{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,2,9]],"date-time":"2024-02-09T05:24:46Z","timestamp":1707456286343},"reference-count":33,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2015,8,1]],"date-time":"2015-08-01T00:00:00Z","timestamp":1438387200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2015,8]]},"DOI":"10.1007\/s10836-015-5534-4","type":"journal-article","created":{"date-parts":[[2015,8,24]],"date-time":"2015-08-24T05:21:18Z","timestamp":1440393678000},"page":"381-394","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors"],"prefix":"10.1007","volume":"31","author":[{"given":"Athanasios","family":"Dimakos","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haralampos-G.","family":"Stratigopoulos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexandre","family":"Siligaris","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Salvador","family":"Mir","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Emeric De","family":"Foucauld","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2015,8,25]]},"reference":[{"issue":"6","key":"5534_CR1","doi-asserted-by":"crossref","first-page":"76","DOI":"10.1109\/MDT.2011.131","volume":"28","author":"L Abdallah","year":"2011","unstructured":"Abdallah L, Stratigopoulos H-G, Mir S, Kelma C (2011) RF front-end test using built-in sensors. IEEE Des Test Comput 28(6):76\u201384","journal-title":"IEEE Des Test Comput"},{"key":"5534_CR2","doi-asserted-by":"crossref","unstructured":"Abdallah L, Stratigopoulos H-G, Mir S, Kelma C (2012) Experiences with non-intrusive sensors for RF built-in test.. In: Proceedings of IEEE international test conference, Anaheim, CA, USA. Paper 17.1.","DOI":"10.1109\/TEST.2012.6401587"},{"key":"5534_CR3","doi-asserted-by":"crossref","unstructured":"Abdallah L, Stratigopoulos H-G, Mir S, Altet J (2013) Defect-oriented non-intrusive RF test using on-chip temperature sensors. In: Proceedings of IEEE VLSI test symposium, Berkeley, CA, USA","DOI":"10.1109\/VTS.2013.6548889"},{"issue":"5","key":"5534_CR4","doi-asserted-by":"crossref","first-page":"920","DOI":"10.1109\/TCAD.2008.917578","volume":"27","author":"E Acar","year":"2008","unstructured":"Acar E, Ozev S (2008) Defect-oriented testing of RF circuits. IEEE Trans Comput Aided Des Integr Circ Syst 27(5):920\u2013931","journal-title":"IEEE Trans Comput Aided Des Integr Circ Syst"},{"key":"5534_CR5","doi-asserted-by":"crossref","unstructured":"Andraud M, Stratigopoulos H-G, Simeu E (2014) One-shot calibration of RF circuits based on non-intrusive sensors.. In: Proceedings of design automation conference, San Francisco, CA, USA","DOI":"10.1109\/DAC.2014.6881337"},{"issue":"3","key":"5534_CR6","doi-asserted-by":"crossref","first-page":"277","DOI":"10.1007\/s10836-010-5193-4","volume":"27","author":"MJ Barragan","year":"2011","unstructured":"Barragan MJ, Fiorelli R, L\u00e9ger G, Rueda A, Huertas JL (2011) Alternate test of LNAs through ensemble learning of on-chip digital envelope signals. J Electron Test Theory Appl 27(3):277\u2013288","journal-title":"J Electron Test Theory Appl"},{"issue":"6","key":"5534_CR7","doi-asserted-by":"crossref","first-page":"464","DOI":"10.1109\/MDT.2006.136","volume":"23","author":"S Bhattacharya","year":"2006","unstructured":"Bhattacharya S, Chatterjee A (2006) A DFT approach for testing embedded systems using DC sensors. IEEE Design & Test of Computers 23(6):464\u2013475","journal-title":"IEEE Design & Test of Computers"},{"issue":"1","key":"5534_CR8","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1109\/TSM.2005.863244","volume":"19","author":"M Bhushan","year":"2006","unstructured":"Bhushan M, Gattiker A, Ketchen MB, Das KK (2006) Ring oscillators for CMOS process tuning and variability control. IEEE Trans Semicond Manuf 19(1):10\u201318","journal-title":"IEEE Trans Semicond Manuf"},{"key":"5534_CR9","doi-asserted-by":"crossref","unstructured":"Bishop CM (1995) Neural networks for pattern recognition. Oxford University Press","DOI":"10.1201\/9781420050646.ptb6"},{"issue":"1","key":"5534_CR10","doi-asserted-by":"crossref","first-page":"85","DOI":"10.1007\/s10836-006-9947-y","volume":"23","author":"D Brown","year":"2007","unstructured":"Brown D, Ferrario J, Wolf R, Li J, Bhagat J, Slamani M (2007) RF testing on a mixed signal tester. J Electron Test Theory Appl 23(1):85\u201394","journal-title":"J Electron Test Theory Appl"},{"issue":"5","key":"5534_CR11","doi-asserted-by":"crossref","first-page":"1187","DOI":"10.1109\/JSSC.2008.920354","volume":"43","author":"M Cimino","year":"2008","unstructured":"Cimino M, Lapuyade H, Deval Y, Taris T, B\u00e9gueret J-B (2008) Design of a 0.9V 2.45 GHz self-testable and reliability-enhanced CMOS LNA. IEEE J Solid-State Circ 43(5):1187\u20131194","journal-title":"IEEE J Solid-State Circ"},{"issue":"6","key":"5534_CR12","doi-asserted-by":"crossref","first-page":"933","DOI":"10.1109\/TVLSI.2009.2019085","volume":"18","author":"JJ Dabrowski","year":"2010","unstructured":"Dabrowski JJ, Ramzan RM (2010) Built-in loopback test for IC RF transceivers. IEEE Trans Very Large Scale Integration (VLSI) Syst 18(6):933\u2013946","journal-title":"IEEE Trans Very Large Scale Integration (VLSI) Syst"},{"key":"5534_CR13","doi-asserted-by":"crossref","unstructured":"Ellouz S, Gamand P, Kelma C, Vandewiele B, Allard B (2006) Combining internal probing with artficial neural networks for optimal RFIC testing.. In: Proceedings of IEEE international test conference, Santa Clara, CA, USA, pp 4.3.1\u20134.3.9","DOI":"10.1109\/TEST.2006.297705"},{"issue":"9","key":"5534_CR14","doi-asserted-by":"crossref","first-page":"82","DOI":"10.1109\/MCOM.2003.1232241","volume":"41","author":"J Ferrario","year":"2003","unstructured":"Ferrario J, Wolf R, Moss S, Slamani M (2003) A low-cost test solution for wireless phone RFICs. IEEE Commun Mag 41(9):82\u201388","journal-title":"IEEE Commun Mag"},{"issue":"12","key":"5534_CR15","doi-asserted-by":"crossref","first-page":"1091","DOI":"10.1016\/j.mejo.2005.04.064","volume":"36","author":"A Gopalan","year":"2005","unstructured":"Gopalan A, Margala M, Mukund PR (2005) A current based self-test methodology for RF front-end circuits. Microelectron J 36(12):1091\u20131102","journal-title":"Microelectron J"},{"key":"5534_CR16","doi-asserted-by":"crossref","unstructured":"Halder A, Chatterjee A (2005) Low-cost alternate EVM test for wireless receiver systems.. In: Proceedings of IEEE VLSI test symposium, Palm Springs, CA, USA, pp 255\u2013260","DOI":"10.1109\/VTS.2005.53"},{"key":"5534_CR17","doi-asserted-by":"crossref","unstructured":"Hastie T, Tibshirani R, Friedman J (2001) The elements of statistical learning: data mining, inference, and prediction. Springer","DOI":"10.1007\/978-0-387-21606-5"},{"issue":"2","key":"5534_CR18","doi-asserted-by":"crossref","first-page":"1035","DOI":"10.1109\/TMTT.2008.921293","volume":"56","author":"Y-C Huang","year":"2008","unstructured":"Huang Y-C, Hsieh H-H, Lu L-H (2008) A built-in self-test technique for RF low-noise amplifiers. IEEE Trans Microw Theory Tech 56(2):1035\u20131042","journal-title":"IEEE Trans Microw Theory Tech"},{"key":"5534_CR19","doi-asserted-by":"crossref","unstructured":"Jarwala M, Duy L, Heutmaker MS (1995) End-to-end test strategy for wireless systems.. In: Proceedings of IEEE international test conference, Washington, DC, USA, pp 940\u2013946","DOI":"10.1109\/TEST.1995.529940"},{"key":"5534_CR20","doi-asserted-by":"crossref","unstructured":"Liaperdos J, Stratigopoulos H-G, Abdallah L, Tsiatouhas Y, Arapoyanni A, Li X (2015) Fast deployment of alternate analog test using bayesian model fusion.. In: Proceedings of design, automation and test in Europe conference, Grenoble, France","DOI":"10.7873\/DATE.2015.0102"},{"issue":"3","key":"5534_CR21","doi-asserted-by":"crossref","first-page":"205","DOI":"10.1007\/s10836-005-6351-y","volume":"21","author":"MG M\u00e9ndez-Rivera","year":"2005","unstructured":"M\u00e9ndez-Rivera MG, Valdes-Garcia A, Silva-Martinez J, S\u00e1nchez-Sinencio E (2005) An on-chip spectrum analyzer for analog built-in testing. J Electron Test Theory Appl 21(3):205\u2013219","journal-title":"J Electron Test Theory Appl"},{"key":"5534_CR22","doi-asserted-by":"crossref","unstructured":"Nassery A, Ozev S, Verhelst M, Slamani M (2011) Extraction of EVM from transmitter system parameters.. In: Proceedings of IEEE European test symposium, Trondheim, Norway, pp 75\u201380","DOI":"10.1109\/ETS.2011.46"},{"issue":"5","key":"5534_CR23","doi-asserted-by":"crossref","first-page":"1655","DOI":"10.1109\/JSSC.2009.2015789","volume":"44","author":"L-T Pang","year":"2009","unstructured":"Pang L-T, Nikolic B (2009) Measurements and analysis of process variability in 90 nm CMOS. IEEE J Solid-State Circ 44(5):1655\u20131663","journal-title":"IEEE J Solid-State Circ"},{"key":"5534_CR24","doi-asserted-by":"crossref","unstructured":"Serhan A, Abdallah L, Stratigopoulos H-G, Mir S (2014) Low-cost EVM built-in test of RF transceivers.. In: Proceedings of IEEE international design & test symposium, Algiers, Algeria, pp 51\u201354","DOI":"10.1109\/IDT.2014.7038586"},{"issue":"4","key":"5534_CR25","doi-asserted-by":"crossref","first-page":"71","DOI":"10.1109\/MDT.2012.2205480","volume":"29","author":"H-G Stratigopoulos","year":"2012","unstructured":"Stratigopoulos H-G, Mir S (2012) Adaptive alternate analog test. IEEE Des Test Comput 29(4):71\u201379","journal-title":"IEEE Des Test Comput"},{"key":"5534_CR26","doi-asserted-by":"crossref","unstructured":"Stratigopoulos H-G, Sunter S (2014) Efficient Monte Carlo-based analog parametric fault modelling.. In: Proceedings of IEEE VLSI test symposium, Napa, CA, USA","DOI":"10.1109\/VTS.2014.6818741"},{"key":"5534_CR27","doi-asserted-by":"crossref","unstructured":"Tsividis Y (2002) Mixed analog-digital vlsi devices and technology. World Scientific","DOI":"10.1142\/5059"},{"issue":"4","key":"5534_CR28","doi-asserted-by":"crossref","first-page":"268","DOI":"10.1109\/MDT.2006.100","volume":"23","author":"A Valdes-Garcia","year":"2006","unstructured":"Valdes-Garcia A, Silva-Martinez J, Sanchez-Sinencio E (2006) On-chip testing techniques for RF wireless transceivers. IEEE Des Test Comput 23(4):268\u2013277","journal-title":"IEEE Des Test Comput"},{"issue":"7","key":"5534_CR29","doi-asserted-by":"crossref","first-page":"1470","DOI":"10.1109\/TIM.2008.917196","volume":"57","author":"A Valdes-Garcia","year":"2008","unstructured":"Valdes-Garcia A, Venkatasubramanian R, Silva-Martinez J, Sanchez-Sinencio E (2008) A broadband CMOS amplitude detector for on-chip RF measurements. IEEE Trans Instrum Meas 57(7):1470\u20131477","journal-title":"IEEE Trans Instrum Meas"},{"key":"5534_CR30","doi-asserted-by":"crossref","unstructured":"Voorakaranam R, Cherubal S, Chatterjee A (2002) A signature test framework for rapid production testing of RF circuits.. In: Proceedings design, automation and test in Europe conference, Paris, France, pp 186\u2013191","DOI":"10.1109\/DATE.2002.998268"},{"issue":"5","key":"5534_CR31","doi-asserted-by":"crossref","first-page":"1715","DOI":"10.1109\/TIM.2005.855091","volume":"54","author":"J-S Yoon","year":"2005","unstructured":"Yoon J-S, Eisenstadt WR (2005) Embedded loopback test for RF ICs. IEEE Trans Instrum Meas 54 (5):1715\u20131720","journal-title":"IEEE Trans Instrum Meas"},{"issue":"5","key":"5534_CR32","doi-asserted-by":"crossref","first-page":"557","DOI":"10.1007\/s10836-012-5315-2","volume":"28","author":"C Zhang","year":"2012","unstructured":"Zhang C, Gharpurey R, Abraham JA (2012) Built-in self test of RF subsystems with integrated sensors. J Electron Test Theory Appl 28(5):557\u2013569","journal-title":"J Electron Test Theory Appl"},{"key":"5534_CR33","doi-asserted-by":"crossref","unstructured":"Zjajo A, Barragan Asian M, Pyneda de Gyvez J (2007) BIST method for die-level process parameter variation monitoring in analog\/mixed-signal integrated circuits.. In: Proceedings of design, automation & test in Europe conference, Nice, France, pp 1301\u20131306","DOI":"10.1109\/DATE.2007.364477"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-015-5534-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-015-5534-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-015-5534-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,20]],"date-time":"2022-05-20T20:54:07Z","timestamp":1653080047000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-015-5534-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,8]]},"references-count":33,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2015,8]]}},"alternative-id":["5534"],"URL":"https:\/\/doi.org\/10.1007\/s10836-015-5534-4","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,8]]}}}