{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,5]],"date-time":"2022-04-05T16:55:41Z","timestamp":1649177741261},"reference-count":6,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2012,8,12]],"date-time":"2012-08-12T00:00:00Z","timestamp":1344729600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2012,10]]},"DOI":"10.1007\/s10836-012-5323-2","type":"journal-article","created":{"date-parts":[[2012,8,11]],"date-time":"2012-08-11T08:48:48Z","timestamp":1344674928000},"page":"723-731","source":"Crossref","is-referenced-by-count":0,"title":["Maximizing Parallel Testing in an FM Receiver"],"prefix":"10.1007","volume":"28","author":[{"given":"Mozar","family":"Naing","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dallas","family":"Webster","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nolan","family":"Blue","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rick","family":"Hudgens","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zahir","family":"Parkar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sumeer","family":"Bhatara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pankaj","family":"Gupta","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Donald Y. C.","family":"Lie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2012,8,12]]},"reference":[{"key":"5323_CR1","first-page":"1563","volume":"3","author":"S Jannesari","year":"1999","unstructured":"Jannesari S (1999) 1999 HP94000 multi-site mixed signal test development considerations. IEEE Instrum Meas Tech Conf 3:1563\u20131568. doi: 10.1109\/IMTC.1999.776088","journal-title":"IEEE Instrum Meas Tech Conf."},{"key":"5323_CR2","doi-asserted-by":"crossref","unstructured":"Lau WY (2002) Measurement challenges for on-wafer RF SoC. IEEE Electron Manuf Tech Symp. 353-359, doi: 10.1109\/IEMT.2002.1032778","DOI":"10.1109\/IEMT.2002.1032778"},{"issue":"3","key":"5323_CR3","doi-asserted-by":"crossref","first-page":"253","DOI":"10.1007\/s10836-011-5215-x","volume":"27","author":"D Mannath","year":"2010","unstructured":"Mannath D, Cohen D, Montano-Martinez V, Hudgens R, de-Obaldia E, Kush S, Ang SS (2010) Methodology to replace Sensitivity BER and transmit power production tests in bluetooth devices with BiSTs. J Electron Test Theory Appl 27(3):253\u2013266. doi: 10.1007\/s10836-011-5215-x","journal-title":"J Electron Test Theory Appl"},{"key":"5323_CR4","doi-asserted-by":"crossref","unstructured":"Mannath D, Montano-Martinez V, Syllaios I, Bhatara S, Attaluri M, Parkar Z, Ang SS (2010) A reduced-cost built-in self test for an FM receiver. IEEE Dallas Circuits Syst. doi: 10.1109\/DCAS.2010.5955036","DOI":"10.1109\/DCAS.2010.5955036"},{"key":"5323_CR5","doi-asserted-by":"crossref","unstructured":"Webster D, Hudgens R, Lie DYC (2011) Replacing production error vector magnitude testing with RF\/Analog BiSTs. IEEE Des Test Comput (99): doi: 10.1109\/MDT.2011.1","DOI":"10.1109\/MDT.2011.1"},{"key":"5323_CR6","doi-asserted-by":"crossref","unstructured":"Zhang L, Heaton D, Largey H (2005) Low cost multisite testing of quadruple band GSM transceivers. 2005 IEEE Int Test Conf. doi: 10.1109\/TEST.2005.1583999","DOI":"10.1109\/TEST.2005.1583999"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-012-5323-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-012-5323-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-012-5323-2","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T22:04:43Z","timestamp":1559253883000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-012-5323-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,8,12]]},"references-count":6,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2012,10]]}},"alternative-id":["5323"],"URL":"https:\/\/doi.org\/10.1007\/s10836-012-5323-2","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,8,12]]}}}