{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T07:39:15Z","timestamp":1740123555718,"version":"3.37.3"},"reference-count":33,"publisher":"Springer Science and Business Media LLC","issue":"5-6","license":[{"start":{"date-parts":[[2015,11,7]],"date-time":"2015-11-07T00:00:00Z","timestamp":1446854400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2015,11,7]],"date-time":"2015-11-07T00:00:00Z","timestamp":1446854400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CNS-0708962","CCF-1116213","IIP-0738088"],"award-info":[{"award-number":["CNS-0708962","CCF-1116213","IIP-0738088"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2015,12]]},"DOI":"10.1007\/s10836-015-5545-1","type":"journal-article","created":{"date-parts":[[2015,11,7]],"date-time":"2015-11-07T08:29:09Z","timestamp":1446884949000},"page":"479-489","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Defect Level Constrained Optimization of Analog and Radio Frequency Specification Tests"],"prefix":"10.1007","volume":"31","author":[{"given":"Suraj","family":"Sindia","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vishwani D.","family":"Agrawal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2015,11,7]]},"reference":[{"key":"5545_CR1","doi-asserted-by":"crossref","unstructured":"Asratian AS, Denley TMJ, H\u00e4ggkvist R (1998) Bipartite graphs and their applications. Cambridge University Press. Tracts in Mathematics 131","DOI":"10.1017\/CBO9780511984068"},{"key":"5545_CR2","doi-asserted-by":"crossref","unstructured":"Biswas S, Blanton RD (2008) Test compaction for mixed-signal circuits using pass-fail test data. In: Proc. 26th IEEE VLSI Test Symposium, 299\u2013308","DOI":"10.1109\/VTS.2008.35"},{"key":"5545_CR3","doi-asserted-by":"crossref","unstructured":"Biswas S, Li P, Blanton R D, Pileggi L T (2005) Specification test compaction for analog circuits and MEMS [Accelerometer and Opamp Examples]. In: Proc. IEEE Design, Automation and Test in Europe, 164\u2013169","DOI":"10.1109\/DATE.2005.277"},{"issue":"3","key":"5545_CR4","doi-asserted-by":"publisher","first-page":"104","DOI":"10.1109\/66.29679","volume":"2","author":"JB Brockman","year":"1989","unstructured":"Brockman JB, Director SW (1989) Predictive subset testing: Optimizing IC parametric performance testing for quality, cost, and yield. IEEE Trans Semicond Manuf 2(3):104\u2013113","journal-title":"IEEE Trans Semicond Manuf"},{"key":"5545_CR5","volume-title":"Introduction to Mixed-Signal IC Test and Measurement","author":"M Burns","year":"2000","unstructured":"Burns M, Roberts G (2000) Introduction to Mixed-Signal IC Test and Measurement. Oxford University Press, New York"},{"key":"5545_CR6","volume-title":"Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits","author":"ML Bushnell","year":"2000","unstructured":"Bushnell ML, Agrawal VD (2000) Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Springer, Boston"},{"key":"5545_CR7","unstructured":"Chang H.-M, Cheng K-T, Zhang W, Li X, Butler KM (2011) Test cost reduction through performance prediction using virtual probe. In: Proc. International Test Conference, 1\u20139. Paper 1.3"},{"issue":"7","key":"5545_CR8","doi-asserted-by":"publisher","first-page":"1026","DOI":"10.1109\/43.771183","volume":"18","author":"G Devarayanadurg","year":"1999","unstructured":"Devarayanadurg G, Soma M, Goteti P, Huynh SD (1999) Test set selection for structural faults in analog IC. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 18(7):1026\u20131039","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"5545_CR9","unstructured":"International Technology Roadmap for Semiconductors (ITRS) 2009 (2015) \n                    http:\/\/bit.ly\/1cCvuY3"},{"key":"5545_CR10","doi-asserted-by":"crossref","unstructured":"Kaminska B (1999) Is analog fault simulation a key to product quality? practical considerations. In: Proc. International Test Conference, 648\u2013648","DOI":"10.1109\/TEST.1999.805789"},{"key":"5545_CR11","doi-asserted-by":"crossref","unstructured":"Kuhn K J (2010) CMOS transistor scaling past 32nm and implications on variation","DOI":"10.1109\/ASMC.2010.5551461"},{"key":"5545_CR12","doi-asserted-by":"crossref","unstructured":"Kupp N, Drineas P, Slamani M, Makris Y (2008) Confidence estimation in Non-RF to RF correlation-based specification test compaction. In: Proc. IEEE European Test Symposium, 35\u201340","DOI":"10.1109\/ETS.2008.31"},{"key":"5545_CR13","doi-asserted-by":"crossref","unstructured":"Kupp N, Huang K, Carulli J M, Makris Y (2012) Spatial correlation modeling for probe test cost reduction in RF devices. In: Proc. IEEE\/ACM International Conference on Computer-Aided Design (ICCAD), 23\u201329","DOI":"10.1145\/2429384.2429390"},{"key":"5545_CR14","unstructured":"LP Solve (2015) \n                    http:\/\/sourceforge.net\/projects\/lpsolve\/"},{"key":"5545_CR15","unstructured":"LTC 4400 Datasheet \u2013 RF Power Controllers with 450kHz Loop BW and 45dB Dynamic Range (2015) Linear Technology, \n                    http:\/\/cds.linear.com\/docs\/en\/datasheet\/4400fas.pdf"},{"issue":"7","key":"5545_CR16","doi-asserted-by":"publisher","first-page":"818","DOI":"10.1109\/T-ED.1981.20437","volume":"28","author":"NC-C Lu","year":"1981","unstructured":"Lu N. C-C, Gerzberg L, Lu C-Y, Meindl JD (1981) Modeling and optimization of monolithic polycrystalline silicon resistors. IEEE Trans on Electron Devices 28(7):818\u2013830","journal-title":"IEEE Trans on Electron Devices"},{"issue":"6","key":"5545_CR17","doi-asserted-by":"publisher","first-page":"796","DOI":"10.1109\/43.285252","volume":"13","author":"L Milor","year":"1994","unstructured":"Milor L, Sangiovanni-Vincentelli AL (1994) Minimizing production test time to detect faults in analog circuits. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 13(6):796\u2013813","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"issue":"6","key":"5545_CR18","doi-asserted-by":"publisher","first-page":"540","DOI":"10.1109\/43.703834","volume":"17","author":"N Nagi","year":"1998","unstructured":"Nagi N, Chatterjee A, Yoon H, Abraham JA (1998) Signature analysis for analog and mixed-signal circuit test response compaction. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 17(6):540\u2013546","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"5545_CR19","unstructured":"Niknejad A M, Meyer R G (1997) Analysis and Optimization of Monolithic Inductors and Transformers for RF ICs. In: Proc. IEEE Custom Integrated Circuits Conference, 375\u2013378"},{"issue":"3","key":"5545_CR20","doi-asserted-by":"publisher","first-page":"268","DOI":"10.1109\/4.748177","volume":"34","author":"B Razavi","year":"1999","unstructured":"Razavi B (1999) CMOS technology characterization for analog and RF design. IEEE Journal of Solid-State Circuits 34(3):268\u2013276","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"5545_CR21","unstructured":"Schaub KB, Kelly J (2004) Production testing of RF and system-on-a-chip devices for wireless communications. Boston: Artech House"},{"key":"5545_CR22","doi-asserted-by":"crossref","unstructured":"Sindia S, Agrawal V D (2014) Specification test minimization for given defect level. In: Proc. IEEE Latin American Test Workshop, 1\u20136","DOI":"10.1109\/LATW.2014.6841927"},{"issue":"6","key":"5545_CR23","doi-asserted-by":"publisher","first-page":"998","DOI":"10.1109\/TVLSI.2009.2017196","volume":"18","author":"H Stratigopoulos","year":"2010","unstructured":"Stratigopoulos H, Drineas P, Slamani M, Makris Y (2010) RF specification test compaction using learning machines. IEEE Trans on Very Large Scale Integration (VLSI) Systems 18(6):998\u20131002","journal-title":"IEEE Trans on Very Large Scale Integration (VLSI) Systems"},{"key":"5545_CR24","unstructured":"Stratigopoulos H-G, Drineas P, Slamani M, Makris Y (2007) Non-RF to RF test correlation using learning machines: A case study. In: Proc. 25th IEEE VLSI Test Symposium, 9\u201314"},{"key":"5545_CR25","unstructured":"Stratogopoulos H-G, Sunter S (2014) Efficient monte Carlo-based analog parametric fault modelling. In: Proc. 32nd IEEE VLSI Test Symposium, 1\u20136"},{"key":"5545_CR26","unstructured":"The Spice Page (2015) \n                    http:\/\/bit.ly\/1b72tyv"},{"key":"5545_CR27","unstructured":"TI LM 741 Datasheet (2015) \n                    http:\/\/www.ti.com\/lit\/ds\/symlink\/lm741.pdf"},{"key":"5545_CR28","unstructured":"TI LM 741 SPICE model (2015) \n                    http:\/\/www.ti.com\/lit\/zip\/snom211"},{"key":"5545_CR29","doi-asserted-by":"crossref","unstructured":"Tuinhout HP, Elzinga H, Brugman JTH, Postma F (1995) Accurate Capacitor Matching Measurements using Floating Gate Test Structures. In: Proc. International Conference on Microelectronic Test Structures, 133\u2013137","DOI":"10.1109\/ICMTS.1995.513960"},{"issue":"3","key":"5545_CR30","doi-asserted-by":"publisher","first-page":"349","DOI":"10.1109\/43.986428","volume":"21","author":"PN Variyam","year":"2002","unstructured":"Variyam PN, Cherubal S, Chatterjee A (2002) Prediction of analog performance parameters using fast transient testing. IEEE Trans Computer-Aided Design of Integrated Circuits and Systems 21(3):349\u2013361","journal-title":"IEEE Trans Computer-Aided Design of Integrated Circuits and Systems"},{"issue":"3","key":"5545_CR31","doi-asserted-by":"publisher","first-page":"458","DOI":"10.1109\/TDMR.2011.2160062","volume":"11","author":"MB Yelten","year":"2011","unstructured":"Yelten MB, Franzon PD, Steer MB (2011) Surrogate-model-based analysis of analog circuits \u2013 Part I: Variability analysis. IEEE Transactions on Device and Materials Reliability 11(3):458\u2013465","journal-title":"IEEE Transactions on Device and Materials Reliability"},{"key":"5545_CR32","unstructured":"Yelten MB, Natarajan S, Xue B, Goteti P (2013) Scalable and efficient analog parametric fault identification. In: Proc. IEEE\/ACM International Conference on Computer-Aided Design (ICCAD), 387\u2013392"},{"issue":"12","key":"5545_CR33","doi-asserted-by":"publisher","first-page":"1814","DOI":"10.1109\/TCAD.2011.2164536","volume":"30","author":"W Zhang","year":"2011","unstructured":"Zhang W, Li X, Liu F, Acar E, Rutenbar RA, Blanton RD (2011) Virtual probe: A statistical framework for low-cost silicon characterization of nanoscale integrated circuits. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 30(12):1814\u20131827","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-015-5545-1.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-015-5545-1\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-015-5545-1","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-015-5545-1.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,5,17]],"date-time":"2020-05-17T09:49:57Z","timestamp":1589708997000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-015-5545-1"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11,7]]},"references-count":33,"journal-issue":{"issue":"5-6","published-print":{"date-parts":[[2015,12]]}},"alternative-id":["5545"],"URL":"https:\/\/doi.org\/10.1007\/s10836-015-5545-1","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2015,11,7]]},"assertion":[{"value":"1 June 2015","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"22 October 2015","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"7 November 2015","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}