{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,3]],"date-time":"2025-05-03T12:10:02Z","timestamp":1746274202732,"version":"3.40.4"},"reference-count":22,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2014,6,18]],"date-time":"2014-06-18T00:00:00Z","timestamp":1403049600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2014,8]]},"DOI":"10.1007\/s10836-014-5462-8","type":"journal-article","created":{"date-parts":[[2014,6,19]],"date-time":"2014-06-19T09:06:57Z","timestamp":1403168817000},"page":"457-467","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["The Use of Software Engineering Methods for Efficacious Test Program Creation: A Supportive Evidence Based Case Study"],"prefix":"10.1007","volume":"30","author":[{"given":"Stefan","family":"Vock","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Omar","family":"Escalona","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Colin","family":"Turner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Frank","family":"Owens","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2014,6,18]]},"reference":[{"key":"5462_CR1","unstructured":"AIAG (1991\/2002) Measurements Systems Analysis & reference manual, Automotive Industry Action Group AIAG, continuous publications, viewed May 2013, < http:\/\/www.aiag.org >"},{"key":"5462_CR2","volume-title":"The likelihood principle","author":"JO Berger","year":"1998","unstructured":"Berger JO, Wolpert RL (1998) The likelihood principle, 2nd edn. Institute of Mathematical Statistics, Hayward","edition":"2"},{"key":"5462_CR3","doi-asserted-by":"crossref","unstructured":"Boehm B, Chulani S, Verner J, Wong B (2009) \u201cSeventh workshop on Software Quality\u201d, in 31st International Conference on Software Engineering - Companion Volume, Page(s): 449\u2013450","DOI":"10.1109\/ICSE-COMPANION.2009.5071056"},{"key":"5462_CR4","doi-asserted-by":"crossref","unstructured":"Campbell M (2010) \u201cPlenary presentations: Keynote: the product complexity and test - How product complexity impacts test industry\u201d, Test Symposium (ETS), 2010 15th IEEE European, pp.9","DOI":"10.1109\/ETSYM.2010.5512791"},{"key":"5462_CR5","doi-asserted-by":"crossref","first-page":"1718","DOI":"10.1109\/JPROC.2012.2189807","volume":"100","author":"RK Cavin","year":"2012","unstructured":"Cavin RK, Lugli P, Zhirnov VV (2012) Prolog to the section on science and engineering beyond Moore\u2019s law. Proc IEEE 100:1718\u20131719","journal-title":"Proc IEEE"},{"key":"5462_CR6","doi-asserted-by":"crossref","unstructured":"Chulani S (2001) \u201cBayesian analysis of software cost and quality models\u201d, in Proceedings Software Maintenance, in Proceedings IEEE International Conference on Software Maintenance, Page(s): 565\u2013568","DOI":"10.1109\/ICSM.2001.972773"},{"key":"5462_CR7","unstructured":"Claeys C (2012) \u201cTrends and challenges in micro- and nanoelectronics for the next decade\u201d, Mixed Design of Integrated Circuits and Systems, Proceedings of the 19th International Conference, pp. 37\u201342"},{"key":"5462_CR8","doi-asserted-by":"crossref","unstructured":"Gertsbakh I (2003) \u201cMeasurement Theory for Engineers\u201d, Springer-Verlag","DOI":"10.1007\/978-3-662-08583-7"},{"key":"5462_CR9","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4613-8242-3","volume-title":"Bayes theory","author":"JA Hartigan","year":"1983","unstructured":"Hartigan JA (1983) Bayes theory. Springer, New York"},{"key":"5462_CR10","unstructured":"Huang JC, Jojic N (2010)\u201d Maximum-likelihood learning of cumulative distribution functions on graphs\u201c, in Proceedings of the 13th International Conference on Artificial Intelligence and Statistics (AISTATS), Volume 9 of JMLR: W&CP 9"},{"key":"5462_CR11","unstructured":"Infineon (2013) Company home webpage, viewed April 2013, < http:\/\/www.infineon.com\/cms\/en\/product\/index.html"},{"key":"5462_CR12","unstructured":"\u2018ITRS\u2019 (2012) \u201cInternational Technology Roadmap for Semiconductors 2009, Update 2012, viewed May 2013, < http:\/\/public.itrs.net\/ >"},{"key":"5462_CR13","doi-asserted-by":"crossref","unstructured":"Jain M, Manjula T, Gulati TR (2011) \u201cSoftware Reliability Growth Model (SRGM) with Imperfect Debugging, Fault Reduction Factor and Multiple Change-Point\u201d, Proceedings of the International Conference on Soft Computing for Problem Solving (SocProS 2011) December 20\u201322, Springer","DOI":"10.1007\/978-81-322-0491-6_95"},{"issue":"1","key":"5462_CR14","doi-asserted-by":"crossref","first-page":"33","DOI":"10.1109\/TSE.2007.256943","volume":"33","author":"M Jorgensen","year":"2007","unstructured":"Jorgensen M, Shepperd M (2007) A systematic review of software development cost estimation studies. IEEE Trans Softw Eng 33(1):33\u201353","journal-title":"IEEE Trans Softw Eng"},{"key":"5462_CR15","unstructured":"Journal of Electronic Testing (2012) \u201cSpecial Issue on Testing of Three-Dimensional Stacked Integrated Circuits\u201d, vol. 28, no. 1, February 2012"},{"key":"5462_CR16","volume-title":"Mathematics of statistics","author":"JF Kenney","year":"1951","unstructured":"Kenney JF, Keeping ES (1951) Mathematics of statistics, 2nd edn. Van Nostrand, Princeton","edition":"2"},{"issue":"2","key":"5462_CR17","first-page":"202","volume":"24","author":"CA Mack","year":"2011","unstructured":"Mack CA (2011) \u201cFifty Years of Moore\u2019s Law\u201d, Semiconductor manufacturing. IEEE Trans 24(2):202\u2013207","journal-title":"IEEE Trans"},{"issue":"1","key":"5462_CR18","doi-asserted-by":"crossref","first-page":"28","DOI":"10.1109\/MSPEC.2012.6117829","volume":"49","author":"PE Ross","year":"2012","unstructured":"Ross PE, Moore SK (2012) Top tech 2012. Spectrum IEEE 49(1):28\u201329. doi: 10.1109\/MSPEC.2012.6117829","journal-title":"Spectrum IEEE"},{"key":"5462_CR19","volume-title":"Fundamentals of probability and statistics for engineers","author":"TT Soong","year":"2004","unstructured":"Soong TT (2004) Fundamentals of probability and statistics for engineers. Wiley, Chichester"},{"issue":"3","key":"5462_CR20","doi-asserted-by":"crossref","first-page":"365","DOI":"10.1007\/s10836-011-5276-x","volume":"28","author":"S Vock","year":"2012","unstructured":"Vock S, Escalona O, Turner C, Owens F (2012) Challenges for semiconductor test engineering: a review paper. J Electron Testing Theory Appl 28(3):365\u2013374","journal-title":"J Electron Testing Theory Appl"},{"key":"5462_CR21","doi-asserted-by":"crossref","unstructured":"Vock S, Schmid M, von Staudt HM (2006) \u201cTest Software Generation Productivity and Code Quality Improvement by applying Software Engineering Techniques\u201d, in Proceedings International Test Conference 2006, Paper 1.4","DOI":"10.1109\/TEST.2006.297652"},{"key":"5462_CR22","doi-asserted-by":"crossref","unstructured":"Vock S, von Staudt HM (2006) \u201cMixed-Signal Test Software Generation Process \u2013 Open Environment, Software Engineering Methods and Tools for Improving Quality and Productivity\u201d, Proceedings ISTFA 2006: 32nd International Symposium for Testing and Failure Analysis\u201d, pp 172\u2013177","DOI":"10.31399\/asm.cp.istfa2006p0172"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-014-5462-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-014-5462-8\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-014-5462-8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,3]],"date-time":"2025-05-03T11:36:11Z","timestamp":1746272171000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-014-5462-8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6,18]]},"references-count":22,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2014,8]]}},"alternative-id":["5462"],"URL":"https:\/\/doi.org\/10.1007\/s10836-014-5462-8","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2014,6,18]]}}}