{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,9]],"date-time":"2025-10-09T16:37:00Z","timestamp":1760027820200},"reference-count":49,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2011,2,9]],"date-time":"2011-02-09T00:00:00Z","timestamp":1297209600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2011,6]]},"DOI":"10.1007\/s10836-011-5199-6","type":"journal-article","created":{"date-parts":[[2011,2,8]],"date-time":"2011-02-08T07:53:57Z","timestamp":1297151637000},"page":"225-240","source":"Crossref","is-referenced-by-count":11,"title":["Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations"],"prefix":"10.1007","volume":"27","author":[{"given":"Marvin","family":"Onabajo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Didac","family":"G\u00f3mez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eduardo","family":"Aldrete-Vidrio","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Josep","family":"Altet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Diego","family":"Mateo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jose","family":"Silva-Martinez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2011,2,9]]},"reference":[{"key":"5199_CR1","doi-asserted-by":"crossref","unstructured":"Abdallah L, Stratigopoulos HG, Kelma C, Mir S (2010) Sensors for built-in alternate RF test. In: Proc IEEE European Test Symposium (ETS), pp 49\u201354","DOI":"10.1109\/ETSYM.2010.5512783"},{"issue":"4","key":"5199_CR2","doi-asserted-by":"crossref","first-page":"526","DOI":"10.1109\/TSM.2008.2004323","volume":"21","author":"K Agarwal","year":"2008","unstructured":"Agarwal K, Hayes J, Nassif S (2008) Fast characterization of threshold voltage fluctuation in MOS devices. IEEE Trans Semicond Manuf 21(4):526\u2013533","journal-title":"IEEE Trans Semicond Manuf"},{"key":"5199_CR3","unstructured":"Ahsan N, Dabrowski J, Ouacha A (2008) A self-tuning technique for optimization of dual band LNA. In: Proc European Conference on Wireless Technology (EuWiT), pp 178\u2013181"},{"issue":"4","key":"5199_CR4","doi-asserted-by":"crossref","first-page":"618","DOI":"10.1109\/TCAPT.2007.906349","volume":"30","author":"E Aldrete-Vidrio","year":"2007","unstructured":"Aldrete-Vidrio E, Mateo D, Altet J (2007) Differential temperature sensors fully compatible with a 0.35-\u03bcm CMOS process. IEEE Trans Components Packaging Technol 30(4):618\u2013626","journal-title":"IEEE Trans Components Packaging Technol"},{"issue":"7","key":"5199_CR5","doi-asserted-by":"crossref","first-page":"075104(10pp)","DOI":"10.1088\/0957-0233\/21\/7\/075104","volume":"21","author":"E Aldrete-Vidrio","year":"2010","unstructured":"Aldrete-Vidrio E, Mateo D, Altet J, Salhi MA, Grauby S, Dilhaire S, Onabajo M, Silva-Martinez J (2010) Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements. Meas Sci Technol 21(7):075104(10pp)","journal-title":"Meas Sci Technol"},{"issue":"1","key":"5199_CR6","doi-asserted-by":"crossref","first-page":"81","DOI":"10.1109\/4.896232","volume":"36","author":"J Altet","year":"2001","unstructured":"Altet J, Rubio A, Schaub E, Dilahire S, Claeys W (2001) Thermal coupling in integrated circuits: application to thermal testing. IEEE J Solid State Circ 36(1):81\u201391","journal-title":"IEEE J Solid State Circ"},{"issue":"8","key":"5199_CR7","doi-asserted-by":"crossref","first-page":"1519","DOI":"10.1109\/JPROC.2006.879793","volume":"94","author":"J Altet","year":"2006","unstructured":"Altet J, Claeys W, Dilhaire S, Rubio A (2006) Dynamic surface temperature measurements in ICs. Proc IEEE 94(8):1519\u20131533","journal-title":"Proc IEEE"},{"key":"5199_CR8","doi-asserted-by":"crossref","unstructured":"Bhattacharya S, Chatterjee A (2004) Use of embedded sensors for built-in-test RF circuits. In: Proc IEEE International Test Conference (ITC), pp 801\u2013809","DOI":"10.1109\/TEST.2004.1387343"},{"issue":"1","key":"5199_CR9","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1109\/TSM.2005.863244","volume":"19","author":"M Bhushan","year":"2006","unstructured":"Bhushan M, Gattiker A, Ketchen MB, Das KK (2006) Ring oscillators for CMOS process tuning and variability control. IEEE Trans Semiconductor Manuf 19(1):10\u201318","journal-title":"IEEE Trans Semiconductor Manuf"},{"key":"5199_CR10","first-page":"14","volume-title":"Design for Manufacturability and Yield for Nano-scale CMOS","author":"C Chiang","year":"2007","unstructured":"Chiang C, Kawa J (2007) Design for Manufacturability and Yield for Nano-scale CMOS. Dordrecht, Springer, pp 14\u201315"},{"issue":"6","key":"5199_CR11","doi-asserted-by":"crossref","first-page":"593","DOI":"10.1007\/s10836-007-5025-3","volume":"23","author":"M Cimino","year":"2007","unstructured":"Cimino M, Lapuyade H, De Matos M, Taris T, Deval Y, B\u00e9gueret JB (2007) A robust 130\u00a0nm-CMOS built-in current sensor dedicated to RF applications. J Electron Test 23(6):593\u2013603","journal-title":"J Electron Test"},{"issue":"6","key":"5199_CR12","doi-asserted-by":"crossref","first-page":"933","DOI":"10.1109\/TVLSI.2009.2019085","volume":"18","author":"JJ Dabrowski","year":"2010","unstructured":"Dabrowski JJ, Ramzan RM (2010) Built-in loopback test for IC RF transceivers. IEEE Trans Very Large Scale Integration (VLSI) Systems 18(6):933\u2013946","journal-title":"IEEE Trans Very Large Scale Integration (VLSI) Systems"},{"issue":"3","key":"5199_CR13","doi-asserted-by":"crossref","first-page":"698","DOI":"10.1109\/JSSC.2005.843597","volume":"40","author":"H Darabi","year":"2005","unstructured":"Darabi H, Chiu J, Khorram S, Kim HJ, Zhou Z, Chien HM, Ibrahim B, Geronaga E, Tran LH, Rofougaran A (2005) A dual-mode 802.11b\/Bluetooth radio in 0.35-\u03bcm CMOS. IEEE J Solid-State Circuits 40(3):698\u2013706","journal-title":"IEEE J Solid-State Circuits"},{"issue":"12","key":"5199_CR14","doi-asserted-by":"crossref","first-page":"821","DOI":"10.1109\/TCSII.2005.853893","volume":"52","author":"T Das","year":"2005","unstructured":"Das T, Gopalan A, Washburn C, Mukund PR (2005) Self-calibration of input-match in RF front-end circuitry. IEEE Trans Circ Syst II Express Briefs 52(12):821\u2013825","journal-title":"IEEE Trans Circ Syst II Express Briefs"},{"key":"5199_CR15","doi-asserted-by":"crossref","unstructured":"Eberle W, Tubbax J, Come B, Donnay S, De Man H, Gielen G (2002) OFDM-WLAN receiver performance improvement using digital compensation techniques. In: Proc IEEE Radio and Wireless Conference (RAWCON), pp 111\u2013114","DOI":"10.1109\/RAWCON.2002.1030130"},{"issue":"2","key":"5199_CR16","doi-asserted-by":"crossref","first-page":"395","DOI":"10.1109\/JSSC.2005.862353","volume":"41","author":"I Elahi","year":"2006","unstructured":"Elahi I, Muhammad K, Balsara PT (2006) I\/Q mismatch compensation using adaptive decorrelation in a low-IF receiver in 90-nm CMOS process. IEEE J Solid State Circ 41(2):395\u2013404","journal-title":"IEEE J Solid State Circ"},{"key":"5199_CR17","doi-asserted-by":"crossref","unstructured":"Eliezer O, Staszewski RB, Mannath D (2010) A statistical approach for design and testing of analog circuitry in low-cost SoCs. In: Proc IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) 1\u20134 August, Seattle, USA","DOI":"10.1109\/MWSCAS.2010.5548733"},{"issue":"2","key":"5199_CR18","doi-asserted-by":"crossref","first-page":"283","DOI":"10.1109\/JSSC.2003.821779","volume":"39","author":"MAI Elmala","year":"2004","unstructured":"Elmala MAI, Embabi SHK (2004) Calibration of phase and gain mismatches in Weaver image-reject receiver. IEEE J Solid State Circ 39(2):283\u2013289","journal-title":"IEEE J Solid State Circ"},{"issue":"7","key":"5199_CR19","doi-asserted-by":"crossref","first-page":"1794","DOI":"10.1109\/TCSI.2008.918207","volume":"55","author":"X Fan","year":"2008","unstructured":"Fan X, Onabajo M, Fernandez F, Silva-Martinez J, S\u00e1nchez-Sinencio E (2008) A current injection built-in test technique for RF low-noise amplifiers. IEEE Trans Circ Syst I Regular Pap 55(7):1794\u20131804","journal-title":"IEEE Trans Circ Syst I Regular Pap"},{"key":"5199_CR20","unstructured":"Gielen GGE (2006) Design methodologies and tools for circuit design in CMOS nanometer technologies. In: Proc 36th European Solid-State Device Research Conference, pp 21\u201332"},{"key":"5199_CR21","doi-asserted-by":"crossref","unstructured":"Glas JPF (1998) Digital I\/Q imbalance compensation in a low-IF receiver. In: Proc IEEE Global Telecommunications Conference (GLOBECOM), vol 3, pp 1461\u20131466","DOI":"10.1109\/GLOCOM.1998.776582"},{"key":"5199_CR22","unstructured":"G\u00f3mez D, Mateo D, Altet J (2010) Electro-thermal coupling analysis methodology for RF circuits. In: Proc 16th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), pp 154\u2013160"},{"key":"5199_CR23","unstructured":"Haider A, Bhattacharya S, Srinivasan G, Chatterjee A (2005) A system-level alternate test approach for specification test of RF transceivers in loopback mode. In: Proc 18th International Conference on VLSI Design, pp 289\u2013294"},{"issue":"11","key":"5199_CR24","doi-asserted-by":"crossref","first-page":"2187","DOI":"10.1109\/JSSC.2005.857348","volume":"40","author":"YH Hsieh","year":"2005","unstructured":"Hsieh YH, Hu WY, Lin SM, Chen CL, Li WK, Chen SJ, Chen DJ (2005) An auto-I\/Q calibrated CMOS transceiver for 802.11g. IEEE J Solid State Circ 40(11):2187\u20132192","journal-title":"IEEE J Solid State Circ"},{"key":"5199_CR25","unstructured":"International Roadmap for Semiconductors, Test & Test Equipment (2009) Available: http:\/\/public.itrs.net\/reports.html"},{"key":"5199_CR26","doi-asserted-by":"crossref","unstructured":"Jose AP, Jenkins KA, Reynolds SK (2005) On-chip spectrum analyzer for analog built-in self test. In: Proc IEEE VLSI Test Symposium, pp 131\u2013136","DOI":"10.1109\/VTS.2005.63"},{"issue":"3","key":"5199_CR27","doi-asserted-by":"crossref","first-page":"718","DOI":"10.1109\/JSSC.2009.2013762","volume":"44","author":"D Kaczman","year":"2009","unstructured":"Kaczman D, Shah M, Alam M, Rachedine M, Cashen D, Han L, Raghavan A (2009) A single-chip 10-band WCDMA\/HSDPA 4-band GSM\/EDGE SAW-less CMOS receiver with DigRF 3G interface and +90 dBm IIP2. IEEE J Solid State Circ 44(3):718\u2013739","journal-title":"IEEE J Solid State Circ"},{"issue":"6","key":"5199_CR28","doi-asserted-by":"crossref","first-page":"766","DOI":"10.1109\/JSSC.2002.1004581","volume":"37","author":"K Kivekas","year":"2002","unstructured":"Kivekas K, Parssinen A, Ryynanen J, Jussila J, Halonen K (2002) Calibration techniques of active BiCMOS mixers. IEEE J Solid State Circ 37(6):766\u2013769","journal-title":"IEEE J Solid State Circ"},{"issue":"12","key":"5199_CR29","doi-asserted-by":"crossref","first-page":"526","DOI":"10.1109\/LMWC.2003.819379","volume":"13","author":"CH Liao","year":"2003","unstructured":"Liao CH, Chuang HR (2003) A 5.7-GHz 0.18-\u03bcm CMOS gain-controlled differential LNA with current reuse for WLAN receiver. IEEE Microwave Wireless Compon Lett 13(12):526\u2013528","journal-title":"IEEE Microwave Wireless Compon Lett"},{"issue":"2","key":"5199_CR30","doi-asserted-by":"crossref","first-page":"486","DOI":"10.1109\/JSSC.2007.914306","volume":"43","author":"S Mattisson","year":"2008","unstructured":"Mattisson S, Hagberg H, Andreani P (2008) Sensitivity degradation in a tri-band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE J Solid State Circ 43(2):486\u2013496","journal-title":"IEEE J Solid State Circ"},{"issue":"2","key":"5199_CR31","doi-asserted-by":"crossref","first-page":"351","DOI":"10.1109\/JSSC.2009.2037476","volume":"45","author":"M Mobarak","year":"2010","unstructured":"Mobarak M, Onabajo M, Silva-Martinez J, S\u00e1nchez-Sinencio E (2010) Attenuation- predistortion linearization of CMOS OTAs with digital correction of process variations in OTA-C filter applications. IEEE J Solid State Circ 45(2):351\u2013367","journal-title":"IEEE J Solid State Circ"},{"key":"5199_CR32","unstructured":"Montemayor R, Razavi B (2000) A self-calibrating 900-MHz CMOS image-reject receiver. In: Proc European Solid-State Circuits Conference (ESSCIRC), pp 320\u2013323"},{"key":"5199_CR33","doi-asserted-by":"crossref","unstructured":"Negreiros M, Carro L, Susin AA (2006) An improved RF loopback for test time reduction. In: Proc Design, Automation and Test in Europe Conference and Exhibition, pp 646\u2013651","DOI":"10.1109\/DATE.2006.244012"},{"key":"5199_CR34","unstructured":"Onabajo M, Altet J, Aldrete-Vidrio E, Mateo E, Silva-Martinez J (to appear) Electro-thermal design procedure to observe RF circuit power and linearity characteristics with a homodyne differential temperature sensor. Accepted for publication in IEEE Trans Circuits and Systems I: Regular Papers. Available: http:\/\/ieeexplore.ieee.org\/stamp\/stamp.jsp?tp=&arnumber=5635371"},{"issue":"6","key":"5199_CR35","doi-asserted-by":"crossref","first-page":"444","DOI":"10.1109\/TCSII.2009.2020940","volume":"56","author":"M Onabajo","year":"2009","unstructured":"Onabajo M, Silva-Martinez J, Fernandez F, S\u00e1nchez-Sinencio E (2009) An on-chip loopback block for RF transceiver built-in test. IEEE Trans Circ Syst II Express Briefs 56(6):444\u2013448","journal-title":"IEEE Trans Circ Syst II Express Briefs"},{"key":"5199_CR36","doi-asserted-by":"crossref","unstructured":"Rebaud B, Belleville M, Beigne E, Robert M, Maurine P, Azemard N (2009) An innovative timing slack monitor for variation tolerant circuits. In: Proc IEEE International Conference on IC Design and Technology (ICICDT), pp 215\u2013218","DOI":"10.1109\/ICICDT.2009.5166299"},{"key":"5199_CR37","unstructured":"Roberts GW, Dufort B (1999) Making complex mixed-signal telecommunication integrated circuits testable. IEEE Commun Mag June, pp 90\u201396"},{"issue":"2","key":"5199_CR38","doi-asserted-by":"crossref","first-page":"381","DOI":"10.1109\/TIM.2006.870317","volume":"55","author":"JY Ryu","year":"2006","unstructured":"Ryu JY, Kim BC, Sylla I (2006) A new low-cost RF built-in self-test measurement for system-on-chip transceivers. IEEE Trans Instrum Meas 55(2):381\u2013388","journal-title":"IEEE Trans Instrum Meas"},{"key":"5199_CR39","unstructured":"Shi B, Chia YW (2005) \u201cAn analog mismatch calibration system for image-reject receivers,\u201d In: Proc European Conference on Wireless Technology, pp. 225\u2013228"},{"issue":"1","key":"5199_CR40","doi-asserted-by":"crossref","first-page":"73","DOI":"10.1007\/s10836-009-5136-0","volume":"26","author":"H Shin","year":"2010","unstructured":"Shin H, Park J, Abraham JA (2010) Spectral prediction for specification-based loopback test of embedded mixed-signal circuits. J Electron Test 26(1):73\u201386","journal-title":"J Electron Test"},{"key":"5199_CR41","doi-asserted-by":"crossref","unstructured":"Srinivasan G, Chatterjee A, Taenzler F (2006) Alternate loop-back diagnostic tests for wafer-level diagnosis of modern wireless transceivers using spectral signatures. In: Proc 24th VLSI Test Symposium, pp 222\u2013227","DOI":"10.1109\/VTS.2006.17"},{"issue":"2","key":"5199_CR42","doi-asserted-by":"crossref","first-page":"186","DOI":"10.1109\/TCSII.2006.886202","volume":"54","author":"RB Staszewski","year":"2007","unstructured":"Staszewski RB, Bashir I, Eliezer O (2007) RF Built-in self test of a wireless transmitter. IEEE Trans Circ Syst II Express Briefs 54(2):186\u2013190","journal-title":"IEEE Trans Circ Syst II Express Briefs"},{"key":"5199_CR43","unstructured":"Stopjakova V, Manhaeve H, Sidiropulos M (1999) On-chip transient current monitor for testing of low-voltage CMOS IC. In: Proc Design, Automation and Test in Europe Conference and Exhibition, pp 538\u2013542"},{"issue":"10","key":"5199_CR44","doi-asserted-by":"crossref","first-page":"2301","DOI":"10.1109\/JSSC.2006.881561","volume":"41","author":"A Valdes-Garcia","year":"2006","unstructured":"Valdes-Garcia A, Hussien FAL, Silva-Martinez J, S\u00e1nchez-Sinencio E (2006) An integrated frequency response characterization system with a digital interface for analog testing. IEEE J Solid State Circ 41(10):2301\u20132313","journal-title":"IEEE J Solid State Circ"},{"issue":"7","key":"5199_CR45","doi-asserted-by":"crossref","first-page":"1470","DOI":"10.1109\/TIM.2008.917196","volume":"57","author":"A Valdes-Garcia","year":"2008","unstructured":"Valdes-Garcia A, Venkatasubramanian R, Silva-Martinez J, S\u00e1nchez-Sinencio E (2008) A broadband CMOS amplitude detector for on-chip RF measurements. IEEE Trans Instrum Meas 57(7):1470\u20131477","journal-title":"IEEE Trans Instrum Meas"},{"issue":"12","key":"5199_CR46","doi-asserted-by":"crossref","first-page":"2221","DOI":"10.1109\/JSSC.2003.819086","volume":"38","author":"I Vassiliou","year":"2003","unstructured":"Vassiliou I, Vavelidis K, Georgantas T, Plevridis S, Haralabidis N, Kamoulakos G, Kapnistis C, Kavadias S, Kokolakis Y, Merakos P, Rudell JC, Yamanaka A, Bouras S, Bouras I (2003) A single-chip digitally calibrated 5.15-5.825-GHz 0.18-\u03bcm CMOS transceiver for 802.11a wireless LAN. IEEE J Solid State Circ 38(12):2221\u20132231","journal-title":"IEEE J Solid State Circ"},{"key":"5199_CR47","doi-asserted-by":"crossref","unstructured":"Wang Q, Soma M (2006) RF front-end system gain and linearity built-in test. In: Proc 24th IEEE VLSI Test Symposium, pp 228\u2013233","DOI":"10.1109\/VTS.2006.59"},{"issue":"5","key":"5199_CR48","doi-asserted-by":"crossref","first-page":"1708","DOI":"10.1109\/TIM.2005.855105","volume":"54","author":"Q Yin","year":"2005","unstructured":"Yin Q, Eisenstadt WR, Fox RM, Zhang T (2005) A translinear RMS detector for embedded test of RF ICs. IEEE Trans Instrum Meas 54(5):1708\u20131714","journal-title":"IEEE Trans Instrum Meas"},{"key":"5199_CR49","doi-asserted-by":"crossref","unstructured":"Zjajo A, de Gyvez JP (2005) Evaluation of signature-based testing of RF\/analog circuits. In: Proc IEEE European Test Symposium, pp 62\u201367","DOI":"10.1109\/ETS.2005.22"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5199-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-011-5199-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5199-6","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,8]],"date-time":"2019-06-08T11:52:48Z","timestamp":1559994768000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-011-5199-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,2,9]]},"references-count":49,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2011,6]]}},"alternative-id":["5199"],"URL":"https:\/\/doi.org\/10.1007\/s10836-011-5199-6","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,2,9]]}}}