{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,11]],"date-time":"2024-08-11T19:09:39Z","timestamp":1723403379656},"reference-count":17,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2014,8,1]],"date-time":"2014-08-01T00:00:00Z","timestamp":1406851200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2014,8]]},"DOI":"10.1007\/s10836-014-5466-4","type":"journal-article","created":{"date-parts":[[2014,8,14]],"date-time":"2014-08-14T07:01:55Z","timestamp":1407999715000},"page":"443-455","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Analog Fault Diagnosis Using Conic Optimization and Ellipsoidal Classifiers"],"prefix":"10.1007","volume":"30","author":[{"given":"Mohamed A.","family":"El-Gamal","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abdel-Karim S. O.","family":"Hassan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ahmad A. I.","family":"Ibrahim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2014,8,15]]},"reference":[{"key":"5466_CR1","unstructured":"Abo El-Magd M (2005) Gaussian mixture modeling versus auto associative neural network for analog circuits fault diagnosis. Master thesis, Cairo University, Faculty of Engineering, Egypt, 2005"},{"key":"5466_CR2","doi-asserted-by":"crossref","first-page":"544","DOI":"10.1109\/TIM.2002.1017726","volume":"51","author":"F Aminian","year":"2002","unstructured":"Aminian F, Aminian M, Collins H (2002) Analog fault diagnosis of actual circuits using neural networks. IEEE Trans Instrum Meas (TIM) 51:544\u2013550","journal-title":"IEEE Trans Instrum Meas (TIM)"},{"key":"5466_CR3","doi-asserted-by":"crossref","first-page":"101","DOI":"10.1214\/ss\/1009213286","volume":"16","author":"L Brown","year":"2001","unstructured":"Brown L, Cai T, DasGupta A (2001) Interval estimation for a binomial proportion. Stat Sci 16:101\u2013133","journal-title":"Stat Sci"},{"key":"5466_CR4","doi-asserted-by":"crossref","first-page":"288","DOI":"10.1007\/s00521-004-0423-2","volume":"13","author":"B Cannas","year":"2004","unstructured":"Cannas B, Fanni A, Manetti S, Montisci A, Piccirilli M (2004) Neural network-based analog fault diagnosis using testability analysis. Neural Comput Applic 13:288\u2013298","journal-title":"Neural Comput Applic"},{"key":"5466_CR5","doi-asserted-by":"crossref","first-page":"147","DOI":"10.1016\/S0263-2241(00)00008-7","volume":"28","author":"M Catelani","year":"2000","unstructured":"Catelani M, Fort A (2000) Fault diagnosis of electronic circuits using a radial basis function network classifier. Measurement 28:147\u2013154","journal-title":"Measurement"},{"key":"5466_CR6","unstructured":"Electronics Lab (2012) PSPICE9.1 Student Version, Free License www.electronics-lab.com\/downloads\/schematic\/013 . Accessed 12 Dec 2012"},{"key":"5466_CR7","doi-asserted-by":"crossref","first-page":"112","DOI":"10.1007\/s005210200023","volume":"11","author":"M El-Gamal","year":"2002","unstructured":"El-Gamal M (2002) Genetically evolved neural networks for fault classification in analog circuits. Neural Comput Applic 11:112\u2013121","journal-title":"Neural Comput Applic"},{"key":"5466_CR8","unstructured":"El-Gamal M (2004) A knowledge-based approach for fault detection and isolation in analog circuits. Proc. of IEEE International Conference on Neural Networks, Houston, Texas. vol. 3, pp 1580\u20131584"},{"key":"5466_CR9","doi-asserted-by":"crossref","first-page":"213","DOI":"10.1016\/S0045-7906(01)00020-9","volume":"29","author":"M El-Gamal","year":"2003","unstructured":"El-Gamal M, Abdulghafour M (2003) Fault isolation in analog circuits using a fuzzy interference system. Comput Electr Eng 29:213\u2013229","journal-title":"Comput Electr Eng"},{"key":"5466_CR10","doi-asserted-by":"crossref","first-page":"207","DOI":"10.1023\/A:1008353901973","volume":"14","author":"M El-Gamal","year":"1999","unstructured":"El-Gamal M, Abu El-Yazeed M (1999) A combined clustering anf neural network apporach for analog multiple hard fault classification. J Electron Test Theory Appl 14:207\u2013217","journal-title":"J Electron Test Theory Appl"},{"key":"5466_CR11","doi-asserted-by":"crossref","first-page":"323","DOI":"10.1007\/s10836-006-0710-1","volume":"23","author":"M El-Gamal","year":"2007","unstructured":"El-Gamal M, Darwish M (2007) Ensembles of neural networks for fault diagnosis in analog circuits. J Electron Test Theory Appl 23:323\u2013339","journal-title":"J Electron Test Theory Appl"},{"key":"5466_CR12","unstructured":"Glineur Fr (1998) Pattern separation via ellipsoids and conic programming. Master Dissertation, Faculty Polytechnique de Mons, Belgium"},{"key":"5466_CR13","doi-asserted-by":"crossref","unstructured":"Huang K, Stratigopoulos H-G, Mir S (2010) Fault diagnosis of analog circuits based on machine learning. Proc. of Design, Automation and Test in Europe conference (DATE), pp. 1761\u20131766","DOI":"10.1109\/DATE.2010.5457099"},{"issue":"10","key":"5466_CR14","doi-asserted-by":"crossref","first-page":"2701","DOI":"10.1109\/TIM.2012.2196390","volume":"61","author":"K Huang","year":"2012","unstructured":"Huang K, Stratigopoulos H-G, Mir S, Hora C, Xing Y, Kruseman B (2012) Diagnosis of local spot defects in analog circuits. IEEE Trans Instrum Meas (TIM) 61(10):2701\u20132712","journal-title":"IEEE Trans Instrum Meas (TIM)"},{"key":"5466_CR15","unstructured":"Jeorge N, Stephen W (2006) Numerical optimization. 2nd edition. Springer"},{"key":"5466_CR16","doi-asserted-by":"crossref","unstructured":"Karg M (2009) A comparison of PCA, KPCA and LDA for feature extraction to recognize affect in gait kinematics. Proc. of Affective Computing and Intelligent Interaction and Workshops","DOI":"10.1109\/ACII.2009.5349438"},{"key":"5466_CR17","first-page":"188","volume":"44","author":"R Spina","year":"1997","unstructured":"Spina R, Upadhyaya S (1997) Linear circuit fault diagnosis using neuromorphic analyzers. IEEE Trans Circ II 44:188\u2013196","journal-title":"IEEE Trans Circ II"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-014-5466-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-014-5466-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-014-5466-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,14]],"date-time":"2022-04-14T12:49:26Z","timestamp":1649940566000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-014-5466-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,8]]},"references-count":17,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2014,8]]}},"alternative-id":["5466"],"URL":"https:\/\/doi.org\/10.1007\/s10836-014-5466-4","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,8]]}}}