{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T00:28:52Z","timestamp":1761611332060},"reference-count":35,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2013,7,24]],"date-time":"2013-07-24T00:00:00Z","timestamp":1374624000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2013,8]]},"DOI":"10.1007\/s10836-013-5393-9","type":"journal-article","created":{"date-parts":[[2013,7,23]],"date-time":"2013-07-23T04:45:11Z","timestamp":1374554711000},"page":"457-471","source":"Crossref","is-referenced-by-count":12,"title":["A Library-Based Early Soft Error Sensitivity Analysis Technique for SRAM-Based FPGA Design"],"prefix":"10.1007","volume":"29","author":[{"given":"C.","family":"Thibeault","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Hariri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. R.","family":"Hasan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Hobeika","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Savaria","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Audet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F. Z.","family":"Tazi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2013,7,24]]},"reference":[{"key":"5393_CR1","unstructured":"Aigner G et al (2010) The SUIF program representation. Computer Systems Laboratory of Stanford University, ( http:\/\/crsuif.stanford.edu\/suif\/suif2 )"},{"key":"5393_CR2","doi-asserted-by":"crossref","unstructured":"Alderighi M, D\u2019Angelo S, Mancini M, Sechi GR (2003) A fault injection tool for SRAM-based FPGAs. In: Proc. 9th IEEE On-Line Testing Symposium, pp 129\u2013133","DOI":"10.1109\/OLT.2003.1214379"},{"key":"5393_CR3","unstructured":"Allen G, Swift G, Carmichael C. \u201cVirtex-4QV static SEU characterization summary,\u201d NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance, Document number NASA WBS: 939904.01.11.30, JPL Project Number: 102197, Task Number: 3.18.4, Last revision September, 2008 (can be found at http:\/\/parts.jpl.nasa.gov\/resources.htm )"},{"key":"5393_CR4","doi-asserted-by":"crossref","unstructured":"Asadi G, Tahoori MB (2005) An accurate SER estimation method based on propagation probability. In the Proceedings of Design Automation and Test in Europe Conference, DATE\u201905, pp 306\u2013307","DOI":"10.1109\/DATE.2005.49"},{"issue":"12","key":"5393_CR5","doi-asserted-by":"crossref","first-page":"1320","DOI":"10.1109\/TVLSI.2007.909795","volume":"15","author":"G Asadi","year":"2007","unstructured":"Asadi G, Tahoori MB (2007) Analytical techniques for soft error rate modeling and mitigation of FGPA-based designs. IEEE Trans Very Large Scale Integr Circ (VLSI) Syst 15(12):1320\u20131331","journal-title":"IEEE Trans Very Large Scale Integr Circ (VLSI) Syst"},{"key":"5393_CR6","doi-asserted-by":"crossref","unstructured":"Asadi H, Tahoori MB, Mullins B, Kaeli D, Granlund K (2007) Soft error susceptibility analysis of SRAM-based FPGAs in high-performance information systems. IEEE Trans Nucl Sci 54(6):2714\u20132726","DOI":"10.1109\/TNS.2007.910426"},{"key":"5393_CR7","doi-asserted-by":"crossref","unstructured":"Baumann R (2002) The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction. International Electronic Devices Meeting (IEDM) Tech. Dig., San Francisco, CA, pp 329\u2013332","DOI":"10.1109\/IEDM.2002.1175845"},{"issue":"3","key":"5393_CR8","doi-asserted-by":"crossref","first-page":"305","DOI":"10.1109\/TDMR.2005.853449","volume":"5","author":"RC Baumann","year":"2005","unstructured":"Baumann RC (2005) Radiation-induced soft errors in advanced semiconductor technologies. IEEE Trans Device Mater Reliab 5(3):305\u2013316","journal-title":"IEEE Trans Device Mater Reliab"},{"key":"5393_CR9","doi-asserted-by":"crossref","unstructured":"Bernardeschi C, Cassano L, Domenici A, Sterpone L (2012) Accurate simulation of SEUs in the configuration memory of SRAM-based FPGAs. In International IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), pp 115\u2013120","DOI":"10.1109\/DFT.2012.6378210"},{"key":"5393_CR10","doi-asserted-by":"crossref","unstructured":"Bernardi P, Reorda MS, Sterpone L, Violante M (2004) On the evaluation of SEU\u2019s sensitiveness in SRAM-based FPGAs. In: Proc. 10th IEEE On-line Testing Symposium, pp 115\u2013120","DOI":"10.1109\/OLT.2004.1319668"},{"key":"5393_CR11","unstructured":"Chapman K (2010) SEU strategies for Virtex-5 devices. Xilinx Application Note on Virtex-5, XAPP 864 (v2.0) ( http:\/\/www.xilinx.com\/support\/documentation\/application_notes\/xapp864.pdf )"},{"key":"5393_CR12","unstructured":"Hariri Y, Thibeault C, Tremblay J-P, Morrissey D, Savaria Y, Gagnon F, Boland JF. Early performance and resources estimation of high-level modeled applications running on unconventional multiprocessor ICs. Submitted to the EURASIP Journal on Embedded Systems"},{"issue":"6","key":"5393_CR13","doi-asserted-by":"crossref","first-page":"2586","DOI":"10.1109\/23.903813","volume":"47","author":"P Hazucha","year":"2000","unstructured":"Hazucha P, Svensson C (2000) Impact of CMOS technology scaling on the atmospheric neutron soft error rate. IEEE Trans Nucl Sci 47(6):2586\u20132594","journal-title":"IEEE Trans Nucl Sci"},{"key":"5393_CR14","doi-asserted-by":"crossref","unstructured":"Jahanirad H, Mohammadi K, Attarsharghi P (2012) Single fault reliability analysis in FPGA implemented circuits. In 13th International Symposium on Quality Electronic Design (ISQED), pp 49\u201356","DOI":"10.1109\/ISQED.2012.6187473"},{"key":"5393_CR15","unstructured":"Lesea A (2009) Continuing experiments of atmospheric neutron effect on deep submicron integrated circuits. Xilinx\u2019s White paper, WP 286 (v1.0.1), available online at http:\/\/www.xilinx.com\/support\/documentation\/white_papers\/wp286.pdf"},{"key":"5393_CR16","doi-asserted-by":"crossref","unstructured":"Lesea A, Drimer S, Fabula J, Carmichael C, Alfke P (2005) The Rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs. IEEE Trans Device Mater Reliab 5(3):317\u2013328","DOI":"10.1109\/TDMR.2005.854207"},{"key":"5393_CR17","unstructured":"MACHSUIF (2008) http:\/\/www.eecs.harvard.edu\/hube\/software\/software.html"},{"key":"5393_CR18","unstructured":"Morgan KS (2006) \u201cSEU-Induced Persistent Error Propagation in FPGAs,\u201d thesis in the department of electrical and computer engineering at Brigham Yong University, http:\/\/contentdm.lib.byu.edu\/ETD\/image\/etd1377.pdf"},{"key":"5393_CR19","unstructured":"Mukherjee S (2008) Architecture design for soft errors. Morgan Kaufmann Publishers, Copyright \u00a9 2008 by Elsevier Inc."},{"issue":"2","key":"5393_CR20","doi-asserted-by":"crossref","first-page":"461","DOI":"10.1109\/23.490893","volume":"43","author":"E Normand","year":"1996","unstructured":"Normand E (1996) Single-event effects in avionics. IEEE Trans Nucl Sci 43(2):461\u2013474","journal-title":"IEEE Trans Nucl Sci"},{"issue":"6","key":"5393_CR21","doi-asserted-by":"crossref","first-page":"1996","DOI":"10.1109\/23.983162","volume":"48","author":"E Normand","year":"2001","unstructured":"Normand E (2001) Correlation of inflight neutron dosimeter and SEU measurements with atmospheric neutron model. IEEE Trans Nucl Sci 48(6):1996\u20132003","journal-title":"IEEE Trans Nucl Sci"},{"issue":"1","key":"5393_CR22","doi-asserted-by":"crossref","first-page":"149","DOI":"10.1016\/j.microrel.2009.08.006","volume":"50","author":"SZ Shazli","year":"2010","unstructured":"Shazli SZ, Tahoori MB (2010) Using Boolean satisfiability for computing soft error rates in early design stages. Microelectron Reliab 50(1):149\u2013159","journal-title":"Microelectron Reliab"},{"key":"5393_CR23","doi-asserted-by":"crossref","unstructured":"Shivakumar P, Kistler M, Keckler SW, Burger D, Alivis L (2002) Modeling the effect of technology trends on the soft error rate of combinational logic. In: IEEE Proceeding of the International Conference on Dependable Systems and Networks (DSN\u201902), pp 389\u2013398","DOI":"10.1109\/DSN.2002.1028924"},{"key":"5393_CR24","doi-asserted-by":"crossref","unstructured":"Sonza Reorda M, Sterpone L, Violante M (2005) Efficient estimation of SEU effects in SRAM-based FPGAs. Proc. of the 11th IEEE Int. On-Line Testing Symp. (IOLTS\u201905), pp 54\u201359","DOI":"10.1109\/IOLTS.2005.26"},{"issue":"6","key":"5393_CR25","doi-asserted-by":"crossref","first-page":"2576","DOI":"10.1109\/TNS.2007.910122","volume":"54","author":"L Sterpone","year":"2007","unstructured":"Sterpone L, Violante M, Harboe Sorensen R, Merodio D, Sturesson F, Weigand R, Mattsson S (2007) Experimental validation of a tool for predicting the effects of soft errors in SRAM-based FPGAs. IEEE Trans Nucl Sci 54(6):2576\u20132583, Part 1","journal-title":"IEEE Trans Nucl Sci"},{"key":"5393_CR26","unstructured":"Sundararajan P, McMillan S, Blodget B, Carmichael C, Patterson C (2003) Estimation of single event upset probability impact of FPGA designs. Military and Aerospace Applications of Programmable Logic Devices (MAPLD) International Conference. Available on line at klabs.org\/richcontent\/MAPLDCon03\/papers\/p\/p67_sundararajan_p.doc"},{"key":"5393_CR27","unstructured":"Vocallo: The Expandable Media Gateway Solution (2007) http:\/\/www.octasic.com\/en\/products\/vocallo\/overview.php"},{"key":"5393_CR28","doi-asserted-by":"crossref","unstructured":"Wang F, Agrawal VD (2008) Single event upset: an embedded tutorial. In: 21st International Conference on VLSI Design, pp 429\u2013434","DOI":"10.1109\/VLSI.2008.28"},{"key":"5393_CR29","doi-asserted-by":"crossref","unstructured":"Wang Z, Zhibin Y, Hongxia G, Min L (2011) A software solution to estimate the SEU-induced soft error rate for systems implemented on SRAM-based FPGAs. J Semicond 32(5)","DOI":"10.1088\/1674-4926\/32\/5\/055008"},{"key":"5393_CR30","unstructured":"Xilinx, http:\/\/www.xilinx.com\/support\/documentation"},{"key":"5393_CR31","unstructured":"Xilinx corporation, San Jose, CA (2001) Viretex-II 1.5 V field programmable gate arrays. Data Sheet DS003-1 (v1.7)"},{"key":"5393_CR32","unstructured":"Xilinx Inc. (2001) The JBits 2.8 SDK for Virtex. http:\/\/www.xilinx.com\/labs\/projects\/jbits"},{"key":"5393_CR33","unstructured":"Xilinx Corporation, San Jose, CA (2001) Viretex 2.5 V field programmable gate arrays. Data Sheet DS003-1"},{"key":"5393_CR34","unstructured":"Xilinx\u2019s Device Reliability Report, Fourth Quarter 2010, UG116 (v5.12), February 1, 2011"},{"issue":"1","key":"5393_CR35","doi-asserted-by":"crossref","first-page":"117","DOI":"10.1147\/rd.421.0117","volume":"42","author":"JF Ziegler","year":"1998","unstructured":"Ziegler JF (1998) Terrestrial cosmic ray intensities. IBM J Res Dev 42(1):117\u2013139","journal-title":"IBM J Res Dev"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-013-5393-9.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-013-5393-9\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-013-5393-9","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,7,19]],"date-time":"2019-07-19T03:51:03Z","timestamp":1563508263000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-013-5393-9"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,7,24]]},"references-count":35,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2013,8]]}},"alternative-id":["5393"],"URL":"https:\/\/doi.org\/10.1007\/s10836-013-5393-9","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,7,24]]}}}