{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:56:24Z","timestamp":1747810584873},"reference-count":14,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2012,4,1]],"date-time":"2012-04-01T00:00:00Z","timestamp":1333238400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2012,10]]},"DOI":"10.1007\/s10836-012-5293-4","type":"journal-article","created":{"date-parts":[[2012,3,31]],"date-time":"2012-03-31T05:20:45Z","timestamp":1333171245000},"page":"641-651","source":"Crossref","is-referenced-by-count":21,"title":["Low-Distortion Sinewave Generation Method Using Arbitrary Waveform Generator"],"prefix":"10.1007","volume":"28","author":[{"given":"Kazuyuki","family":"Wakabayashi","sequence":"first","affiliation":[]},{"given":"Keisuke","family":"Kato","sequence":"additional","affiliation":[]},{"given":"Takafumi","family":"Yamada","sequence":"additional","affiliation":[]},{"given":"Osamu","family":"Kobayashi","sequence":"additional","affiliation":[]},{"given":"Haruo","family":"Kobayashi","sequence":"additional","affiliation":[]},{"given":"Fumitaka","family":"Abe","sequence":"additional","affiliation":[]},{"given":"Kiichi","family":"Niitsu","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2012,4,1]]},"reference":[{"key":"5293_CR1","unstructured":"Arabi K (2010) Mixed-signal test impact to SoC commercialization. In: IEEE VLSI test symposium"},{"key":"5293_CR2","unstructured":"Burns M, Roberts GW (2000) An introduction in mixed-signal IC test and measurement. Oxford Univ Press"},{"key":"5293_CR3","doi-asserted-by":"crossref","unstructured":"Cheng K-T, Chang H-M (2010) Recent advances in analog, mixed-signal and RF testing. IPSJ trans on system LSI design methodology, vol 3, pp 19\u201346","DOI":"10.2197\/ipsjtsldm.3.19"},{"key":"5293_CR4","unstructured":"Cripps SC (1999) RF power amplifier for wireless communications. Artec House, pp 263\u2013267"},{"key":"5293_CR5","unstructured":"Cripps SC (2002) Advanced techniques in RF power amplifier design. Artec House, pp 153\u2013195"},{"issue":"3","key":"5293_CR6","doi-asserted-by":"crossref","first-page":"261","DOI":"10.1109\/81.915383","volume":"48","author":"N Kurosawa","year":"2001","unstructured":"Kurosawa N, Kobayashi H, Maruyama K, Sugawara H, Kobayashi K (2001) Explicit analysis of channel mismatch effects in time-interleaved ADC systems. IEEE Trans Circuits Syst I 48(3):261\u2013271","journal-title":"IEEE Trans Circuits Syst I"},{"key":"5293_CR7","doi-asserted-by":"crossref","unstructured":"Maeda A (2008) A method to generate a very low distortion, high frequency sine waveform using an AWG. In: IEEE international test conference, Santa Clara, CA","DOI":"10.1109\/TEST.2008.4700607"},{"key":"5293_CR8","unstructured":"Maloberti F (2007) Data converters. Springer"},{"key":"5293_CR9","series-title":"Chapters 1, 4 and 6","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-3768-4","volume-title":"CMOS integrated analog-to-digital and digital-to-analog converters","author":"R Plassche","year":"2003","unstructured":"Plassche R (2003) CMOS integrated analog-to-digital and digital-to-analog converters, 2nd edn, Chapters 1, 4 and 6. Kluwer Academic Publishers, Boston","edition":"2"},{"key":"5293_CR10","doi-asserted-by":"crossref","unstructured":"Shrestha R, Mensink E, Klumperink EAM, Wienk GJM, Nauta B (2006) A multi-path technique canceling harmonics and sidebands in a wideband power upconverter. In: Tech digest of IEEE international solid-state circuits conference, San Francisco","DOI":"10.1109\/ISSCC.2006.1696237"},{"key":"5293_CR11","doi-asserted-by":"crossref","unstructured":"Uemori S, Yamaguchi TJ, Ito S, Tan Y, Kobayashi H, Takai N, Niitsu K, Ishikawa N (2010) ADC linearity test signal generation algorithm. In: IEEE Asia Pacific conference on circuits and systems, Kuala Lumpur","DOI":"10.1109\/APCCAS.2010.5774755"},{"key":"5293_CR12","doi-asserted-by":"crossref","unstructured":"Wakabayashi K, Yamada T, Uemori S, Kobayashi O, Kato K, Kobayashi H, Niitsu K, Miyashita H, Kishigami S, Rikino K, Yano Y, Gake T (2011) Low-distortion single-tone and two-tone sinewave generation algorithms using an arbitrary waveform generator. In: IEEE international mixed-signals, sensors and systems test workshop, Santa Barbara, CA","DOI":"10.1109\/IMS3TW.2011.17"},{"issue":"6","key":"5293_CR13","doi-asserted-by":"crossref","first-page":"651","DOI":"10.1002\/tee.20588","volume":"5","author":"T Yagi","year":"2010","unstructured":"Yagi T, Kobayashi H, Tan Y, Ito S, Uemori S, Takai N, Yamaguchi TJ (2010) Production test consideration for mixed-signal IC with background calibration. IEEJ Trans on Electrical and Electronic Eng 5(6):651\u2013659","journal-title":"IEEJ Trans on Electrical and Electronic Eng"},{"key":"5293_CR14","doi-asserted-by":"crossref","unstructured":"Yamada T, Kobayashi O, Kato K, Wakabayashi K, Kobayashi H, Matsuura T, Yano Y, Gake T, Niitsu K, Takai N, Yamaguchi TJ (2011) Low-distortion single-tone and two-tone sinewave generation using \u03a3\u0394 DAC. In: IEEE international test conference (poster session), Anaheim, CA","DOI":"10.1109\/IMS3TW.2011.17"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-012-5293-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-012-5293-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-012-5293-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,26]],"date-time":"2019-06-26T10:53:00Z","timestamp":1561546380000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-012-5293-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,4,1]]},"references-count":14,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2012,10]]}},"alternative-id":["5293"],"URL":"https:\/\/doi.org\/10.1007\/s10836-012-5293-4","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,4,1]]}}}