{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,21]],"date-time":"2026-01-21T03:51:47Z","timestamp":1768967507673,"version":"3.49.0"},"reference-count":44,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2016,3,11]],"date-time":"2016-03-11T00:00:00Z","timestamp":1457654400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2016,3,11]],"date-time":"2016-03-11T00:00:00Z","timestamp":1457654400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CCF-1116213"],"award-info":[{"award-number":["CCF-1116213"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1007\/s10836-016-5576-2","type":"journal-article","created":{"date-parts":[[2016,3,11]],"date-time":"2016-03-11T07:41:19Z","timestamp":1457682079000},"page":"209-225","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["Applications of Mixed-Signal Technology in Digital Testing"],"prefix":"10.1007","volume":"32","author":[{"given":"Baohu","family":"Li","sequence":"first","affiliation":[]},{"given":"Vishwani D.","family":"Agrawal","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2016,3,11]]},"reference":[{"key":"5576_CR1","unstructured":"AD557: Low cost, complete \u03bcP-Compatible 8-Bit DAC, analog devices. \n                    www.analog.com\/static\/imported-files\/data_sheets\/AD557.pdf\n                    \n                  , accessed on 04\/22\/2015"},{"key":"5576_CR2","unstructured":"AD7822: 3V\/5V, 2MSPS, 8-bit sampling ADC, analog devices. \n                    www.analog.com\/static\/imported-files\/data_sheets\/AD7822_7825_7829.pdf\n                    \n                  , accessed on 04\/22\/2015"},{"key":"5576_CR3","unstructured":"Advantest R&D Center Inc. OPENSTAR Test Programming Language (OTPL) (2003) Advantest Corporation technical publication"},{"key":"5576_CR4","unstructured":"Altera: DE2 development and education board, \n                    http:\/\/www.altera.com\/education\/univ\/materials\/boards\/de2\/unv-de2-board.html\n                    \n                  , accessed on 04\/22\/2015"},{"issue":"9","key":"5576_CR5","doi-asserted-by":"publisher","first-page":"1277","DOI":"10.1109\/TVLSI.2009.2024116","volume":"18","author":"K Basu","year":"2010","unstructured":"Basu K, Mishra P (2010) Test data compression using efficient bitmask and dictionary selection methods. IEEE Trans Very Large Scale Integration Syst 18(9):1277\u20131286","journal-title":"IEEE Trans Very Large Scale Integration Syst"},{"key":"5576_CR6","unstructured":"Bushnell ML, Agrawal VD (2000) Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits. Springer"},{"key":"5576_CR7","unstructured":"Cadence: Encounter DFT architect, \n                    http:\/\/www.cadence.com\/rl\/Resources\/datasheets\/6083_EncTestArch_DS2.pdf\n                    \n                  , accessed on 04\/22\/2015"},{"key":"5576_CR8","unstructured":"Chakravadhanula K, Chickermane V, Pearl D, Garg A, Khurana R, Mukherjee S, Nagaraj P (2013) SmartScan - hierarchical test compression for pin-limited low power designs. In: Proceedings of IEEE international test conference. Paper 4.2"},{"key":"5576_CR9","doi-asserted-by":"crossref","unstructured":"Chandra A, Kapur R, Kanzawa Y (2009) Scalable Adaptive Scan (SAS). In: Proceedings of design, automation and test in Europe conference and exhibition, pp 1476\u20131481","DOI":"10.1109\/DATE.2009.5090896"},{"key":"5576_CR10","doi-asserted-by":"crossref","unstructured":"Chillarige S, Virdi S, Malik A, Chakravadhanula K, Chickermane V, Swenton J, Vandling G (2015) A novel failure diagnosis approach for low pin count and low power compression architectures. In: Proceedings of 24th IEEE North Atlantic test workshop, pp 43\u201348","DOI":"10.1109\/NATW.2015.17"},{"key":"5576_CR11","unstructured":"Greshishchev Y, Pollex D, Wang S-C, Besson M, Flemeke P, Szilagyi S, Aguirre J, Falt C, Ben-Hamida N, Gibbins R, Schvan P (2011) A 56GS\/S 6b DAC in 65nm CMOS with 256x6b Memory. In: IEEE solid-state circuits conference digest of technical papers, pp 194\u2013196"},{"key":"5576_CR12","unstructured":"Gustavsson M, Wikner JJ, Tan NN (2000) CMOS data converters for communications. Springer"},{"issue":"8","key":"5576_CR13","doi-asserted-by":"publisher","first-page":"1146","DOI":"10.1109\/TC.2007.1057","volume":"56","author":"X Kavousianos","year":"2007","unstructured":"Kavousianos X, Kalligeros E, Nikolos D (2007) Optimal selective Huffman coding for test-data compression. IEEE Trans Comput 56(8):1146\u20131152","journal-title":"IEEE Trans Comput"},{"issue":"9","key":"5576_CR14","doi-asserted-by":"publisher","first-page":"1583","DOI":"10.1109\/TVLSI.2010.2051569","volume":"19","author":"JC Koob","year":"2011","unstructured":"Koob JC, Ung SA, Cockburn BF, Elliott DG (2011) Design and characterization of a multilevel DRAM. IEEE Trans Very Large Scale Integration Syst 19(9):1583\u20131596","journal-title":"IEEE Trans Very Large Scale Integration Syst"},{"key":"5576_CR15","doi-asserted-by":"crossref","unstructured":"Kull L, Toifl T, Schmatz M, Francese P, Menolfi C, Braendli M, Kossel M, Morf T, Andersen T, Leblebici Y (2014) A 90GS\/s 8b 667mW 64 interleaved SAR ADC in 32nm Digital SOI CMOS. In: IEEE international solid-state circuits conference digest of technical papers, pp 378\u2013379","DOI":"10.1109\/ISSCC.2014.6757477"},{"key":"5576_CR16","unstructured":"LabVIEW: System design software, national instruments., \n                    http:\/\/www.ni.com\/labview\/\n                    \n                  , accessed on 04\/22\/2015"},{"key":"5576_CR17","volume-title":"Digital testing with multi-valued logic signals","author":"B Li","year":"2015","unstructured":"Li B. (2015) Digital testing with multi-valued logic signals. PhD thesis, Auburn University, Alabama"},{"key":"5576_CR18","doi-asserted-by":"crossref","unstructured":"Li B, Agrawal VD (2015) Multivalued logic for reduced pin count and multi-site SoC testing. In: Proceedings of 24th IEEE North Atlantic test workshop, pp 49\u201354","DOI":"10.1109\/NATW.2015.15"},{"key":"5576_CR19","unstructured":"Li B, Zhang B, Agrawal VD Testing with reduced ATE channels. In: 23rd IEEE North Atlantic test workshop, 2014. \n                    http:\/\/www.eng.auburn.edu\/\u223cvagrawal\/TALKS\/NATW14\/natw14_Li.pdf\n                    \n                  , accessed on 04\/22\/2015"},{"key":"5576_CR20","doi-asserted-by":"crossref","unstructured":"Li B, Zhang B, Agrawal VD (2015) Adopting multi-valued logic for reduced pin-count testing. In: Proceedings of 16th Latin-American test symposium","DOI":"10.1109\/LATW.2015.7102497"},{"key":"5576_CR21","unstructured":"Li L, Chakrabarty K (2003) Test data compression using dictionaries with fixed-length indices. In: Proceedings of 21st IEEE VLSI test symposium, pp 219\u2013224"},{"issue":"2","key":"5576_CR22","doi-asserted-by":"publisher","first-page":"591","DOI":"10.1109\/TNET.2009.2014654","volume":"17","author":"T Li","year":"2009","unstructured":"Li T, Ni Q, Malone D, Leith D, Xiao Y, Turletti T (2009) Aggregation with fragment retransmission for very high-speed WLANs. IEEE\/ACM Trans Netw 17(2):591\u2013604","journal-title":"IEEE\/ACM Trans Netw"},{"key":"5576_CR23","doi-asserted-by":"crossref","unstructured":"Lin C-H, Bult K. (Dec. 1998) A 10-b, 500-MSample\/s CMOS DAC in 0.6 mm2. IEEE J Solid State Circuits 33(12):1948\u20131958","DOI":"10.1109\/4.735535"},{"key":"5576_CR24","unstructured":"Mentor Graphics: tessent testkompress, \n                    http:\/\/www.mentor.com\/products\/silicon-yield\/products\/testkompress\/\n                    \n                  , accessed on 04\/22\/2015"},{"key":"5576_CR25","unstructured":"Mochizuki A, Hanyu T (2005) A 1.88ns 54\u00d754-bit multiplier in 0.18\u03bcm CMOS based on multiple-valued differential-pair circuitry. In: Symposium on VLSI circuits digest of technical papers, pp 264\u2013267"},{"key":"5576_CR26","unstructured":"Moreau J, Droniou T, Lebourg P, Armagnat P (2009) Running scan test on three pins: yes we can!. In: Proceedings of IEEE international test conference. Paper 18.1"},{"key":"5576_CR27","doi-asserted-by":"crossref","unstructured":"Murmann B (2013) A\/D converter circuit and architecture design for high-speed data communication. In: Proceedings of custom integrated circuits conference, pp 1\u201378","DOI":"10.1109\/CICC.2013.6658509"},{"key":"5576_CR28","unstructured":"Murmann B. ADC Performance Survey 1997-2013, \n                    http:\/\/www.stanford.edu\/\u223cmurmann\/adcsurvey.html\n                    \n                  , accessed on 04\/22\/2015"},{"key":"5576_CR29","doi-asserted-by":"crossref","unstructured":"Nakajima T, Yaguchi T, Sugimura H (2012) An ATE architecture for implementing very high efficiency concurrent testing. In: Proceedings of IEEE international test conference. Paper7.1","DOI":"10.1109\/TEST.2012.6401551"},{"key":"5576_CR30","unstructured":"Nelson V.P. Functional IC Test with the Advantest T2000GS System. \n                    http:\/\/www.eng.auburn.edu\/\u223cnelson\/courses\/elec7950\/T2000%20Seminar%20Spring2014.pdf\n                    \n                  , accessed October 20, 2015 (VLSI Design & Test Seminar, ECE Dept., Auburn University, January 15, 2014)"},{"key":"5576_CR31","unstructured":"NI ELVIS: Educational design and prototyping platform, national instruments, \n                    http:\/\/www.ni.com\/nielvis\/\n                    \n                  , accessed on 04\/22\/2015"},{"key":"5576_CR32","doi-asserted-by":"crossref","unstructured":"Rajski J, Tyszer J, Kassab M, Mukherjee N (May 2004) Embedded deterministic test. IEEE Trans Comput Aided Des Integr Circuits Syst 23(5):776\u2013792","DOI":"10.1109\/TCAD.2004.826558"},{"key":"5576_CR33","doi-asserted-by":"crossref","unstructured":"Sanghani A, Yang B, Natarajan K, Liu C (2011) Design and implementation of a time-division multiplexing scan architecture using serializer and deserializer in GPU chips. In: Proceedings of 29th IEEE VLSI test symposium, pp 219\u2013224","DOI":"10.1109\/VTS.2011.5783724"},{"key":"5576_CR34","doi-asserted-by":"crossref","unstructured":"Song B, Kim K, Lee J, Burm J (Feb. 2013) A 0.18- \u03bcm CMOS 10-Gb\/s Dual-Mode 10-PAM serial link transceiver. IEEE Trans Circuits Syst 60(2):457\u2013468","DOI":"10.1109\/TCSI.2012.2215799"},{"key":"5576_CR35","unstructured":"Synopsys: High quality, low cost test, \n                    http:\/\/www.synopsys.com\/Tools\/Implementation\/RTLSynthesis\/Test\/Documents\/dftmax_ds.pdf\n                    \n                  , accessed on 04\/22\/2015"},{"key":"5576_CR36","doi-asserted-by":"crossref","unstructured":"Takahashi Y, Maeda A (2011) Multi domain test: novel test strategy to reduce the cost of test. In: Proceedings of 29th IEEE VLSI test symposium, pp 303\u2013308","DOI":"10.1109\/VTS.2011.5783738"},{"key":"5576_CR37","doi-asserted-by":"crossref","unstructured":"Tehranipoor M, Nourani M, Arabi K, Afzali-Kusha A (2004) Mixed RL-huffman encoding for power reduction and data compression in scan test. In: Proceedings of international symposium circuits and systems, vol 2, pp 681\u2013684","DOI":"10.1109\/ISCAS.2004.1329363"},{"key":"5576_CR38","unstructured":"Test and Test Equipment. In: International Technology roadmap for semiconductors 2011 Edition, 2011. \n                    www.itrs.net\/Links\/2011ITRS\/2011Chapters\/2011Test.pdf"},{"issue":"4","key":"5576_CR39","doi-asserted-by":"publisher","first-page":"294","DOI":"10.1109\/MDT.2006.105","volume":"23","author":"NA Touba","year":"2006","unstructured":"Touba NA (2006) Survey of test vector compression techniques. IEEE Des Test Comput 23(4):294\u2013303","journal-title":"IEEE Des Test Comput"},{"key":"5576_CR40","doi-asserted-by":"crossref","unstructured":"Volkerink E, Khoche A, Kamas L, Rivoir J, Kerkhoff H (2001) Tackling test trade-offs from design, manufacturing to market using economic modeling. In: Proceedings of IEEE international test conference, pp 1098\u20131107","DOI":"10.1109\/TEST.2001.966736"},{"key":"5576_CR41","doi-asserted-by":"crossref","unstructured":"Vranken G, Waayers T, Fleury H, Lelouvier D (2001) Enhanced reduced pin-count test for full-scan design. In: Proceedings of IEEE international test conference, pp 738\u2013747","DOI":"10.1109\/TEST.2001.966695"},{"key":"5576_CR42","doi-asserted-by":"crossref","unstructured":"Volkerink E, Khoche A, Rivoir J, Hilliges K (2002) Test economics for multi-site test with modern cost reduction techniques. In: Proceedings of 20th IEEE VLSI test symposium, pp 411\u2013416","DOI":"10.1109\/VTS.2002.1011173"},{"key":"5576_CR43","unstructured":"Walck C (2007) Handbook on statistical distributions for experimentalists. University of Stockholm, Particle Physics Group, pp 69-143, \n                    http:\/\/www.stat.rice.edu\/~dobelman\/textfiles\/DistributionsHandbook.pdf\n                    \n                  , accessed on November 10, 2015"},{"key":"5576_CR44","unstructured":"Wang L-T, Wu C-W, Wen X (2006) VLSI test principles and architectures. Morgan Kaufmann"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5576-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-016-5576-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5576-2","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5576-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,5,17]],"date-time":"2020-05-17T09:50:14Z","timestamp":1589709014000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-016-5576-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3,11]]},"references-count":44,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2016,4]]}},"alternative-id":["5576"],"URL":"https:\/\/doi.org\/10.1007\/s10836-016-5576-2","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,3,11]]},"assertion":[{"value":"20 November 2015","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"23 February 2016","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"11 March 2016","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}