{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,30]],"date-time":"2025-11-30T08:46:41Z","timestamp":1764492401569},"reference-count":24,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2012,5,8]],"date-time":"2012-05-08T00:00:00Z","timestamp":1336435200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2012,10]]},"DOI":"10.1007\/s10836-012-5301-8","type":"journal-article","created":{"date-parts":[[2012,5,7]],"date-time":"2012-05-07T04:18:03Z","timestamp":1336364283000},"page":"745-755","source":"Crossref","is-referenced-by-count":21,"title":["Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on LS-SVM"],"prefix":"10.1007","volume":"28","author":[{"given":"Bing","family":"Long","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shulin","family":"Tian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Houjun","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2012,5,8]]},"reference":[{"key":"5301_CR1","first-page":"471","volume":"17","author":"M Aminian","year":"2001","unstructured":"Aminian M, Aminian F (2001) Fault diagnosis of nonlinear circuits using Neural Networks with wavelet and Fourier transforms as preprocessors. JETTA 17:471\u2013481","journal-title":"JETTA"},{"issue":"5","key":"5301_CR2","doi-asserted-by":"crossref","first-page":"1546","DOI":"10.1109\/TIM.2007.904549","volume":"56","author":"M Aminian","year":"2007","unstructured":"Aminian M, Aminian F (2007) A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Trans Instru Meas 56(5):1546\u20131554","journal-title":"IEEE Trans Instru Meas"},{"issue":"8","key":"5301_CR3","doi-asserted-by":"crossref","first-page":"1279","DOI":"10.1109\/PROC.1985.13281","volume":"73","author":"JW Bandler","year":"1985","unstructured":"Bandler JW, Salama AE (1985) Fault diagnosis of analog circuits. Proc IEEE 73(8):1279\u20131325","journal-title":"Proc IEEE"},{"key":"5301_CR4","unstructured":"Chen C, Brown D, Sconyers C, et al (2010) A .NET framework for an integrated fault diagnosis and failure prognosis architecture. IEEE Autotestcon, Orlando, FL, Sept. 13\u201316, 2010: 1\u20136"},{"issue":"9","key":"5301_CR5","doi-asserted-by":"crossref","first-page":"4353","DOI":"10.1109\/TIE.2010.2098369","volume":"58","author":"C Chen","year":"2011","unstructured":"Chen C, Zhang B, Vachtsevanos G, Orchard M (2011) Machine condition prediction based on adaptive neuro-fuzzy and high-order particle filtering. IEEE Trans Ind Electron 58(9):4353\u20134364","journal-title":"IEEE Trans Ind Electron"},{"key":"5301_CR6","doi-asserted-by":"crossref","unstructured":"Cui J, Wang YR (2011) A novel approach of analog circuit fault diagnosis using support vector machines classifier. Measurement 44\u2013289","DOI":"10.1016\/j.measurement.2010.10.004"},{"issue":"2","key":"5301_CR7","doi-asserted-by":"crossref","first-page":"415","DOI":"10.1109\/72.991427","volume":"13","author":"CW Hsu","year":"2002","unstructured":"Hsu CW, Lin CJ (2002) A comparison of methods for multi-class support vector machines. IEEE Trans Neural Network 13(2):415\u2013425","journal-title":"IEEE Trans Neural Network"},{"issue":"6","key":"5301_CR8","doi-asserted-by":"crossref","first-page":"1018","DOI":"10.1016\/j.measurement.2011.02.017","volume":"44","author":"J Huang","year":"2011","unstructured":"Huang J, Hu XG, Yang F (2011) Support vector machine with genetic algorithm for machinery fault diagnosis of high voltage circuit breaker. Measurement 44(6):1018\u20131027","journal-title":"Measurement"},{"issue":"8","key":"5301_CR9","doi-asserted-by":"crossref","first-page":"2055","DOI":"10.1109\/TIM.2009.2032884","volume":"59","author":"S Kumar","year":"2010","unstructured":"Kumar S, Chow TWS, Pecht M (2010) Approach to fault identification for electronic products using Mahalanobis distance. IEEE Trans Instru Meas 59(8):2055\u20132064","journal-title":"IEEE Trans Instru Meas"},{"key":"5301_CR10","unstructured":"Liu YH, Yang YY, Huang L (2009) Fault diagnosis of analog circuit based on support vector machines. Proceedings of ICCTA2009:40\u201343"},{"key":"5301_CR11","doi-asserted-by":"crossref","unstructured":"Long B, Tian SL, Miao Q, Pecht M (2011) Research on features for diagnostics of filtered analog circuits based on LS-SVM. Autotestcon 2011. Baltimore, MD, Step.12-15, 2011","DOI":"10.1109\/AUTEST.2011.6058746"},{"key":"5301_CR12","unstructured":"Long B, Tian SL, Wang HJ (2008) Least squares support vector machine based analog circuit fault diagnosis using wavelet transform as preprocessor. ICCCAS. doi: 10.1109\/ICCCAS. 2008.4657943"},{"key":"5301_CR13","doi-asserted-by":"crossref","unstructured":"Long B, Tian SL, Wang HJ (2011) Diagnostics of filtered analog circuits with tolerance based on LS-SVM using frequency features. J Electron Test. doi: 10.1007\/s10836-011-5275-y","DOI":"10.1007\/s10836-011-5275-y"},{"key":"5301_CR14","unstructured":"Long B, Tian SL, Wang HJ (2011) Diagnostics of analog circuits based on LS-SVM using time-domain features. Submitted to Measurement"},{"key":"5301_CR15","first-page":"49","volume":"2","author":"PC Mahalanobis","year":"1936","unstructured":"Mahalanobis PC (1936) On the generalised distance in statistics. Proc Natl Inst Sci India 2:49\u201355","journal-title":"Proc Natl Inst Sci India"},{"key":"5301_CR16","volume-title":"Fault diagnosis of analog intekgrated circuits","author":"K Prithviraj","year":"2005","unstructured":"Prithviraj K (2005) Fault diagnosis of analog intekgrated circuits. Springer, Netherlands"},{"issue":"6","key":"5301_CR17","doi-asserted-by":"crossref","first-page":"2025","DOI":"10.1109\/TIM.2011.2115550","volume":"60","author":"AD Spyronasios","year":"2011","unstructured":"Spyronasios AD, Dimopoulos MG, Hatzopoulos AA (2011) Wavelet analysis for the detection of parametric and catastrophic faults in mixed-signal circuits. IEEE Trans Instru Meas 60(6):2025\u20132038","journal-title":"IEEE Trans Instru Meas"},{"key":"5301_CR18","doi-asserted-by":"crossref","DOI":"10.1142\/5089","volume-title":"Least squares support vector machines","author":"JAK Suykens","year":"2002","unstructured":"Suykens JAK, Gestel TV, Brabanter JD, Moor BD, Vandewalle J (2002) Least squares support vector machines. World Scientific, Singapore"},{"key":"5301_CR19","unstructured":"Vasan ASS, Long B, Pecht M (2011) Experimental validation of LS-SVM based fault identification in analog circuits using frequency features. The Sixth Annual World Congress on Engineering Asset Management, Cincinnati, OH, USA, October 2\u20135, 2011"},{"issue":"1","key":"5301_CR20","doi-asserted-by":"crossref","first-page":"59","DOI":"10.1109\/TSM.2010.2065531","volume":"24","author":"G Verdier","year":"2011","unstructured":"Verdier G, Ferreira A (2011) Adaptive Mahalanobis distance and k-nearest neighbor rule for fault detection in semiconductor manufacturing. IEEE Trans Semicond Manuf 24(1):59\u201368","journal-title":"IEEE Trans Semicond Manuf"},{"issue":"1","key":"5301_CR21","doi-asserted-by":"crossref","first-page":"176","DOI":"10.1109\/TIM.2010.2050356","volume":"60","author":"CL Yang","year":"2011","unstructured":"Yang CL, Tian SL, Long B (2011) Methods of handling the tolerance and test-point selection problem for analog circuit fault diagnosis. IEEE Trans Instru Meas 60(1):176\u2013185","journal-title":"IEEE Trans Instru Meas"},{"issue":"3","key":"5301_CR22","doi-asserted-by":"crossref","first-page":"586","DOI":"10.1109\/TIM.2009.2025068","volume":"59","author":"LY Yuan","year":"2010","unstructured":"Yuan LY, He YG, Huang JY, Sun YC (2010) A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor. IEEE Trans Instru Meas 59(3):586\u2013595","journal-title":"IEEE Trans Instru Meas"},{"issue":"4","key":"5301_CR23","doi-asserted-by":"crossref","first-page":"371","DOI":"10.1016\/j.measurement.2007.02.007","volume":"41","author":"Y Zhang","year":"2008","unstructured":"Zhang Y, Wei XY, Jiang HF (2008) One-class classifier based on SBT for analog circuit fault diagnosis. Measurement 41(4):371\u2013380","journal-title":"Measurement"},{"key":"5301_CR24","unstructured":"Zuo L, Hou LG, Zhang W, Wu WC (2010) Applying wavelet support vector machine to analog circuit fault diagnosis. 2010 Second International Workshop on Education Technology and Computer Science:75\u201378"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-012-5301-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-012-5301-8\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-012-5301-8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,28]],"date-time":"2019-06-28T09:17:00Z","timestamp":1561713420000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-012-5301-8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,5,8]]},"references-count":24,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2012,10]]}},"alternative-id":["5301"],"URL":"https:\/\/doi.org\/10.1007\/s10836-012-5301-8","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,5,8]]}}}