{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,4]],"date-time":"2022-04-04T06:28:45Z","timestamp":1649053725090},"reference-count":21,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2011,3,24]],"date-time":"2011-03-24T00:00:00Z","timestamp":1300924800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2011,6]]},"DOI":"10.1007\/s10836-011-5212-0","type":"journal-article","created":{"date-parts":[[2011,3,23]],"date-time":"2011-03-23T11:20:31Z","timestamp":1300879231000},"page":"241-252","source":"Crossref","is-referenced-by-count":3,"title":["Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme"],"prefix":"10.1007","volume":"27","author":[{"given":"Sukeshwar","family":"Kannan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bruce","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ganesh","family":"Srinivasan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Friedrich","family":"Taenzlar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Richard","family":"Antley","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Craig","family":"Force","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2011,3,24]]},"reference":[{"key":"5212_CR1","unstructured":"(1992) Quantization and dither: a theoretical survey. J Audio Eng Soc 40(5):355\u2013375, May"},{"issue":"2","key":"5212_CR2","doi-asserted-by":"crossref","first-page":"139","DOI":"10.1109\/19.293410","volume":"43","author":"P Carbone","year":"1994","unstructured":"Carbone P, Narduzzi C, Pedri D (1994) Dither signal effects on the resolution of nonlinear quantizers. IEEE Trans Instrum Meas 43(2):139\u2013145","journal-title":"IEEE Trans Instrum Meas"},{"issue":"3","key":"5212_CR3","doi-asserted-by":"crossref","first-page":"389","DOI":"10.1109\/19.293456","volume":"43","author":"P Carbone","year":"1994","unstructured":"Carbone P, Petri D (1994) Effect of additive dither on the resolution of ideal quantizers. IEEE Trans Instrum Meas 43(3):389\u2013396","journal-title":"IEEE Trans Instrum Meas"},{"key":"5212_CR4","doi-asserted-by":"crossref","unstructured":"Chakrabarti S, Cherubal S, Chatterjee A (1999) Fault diagnosis for mixed-signal electronic systems. In Proceedings IEEE Aerosp Conf, pp 169\u2013179","DOI":"10.1109\/AERO.1999.789776"},{"key":"5212_CR5","unstructured":"Cherubal S, Chatterjee A (2001) Test generation based diagnosis of device parameters for analog circuits. In: Proc Des Autom Test Eur, pp 596\u2013602"},{"issue":"1","key":"5212_CR6","doi-asserted-by":"crossref","first-page":"157","DOI":"10.1109\/19.50436","volume":"39","author":"H Dai","year":"1990","unstructured":"Dai H, Souders M (1990) Time-domain testing strategies and fault diagnosis for analog systems. IEEE Trans Instrum Meas 39(1):157\u2013162","journal-title":"IEEE Trans Instrum Meas"},{"key":"5212_CR7","doi-asserted-by":"crossref","unstructured":"Friese M (1997) Multitone signal with low crest factor. IEEE Trans Commun 45(10), October","DOI":"10.1109\/26.634697"},{"key":"5212_CR8","unstructured":"Huang K, Stratigopoulos HG, Mir S (2010) Fault diagnosis of analog circuits based on machine learning. Design Automation and Test Europe"},{"key":"5212_CR9","doi-asserted-by":"crossref","unstructured":"Kalyanaraman V, Kim B, Variyam P, Cherubal S (2006) DIBPro: automatic diagnostic program generation tool. IEEE Int Test Conf","DOI":"10.1109\/TEST.2006.297655"},{"key":"5212_CR10","unstructured":"Kannan S, Kim B (2009) Low cost test technique for RF interconnects in MCM substrate. IMAPS Advanced Technology Workshop on RF and Microwave Packaging, San Diego"},{"key":"5212_CR11","doi-asserted-by":"crossref","unstructured":"Kannan S, Kim B, Srinivasan G, Taenzlar F, Antley R, Force C (2010) RADPro: RF circuit analyzer and diagnostic program generation tool. IEEE Int Test Conf","DOI":"10.1109\/TEST.2010.5699233"},{"key":"5212_CR12","unstructured":"Kannan S, Kim B, Srinivasan G, Taenzlar F, Antley R, Vogel C, Force C (2010) Development of automatic program generation tool for analog-mixed signal and RF load boards. IEEE International Workshop on Reliability Aware System Design and Test, India January"},{"key":"5212_CR13","doi-asserted-by":"crossref","unstructured":"Pinjala K, Kim B, Variyam P (2003) Automatic diagnostic program generation for mixed signal load board. IEEE Int Test Conf, pp 403\u2013409","DOI":"10.1109\/TEST.2003.1270864"},{"issue":"4","key":"5212_CR14","doi-asserted-by":"crossref","first-page":"223","DOI":"10.1109\/TCS.1983.1085352","volume":"CAS-30","author":"L Rapisarda","year":"1983","unstructured":"Rapisarda L, Decarlo RA (1983) Analog multifrequency fault diagnosis. IEEE Trans Circuits Syst CAS-30(4):223\u2013234","journal-title":"IEEE Trans Circuits Syst"},{"key":"5212_CR15","unstructured":"Schuttert R, van Geest DCL (2004) On-chip mixed-signal test structures re-used for board test. IEEE Int Test Conf"},{"issue":"7","key":"5212_CR16","doi-asserted-by":"crossref","first-page":"457","DOI":"10.1109\/TCS.1979.1084659","volume":"26","author":"N Sen","year":"1979","unstructured":"Sen N, Saeks R (1979) Fault diagnosis for linear systems via multifrequency measurements. IEEE Trans Circuits Syst 26(7):457\u2013465","journal-title":"IEEE Trans Circuits Syst"},{"key":"5212_CR17","unstructured":"Srinivasan G, Cherubal S, Variyam P, Teklu M, Wang CP, Guidry D, Chatterjee A (2005) Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. IEEE European Test Symposium, Estonia, May"},{"key":"5212_CR18","unstructured":"Sundar S, Kim B (2008) Circuit analyzer and test generator (CATGEN) for mixed-signal device interface boards. IEEE VLSI Test Symposium, San Diego, April"},{"key":"5212_CR19","doi-asserted-by":"crossref","unstructured":"Sundar S, Kim B, Wokhlu S, Beskar E, Rousselin R, Byrd T, Toledo F, Cotton D, Kendall G (2007) Low cost automatic mixed-signal board test using IEEE 1149.4. IEEE Int Test Conf, Santa Clara, CA, October","DOI":"10.1109\/TEST.2007.4437629"},{"key":"5212_CR20","unstructured":"Tulloss RE, Yau CW (1989) BIST and boundary-scan for board level test: test program pseudo-code. First IEEE European Test Conference"},{"key":"5212_CR21","doi-asserted-by":"crossref","unstructured":"Woodard OC (1991) High density interconnects verification of unpopulated multichip modules. In: Proceedings of 11th IEEE\/CHMT International Electronic Manufacturing Technology Symposium, pp 434\u2013439","DOI":"10.1109\/IEMT.1991.279832"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5212-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-011-5212-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5212-0","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,9]],"date-time":"2019-06-09T11:25:44Z","timestamp":1560079544000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-011-5212-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3,24]]},"references-count":21,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2011,6]]}},"alternative-id":["5212"],"URL":"https:\/\/doi.org\/10.1007\/s10836-011-5212-0","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,3,24]]}}}