{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:57:10Z","timestamp":1759147030816},"reference-count":15,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2011,9,9]],"date-time":"2011-09-09T00:00:00Z","timestamp":1315526400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2011,12]]},"DOI":"10.1007\/s10836-011-5252-5","type":"journal-article","created":{"date-parts":[[2011,9,8]],"date-time":"2011-09-08T00:08:44Z","timestamp":1315440524000},"page":"697-709","source":"Crossref","is-referenced-by-count":1,"title":["Digital Design-for-Diagnosis Method for Error Identification of Pipelined ADCs"],"prefix":"10.1007","volume":"27","author":[{"given":"Jin-Fu","family":"Lin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hsin-Wen","family":"Ting","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2011,9,9]]},"reference":[{"key":"5252_CR1","doi-asserted-by":"crossref","unstructured":"Charoenrook A, Soma M (1993) Fault diagnosis of flash ADC using DNL test. in Proc. IEEE International Test Conference. Oct. 680\u2013689","DOI":"10.1109\/TEST.1993.470635"},{"key":"5252_CR2","doi-asserted-by":"crossref","unstructured":"Charoenrook A, Soma M (1994) Fault diagnosis technique for subranging ADCs. in Proc. IEEE International Test Conference. Nov. 367\u2013372","DOI":"10.1109\/ATS.1994.367204"},{"issue":"3","key":"5252_CR3","doi-asserted-by":"crossref","first-page":"2139","DOI":"10.1109\/JSSC.2004.836232","volume":"39","author":"Y Chiu","year":"2004","unstructured":"Chiu Y, Gray PR, Nikolic B (2004) A 14-b 12-MS\/s CMOS pipeline ADC with over 100-dB SFDR. IEEE J Solid-State Circuits 39(3):2139\u20132151","journal-title":"IEEE J. Solid-State Circuits"},{"key":"5252_CR4","doi-asserted-by":"crossref","first-page":"166","DOI":"10.1109\/4.364429","volume":"30","author":"TB Cho","year":"1995","unstructured":"Cho TB, Gray PR (1995) A 10 b 20 Msample\/s, 35 mW pipeline A\/D converter. IEEE J Solid-State Circuits 30:166\u2013172","journal-title":"IEEE J. Solid-State Circuits"},{"issue":"3","key":"5252_CR5","doi-asserted-by":"crossref","first-page":"294","DOI":"10.1109\/81.662703","volume":"45","author":"P Cusinato","year":"1998","unstructured":"Cusinato P, Bruccoleri M, Caviglia DD, Valle M (1998) Analysis of the behavior of a dynamic latch comparator. IEEE Trans Circuits Syst I, Fundam Theory Appl 45(3):294\u2013298","journal-title":"IEEE Trans. Circuits Syst. I, Fundam. Theory Appl"},{"key":"5252_CR6","doi-asserted-by":"crossref","unstructured":"Huang CH, Lee KJ, Chang SJ (2004) A low-cost diagnosis methodology for pipelined A\/D converters. in Proc. IEEE Asian Test Symposium. Nov. 296\u2013301","DOI":"10.1109\/ATS.2004.8"},{"key":"5252_CR7","doi-asserted-by":"crossref","unstructured":"Kuyel T, Bilhanhen H (1999) Relating linearity test results to design flaws of pipelined analog to digital converters. in Proc. IEEE International Test Conference. Sept. 772\u2013779","DOI":"10.1109\/TEST.1999.805807"},{"key":"5252_CR8","doi-asserted-by":"crossref","first-page":"954","DOI":"10.1109\/JSSC.1987.1052843","volume":"22","author":"SH Lewis","year":"1987","unstructured":"Lewis SH, Gray PR (1987) A pipelined 5-Msample\/s 9-bit analog-to-digital converter. IEEE J Solid-State Circuits 22:954\u2013961","journal-title":"IEEE J. Solid-State Circuits"},{"key":"5252_CR9","doi-asserted-by":"crossref","unstructured":"Lin JF, Chang SJ, Huang CH (2009) Design-for-test circuit for the reduced code based linearity test method in pipelined ADCs with digital error correction technique. in Proc. IEEE Asian Test Symposium. Nov. 24\u201327. 57\u201362","DOI":"10.1109\/ATS.2009.18"},{"key":"5252_CR10","doi-asserted-by":"crossref","unstructured":"Lin JF, Kung TC, Chang SJ (2008) A reduced code linearity test method for pipelined A\/D converters. in Proc. IEEE Asian Test Symposium. Nov 24\u201327. 111\u2013116","DOI":"10.1109\/ATS.2008.53"},{"key":"5252_CR11","doi-asserted-by":"crossref","unstructured":"Peralias E, Rueda A, Prieto JA, Huertas JL (1998) DfT & on-line test of high-performance data converters: a practical case. in Proc. IEEE International Test Conference. Oct. 534\u2013540","DOI":"10.1109\/TEST.1998.743196"},{"issue":"2","key":"5252_CR12","doi-asserted-by":"crossref","first-page":"448","DOI":"10.1109\/TIM.2004.823317","volume":"53","author":"B Provost","year":"2004","unstructured":"Provost B, Sinencio ES (2004) A practical self-calibration scheme implementation for pipeline ADC. IEEE Trans Instrum Meas 53(2):448\u2013456","journal-title":"IEEE Trans Instrum Meas"},{"key":"5252_CR13","doi-asserted-by":"crossref","unstructured":"Samid L, Volz P, Manoli Y (2004) A dynamic analysis of a latched CMOS comparator. in Proc. IEEE International Symposium on Circuit and System. 181\u2013184","DOI":"10.1109\/ISCAS.2004.1328161"},{"key":"5252_CR14","doi-asserted-by":"crossref","first-page":"549","DOI":"10.1007\/s10836-007-5010-x","volume":"23","author":"HW Ting","year":"2007","unstructured":"Ting HW, Lin CW, Liu BD, Chang SJ (2007) Oscillator-based reconfigurable sinusoidal signal generator for ADC BIST. J Electron Test: Theory Appl 23:549\u2013558","journal-title":"J Electron Test: Theory Appl"},{"key":"5252_CR15","doi-asserted-by":"crossref","first-page":"420","DOI":"10.1109\/TIM.2007.910106","volume":"57","author":"HW Ting","year":"2008","unstructured":"Ting HW, Liu BD, Chang SJ (2008) Histogram based testing method for estimating A\/D converter performance. IEEE Trans Instrum Meas 57:420\u2013427","journal-title":"IEEE Trans Instrum Meas"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5252-5.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-011-5252-5\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5252-5","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,14]],"date-time":"2019-06-14T23:30:57Z","timestamp":1560555057000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-011-5252-5"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9,9]]},"references-count":15,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2011,12]]}},"alternative-id":["5252"],"URL":"https:\/\/doi.org\/10.1007\/s10836-011-5252-5","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,9,9]]}}}