{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T22:25:52Z","timestamp":1768343152996,"version":"3.49.0"},"reference-count":54,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2014,1,15]],"date-time":"2014-01-15T00:00:00Z","timestamp":1389744000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2014,2]]},"DOI":"10.1007\/s10836-013-5428-2","type":"journal-article","created":{"date-parts":[[2014,1,13]],"date-time":"2014-01-13T22:25:52Z","timestamp":1389651952000},"page":"25-40","source":"Crossref","is-referenced-by-count":71,"title":["A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment"],"prefix":"10.1007","volume":"30","author":[{"given":"Ujjwal","family":"Guin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniel","family":"DiMase","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammad","family":"Tehranipoor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2014,1,15]]},"reference":[{"issue":"1","key":"5428_CR1","doi-asserted-by":"crossref","first-page":"71","DOI":"10.1016\/j.microrel.2004.03.019","volume":"45","author":"M Alam","year":"2005","unstructured":"Alam M, Mahapatra S (2005) A comprehensive model of pmos nbti degradation. Microelectron Reliab 45(1):71\u201381","journal-title":"Microelectron Reliab"},{"key":"5428_CR2","doi-asserted-by":"crossref","unstructured":"Bhardwaj S, Wang W, Vattikonda R, Cao Y, Vrudhula S (2006) Predictive modeling of the nbti effect for reliable design. In: Proceeding of IEEE on custom integrated circuits conference, pp 189\u2013192","DOI":"10.1109\/CICC.2006.320885"},{"issue":"4","key":"5428_CR3","doi-asserted-by":"crossref","first-page":"338","DOI":"10.1109\/T-ED.1969.16754","volume":"16","author":"J Black","year":"1969","unstructured":"Black J (1969) Electromigration - a brief survey and some recent results. IEEE Trans Electron Devices 16(4):338\u2013347","journal-title":"IEEE Trans Electron Devices"},{"key":"5428_CR4","doi-asserted-by":"crossref","unstructured":"Bolotnyy L, Robins G (2007) Physically unclonable function-based security and privacy in rfid systems. In: Proceeding of IEEE International conference on pervasive computing and communications, pp 211\u2013220","DOI":"10.1109\/PERCOM.2007.26"},{"key":"5428_CR5","unstructured":"Bushnell M, Agrawal V (2000) Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Springer"},{"key":"5428_CR6","unstructured":"Cassell J (2012) Reports of Counterfeit Parts Quadruple Since 2009, Challenging US Defence Industry and National Security"},{"key":"5428_CR7","unstructured":"CHASE (2013). http:\/\/www.chase.uconn.edu\/arochase-special-workshop-on-counterfeit-electronics.php"},{"issue":"2","key":"5428_CR8","doi-asserted-by":"crossref","first-page":"386","DOI":"10.1109\/T-ED.1985.21953","volume":"32","author":"K-L Chen","year":"1985","unstructured":"Chen K-L, Saller S, Groves I, Scott D (1985) Reliability effects on mos transistors due to hot-carrier injection. IEEE Trans Electron Devices 32(2):386\u2013393","journal-title":"IEEE Trans Electron Devices"},{"key":"5428_CR9","unstructured":"CTI (2011) Certification for coutnerfeit components avoidance program. http:\/\/www.cti-us.com\/pdf\/CCAP101Certification.pdf"},{"key":"5428_CR10","unstructured":"Departnent of Defense (2010) Test method standard: microcircuits. [Online]. Available: http:\/\/www.landandmaritime.dla.mil\/Downloads\/MilSpec\/Docs\/MIL-STD-883\/std883.pdf"},{"key":"5428_CR11","unstructured":"Departnent of Defense (2012) Test method standard: test methods for semiconductor devices. [Online]. Available: http:\/\/www.landandmaritime.dla.mil\/Downloads\/MilSpec\/Docs\/MIL-STD-750\/std750.pdf"},{"issue":"1","key":"5428_CR12","doi-asserted-by":"crossref","first-page":"33","DOI":"10.1145\/320954.320957","volume":"6","author":"RD Eldred","year":"1959","unstructured":"Eldred RD (1959) Test routines based on symbolic logical statements. J ACM 6(1):33\u201337","journal-title":"J ACM"},{"key":"5428_CR13","doi-asserted-by":"crossref","unstructured":"Galey JM, Norby RE, Roth JP (1961) Techniques for the diagnosis of switching circuit failures. In: Proceedings of the Second annual symposium on switching circuit theory and logical design, pp 152\u2013160","DOI":"10.1109\/FOCS.1961.33"},{"key":"5428_CR14","unstructured":"GIDEP, Government-Industry Data Exchange Program (GIDEP). http:\/\/www.gidep.org\/"},{"issue":"1\u20132","key":"5428_CR15","doi-asserted-by":"crossref","first-page":"27","DOI":"10.1016\/S0167-9317(99)00427-X","volume":"49","author":"G Groeseneken","year":"1999","unstructured":"Groeseneken G, Degraeve R, Nigam T, Van den Bosch G, Maes HE (1999) Hot carrier degradation and time-dependent dielectric breakdown in oxides. Microelectron Eng 49(1\u20132):27\u201340","journal-title":"Microelectron Eng"},{"key":"5428_CR16","unstructured":"Guin U, Tehranipoor M (2013) Counterfeit detection technology assessment. In: GOMACTech"},{"key":"5428_CR17","unstructured":"Guin U, Tehranipoor M (2013) On selection of counterfeit IC detection methods. In: IEEE North Atlantic test workshop (NATW)"},{"key":"5428_CR18","unstructured":"Guin U, Tehranipoor M, DiMase D, Megrdician M (2013) Counterfeit IC detection and challenges ahead. In: ACM SIGDA"},{"key":"5428_CR19","unstructured":"IDEA, Acceptability of electronic components distributed in the open market. http:\/\/www.idofea.org\/products\/118-idea-std-1010b"},{"issue":"10","key":"5428_CR20","doi-asserted-by":"crossref","first-page":"39","DOI":"10.1109\/MC.2010.299","volume":"43","author":"R Karri","year":"2010","unstructured":"Karri R, Rajendran J, Rosenfeld K, Tehranipoor M (2010) Trustworthy hardware: identifying and classifying hardware trojans. Computer 43(10):39\u201346","journal-title":"Computer"},{"key":"5428_CR21","unstructured":"Kessler LW, Sharpe T (2010) Faked parts detection, circuits assembly, the journal for surface mount and electronics assembly"},{"key":"5428_CR22","doi-asserted-by":"crossref","unstructured":"Koushanfar F, Qu G (2001) Hardware metering. In: DAC, pp 490\u2013493","DOI":"10.1145\/378239.378568"},{"key":"5428_CR23","doi-asserted-by":"crossref","unstructured":"Koushanfar F, Qu G, Potkonjak M (2001) Intellectual property metering. In: Inform. Hiding. Springer-Verlag, pp 81\u201395","DOI":"10.1007\/3-540-45496-9_7"},{"key":"5428_CR24","doi-asserted-by":"crossref","unstructured":"Kumar S, Guajardo J, Maes R, Schrijen G-J, Tuyls P (2008) Extended abstract: the butterfly puf protecting ip on every fpga. In: Proceedings of IEEE International workshop on hardware-oriented security and trust, pp 67\u201370","DOI":"10.1109\/HST.2008.4559053"},{"key":"5428_CR25","doi-asserted-by":"crossref","unstructured":"Kursawe K, Sadeghi A-R, Schellekens D, Skoric B, Tuyls P (2009) Reconfigurable physical unclonable functions - enabling technology for tamper-resistant storage. In: Proceeding of IEEE International workshop on hardware-oriented security and trust, pp 22\u201329","DOI":"10.1109\/HST.2009.5225058"},{"issue":"7","key":"5428_CR26","doi-asserted-by":"crossref","first-page":"1583","DOI":"10.1109\/TED.2006.876041","volume":"53","author":"S Mahapatra","year":"2006","unstructured":"Mahapatra S, Saha D, Varghese D, Kumar P (2006) On the generation and recovery of interface traps in mosfets subjected to nbti, fn, and hci stress. IEEE Trans Electron Devices 53(7):1583\u20131592","journal-title":"IEEE Trans Electron Devices"},{"key":"5428_CR27","doi-asserted-by":"crossref","unstructured":"Mazumder P, Chakraborty K (1996) Testing and testable design of high-density random-access memories. Springer","DOI":"10.1007\/978-1-4613-1451-6"},{"key":"5428_CR28","doi-asserted-by":"crossref","unstructured":"McPherson J (2006) Reliability challenges for 45nm and beyond. In: Proceeding of ACM\/IEEE on Design automation conference, pp 176\u2013181","DOI":"10.1145\/1146909.1146959"},{"key":"5428_CR29","doi-asserted-by":"crossref","unstructured":"Miller M, Meraglia J, Hayward J (2012) Traceability in the age of globalization: a proposal for a marking protocol to assure authenticity of electronic parts. In: SAE aerospace electronics and avionics systems conference","DOI":"10.4271\/2012-01-2104"},{"issue":"3","key":"5428_CR30","doi-asserted-by":"crossref","first-page":"38","DOI":"10.1109\/MSPEC.2007.323431","volume":"44","author":"C Mouli","year":"2007","unstructured":"Mouli C, Carriker W (2007) Future Fab: how software is helping Intel go nano\u2013and beyond. IEEE Spectr 44(3):38\u201343","journal-title":"IEEE Spectr"},{"issue":"5","key":"5428_CR31","first-page":"108","volume":"48","author":"GF Nelson","year":"1975","unstructured":"Nelson GF, Boggs WF (1975) Parametric tests meet the challenge of high-density ICs. Electronics 48(5):108\u2013111","journal-title":"Electronics"},{"key":"5428_CR32","unstructured":"Pappu R (2001) Physical one-way functions. PhD dissertation, Massachusetts Institute of Technology"},{"key":"5428_CR33","doi-asserted-by":"crossref","unstructured":"Reddy V, Krishnan A, Marshall A, Rodriguez J, Natarajan S, Rost T, Krishnan S (2002) Impact of negative bias temperature instability on digital circuit reliability. In: Proceeding on reliability physics, pp 248\u2013254","DOI":"10.1109\/RELPHY.2002.996644"},{"key":"5428_CR34","unstructured":"SAE (2009) Counterfeit electronic parts; avoidance, detection, mitigation, and disposition. http:\/\/standards.sae.org\/as5553\/"},{"key":"5428_CR35","unstructured":"SAE, http:\/\/www.sae.org\/works\/committeeHome.do?comtID=TEAG19"},{"issue":"1","key":"5428_CR36","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1063\/1.1567461","volume":"94","author":"DK Schroder","year":"2003","unstructured":"Schroder DK, Babcock JA (2003) Negative bias temperature instability: road to cross in deep submicron silicon semiconductor manufacturing. Appl Phys 94(1):1\u201318","journal-title":"Appl Phys"},{"key":"5428_CR37","doi-asserted-by":"crossref","unstructured":"Seshu S, Freeman DN (1962) The diagnosis of asynchronous sequential switching systems, vol EC-11","DOI":"10.1109\/TEC.1962.5219384"},{"key":"5428_CR38","doi-asserted-by":"crossref","unstructured":"Soma M (1993) Fault coverage of dc parametric tests for embedded analog amplifiers. In: Proceedings on International test conference, pp 566\u2013573","DOI":"10.1109\/TEST.1993.470653"},{"issue":"1","key":"5428_CR39","doi-asserted-by":"crossref","first-page":"43","DOI":"10.1109\/7298.946459","volume":"1","author":"J Stathis","year":"2001","unstructured":"Stathis J (2001) Physical and predictive models of ultrathin oxide reliability in cmos devices and circuits. IEEE Trans Device Mater Reliab 1(1):43\u201359","journal-title":"IEEE Trans Device Mater Reliab"},{"key":"5428_CR40","unstructured":"Suh G, Devadas S (2007) Physical unclonable functions for device authentication and secret key generation. In: Proceedings of ACM\/IEEE on Design automation conference, pp 9\u201314"},{"issue":"12","key":"5428_CR41","doi-asserted-by":"crossref","first-page":"982","DOI":"10.1109\/TC.1981.1675739","volume":"C30","author":"D Suk","year":"1981","unstructured":"Suk D, Reddy S (1981) A march test for functional faults in semiconductor random access memories. IEEE Trans Comput C30(12):982\u2013985","journal-title":"IEEE Trans Comput"},{"issue":"1","key":"5428_CR42","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1109\/MDT.2010.7","volume":"27","author":"M Tehranipoor","year":"2010","unstructured":"Tehranipoor M, Koushanfar F (2010) A survey of hardware trojan taxonomy and detection. IEEE Des Test 27(1):10\u201325","journal-title":"IEEE Des Test"},{"key":"5428_CR43","doi-asserted-by":"crossref","unstructured":"Tehranipoor M, Wang C (2012) Introduction to hardware security and trust. Springer","DOI":"10.1007\/978-1-4419-8080-9"},{"key":"5428_CR44","unstructured":"trust-HUB, http:\/\/trust-hub.org\/home"},{"key":"5428_CR45","unstructured":"US Congress, National Defense Authorization Act for Fiscal Year 2012. [Online]. Available: http:\/\/www.gpo.gov\/fdsys\/pkg\/BILLS-112hr1540enr\/pdf\/BILLS-112hr1540enr.pdf"},{"key":"5428_CR46","unstructured":"U.S. Department Of Commerce (2010) Defense industrial base assessment: counterfeit electronics"},{"key":"5428_CR47","unstructured":"U.S. Environmental Protection Agency (2011) Electronic waste management in the united states through 2009"},{"key":"5428_CR48","unstructured":"U.S. Senate Committee on Armed Services (2012) Inquiry into counterfeit electronic parts in the department of defence supply chain"},{"key":"5428_CR49","unstructured":"U.S. Senate Committee on Armed Services (2012) Suspect Counterfeit Electronic Parts Can Be Found on Internet Purchasing Platforms. [Online]. Available: http:\/\/www.gao.gov\/assets\/590\/588736.pdf"},{"key":"5428_CR50","unstructured":"Villasenor J, Tehranipoor M (2012) Are you sure its new? the hidden dangers of recycled electronics components. In: IEEE spectrum"},{"issue":"4","key":"5428_CR51","doi-asserted-by":"crossref","first-page":"509","DOI":"10.1109\/TDMR.2007.910130","volume":"7","author":"W Wang","year":"2007","unstructured":"Wang W, Reddy V, Krishnan A, Vattikonda R, Krishnan S, Cao Y (2007) Compact modeling and simulation of circuit reliability for 65-nm cmos technology. IEEE Trans Device Mater Reliab 7(4):509\u2013517","journal-title":"IEEE Trans Device Mater Reliab"},{"key":"5428_CR52","unstructured":"Zhang X, Tehranipoor M (2013) Design of on-chip light-weight sensors for effective detection of recycled ICs. In: TVLSI"},{"key":"5428_CR53","doi-asserted-by":"crossref","unstructured":"Zhang X, Tuzzio N, Tehranipoor M (2012) Identification of recovered ics using fingerprints from a light-weight on-chip sensor. In: DAC, pp 703\u2013708","DOI":"10.1145\/2228360.2228486"},{"key":"5428_CR54","doi-asserted-by":"crossref","unstructured":"Zhang X, Xiao K, Tehranipoor M (2012) Path-delay fingerprinting for identification of recovered ICs. In: DFT","DOI":"10.1109\/DFT.2012.6378192"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-013-5428-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-013-5428-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-013-5428-2","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,6]],"date-time":"2019-08-06T08:57:18Z","timestamp":1565081838000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-013-5428-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,1,15]]},"references-count":54,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2014,2]]}},"alternative-id":["5428"],"URL":"https:\/\/doi.org\/10.1007\/s10836-013-5428-2","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,1,15]]}}}