{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T07:39:15Z","timestamp":1740123555507,"version":"3.37.3"},"reference-count":15,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2016,3,19]],"date-time":"2016-03-19T00:00:00Z","timestamp":1458345600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1007\/s10836-016-5577-1","type":"journal-article","created":{"date-parts":[[2016,3,19]],"date-time":"2016-03-19T03:40:46Z","timestamp":1458358846000},"page":"125-136","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Exemplar-based Failure Triage for Regression Design Debugging"],"prefix":"10.1007","volume":"32","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2427-7413","authenticated-orcid":false,"given":"Zissis","family":"Poulos","sequence":"first","affiliation":[]},{"given":"Andreas","family":"Veneris","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2016,3,19]]},"reference":[{"key":"5577_CR1","doi-asserted-by":"crossref","unstructured":"Berryhill R, Veneris A (2015) Automated rectification methodologies to functional state-space unreachability. In: Proc. Design, automation and test in Europe, pp 1401\u20131406","DOI":"10.7873\/DATE.2015.0331"},{"key":"5577_CR2","unstructured":"Bishop CM (2007) Pattern recognition and machine learning (Information Science and Statistics). Springer"},{"key":"5577_CR3","unstructured":"Chang KH, Wagner I, Bertacco V, Markov IL (2007) Automatic error diagnosis and correction for rtl designs. In: Proceedings International High Level Design Validation and Test Workshop (HLDVT), pp 65\u201372"},{"key":"5577_CR4","unstructured":"Foster H (2011) From volume to velocity: the transforming landscape in function verification. In: Proc. Design and Verification Conf"},{"key":"5577_CR5","doi-asserted-by":"crossref","first-page":"972","DOI":"10.1126\/science.1136800","volume":"315","author":"BJ Frey","year":"2007","unstructured":"Frey BJ, Dueck D (2007) Clustering by passing messages between data points. Science 315:972\u2013976","journal-title":"Science"},{"key":"5577_CR6","doi-asserted-by":"crossref","unstructured":"Keng B, Veneris A (2012) Path directed abstraction and refinement in sat-based design debugging. In: Proc. Design Automation Conf","DOI":"10.1145\/2228360.2228530"},{"key":"5577_CR7","doi-asserted-by":"crossref","unstructured":"Mirzaeian S, Zheng F, Cheng K (2008) Rtl error diagnosis using a word-level sat-solver. In: Proceedings of IEEE international test conference, pp 1\u20138","DOI":"10.1109\/TEST.2008.4700568"},{"key":"5577_CR8","unstructured":"OpenCores (2007). http:\/\/www.opencores.org"},{"key":"5577_CR9","doi-asserted-by":"crossref","unstructured":"Poulos Z, Veneris A (2014) Clustering-based failure triage for rtl regression debugging. In: Proceedings IEEE international test conference, pp 1\u201310","DOI":"10.1109\/TEST.2014.7035339"},{"key":"5577_CR10","doi-asserted-by":"crossref","unstructured":"Poulos Z, Yang Y, Veneris A (2014) Simulation and satisifiability guided counter-example triage for rtl design debugging. In: Proceedings of IEEE international symposium on quality electronic design, pp 394\u2013399","DOI":"10.1109\/ISQED.2014.6783384"},{"key":"5577_CR11","unstructured":"Safarpour S, Keng B, Yang YS, Qin E (2012) Failure triage: the neglected debugging problem. In: Proc. Design and verification conference"},{"key":"5577_CR12","doi-asserted-by":"crossref","unstructured":"Safarpour S, Veneris A, Najm F (2010) Managing verification error traces with bounded model debugging. In: Proc. ASP design automation conference, pp 601\u2013606","DOI":"10.1109\/ASPDAC.2010.5419816"},{"key":"5577_CR13","doi-asserted-by":"crossref","first-page":"742","DOI":"10.1109\/TCAD.2009.2013998","volume":"28","author":"O Sarbishei","year":"2009","unstructured":"Sarbishei O, Tabandeh M, Alizadeh B, Fujita M (2009) A formal approach for debugging arithmetic circuits. IEEE Trans CAD 28:742\u2013754","journal-title":"IEEE Trans CAD"},{"issue":"10","key":"5577_CR14","doi-asserted-by":"crossref","first-page":"1606","DOI":"10.1109\/TCAD.2005.852031","volume":"24","author":"A Smith","year":"2005","unstructured":"Smith A, Veneris A, Ali MF, Viglas A (2005) Fault diagnosis and logic debugging using Boolean satisfiability. IEEE Trans CAD 24(10):1606\u20131621","journal-title":"IEEE Trans CAD"},{"key":"5577_CR15","doi-asserted-by":"crossref","unstructured":"Vasudevan S, Sheridan D, Patel S, Tcheng D, Tuohy B, Johnson D (2010) Goldmine: automatic assertion generation using data mining and static analysis. In: Proc. Design, automation and test in Europe, pp 626\u2013629","DOI":"10.1109\/DATE.2010.5457129"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5577-1.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-016-5577-1\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5577-1","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T22:04:48Z","timestamp":1559253888000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-016-5577-1"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3,19]]},"references-count":15,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2016,4]]}},"alternative-id":["5577"],"URL":"https:\/\/doi.org\/10.1007\/s10836-016-5577-1","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2016,3,19]]}}}