{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,3]],"date-time":"2025-09-03T11:14:59Z","timestamp":1756898099627},"reference-count":17,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2011,9,10]],"date-time":"2011-09-10T00:00:00Z","timestamp":1315612800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2011,10]]},"DOI":"10.1007\/s10836-011-5245-4","type":"journal-article","created":{"date-parts":[[2011,9,9]],"date-time":"2011-09-09T09:08:53Z","timestamp":1315559333000},"page":"627-633","source":"Crossref","is-referenced-by-count":5,"title":["Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions"],"prefix":"10.1007","volume":"27","author":[{"given":"Gilles","family":"Foucard","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paul","family":"Peronnard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raoul","family":"Velazco","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2011,9,10]]},"reference":[{"key":"5245_CR1","unstructured":"Berger G, Ryckewaert G, Harboe-Sorensen R, Adams L (1996) The heavy ion irradiation facility at CYCLONE - a dedicated SEE beam line. IEEE NSREC Workshop"},{"key":"5245_CR2","unstructured":"Berger G, Ryckewaert G, Harboe-Sorensen R (1997) CYCLONE \u2013 A Multipurpose Heavy Ion, Proton and Neutron SEE Test Site, RADECS Workshop, 51\u201355"},{"key":"5245_CR3","unstructured":"Caffrey M, Graham P, Johnson E, Wirthlin M (2002) Single-event upsets in SRAM FPGAs. in Proc. of the military and aerospace applications of programmable devices Int\u2019l conference (MAPLD)"},{"key":"5245_CR4","unstructured":"Faure F, Peronnard P, Velazco R (2002) Thesic+: A flexible system for see testing, in Proc. of RADECS"},{"key":"5245_CR5","unstructured":"Kastensmidt FL, Sterpone L, Carro L, Reorda MS (2005) On the optimal design of triple modular redundancy logic for SRAM-based FPGAs, Proc. Of Design, Automation and Test in Europe (DATE) 2005. 2:1290\u20131295"},{"issue":"5","key":"5245_CR6","doi-asserted-by":"crossref","first-page":"2825","DOI":"10.1109\/TNS.2004.835057","volume":"51","author":"R Koga","year":"2004","unstructured":"Koga R, George J, Swift G, Yui C, Edmonds L, Carmichael C, Langley T, Murray P, Lanes K, Napier M (2004) Comparison of Xilinx Virtex-II FPGA SEE sensitivities to protons and heavy ions. IEEE Trans Nucl Sci 51(5):2825\u20132833","journal-title":"IEEE Trans Nucl Sci"},{"key":"5245_CR7","volume-title":"Ionizing radiation effects in MOS devices and circuits","author":"T Ma","year":"1989","unstructured":"Ma T, Dressendorfer P (1989) Ionizing radiation effects in MOS devices and circuits. Wiley, New York"},{"issue":"4","key":"5245_CR8","doi-asserted-by":"crossref","first-page":"1968","DOI":"10.1109\/TNS.2008.2000850","volume":"55","author":"A Manuzzato","year":"2008","unstructured":"Manuzzato A, Gerardin S, Paccagnella A, Sterpone L, Violante M (2008) Effectiveness of TMR-based techniques to mitigate alpha-induced SEU accumulation in commercial SRAM-based FPGAs. Nuclear Science, IEEE Transactions on 55(4):1968\u20131973","journal-title":"Nuclear Science, IEEE Transactions on"},{"key":"5245_CR9","unstructured":"Mersenne twister: http:\/\/www.math.sci.hiroshima-u.ac.jp\/~m-mat\/MT\/emt.html"},{"issue":"6","key":"5245_CR10","doi-asserted-by":"crossref","first-page":"2438","DOI":"10.1109\/TNS.2005.860674","volume":"52","author":"K Morgan","year":"2005","unstructured":"Morgan K, Caffrey M, Graham P, Johnson E, Pratt B, Wirthlin M (2005) SEU-induced persistent error propagation in FPGAs. IEEE Trans Nucl Sci 52(6):2438\u20132445","journal-title":"IEEE Trans Nucl Sci"},{"issue":"2","key":"5245_CR11","doi-asserted-by":"crossref","first-page":"461","DOI":"10.1109\/23.490893","volume":"43","author":"E Normand","year":"1966","unstructured":"Normand E (1966) Single-event effects in avionics. IEEE Trans Nucl Sci 43(2):461\u2013474","journal-title":"IEEE Trans Nucl Sci"},{"key":"5245_CR12","unstructured":"Opencores: http:\/\/www.opencores.org\/project,des"},{"key":"5245_CR13","unstructured":"Pouget V, Fouillat P, Lewis D (2006) Using the SEEM software for SET testing and analysis, Radiation effects in embedded systems, to be published by Springer"},{"key":"5245_CR14","unstructured":"Pouget V, Wan D, Jaulent P, Douin A, Lewis D, Fouillat P (2006) Recent developments for SEE testing at the ATLAS laser facility. Proc. of 15th Single-Event Effects Symposium"},{"key":"5245_CR15","unstructured":"Pouget V, Douin A, Lewis D, Fouillat P, Foucard G, Peronnard P, Maingot V, Ferron JB, Anghel L, Leveugle R, Velazco R (2007) Tools and Methodology Development for Pulsed Laser Fault Injection in SRAM-Based FPGAs, 8th Latin American Test Workshop (LATW 2007), [Cusco (Peru), 11\u201314]."},{"key":"5245_CR16","unstructured":"Xilinx (2005) Virtex-II platform FPGAs: complete data sheet, http:\/\/www.xilinx.com , March"},{"key":"5245_CR17","unstructured":"XTMR Tool User Guide (2004) Xilinx User guide UG156"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5245-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-011-5245-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5245-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T22:04:42Z","timestamp":1559253882000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-011-5245-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9,10]]},"references-count":17,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2011,10]]}},"alternative-id":["5245"],"URL":"https:\/\/doi.org\/10.1007\/s10836-011-5245-4","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,9,10]]}}}