{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T19:54:58Z","timestamp":1648583698522},"reference-count":17,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2010,11,2]],"date-time":"2010-11-02T00:00:00Z","timestamp":1288656000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2010,12]]},"DOI":"10.1007\/s10836-010-5175-6","type":"journal-article","created":{"date-parts":[[2010,11,2]],"date-time":"2010-11-02T10:44:40Z","timestamp":1288694680000},"page":"641-658","source":"Crossref","is-referenced-by-count":10,"title":["Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture"],"prefix":"10.1007","volume":"26","author":[{"given":"Jari","family":"Hannu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Teuvo","family":"Saikkonen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juha","family":"H\u00e4kkinen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juha","family":"Karttunen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Markku","family":"Moilanen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2010,11,2]]},"reference":[{"key":"5175_CR1","unstructured":"Chiang C-H, Wheatley PJ, Ho KY, Cheung KL (2004) Testing and remote field update of distributed base stations in a wireless network. Proc Int Test Conf 711\u2013718"},{"key":"5175_CR2","doi-asserted-by":"crossref","first-page":"123","DOI":"10.1109\/TIM.2004.834067","volume":"54","author":"L Cristaldi","year":"2005","unstructured":"Cristaldi L, Ferrero A, Monti A, Ponci F, McKay W, Dougal R (2005) A virtual environment for remote testing of complex systems. IEEE Trans Instrum Meas 54:123\u2013133. doi: 10.1109\/TIM.2004.834067","journal-title":"IEEE Trans Instrum Meas"},{"key":"5175_CR3","doi-asserted-by":"crossref","first-page":"1559","DOI":"10.1109\/TIM.2006.880941","volume":"55","author":"S De Capitani di Vimercati","year":"2006","unstructured":"De Capitani di Vimercati S, Ferrero A, Lazzaroni M (2006) Mobile agent technology for remote measurements. IEEE Trans Instrum Meas 55:1559\u20131565. doi: 10.1109\/TIM.2006.880941","journal-title":"IEEE Trans Instrum Meas"},{"issue":"3","key":"5175_CR4","doi-asserted-by":"crossref","first-page":"260","DOI":"10.1016\/j.measurement.2004.12.002","volume":"37","author":"S Dejanovic","year":"2005","unstructured":"Dejanovic S, Persson U, Kuttainen S, Westerfur L (2005) Measurement of electrical parameters using mixed-signal test bus, IEEE Std. 1149.4. Meas 37(3):260\u2013277. doi: 10.1016\/j.measurement.2004.12.002","journal-title":"Meas"},{"key":"5175_CR5","unstructured":"EN 60384-22:2004, Fixed capacitors for use in electronic equipment. Part 22: Sectional specification: Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2"},{"issue":"6","key":"5175_CR6","doi-asserted-by":"crossref","first-page":"581","DOI":"10.1007\/s10836-007-5007-5","volume":"23","author":"J Hannu","year":"2007","unstructured":"Hannu J, Moilanen M (2007) Methods of testing discrete semiconductors in the 1149.4 environment. J Elect Test Theory App 23(6):581\u2013592. doi: 10.1007\/s10836-007-5007-5","journal-title":"J Elect Test Theory App"},{"key":"5175_CR7","unstructured":"Hannu J, Happonen T, Moilanen M (2007) Embedded test controller for board and system level remote testing. Proc Int Mix Signals Test Workshop 88\u201392"},{"key":"5175_CR8","unstructured":"Happonen T, Sankala J, Hekkala V, Koivukangas T, Moilanen M (2007) Work in progress: universally applicable test communication standard to enable life-cycle testing of modern electronic devices. Proc Conf Test Commun Syst 10\u201313"},{"key":"5175_CR9","unstructured":"IEEE Std 1149.4-1999 (2000) Standard for a mixed-signal test bus. IEEE, Piscataway"},{"issue":"17","key":"5175_CR10","first-page":"53","volume":"41","author":"V Knivett","year":"2008","unstructured":"Knivett V (2008) Beyond the boundary. New Electr 41(17):53\u201354","journal-title":"New Electr"},{"key":"5175_CR11","doi-asserted-by":"crossref","unstructured":"Miu K, Ajjarapu V, Butler-Purry K, Niebur D, Nwankpa C, Schulz N, Stankovic A (2005) Testing of shipboard power systems: A case for remote testing and measurement. IEEE Electr Ship Technol Symp 195\u2013201. doi: 10.1109\/ESTS.2005.1524674","DOI":"10.1109\/ESTS.2005.1524674"},{"key":"5175_CR12","doi-asserted-by":"crossref","first-page":"396","DOI":"10.1007\/BF01751101","volume":"8","author":"NS Ong","year":"1993","unstructured":"Ong NS, Lim LEN (1993) Activity-based cost-modelling procedures for PCB assembly. Int J Adv Manuf Technol 8:396\u2013406. doi: 10.1007\/BF01751101","journal-title":"Int J Adv Manuf Technol"},{"key":"5175_CR13","doi-asserted-by":"crossref","unstructured":"Reis I, Collins P, van Houcke M (2006) On-line boundary-scan testing in service of extended products. Proc Int Test Conf 1\u201310. doi: 10.1109\/TEST.2006.297745","DOI":"10.1109\/TEST.2006.297745"},{"issue":"6","key":"5175_CR14","doi-asserted-by":"crossref","first-page":"569","DOI":"10.1007\/s10836-007-5008-4","volume":"23","author":"T Saikkonen","year":"2007","unstructured":"Saikkonen T, Moilanen M (2007) Component value calculations and characterizations for measurements in the IEEE 1149.4 environment. J Elect Test Theory Appl 23(6):569\u2013579. doi: 10.1007\/s10836-007-5008-4","journal-title":"J Elect Test Theory Appl"},{"key":"5175_CR15","volume-title":"Building a successful board-test strategy","author":"SF Scheiber","year":"2001","unstructured":"Scheiber SF (2001) Building a successful board-test strategy. Newnes, New York"},{"key":"5175_CR16","doi-asserted-by":"crossref","unstructured":"Sundar S, Kim BC, Byrd T, Toledo F, Wokhlu S, Beskar E, Rousselin R, Cotton D, Kendall G (2007) Low cost automatic mixed-signal board test using IEEE 1149.4. Proc Int Test Conf 1\u20139. doi: 10.1109\/TEST.2007.4437629","DOI":"10.1109\/TEST.2007.4437629"},{"key":"5175_CR17","author":"LY Ungar","year":"2006","unstructured":"Ungar LY (2006) An economics model of supportability through design for testability. Proc Autotestcon. doi: 10.1109\/AUTEST.2006.283603","journal-title":"Proc Autotestcon"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-010-5175-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-010-5175-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-010-5175-6","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T22:04:41Z","timestamp":1559253881000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-010-5175-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11,2]]},"references-count":17,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2010,12]]}},"alternative-id":["5175"],"URL":"https:\/\/doi.org\/10.1007\/s10836-010-5175-6","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,11,2]]}}}