{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,30]],"date-time":"2025-10-30T22:30:13Z","timestamp":1761863413557},"reference-count":20,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2015,3,29]],"date-time":"2015-03-29T00:00:00Z","timestamp":1427587200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1007\/s10836-015-5520-x","type":"journal-article","created":{"date-parts":[[2015,3,29]],"date-time":"2015-03-29T06:30:37Z","timestamp":1427610637000},"page":"217-224","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":18,"title":["Analog Circuits Soft Fault Diagnosis Using R\u00e9nyi\u2019s Entropy"],"prefix":"10.1007","volume":"31","author":[{"given":"Xuan","family":"Xie","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xifeng","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dongjie","family":"Bi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qizhong","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sanshan","family":"Xie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yongle","family":"Xie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2015,3,29]]},"reference":[{"issue":"3","key":"5520_CR1","doi-asserted-by":"crossref","first-page":"544","DOI":"10.1109\/TIM.2002.1017726","volume":"51","author":"F Aminian","year":"2002","unstructured":"Aminian F, Aminian M, Collins H (2002) Analog fault diagnosis of actual circuits using neural networks. IEEE Trans Instrum Meas 51(3):544\u2013550","journal-title":"IEEE Trans Instrum Meas"},{"key":"5520_CR2","volume-title":"Maximum entropy spectral analysis. Proceedings of the 37th Ann. Int Soc","author":"JP Burg","year":"1967","unstructured":"Burg JP (1967) Maximum entropy spectral analysis. Proceedings of the 37th Ann. Int Soc. Explar Geophysics meeting, Oklahoma"},{"key":"5520_CR3","doi-asserted-by":"crossref","first-page":"511","DOI":"10.1364\/JOSA.62.000511","volume":"62","author":"BR Frieden","year":"1997","unstructured":"Frieden BR (1997) Restoring with maximum likelihood and maximum entropy. J Opt Soc Amer 62:511\u2013518","journal-title":"J Opt Soc Amer"},{"key":"5520_CR4","doi-asserted-by":"crossref","DOI":"10.1017\/CBO9780511622670","volume-title":"Physics from Fisher information measure","author":"BR Frieden","year":"1998","unstructured":"Frieden BR (1998) Physics from Fisher information measure. Cambridge Univeresity Press, Cambridge"},{"issue":"3","key":"5520_CR5","doi-asserted-by":"crossref","first-page":"717","DOI":"10.1109\/TIM.2007.894915","volume":"56","author":"G Iuculano","year":"2007","unstructured":"Iuculano G, Nielsen L, Zanobini A, Pellegrini G (2007) The principle of maximum entropy applied in the evaluation of the measurement uncertainty. IEEE Trans Instrum Meas 56(3):717\u2013722","journal-title":"IEEE Trans Instrum Meas"},{"key":"5520_CR6","doi-asserted-by":"crossref","first-page":"237","DOI":"10.1007\/s10836-013-5370-3","volume":"29","author":"A Kavithamani","year":"2013","unstructured":"Kavithamani A, Manikandan V, Devarajan N (2013) Soft fault classification of analog circuits using network parameters and neural networks. J Electron Test Theory Appl 29:237\u2013 240","journal-title":"J Electron Test Theory Appl"},{"issue":"5","key":"5520_CR7","doi-asserted-by":"crossref","first-page":"984","DOI":"10.1109\/TASSP.1984.1164434","volume":"32","author":"M Lagunas-Hernandez","year":"1984","unstructured":"Lagunas-Hernandez M, Santamaria ME, Figueiras AR (1984) ARMA model maximum entropy power spectral estimation. IEEE Tran Acoust, Speech Signal Process 32(5):984\u2013990","journal-title":"IEEE Tran Acoust, Speech Signal Process"},{"issue":"1","key":"5520_CR8","doi-asserted-by":"crossref","first-page":"21","DOI":"10.1109\/TBME.2005.859782","volume":"53","author":"DE Lake","year":"2006","unstructured":"Lake DE (2006) R\u00e9nyi entropy measures of heart rate Gaussianity. IEEE Trans on Biomed Eng 53(1):21\u201327","journal-title":"IEEE Trans on Biomed Eng"},{"key":"5520_CR9","doi-asserted-by":"crossref","first-page":"115","DOI":"10.1007\/s10836-012-5344-x","volume":"29","author":"XF Li","year":"2013","unstructured":"Li XF, Xie YL (2013) Analog circuits fault detection using cross-entropy approach. J Electron Test Theory Appl 29:115\u2013120","journal-title":"J Electron Test Theory Appl"},{"issue":"3","key":"5520_CR10","doi-asserted-by":"crossref","first-page":"324","DOI":"10.1109\/TIT.1978.1055890","volume":"24","author":"B Moshe","year":"1978","unstructured":"Moshe B, Raviv J (1978) R\u00e9nyi\u2019s Entropy and the Probability of Error. IEEE Trans Inform Theory IT- 24 (3):324\u2013330","journal-title":"IEEE Trans Inform Theory IT-"},{"key":"5520_CR11","volume-title":"Probability, random variables and stochastic processes ch.10","author":"A Papoulis","year":"1965","unstructured":"Papoulis A (1965) Probability, random variables and stochastic processes ch.10. McGraw-Hill, New York"},{"key":"5520_CR12","doi-asserted-by":"crossref","unstructured":"Park J, Shin H, Abraham JA (2011) Pseudorandom test of nonlinear analog and mixed-signal circuits based on a volterra series model. J Electron Test Theory Appl 27(3):321\u2013334","DOI":"10.1007\/s10836-011-5227-6"},{"key":"5520_CR13","unstructured":"R\u00e9nyi A (1961) On measures of entropy and information. In: Proc. 4th Berkeley Symp. Math. Stat. and Probability, vol 1, pp 547\u2013561"},{"key":"5520_CR14","doi-asserted-by":"crossref","unstructured":"Sindia S, Agrawal VD, Singh V (2011) Test and Diagnosis of Analog Circuits using Moment Generating Functions, in Proc IEEE Asian Test Symposium 2011","DOI":"10.1109\/ATS.2011.86"},{"key":"5520_CR15","doi-asserted-by":"crossref","unstructured":"Sindia S, Agrawal VD, Singh V (2011) Testing Linear and Non-Linear Analog Circuits using Moment Generating Functions. In: Proceedings of IEEE Latin American Test Workshop 2011, pp 1\u20136","DOI":"10.1109\/LATW.2011.5985915"},{"key":"5520_CR16","volume-title":"Introduction to nonextensive statistical mechanics: Approaching a complex world, ch 4","author":"C Tsallis","year":"2009","unstructured":"Tsallis C (2009) Introduction to nonextensive statistical mechanics: Approaching a complex world, ch 4. Springer, New York"},{"issue":"6","key":"5520_CR17","first-page":"1","volume":"22","author":"P Wang","year":"2006","unstructured":"Wang P, Yang S (2006) A soft fault dictionary method for analog circuit diagnosis based on slope fault mode. Control Autom 22(6):1\u201323","journal-title":"Control Autom"},{"issue":"10","key":"5520_CR18","doi-asserted-by":"crossref","first-page":"2118","DOI":"10.1109\/TCSI.2005.853266","volume":"52","author":"P Wang","year":"2005","unstructured":"Wang P, Yang S (2005) A new diagnosis approach for handling tolerance in analog and mixed-signal circuits by using fuzzy math. IEEE Trans Circuits Syst I, Reg Papers 52 (10):2118\u2013 2127","journal-title":"IEEE Trans Circuits Syst I, Reg Papers"},{"key":"5520_CR19","doi-asserted-by":"crossref","first-page":"243","DOI":"10.1007\/s10836-014-5445-9","volume":"30","author":"YL Xie","year":"2014","unstructured":"Xie YL, Li XF, Xie SS, Xie X, Zhou QZ (2014) Soft fault diagnosis of analog circuits via frequency response function measurements. J Electron Test Theory Appl 30:243\u2013249","journal-title":"J Electron Test Theory Appl"},{"key":"5520_CR20","volume-title":"Modern signal processing ch.1","author":"XD Zhang","year":"2006","unstructured":"Zhang XD (2006) Modern signal processing ch.1. Tsinghua University Press & Springer, Beijing"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-015-5520-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-015-5520-x\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-015-5520-x","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,31]],"date-time":"2019-05-31T02:04:47Z","timestamp":1559268287000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-015-5520-x"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,3,29]]},"references-count":20,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2015,4]]}},"alternative-id":["5520"],"URL":"https:\/\/doi.org\/10.1007\/s10836-015-5520-x","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,3,29]]}}}