{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,5]],"date-time":"2022-04-05T12:35:15Z","timestamp":1649162115734},"reference-count":18,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2011,7,30]],"date-time":"2011-07-30T00:00:00Z","timestamp":1311984000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2011,10]]},"DOI":"10.1007\/s10836-011-5238-3","type":"journal-article","created":{"date-parts":[[2011,7,28]],"date-time":"2011-07-28T22:48:28Z","timestamp":1311893308000},"page":"647-655","source":"Crossref","is-referenced-by-count":5,"title":["A cost-efficient self-configurable BIST technique for testing multiplexer-based FPGA interconnect"],"prefix":"10.1007","volume":"27","author":[{"given":"Zhu","family":"Jianfeng","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"He","family":"Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wu","family":"Dong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pan","family":"Liyang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2011,7,30]]},"reference":[{"issue":"1","key":"5238_CR1","doi-asserted-by":"crossref","first-page":"159","DOI":"10.1109\/92.920830","volume":"9","author":"M Abramovici","year":"2001","unstructured":"Abramovici M, Stroud CE (2001) BIST-based test and diagnosis of FPGA logic blocks. IEEE transactions on VLSI systems 9(1):159\u2013172","journal-title":"IEEE transactions on VLSI systems"},{"key":"5238_CR2","unstructured":"Actel inc (2010) ProASIC3 FPGA fabric user\u2019s guide"},{"key":"5238_CR3","unstructured":"Actel inc (2009) Actel inc (2009) ProASIC3 Flash Family FPGAs Datasheet, IGLOO Low Power Flash FPGAs Datasheet. http:\/\/www.actel.com\/documents\/PA3_DS.pdf , http:\/\/www.actel.com\/documents\/IGLOO_DS.pdf"},{"key":"5238_CR4","unstructured":"Chmelar E (2004) Minimize the number of test configurations for FPGAs. ICCAD, pp 899\u2013902"},{"key":"5238_CR5","doi-asserted-by":"crossref","unstructured":"Dutt S, Verma V, Suthar V (2008) Built-in-self-test of FPGAs with provable diagnosabilities and high diagnostic coverage with application to online testing. IEEE Transactions on Computer-Aided Design of integrated circuits and systems, pp 309-326","DOI":"10.1109\/TCAD.2007.906992"},{"key":"5238_CR6","doi-asserted-by":"crossref","unstructured":"Fernandes D, Harris I (2003) Application of built-in self test for interconnect testing of FPGAs. Proceedings IEEE Int. Test Conference, pp 1248\u20131257","DOI":"10.1109\/TEST.2003.1271114"},{"key":"5238_CR7","doi-asserted-by":"crossref","unstructured":"Karp RM (1982) Dynamic programming meets the principle of inclusion and exclusion. Operations Research Letters","DOI":"10.1016\/0167-6377(82)90044-X"},{"key":"5238_CR8","unstructured":"Kohn S, Gottlieb A, Kohn M (1997) A Generating Function Approach to the Traveling Salesman Problem, Proceedings of the annual conference"},{"key":"5238_CR9","doi-asserted-by":"crossref","unstructured":"Lemieux G, Lee E, Tom M, Yu A (2004) Directional and single-driver wires in FPGA interconnect. In IEEE International Conference on Field-Programmable Technology, pp 41\u201348","DOI":"10.1109\/FPT.2004.1393249"},{"key":"5238_CR10","doi-asserted-by":"crossref","unstructured":"McCracken S, Zilic Z (2002) FPGA test time reduction through a novel interconnect testing scheme. Proc. ACM Int\u2019l Symp. on Field Programmable Gate Arrays, pp 136\u2013144","DOI":"10.1145\/503048.503069"},{"issue":"3","key":"5238_CR11","doi-asserted-by":"crossref","first-page":"239","DOI":"10.1007\/s10836-006-9319-7","volume":"22","author":"J Smith","year":"2006","unstructured":"Smith J, Xia T, Stroud C (2006) An automated BIST architecture for testing and diagnosing FPGA interconnect faults. J Electron Test Theory Appl 22(3):239\u2013253","journal-title":"J Electron Test Theory Appl"},{"key":"5238_CR12","unstructured":"SST inc (2010) SPI Serial Flash 25 Series Product Brief, http:\/\/ww1.microchip.com\/downloads\/en\/DeviceDoc\/01357A.pdf"},{"key":"5238_CR13","doi-asserted-by":"crossref","unstructured":"Stroud C, Wijesuriya S, Hamilton C, M Abramovici (1998) Built-in self-test of FPGA interconnect. Proceedings IEEE Int. Test Conference, pp 404\u2013411","DOI":"10.1109\/TEST.1998.743180"},{"key":"5238_CR14","doi-asserted-by":"crossref","unstructured":"Stroud C, Nall J, Lashinsky M, Abramovici M (2002) BIST-based diagnosis of FPGA interconnect. Proceedings IEEE Int. Test Conference, pp 618\u2013627","DOI":"10.1109\/TEST.2002.1041813"},{"key":"5238_CR15","doi-asserted-by":"crossref","unstructured":"Tahoori M, Mitra S (2003) Automatic configuration generation for FPGA interconnect testing. Proc. 21st VLSI Test Symp, pp 134\u2013139","DOI":"10.1109\/VTEST.2003.1197644"},{"issue":"11","key":"5238_CR16","doi-asserted-by":"crossref","first-page":"1774","DOI":"10.1109\/TCAD.2005.852452","volume":"24","author":"M Tahoori","year":"2005","unstructured":"Tahoori M, Mitra S (2005) Application independent testing of FPGA interconnects. IEEE Trans Comput Aided Des Integrated Circ Syst 24(11):1774\u20131783","journal-title":"IEEE Trans Comput Aided Des Integrated Circ Syst"},{"key":"5238_CR17","doi-asserted-by":"crossref","unstructured":"Wunderlich HJ (1998) BIST for systems-on-a-chip. INTEGRATION, the VLSI journal","DOI":"10.1016\/S0167-9260(98)00021-2"},{"key":"5238_CR18","unstructured":"Xilinx inc (2008) Spartan-3 FPGA Family Advanced Configuration Architecture"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5238-3.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-011-5238-3\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5238-3","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,13]],"date-time":"2019-06-13T10:44:11Z","timestamp":1560422651000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-011-5238-3"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,7,30]]},"references-count":18,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2011,10]]}},"alternative-id":["5238"],"URL":"https:\/\/doi.org\/10.1007\/s10836-011-5238-3","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,7,30]]}}}