nm FPGAs and ASICs with transceivers. Whitepaper"},{"key":"5131_CR3","unstructured":"Altera Corporation. Stratix IV Device Datasheet, http:\/\/www.altera.com\/literature\/hb\/stratix-iv\/ stx4_5v4_01.pdf, December, 2008"},{"key":"5131_CR4","doi-asserted-by":"crossref","unstructured":"Cai Y, Laquai B, Luehman K (2002) Jitter Testing for Gigabit Serial Communication Transceivers. IEEE Des Test Comput 19(1) Jan","DOI":"10.1109\/54.980054"},{"issue":"5","key":"5131_CR5","doi-asserted-by":"crossref","first-page":"897","DOI":"10.1109\/TIM.2007.913760","volume":"57","author":"Y Fan","year":"2008","unstructured":"Fan Y, Zilic Z (2008) BER Testing of Communication Interfaces. IEEE Trans Instrum Meas 57(5):897\u2013906","journal-title":"IEEE Trans Instrum Meas"},{"key":"5131_CR6","unstructured":"Fan Y, Zilic Z (2009) Accelerating jitter tolerance qualification for high speed serial interfaces. Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED\u201909, March"},{"key":"5131_CR7","doi-asserted-by":"crossref","unstructured":"Fan Y, Cai Y, Fang L, Verma A, Burcanowski B, Zilic Z, Kumar S (2006) An accelerated jitter tolerance test technique on ATE for 1.5\u00a0GB\/s and 3\u00a0GB\/s Serial-ATA. Proceedings of IEEE International Test Conference, ITC\u201906, Oct","DOI":"10.1109\/TEST.2006.297721"},{"key":"5131_CR8","unstructured":"Fan Y, Cai Y, Zilic Z (2007) A high accuracy, high throughput jitter test solution on ATE for 3\u00a0Gbps and 6\u00a0Gbps Serial-ATA. Proceedings of IEEE International Test Conference, ITC\u201907, Oct"},{"key":"5131_CR9","doi-asserted-by":"crossref","unstructured":"Fritzsche W, Haque A (2008) Low cost testing of multi-GBit device pins with ATE assisted loopback instrument. Proceedings of IEEE International Test Conference, ITC\u201908, Oct","DOI":"10.1109\/TEST.2008.4700558"},{"key":"5131_CR10","unstructured":"GigOptix\u2019s Broadband Phase Delay Opens Numerous Application Opportunities. Press release, April 28, 2008, available at http:\/\/www.gigoptix.com\/newsroom\/ release\/2008_04_01_archive.php"},{"key":"5131_CR11","unstructured":"GigOptix, http:\/\/www.gigoptix.com ."},{"key":"5131_CR12","unstructured":"http:\/\/www.teradyne.com"},{"key":"5131_CR13","unstructured":"ITRS. The International Technology Roadmap for Semiconductors, 2007 Edition"},{"key":"5131_CR14","unstructured":"http:\/\/www.teledynerelays.com\/pdf\/electromechanical\/grf300grf303.pdf , GRF300 Series data sheet"},{"key":"5131_CR15","unstructured":"iT4036 Wideband Phase Delay Datasheet, hikari-trading.com\/opt\/gigoptix\/file\/it4036\/it4036_data.pdf"},{"key":"5131_CR16","doi-asserted-by":"crossref","unstructured":"Keezer DC, Minier D, Ducharme P, Viens D, Flynn G, McKillop JS (2007) Multi-GHz loopback testing using MEMS switches and SiGe logic. Proc. of IEEE International Test Conference, October","DOI":"10.1109\/TEST.2007.4437581"},{"key":"5131_CR17","doi-asserted-by":"crossref","unstructured":"Meixner A, Kakizawa A, Provost B, Bedwani S (2008) External loopback testing experiences with high speed serial interfaces. Proceedings of IEEE International Test Conference, ITC\u201908, Oct","DOI":"10.1109\/TEST.2008.4700557"},{"key":"5131_CR18","doi-asserted-by":"crossref","unstructured":"Moreira J, Barnes H, Hoersch G (2007) Analyzing and addressing the impact of test fixture relays for multi-gigabit ATE I\/O characterization application. Proceedings of IEEE International Test Conference, ITC\u201907, Oct","DOI":"10.1109\/TEST.2007.4437582"},{"key":"5131_CR19","unstructured":"Noel P, Zarkeshvari F, KwasniewskiT (2005) Recent advances in high-speed serial I\/O trends, standards and techniques. Proceedings of 18th Canadian Conference on Electrical and Computer Engineer, CCECE05, May"},{"issue":"2","key":"5131_CR20","doi-asserted-by":"crossref","first-page":"193","DOI":"10.1109\/MDT.2007.54","volume":"24","author":"P Patra","year":"2007","unstructured":"Patra P (2007) On the cusp of a validation wall. IEEE Design & Test 24(2):193\u2013196","journal-title":"IEEE Design & Test"},{"key":"5131_CR21","unstructured":"Proakis JG (2001) Digital communications. McGraw-Hill High Education"},{"key":"5131_CR22","unstructured":"Semiconductor Technologies for Optical Interconnection, from Ultra Long Haul to Very Short Reach. http:\/\/www.gigoptix.com\/pdf\/whitepapers\/Optical_Interconnection_rev6.pdf , white paper"},{"key":"5131_CR23","doi-asserted-by":"crossref","unstructured":"Sunter S, Roy A, Cote J. An automated, complete, structural test solution for SERDES. Proceedings of IEEE International Test Conference, ITC\u201904, Oct. 2004","DOI":"10.1109\/TEST.2004.1386941"},{"key":"5131_CR24","unstructured":"TeraVicta Announces Availability of DC to 26.5\u00a0GHz SPDT MEMS Switch. Press Release, TeraVicta Technologies, Inc., Austin, Texas, April 30, 2007. http:\/\/news.thomasnet.com\/fullstory\/518285"},{"key":"5131_CR25","unstructured":"Texas Instruments Incorporated, http:\/\/www.ti.com"},{"key":"5131_CR26","unstructured":"TT1244: SPDT 265.GHz RF MEMS Switch. Datasheet, TeraVicta, http:\/\/www.rapidtek.net\/spec\/mems\/DS-TT1244_1.3.pdf"},{"key":"5131_CR27","unstructured":"Xilinx, Inc. Introducing Virtex-6 and Spartan-6 FPGA Families, http:\/\/www.xilinx.com\/products\/v6s6.htm"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-009-5131-5.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-009-5131-5\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-009-5131-5","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T21:57:45Z","timestamp":1559253465000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-009-5131-5"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,1,6]]},"references-count":27,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2010,4]]}},"alternative-id":["5131"],"URL":"https:\/\/doi.org\/10.1007\/s10836-009-5131-5","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,1,6]]}}}