{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,5]],"date-time":"2025-03-05T00:10:02Z","timestamp":1741133402765,"version":"3.38.0"},"reference-count":22,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2011,4,9]],"date-time":"2011-04-09T00:00:00Z","timestamp":1302307200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2011,8]]},"DOI":"10.1007\/s10836-011-5218-7","type":"journal-article","created":{"date-parts":[[2011,4,8]],"date-time":"2011-04-08T17:17:17Z","timestamp":1302283037000},"page":"541-550","source":"Crossref","is-referenced-by-count":17,"title":["Exploring the Limitations of Software-based Techniques in SEE Fault Coverage"],"prefix":"10.1007","volume":"27","author":[{"given":"Jos\u00e9 Rodrigo","family":"Azambuja","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Samuel","family":"Pagliarini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lucas","family":"Rosa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fernanda Lima","family":"Kastensmidt","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2011,4,9]]},"reference":[{"key":"5218_CR1","unstructured":"(2005) International Technology Roadmap for Semiconductors: 2005 Edition, Chapter Design, pp 6\u20137"},{"key":"5218_CR2","doi-asserted-by":"crossref","unstructured":"Alkhalifa Z, Nair VSS, Krishnamurthy N, Abraham JA (1999) Design and evaluation of system-level checks for on-line control flow error detection. In IEEE Trans. on Parallel and Distributed Systems 10(6):627\u2013641. June","DOI":"10.1109\/71.774911"},{"key":"5218_CR3","doi-asserted-by":"crossref","unstructured":"Azambuja JR, Sousa F, Rosa L, Kastensmidt FL (2010) The limitations of software signature and basic block sizing in soft error fault coverage. In Proc. of IEEE Latin\u2013American Test Workshop","DOI":"10.1109\/LATW.2010.5550346"},{"key":"5218_CR4","doi-asserted-by":"crossref","unstructured":"Azambuja JR, Sousa F, Rosa L, Kastensmidt FL (2010) Evaluating the efficiency of software-only techniques to detect SEU and SET in microprocessors. In Proc. of IEEE Latin American Symposium on Circuits and Systems","DOI":"10.1109\/LATW.2011.5985914"},{"key":"5218_CR5","doi-asserted-by":"crossref","unstructured":"Baumann RC (2001) Soft errors in advanced semiconductor devices-part I: the three radiation sources. In IEEE Transactions on Device and Materials Reliability. March","DOI":"10.1109\/7298.946456"},{"key":"5218_CR6","doi-asserted-by":"crossref","unstructured":"Bolchini C, Miele A, Salice F, Sciuto D (2005) A model of soft error effects in generic ip processors. In Proc. of the 20th IEEE Int. Symp. on Defect and Fault Tolerance in VLSI Systems, pp 334\u2013342","DOI":"10.1109\/DFTVS.2005.10"},{"key":"5218_CR7","doi-asserted-by":"crossref","unstructured":"Bolchini C, Pomante L, Salice F, Sciuto D (2005) Reliable system specification for self-checking datapaths. In Proc. of the Conf. on Design, Automation and Test in Europe, pages 1278\u20131283, Washington, DC, USA. IEEE Computer Society","DOI":"10.1109\/DATE.2005.259"},{"key":"5218_CR8","doi-asserted-by":"crossref","unstructured":"Cheynet P, Nicolescu B, Velazco R, Rebaudengo M, Sonza Reorda M, Violante M (2000) Experimentally evaluating na automatic approach for generating safety-critical software with respect to transient errors. In IEEE Trans Nucl Sci 47(6 part 3):2231\u20132236. Dec","DOI":"10.1109\/23.903758"},{"key":"5218_CR9","doi-asserted-by":"crossref","first-page":"583","DOI":"10.1109\/TNS.2003.813129","volume":"50","author":"PE Dodd","year":"2003","unstructured":"Dodd PE, Massengill LW (2003) Basic mechanism and modeling of single-event upset in digital microelectronics. IEEE Trans Nucl Sci 50:583\u2013602","journal-title":"IEEE Trans Nucl Sci"},{"key":"5218_CR10","doi-asserted-by":"crossref","unstructured":"Goloubeva O, Rebaudengo M, Sonza Reorda M, Violante M (2003) Soft-error detection using control flow assertions. In: Proceedings of the 18th IEEE international symposium on defect and fault tolerance in VLSI systems\u2014DFT 2003, November, pp 581\u2013588","DOI":"10.1109\/DFTVS.2003.1250158"},{"key":"5218_CR11","doi-asserted-by":"crossref","unstructured":"Gorman TJO, Ross JM, Taber AH, Ziegler JF, Muhlfeld HP, Montrose ICJ, Curtis HW, Walsh JL (1996) Field testing for cosmic ray soft errors in semiconductor memories. In IBM Journal of Research and Development, pp 41\u201349, January","DOI":"10.1147\/rd.401.0041"},{"key":"5218_CR12","unstructured":"Hangout LMOSS, Jan S (2011) The minimips project. Available online at http:\/\/www.opencores.org\/projects.cgi\/web\/minimips\/overview"},{"key":"5218_CR13","doi-asserted-by":"crossref","unstructured":"Huang KH, Abraham JA (1984) Algorithm-based fault tolerance for matrix operations. In IEEE Trans Comput 33:518\u2013528. Dec","DOI":"10.1109\/TC.1984.1676475"},{"key":"5218_CR14","unstructured":"Lu DJ (1982) Watchdog processors and structural integrity checking. In IEEE Trans. on Computers C-31(7):681\u2013685"},{"key":"5218_CR15","unstructured":"Mcfearin LD, Nair VSS (1995) Control-flow checking using assertions. In Proc. of IFIP International Working Conference Dependable Computing for Critical Applications (DCCA-05), Urbana-Champaign, IL, USA, September"},{"key":"5218_CR16","unstructured":"Mentor Graphics (2009) http:\/\/www.model.com\/content\/modelsim-support"},{"key":"5218_CR17","unstructured":"Nicolescu B, Velazco R (2003) Detecting soft errors by a purely software approach: method, tools and experimental results. In Proc of the Design, Automation and Test in Europe Conference and Exhibition"},{"key":"5218_CR18","doi-asserted-by":"crossref","unstructured":"Oh N, Shirvani PP, McCluskey EJ (2002) Control flow checking by software signatures. In IEEE Trans Reliab 51(2):111\u2013112. (Mar)","DOI":"10.1109\/24.994926"},{"key":"5218_CR19","doi-asserted-by":"crossref","unstructured":"Oh N, Shirvani PP, McCluskey EJ (2002) Control-flow checking by software signatures. In IEEE Trans. on Reliability, 51(1):111\u2013122","DOI":"10.1109\/24.994926"},{"key":"5218_CR20","doi-asserted-by":"crossref","unstructured":"Oh N, Shirvani E, McCluskey E (2002) Error detection by duplicated instructions in Super-scalar Processors. In IEEE Trans. On Reliability 51\u20131:63\u201375","DOI":"10.1109\/24.994913"},{"key":"5218_CR21","doi-asserted-by":"crossref","unstructured":"Rebaudengo M, Sonza Reorda M, Torchiano M, Violante M (1999) Soft-error detection through software fault-tolerance techniques. In Proc. IEEE Int. Symp. on Defect and Fault Tolerance in VLSI Systems, pp 210\u2013218","DOI":"10.1109\/DFTVS.1999.802887"},{"key":"5218_CR22","doi-asserted-by":"crossref","unstructured":"Reis GA, Chang J, Vachharajani N, Rangan R, August DI (2005) SWIFT: software implemented fault tolerance. In Proc. of the Inter. Symp. on Code Generation and Optimization","DOI":"10.1145\/1113841.1113843"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5218-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-011-5218-7\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5218-7","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,4]],"date-time":"2025-03-04T23:33:07Z","timestamp":1741131187000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-011-5218-7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,4,9]]},"references-count":22,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2011,8]]}},"alternative-id":["5218"],"URL":"https:\/\/doi.org\/10.1007\/s10836-011-5218-7","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2011,4,9]]}}}