{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T22:31:33Z","timestamp":1769812293388,"version":"3.49.0"},"reference-count":97,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2012,1,26]],"date-time":"2012-01-26T00:00:00Z","timestamp":1327536000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2012,6]]},"DOI":"10.1007\/s10836-011-5276-x","type":"journal-article","created":{"date-parts":[[2012,1,25]],"date-time":"2012-01-25T20:17:53Z","timestamp":1327522673000},"page":"365-374","source":"Crossref","is-referenced-by-count":9,"title":["Challenges for Semiconductor Test Engineering: A Review Paper"],"prefix":"10.1007","volume":"28","author":[{"given":"Stefan R.","family":"Vock","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Omar J.","family":"Escalona","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Colin","family":"Turner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Frank J.","family":"Owens","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2012,1,26]]},"reference":[{"key":"5276_CR1","doi-asserted-by":"crossref","unstructured":"Abdennadher S (2008) \u201cEffects of Advances in Analog, Mixed Signal and IO Circuits on Test Strategies\u201d, 17th Asian Test Symposium, pp 145","DOI":"10.1109\/ATS.2008.94"},{"key":"5276_CR2","unstructured":"Ackermann CS, and Fabia JM (1992) \u201cMonitoring supplier quality at p.p.m. levels\u201d, Semiconductor Manufacturing Science Symposium, IEEE\/SEMI International, 15\u201316: 24\u201330"},{"key":"5276_CR3","unstructured":"Advantest (2011) company products web page, viewed February 2011, < http:\/\/www.advantest.co.jp\/products\/ate\/en-index.shtml >"},{"key":"5276_CR4","doi-asserted-by":"crossref","unstructured":"Aldrich G (2004) \u201c100 DPPM in nanometer technology\u2026 is it achievable?\u201d, in Proceedings International Test Conference, pp 1417","DOI":"10.1109\/TEST.2004.1387425"},{"issue":"1","key":"5276_CR5","doi-asserted-by":"crossref","first-page":"17","DOI":"10.1016\/j.vlsi.2003.09.006","volume":"37","author":"L Ali","year":"2004","unstructured":"Ali L, Sidek R, Aris I, Suparjo BS, Mohd Alib MA (2004) \u201cChallenges and directions for testing IC\u201d, Integration. The VLSI Journal 37(1):17\u201328","journal-title":"The VLSI Journal"},{"key":"5276_CR6","unstructured":"Anderson M (2005) \u201cThe increasing importance of testing\u201d, in Automotive Design & Production, 117(6): 18, Cincinnati"},{"key":"5276_CR7","doi-asserted-by":"crossref","unstructured":"Antoniol G, Hayes JH, Gueheneuc YG, and di Penta M (2008) \u201cReuse or rewrite: combining textual, static, and dynamic analyses to assess the cost of keeping a system up-to-date\u201d, 2008 IEEE International Conference on Software Maintenance, pp 147\u201356","DOI":"10.1109\/ICSM.2008.4658063"},{"key":"5276_CR8","doi-asserted-by":"crossref","unstructured":"Ardimento P, Bruno G, Caivano D, and Visaggio G (2007) \u201cA maintenance oriented framework for software components characterization\u201d, 11th European Conference on Software Maintenance and Reengineering, p 10","DOI":"10.1109\/CSMR.2007.7"},{"key":"5276_CR9","doi-asserted-by":"crossref","first-page":"456","DOI":"10.1109\/AUTEST.2005.1609179","volume":"2005","author":"CR Barker","year":"2005","unstructured":"Barker CR, O\u2019Donnell SJ (2005) Improving test time on a COTS based system. Autotestcon 2005:456\u2013462","journal-title":"Autotestcon"},{"issue":"2","key":"5276_CR10","doi-asserted-by":"crossref","first-page":"77","DOI":"10.1109\/MAHC.2006.36","volume":"28","author":"JP Bowen","year":"2006","unstructured":"Bowen JP, Bergin T, Sterling CH (2006) Reviews. IEEE Ann Hist Comput 28(2):77\u201380","journal-title":"IEEE Ann Hist Comput"},{"key":"5276_CR11","doi-asserted-by":"crossref","first-page":"44","DOI":"10.1109\/ICSM.2007.4362617","volume":"2007","author":"D Brand","year":"2007","unstructured":"Brand D, Buss M, Sreedhar VC (2007) Evidence-based analysis and inferring preconditions for bug detection. IEEE International Conference on Software Maintenance 2007:44\u201353","journal-title":"IEEE International Conference on Software Maintenance"},{"key":"5276_CR12","unstructured":"Brown S (2003) \u201cChanging the automatic test paradigm through concurrent measurement and test development\u201d, in AUTOTESTCON 2003, Proceedings. IEEE Systems Readiness Technology Conference, Future Sustainment for Military and Aerospace (Cat. No.03CH37447), pp 34\u20139"},{"key":"5276_CR13","unstructured":"Bucy J (1980) \u201cThe semiconductor industry challenges in the decade ahead\u201d, IEEE International Solid-State Circuits Conference, Digest of Technical Papers, vol. XXIII, pp 53"},{"key":"5276_CR14","doi-asserted-by":"crossref","unstructured":"Burlison, Crouch, Ritchie (2007) \u201cProtocol aware test. It has a role, but where? And how?,\u201d Test Conference, 2007. ITC 2007. IEEE International, pp. 1","DOI":"10.1109\/TEST.2007.4437691"},{"key":"5276_CR15","unstructured":"Cadence Design Systems (2011) Company web page, viewed February 2011, < http:\/\/www.cadence.com\/us\/pages\/default.aspx >"},{"key":"5276_CR16","unstructured":"Canepa M (1988) \u201cThe future of open systems\u201d, Interoperable Information Systems, ISIIS \u201988, pp. 17\u201324"},{"key":"5276_CR17","unstructured":"Chappell J (2003) \u201cOpen standard ATE engenders open debate\u201d, Electronic Business 29(14): 40, Highlands Ranch"},{"issue":"1","key":"5276_CR18","doi-asserted-by":"crossref","first-page":"63","DOI":"10.1109\/7.640263","volume":"34","author":"CIH Chen","year":"1998","unstructured":"Chen CIH (1998) Efficient approaches to low-cost high-fault coverage VLSI BIST designs. IEEE Trans Aerosp Electron Syst 34(1):63\u201370","journal-title":"IEEE Trans Aerosp Electron Syst"},{"key":"5276_CR19","unstructured":"Clendenin CK (2004) \u201cFlexible test systems - an adaptive architecture to preserve existing investment and enable use of emerging technologies\u201d, in AUTOTESTCON 2004 Proceedings (IEEE Cat. No.04CH37560), pp 45\u201351"},{"key":"5276_CR20","unstructured":"LIN Consortium (2010) \u201cLocal interconnect network concept\u201d, LIN Administration, viewed October 2010, < http:\/\/www.lin-subbus.org\/ >"},{"key":"5276_CR21","unstructured":"Dakshinamoorthy S (2008) \u201cZero defects quality and reliability challenges for growing markets\u201d, IEEE International Integrated Reliability Workshop Final Report, pp. 12\u201316"},{"key":"5276_CR22","unstructured":"Desmier H (1989) \u201cCATE at heat of board test system\u201d, in Electronics Manufacture & amp Test, 8(11): 27-8, 31"},{"key":"5276_CR23","unstructured":"Eclipse (2010) Eclipse Foundation, viewed November 2010, < http:\/\/www.eclipse.org >"},{"key":"5276_CR24","doi-asserted-by":"crossref","unstructured":"Ellis K (2003) \u201cSignal and test definition - an IEEE standard\u201d, in AUTOTESTCON 2003, Proceedings. IEEE Systems Readiness Technology Conference, Future Sustainment for Military and Aerospace (Cat. No.03CH37447), pp. 244\u201357","DOI":"10.1109\/AUTEST.2003.1243584"},{"key":"5276_CR25","unstructured":"Furukawa Y, and Rajsuman R (2005) \u201cNew trends drive ATE open architecture\u201d, Semiconductor International, 28(8): 75, 3 pgs, Newton"},{"key":"5276_CR26","unstructured":"Geathers GE (2001) \u201cThe IVI foundation signal interface; a new industry standard\u201d, in 2001 IEEE Autotestcon Proceedings, IEEE Systems Readiness Technology Conference. (Cat. No.01CH37237), pp. 497\u2013503"},{"issue":"5","key":"5276_CR27","doi-asserted-by":"crossref","first-page":"1495","DOI":"10.1109\/TIM.2008.2009417","volume":"58","author":"K George","year":"2009","unstructured":"George K, Chen CIH (2009) Logic Built-In Self-Test for Core-Based Designs on System-on-a-Chip. IEEE Trans Instrum Meas 58(5):1495\u20131504","journal-title":"IEEE Trans Instrum Meas"},{"key":"5276_CR28","doi-asserted-by":"crossref","unstructured":"Gessner B (2007) \u201cHow to ensure zero defects from the beginning with semiconductor test methods\u201d, IEEE International Test Conference, pp. 1\u20132","DOI":"10.1109\/TEST.2007.4437697"},{"issue":"4","key":"5276_CR29","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1109\/MAES.2005.1423383","volume":"20","author":"K Ham","year":"2005","unstructured":"Ham K (2005) \u201cAn alternative to traditional software rehosting\u201d. IEEE Aerosp Electron Syst Mag 20(4):9\u201312","journal-title":"IEEE Aerosp Electron Syst Mag"},{"key":"5276_CR30","unstructured":"Hapgood F (2001) \u201cBug battles\u201d, CIO: Aug 1, 14(20), pp. 94, Framingham"},{"issue":"3","key":"5276_CR31","first-page":"14","volume":"44","author":"R Harrison","year":"2005","unstructured":"Harrison R (2005) ATML - a new standard for ATE. Eval Eng 44(3):14\u201319","journal-title":"Eval Eng"},{"key":"5276_CR32","unstructured":"Harrold MJ, and Orso A (2008) \u201cRetesting software during development and maintenance\u201d, 2008 IEEE International Conference on Software Maintenance, pp. 99\u2013108"},{"issue":"2","key":"5276_CR33","doi-asserted-by":"crossref","first-page":"300","DOI":"10.1109\/TIM.2003.822710","volume":"53","author":"H Hashempour","year":"2004","unstructured":"Hashempour H, Meyer FJ, Lombardi F (2004) Analysis and measurement of fault coverage in a combined ATE and BIST environment. IEEE Trans Instrum Meas 53(2):300\u2013307","journal-title":"IEEE Trans Instrum Meas"},{"key":"5276_CR34","unstructured":"Hashimoto T (1994) \u201cDesigning the conformance test program for programming language processors\u201d, in NTT R&D, 43(6): 681\u2013688"},{"key":"5276_CR35","doi-asserted-by":"crossref","unstructured":"Hetherington G, Fryars T, Tamarapalli N, Kassab M, Hassan A, and Rajski J (1999) \u201cLogic BIST for large industrial designs: real issues and case studies\u201d, in Proceedings International Test Conference, pp. 358\u2013367","DOI":"10.1109\/TEST.1999.805650"},{"key":"5276_CR36","unstructured":"Hoffman D (2002) \u201cHomegrown tools and equipment versus EDA and ATE vendors: future of design to test product lines\u201d, in Proceedings International Test Conference 2002 (Cat. No.02CH37382), pp 26"},{"key":"5276_CR37","doi-asserted-by":"crossref","first-page":"284","DOI":"10.1109\/AUTEST.2004.1436849","volume":"2004","author":"JN Hulett","year":"2004","unstructured":"Hulett JN (2004) \u201cAsk the user: a practical approach to test program set development\u201d, in Proceedings. Autotestcon 2004:284\u2013288","journal-title":"Autotestcon"},{"key":"5276_CR38","doi-asserted-by":"crossref","unstructured":"Hulme A, and Nash K (2008) \u201cImplementing IEEE 1641\u2014Using a complete system\u201d, in Proceedings IEEE Autotestcon 2008, pp 301\u2013307","DOI":"10.1109\/AUTEST.2008.4662630"},{"key":"5276_CR39","unstructured":"IEEE 1641 (2011) IEEE Standards Association web page, viewed February 2011, < http:\/\/standards.ieee.org\/findstds\/standard\/1641-2010.html >"},{"key":"5276_CR40","volume-title":"IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data","author":"IEEE 1450\u20131999","year":"1999","unstructured":"IEEE 1450\u20131999 (1999) IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data. IEEE, USA"},{"key":"5276_CR41","doi-asserted-by":"crossref","unstructured":"Ishihara S, Okazaki S, and Arimoto H (2007) \u201c20\u00a0years of Microprocesses and Nanotechinology Conference\u201d, Microprocesses and Nanotechnology, Digest of papers, pp. 2, 5\u20138","DOI":"10.1109\/IMNC.2007.4456075"},{"key":"5276_CR42","unstructured":"ITRS (2003) \u201cInternational Technology Roadmap for Semiconductors 2003, Test and Test Equipment\u201d, viewed January 2008, < http:\/\/public.itrs.net\/Files\/2003ITRS\/Test2003.pdf >"},{"key":"5276_CR43","unstructured":"ITRS (2009) \u201cInternational Technology Roadmap for Semiconductors 2009\u201d, viewed March 2010. < www.itrs.net\/Links\/2009ITRS\/2009Chapters_2009Tables\/2009_Test.pdf >"},{"key":"5276_CR44","unstructured":"ITRS (2010) \u201cInternational technology roadmap for semiconductors 2009. Webpage home summary, viewed December 2010, < www.itrs.net\/Links\/2009ITRS\/2009Chapters_2009Tables\/2009_ExecSum.pdf >"},{"key":"5276_CR45","doi-asserted-by":"crossref","unstructured":"Iyengar V, Chakrabarty K, and Marinissen EJ (2002) \u201cRecent advances in test planning for modular testing of core-based SOCs\u201d, in Proceedings of the 11th Asian Test Symposium (ATS'02), pp 320\u20135","DOI":"10.1109\/ATS.2002.1181731"},{"key":"5276_CR46","unstructured":"Journal of Software Maintenance and Evolution: Research and Practice (2010), ISSN: 1532\u2013060X, continued topic"},{"key":"5276_CR47","unstructured":"Kelly N (2004) \u201cMeeting challenges in test\u201d, Semiconductor International, 27(1): 86, Newton"},{"key":"5276_CR48","unstructured":"Koche A, and Barth R (2009) \u201cATE Vision 2020: New Frontiers for ATEs\u201d; \u201cTest Challenges of Device Scaling\u201d, Proc. VLSI Test symposium, viewed June 2009, < http:\/\/www.tttc-vts.org >"},{"key":"5276_CR49","unstructured":"Laney J (2002) \u201cWhich text language works best?\u201d, Test & Measurement World, 22(5): 4, 4 pgs, Boston"},{"key":"5276_CR50","unstructured":"LIN Specification 2.1 (2008) \u201cLIN Spec 2.1\u201d, LIN Administration Specification, < http:\/\/www.lin-subbus.org\/ >"},{"key":"5276_CR51","unstructured":"LTX-Credence (2011) company products web page, viewed February 2011, < http:\/\/www.ltx.com\/xweb.nsf\/published\/testplatformportfolio?Open >"},{"key":"5276_CR52","unstructured":"Maciejewski W, and Harrison M (1981) \u201cCost-effective approaches for extending the useful life of ATE and test program sets\u201d, in Proceedings IEEE AUTOTESTCON, pp. 273\u20135"},{"issue":"6","key":"5276_CR53","first-page":"21","volume":"27","author":"LD Maloney","year":"2007","unstructured":"Maloney LD (2007) \u201cLaying the foundation for growth\u201d. Test &amp Measurement World 27(6):21\u201324","journal-title":"Test &amp Measurement World"},{"issue":"3","key":"5276_CR54","doi-asserted-by":"crossref","first-page":"315","DOI":"10.1016\/j.asoc.2004.08.004","volume":"5","author":"T Mantere","year":"2005","unstructured":"Mantere T, Alander JT (2005) \u201cEvolutionary software engineering, a review\u201d. Appl Soft Comput 5(3):315\u2013331","journal-title":"Appl Soft Comput"},{"key":"5276_CR55","unstructured":"Measurements Systems Analysis (2002) Automotive Industry Action Group AIAG, continuous publications, viewed May 2010, < http:\/\/www.aiag.org >"},{"key":"5276_CR56","unstructured":"Mentor Graphics (2011) Company web page, viewed February 2011, < http:\/\/www.mentor.com\/ >"},{"key":"5276_CR57","unstructured":"Microsoft (2011) Company developer network web page, viewed February 2011, < http:\/\/msdn.microsoft.com\/en-us\/ >"},{"key":"5276_CR58","doi-asserted-by":"crossref","unstructured":"Mitra S, McCluskey EJ, and Makar S (2002) \u201cDesign for testability and testing of IEEE 1149.1 TAP controller\u201d, in Proceedings 20th IEEE VLSI Test Symposium 2002, pp. 247\u2013252","DOI":"10.1109\/VTS.2002.1011145"},{"issue":"3","key":"5276_CR59","doi-asserted-by":"crossref","first-page":"62","DOI":"10.1109\/MAHC.2006.45","volume":"28","author":"E Mollick","year":"2006","unstructured":"Mollick E (2006) Establishing Moore\u2019s Law. IEEE Ann Hist Comput 28(3):62\u201375","journal-title":"IEEE Ann Hist Comput"},{"key":"5276_CR60","unstructured":"Moran A, Teisher J, Gill A, Pasalic E, and Veneruso J (2001) \u201cAutomated translation of legacy code for ATE\u201d, in Proceedings International Test Conference 2001 (Cat. No.01CH37260), pp. 148\u201356"},{"key":"5276_CR61","first-page":"51","volume":"2005","author":"R Nageswaran","year":"2005","unstructured":"Nageswaran R, Nelson C (2005) Enabling innovation in test manufacturing through ATE software standards. IEEE International Symposium on Semiconductor Manufacturing 2005:51\u201354","journal-title":"IEEE International Symposium on Semiconductor Manufacturing"},{"key":"5276_CR62","unstructured":"Nelson R (2002) \u201cFASTest RF\u201d Test and Measurement World, viewed July 2010, < http:\/\/www.tmworld.com\/article\/322507-FASTest_RF.php >"},{"key":"5276_CR63","unstructured":"Nelson R (2002b) \u201cQuality and responsibility\u201d, Test & Measurement World, 22(13): 7, Boston"},{"key":"5276_CR64","first-page":"687","volume":"1999","author":"RP Oblad","year":"1999","unstructured":"Oblad RP (1999) \u201cAchieving robust interchangeability of test assets in ATE systems\u201d in Proceedings. IEEE AUTOTESTCON 1999:687\u2013698","journal-title":"IEEE AUTOTESTCON"},{"key":"5276_CR65","doi-asserted-by":"crossref","unstructured":"O\u2019Donnell SJ, and Brackett RA (2002) \u201cAdopting IVI: an incremental approach [Interchangeable Virtual Instruments]\u201d, in IEEE AUTOTESTCON Proceedings. Systems Readiness Technology Conference. \u2018The New Millennium Challenge\u2014Transforming Test\u2019 (Cat. No.02CH37350), pp. 324\u2013336","DOI":"10.1109\/AUTEST.2002.1047902"},{"key":"5276_CR66","doi-asserted-by":"crossref","unstructured":"O\u2019Donnell SJ, and Schwentner JC (2003) \u201cAdopting IVI: an incremental approach, 1\u00a0year later [ATE applications]\u201d, in AUTOTESTCON 2003, Proceedings, IEEE Systems Readiness Technology Conference, Future Sustainment for Military and Aerospace (Cat. No.03CH37447), pp. 436\u201343","DOI":"10.1109\/AUTEST.2003.1243610"},{"key":"5276_CR67","doi-asserted-by":"crossref","unstructured":"Ogata T, Ono T, Watanabe T and Ito K (1991) \u201cAn automatic test program generator\u201d, in Proceedings IECON '91. 1991 International Conference on Industrial Electronics, Control and Instrumentation (Cat. No.91CH2976\u20139), 1372\u20134 vol.2","DOI":"10.1109\/IECON.1991.239068"},{"key":"5276_CR68","doi-asserted-by":"crossref","unstructured":"O\u2019Reilly J, Khoche A, Wahl E, Parnas B (2010) \u201cSTIL P1450.4: A standard for test flow specification,\u201d Test Conference (ITC), 2010 IEEE International, pp. 1\u201310","DOI":"10.1109\/TEST.2010.5699254"},{"key":"5276_CR69","unstructured":"Panigrahi G, and Sewell RF (1981) \u201cA generalized test program generator\u201d, in Proceedings of the Eighth Semi-Annual Seminar\/Exhibit. Automated Testing for Electronics Manufacturing, 1\/33\u201347"},{"issue":"3","key":"5276_CR70","doi-asserted-by":"crossref","first-page":"321","DOI":"10.1007\/s10836-011-5227-6","volume":"27","author":"J Park","year":"2011","unstructured":"Park J, Shin H, Abraham J (2011) Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. J Electron Test 27(3):321\u2013334","journal-title":"J Electron Test"},{"key":"5276_CR71","unstructured":"Pascual JMG, and Brown M (2007) \u201cA case study: developing a complete test program using IEEE 1641\u201d, IEEE Autotestcon 2007 Systems Readiness Technology Conference, pp. 718\u201327"},{"key":"5276_CR72","first-page":"181","volume":"2008","author":"T Popolo","year":"2008","unstructured":"Popolo T, Plunske E, Kulla G (2008) Dramatically reduce TPS development costs over all ATE platforms while still achieving accurate test results. Proceedings IEEE Autotestcon 2008:181\u2013184","journal-title":"Proceedings IEEE Autotestcon"},{"key":"5276_CR73","unstructured":"Reinwardt G (2003) \u201cSiteseer Shorten yout time to market\u201d, Advantest, viewed February 2010, < http:\/\/www.advantest.de >"},{"key":"5276_CR74","doi-asserted-by":"crossref","unstructured":"Rivoir J (2008) \u201cWe Need Faster & Deeper Scan and More Realistic Tests,\u201d Test Conference, 2008. ITC 2008. IEEE International, pp. 1\u20132","DOI":"10.1109\/TEST.2008.4700669"},{"key":"5276_CR75","unstructured":"Sengupta S (2004) \u201cTest strategies for nanometer technologies\u201d in Proceedings International Test Conference 2004, pp. 1421"},{"key":"5276_CR76","doi-asserted-by":"crossref","unstructured":"Seongmoon W (2007) \u201cA BIST TPG for Low Power Dissipation and High Fault Coverage\u201d, in Transactions on Very Large Scale Integration (VLSI) Systems, 15(7): 777\u2013789, IEEE","DOI":"10.1109\/TVLSI.2007.899234"},{"key":"5276_CR77","unstructured":"ShiJie W, Morusupalli RR, and Hartranft M (2009) \u201cAddressing IC component Quality and Reliability assurance challenges\u201d, in IEEE International Reliability Physics Symposium, pp. 810\u2013813"},{"issue":"6","key":"5276_CR78","doi-asserted-by":"crossref","first-page":"366","DOI":"10.1049\/ip-cds:19960898","volume":"143","author":"M Soma","year":"1996","unstructured":"Soma M (1996) \u201cAutomatic test generation algorithms for analogue circuits\u201d, in IEEE Proceedings Circuits. Devices and Systems 143(6):366\u2013373","journal-title":"Devices and Systems"},{"key":"5276_CR79","doi-asserted-by":"crossref","unstructured":"Song YL (2003) \u201cFuture ATE: perspectives & requirements\u201d, in Proceedings International Test Conference 2003 (IEEE Cat. No.03CH37494), pp. 1300 Vol. 1","DOI":"10.1109\/TEST.2003.1271140"},{"issue":"1","key":"5276_CR80","doi-asserted-by":"crossref","first-page":"11","DOI":"10.1023\/B:JETT.0000009310.48706.b7","volume":"20","author":"SJ Spinks","year":"2004","unstructured":"Spinks SJ, Chalk CD, Bell IM, Zwolinski M (2004) Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. J Electron Test 20(1):11\u201323","journal-title":"J Electron Test"},{"key":"5276_CR81","unstructured":"STIL Status (2011) IEEE group 1450 web page, viewed November 2011, < http:\/\/grouper.ieee.org\/groups\/1450\/#status >"},{"key":"5276_CR82","doi-asserted-by":"crossref","unstructured":"Storey MA, Cheng LT, Singer J, Muller M, Myers D, and Ryall J (2007) \u201cHow programmers can turn comments into waypoints for code navigation\u201d, in 2007 IEEE International Conference on Software Maintenance, pp. 265\u201374","DOI":"10.1109\/ICSM.2007.4362639"},{"key":"5276_CR83","unstructured":"Syed I, and Rose N (1982) \u201cAutomated generation of device test software\u201d, in Digest of Papers 1982 International Test Conference, pp. 514\u201321"},{"key":"5276_CR84","unstructured":"Teradyne (2010) \u201cAbout Teradyne\u2014A brief History\u201d, viewed December 2010, < http:\/\/www.teradyne.com\/corp\/history.html >"},{"key":"5276_CR85","unstructured":"Teradyne (2011) company products web page, viewed February 2011, < http:\/\/www.teradyne.com\/prods\/prodserv.html >"},{"key":"5276_CR86","unstructured":"Teradyne IG-XL software (2010) TUG Teradyne User Group, viewed May 2010, < http:\/\/www.teradyne.com\/flex\/software >"},{"key":"5276_CR87","unstructured":"Testinsight (2011) Testinsight web page, viewed November 2011, < http:\/\/www.testinsight.com\/ >"},{"key":"5276_CR88","doi-asserted-by":"crossref","unstructured":"Thrailkill M, and Leekhool L (1997) \u201cImplementing a Test Foundation Framework in LabVIEW\u201d, in 1997 IEEE Autotestcon Proceedings. AUTOTESTCON '97, IEEE Systems Readiness Technology Conference, Systems Readiness Supporting Global Needs and Awareness in the 21st Century (Cat. No.97CH36120), pp. 190\u20133","DOI":"10.1109\/AUTEST.1997.633608"},{"key":"5276_CR89","unstructured":"tttc (2010) The free software foundation within the Technical Activity Committee, Test Technology Technical Council, IEEE tttc, < http:\/\/tab.computer.org\/tttc\/ , Event info 2010>"},{"issue":"10","key":"5276_CR90","doi-asserted-by":"crossref","first-page":"1189","DOI":"10.1109\/43.875320","volume":"19","author":"PN Variyam","year":"2000","unstructured":"Variyam PN, Chatterjee A (2000) Specification-Driven Test Generation for Analog Circuits. IEEE Transactions CAD 19(10):1189\u20131201","journal-title":"IEEE Transactions CAD"},{"key":"5276_CR91","unstructured":"Vock S, Escalona O, and Owens F (2010) \u201cCommercial Challenges and Quality Robustness Issue in Semiconductor Manufacture Test and Measurement\u201d, in Proceedings 27th International Manufacturing Conference, Paper P3"},{"key":"5276_CR92","doi-asserted-by":"crossref","unstructured":"Vock, S, Schmid, M & von Staudt, HM 2006, \u201cTest Software Generation Productivity and Code Quality Improvement by applying Software Engineering Techniques\u201d, in Proceedings International Test Conference 2006, Paper 1.4","DOI":"10.1109\/TEST.2006.297652"},{"key":"5276_CR93","doi-asserted-by":"crossref","unstructured":"von Tils V (2008) \u201cZero Defects\u2014Reliability for Automotive Electronics\u201d, International Interconnect Technology Conference, pp.1\u20133","DOI":"10.1109\/IITC.2008.4546908"},{"key":"5276_CR94","doi-asserted-by":"crossref","unstructured":"Washizaki H, Namiki R, Fukuoka T, Harada Y, and Watanabe H (2007) \u201cA framework for measuring and evaluating program source code quality\u201d, Product-Focused Software Process Improvements. Proceedings 8th International Conference, PROFES 2007, pp. 284\u201399","DOI":"10.1007\/978-3-540-73460-4_26"},{"key":"5276_CR95","unstructured":"Webster B, and Kramer R (1992) \u201cBoosting quality in mixed-signal test programs\u201d, in Evaluation Engineering, 31(5): 156, 158, 160\u20133"},{"key":"5276_CR96","unstructured":"Webster B, and Kramer R (1993) \u201cHigher quality for mixed signal test software\u201d, in Elektronik 42(3): 48\u20139, 54\u20136"},{"key":"5276_CR97","doi-asserted-by":"crossref","unstructured":"Wheater D (2003) \u201cATE-customer perspective & requirements panel\u201d, in Proceedings. International Test Conference 2003 (IEEE Cat. No.03CH37494), p 1298 Vol.1","DOI":"10.1109\/TEST.2003.1271138"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5276-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-011-5276-x\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-011-5276-x","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T08:36:42Z","timestamp":1742373402000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-011-5276-x"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,1,26]]},"references-count":97,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2012,6]]}},"alternative-id":["5276"],"URL":"https:\/\/doi.org\/10.1007\/s10836-011-5276-x","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,1,26]]}}}