{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T10:23:30Z","timestamp":1762251810307},"reference-count":32,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2012,2,14]],"date-time":"2012-02-14T00:00:00Z","timestamp":1329177600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2012,4]]},"DOI":"10.1007\/s10836-012-5286-3","type":"journal-article","created":{"date-parts":[[2012,2,13]],"date-time":"2012-02-13T02:12:35Z","timestamp":1329099155000},"page":"177-187","source":"Crossref","is-referenced-by-count":7,"title":["Diagnostic Test Set Minimization and Full-Response Fault Dictionary"],"prefix":"10.1007","volume":"28","author":[{"given":"Mohammed Ashfaq","family":"Shukoor","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vishwani D.","family":"Agrawal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2012,2,14]]},"reference":[{"issue":"6","key":"5286_CR1","doi-asserted-by":"crossref","first-page":"451","DOI":"10.1109\/TC.1980.1675604","volume":"C-29","author":"M Abramovici","year":"1980","unstructured":"Abramovici M, Breuer MA (1980) Multiple fault diagnosis in combinational circuits based on an effect-cause analysis. IEEE Trans Comput C-29(6):451\u2013460","journal-title":"IEEE Trans Comput"},{"key":"5286_CR2","doi-asserted-by":"crossref","unstructured":"Agrawal VD, Baik DH, Kim YC, Saluja KK (2003) Exclusive test and its applications to fault diagnosis. In: Proc. 16th international conf. VLSI design, pp 143\u2013148","DOI":"10.1109\/ICVD.2003.1183128"},{"issue":"1","key":"5286_CR3","first-page":"110","volume":"46","author":"RC Aitken","year":"1995","unstructured":"Aitken RC, Maxwell PC (1995) Better models or better algorithms? On techniques to improve fault diagnosis. Hewlett-Packard J 46(1):110\u2013116","journal-title":"Hewlett-Packard J"},{"key":"5286_CR4","unstructured":"Akers SB, Joseph C, Krishnamurthy B (1987) On the role of independent fault sets in the generation of minimal test sets. In: Proc. international test conf., pp 1100\u20131107"},{"key":"5286_CR5","unstructured":"Boppana V, Fuchs WK (1994) Fault dictionary compression by output sequence removal. In: Proc. international conf. computer-aided design, pp 576\u2013579"},{"key":"5286_CR6","doi-asserted-by":"crossref","unstructured":"Boppana V, Hartanto I, Fuchs WK (1996) Full fault dictionary storage based on labeled tree encoding. In: Proc. 14th IEEE VLSI test symp., pp 174\u2013179","DOI":"10.1109\/VTEST.1996.510854"},{"key":"5286_CR7","volume-title":"Essentials of electronic testing for digital, memory & mixed-signal VLSI circuits","author":"ML Bushnell","year":"2000","unstructured":"Bushnell ML, Agrawal VD (2000) Essentials of electronic testing for digital, memory & mixed-signal VLSI circuits. Springer, Boston"},{"key":"5286_CR8","unstructured":"Chess B (1995) Diagnostic test pattern generation and the creation of small fault dictionaries. Master\u2019s thesis, University of California, Santa Cruz, Computer Engineering"},{"issue":"3","key":"5286_CR9","doi-asserted-by":"crossref","first-page":"346","DOI":"10.1109\/43.748164","volume":"18","author":"B Chess","year":"1999","unstructured":"Chess B, Larrabee T (1999) Creating small fault dictionaries. IEEE Trans Comput-Aided Des 18(3):346\u2013356","journal-title":"IEEE Trans Comput-Aided Des"},{"key":"5286_CR10","doi-asserted-by":"crossref","unstructured":"Drineas P, Makris Y (2003) Test sequence compaction through integer programming. In: Proc. international conf. computer design, pp\u00a0380\u2013386","DOI":"10.1109\/ICCD.2003.1240924"},{"issue":"4","key":"5286_CR11","doi-asserted-by":"crossref","first-page":"629","DOI":"10.1145\/502175.502186","volume":"6","author":"PF Flores","year":"2001","unstructured":"Flores PF, Neto HC, Marques\u00a0Silva JP (2001) An exact solution to the minimum size test pattern problem. ACM Transact Des Automat Electron Syst 6(4):629\u2013644","journal-title":"ACM Transact Des Automat Electron Syst"},{"key":"5286_CR12","unstructured":"Fourer R, Gay DM, Kernighan BW (2003) AMPL: a mathematical programming language. Brooks\/Cole-Thomson Learning"},{"key":"5286_CR13","unstructured":"Higami Y, Saluja KK, Takahashi H, Kobayashi S, Takamatsu Y (2006) Compaction of pass\/fail-based diagnostic test vectors for combinational and sequential circuits. In: Proc. asia and south pacific design automation conf., pp 75\u201380"},{"key":"5286_CR14","unstructured":"Kantipudi KR, Agrawal VD (2006) On the size and generation of minimal N-detection tests. In: Proc. 19th int. conf. VLSI design, pp 425\u2013430"},{"key":"5286_CR15","unstructured":"Kantipudi KR, Agrawal VD (2007) A reduced complexity algorithm for minimizing N-detect tests. In: Proc.\u00a020th int. conf. VLSI design, pp 492\u2013497"},{"issue":"3","key":"5286_CR16","doi-asserted-by":"crossref","first-page":"255","DOI":"10.1109\/43.700723","volume":"17","author":"D Lavo","year":"1998","unstructured":"Lavo D, Chess B, Larrabee T, Ferguson FJ (1998) Diagnosing realistic bridging faults with single stuck-at information. IEEE Trans Comput-Aided Des 17(3):255\u2013268","journal-title":"IEEE Trans Comput-Aided Des"},{"key":"5286_CR17","doi-asserted-by":"crossref","unstructured":"Lavo D, Larrabee T (2001) Making cause-effect cost effective: low-resolution fault dictionaries. In: Proc. international test conf., pp\u00a0278\u2013286","DOI":"10.1109\/TEST.2001.966643"},{"key":"5286_CR18","unstructured":"Lee HK, Ha DS (1993) On the generation of test patterns for combinational circuits. Tech. Report 12-93, Dept. of Elec. Eng., Virginia Polytechnic Institute and State University, Blacksburg, Virginia"},{"issue":"9","key":"5286_CR19","doi-asserted-by":"crossref","first-page":"1048","DOI":"10.1109\/43.536711","volume":"15","author":"HK Lee","year":"1996","unstructured":"Lee HK, Ha DS (1996) HOPE: an effcient parallel fault simulator for synchronous sequential circuits. IEEE Trans Comput-Aided Des 15(9):1048\u20131058","journal-title":"IEEE Trans Comput-Aided Des"},{"key":"5286_CR20","unstructured":"Lin Y-C, Cheng K-T (2006) Multiple-fault diagnosis based on single-fault activation and single-output observation. In: Proc. design, automation and test in Europe (DATE), pp 424\u2013429"},{"key":"5286_CR21","doi-asserted-by":"crossref","unstructured":"Pomeranz I, Reddy SM (1992) On the generation of small dictionaries for fault location. In: Proc. international conf. computer-aided design, pp 272\u2013278","DOI":"10.1109\/ICCAD.1992.279361"},{"key":"5286_CR22","unstructured":"Shukoor MA (2009) Fault detection and diagnostic test set minimization. Master\u2019s thesis, Auburn University, ECE Department"},{"key":"5286_CR23","unstructured":"Shukoor MA, Agrawal VD (2008) A primal-dual solution to the minimal test generation problem. In: Proc. 12th VLSI design and test symp., pp 169\u2013179"},{"key":"5286_CR24","unstructured":"Shukoor MA, Agrawal VD (2009) A two phase approach for minimal diagnostic test set generation. In: Proc. 14th IEEE European test symp., pp\u00a0115\u2013120"},{"key":"5286_CR25","unstructured":"Shukoor MA, Agrawal VD (2009) Compaction of diagnostic test set for a full-response dictionary. In: Proc. 18th IEEE north atlantic test workshop, pp 104\u2013111"},{"key":"5286_CR26","volume-title":"Linear algebra and its applications","author":"G Strang","year":"1988","unstructured":"Strang G (1988) Linear algebra and its applications, 3rd\u00a0edn. Harcourt Brace Javanovich College Publishers, Fort Worth","edition":"3"},{"key":"5286_CR27","doi-asserted-by":"crossref","unstructured":"Veneris A, Chang R, Abadir MS, Amiri M (2004) Fault equivalence and diagnostic test generation using ATPG. In: Proc. international symp. circuits and systems, pp 221\u2013224","DOI":"10.1109\/ISCAS.2004.1329502"},{"key":"5286_CR28","doi-asserted-by":"crossref","unstructured":"Venkataraman S, Hartanto I, Fuchs WK (1996) Dynamic diagnosis of sequential circuits. In: Proc. 14th IEEE VLSI test symp., pp\u00a0198\u2013203","DOI":"10.1109\/VTEST.1996.510858"},{"key":"5286_CR29","doi-asserted-by":"crossref","unstructured":"Yogi N, Agrawal VD (2008) N-model tests for VLSI circuits. In: Proc. 40th southeastern symp. system theory, pp 242\u2013246","DOI":"10.1109\/SSST.2008.4480230"},{"key":"5286_CR30","doi-asserted-by":"crossref","unstructured":"Zhang Y, Agrawal VD (2010) A diagnostic test generation system. In: Proc. international test conf. Paper\u00a012.3","DOI":"10.1109\/TEST.2010.5699237"},{"key":"5286_CR31","doi-asserted-by":"crossref","unstructured":"Zhang Y, Agrawal VD (2011) Reduced complexity test generation algorithms for transition fault diagnosis. In: Proc. 29th conf. computer design, pp 96\u2013101","DOI":"10.1109\/ICCD.2011.6081382"},{"key":"5286_CR32","unstructured":"Zhao L, Agrawal VD (2012) Net diagnosis using stuck-at and transition fault models. In: Proc. 30th IEEE VLSI test symp."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-012-5286-3.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-012-5286-3\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-012-5286-3","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,23]],"date-time":"2019-06-23T16:05:30Z","timestamp":1561305930000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-012-5286-3"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,2,14]]},"references-count":32,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2012,4]]}},"alternative-id":["5286"],"URL":"https:\/\/doi.org\/10.1007\/s10836-012-5286-3","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,2,14]]}}}