{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T17:38:32Z","timestamp":1648661912364},"reference-count":15,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2016,4,2]],"date-time":"2016-04-02T00:00:00Z","timestamp":1459555200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2016,6]]},"DOI":"10.1007\/s10836-016-5582-4","type":"journal-article","created":{"date-parts":[[2016,4,2]],"date-time":"2016-04-02T03:47:38Z","timestamp":1459568858000},"page":"257-271","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing"],"prefix":"10.1007","volume":"32","author":[{"given":"Masahiro","family":"Ishida","sequence":"first","affiliation":[]},{"given":"Toru","family":"Nakura","sequence":"additional","affiliation":[]},{"given":"Takashi","family":"Kusaka","sequence":"additional","affiliation":[]},{"given":"Satoshi","family":"Komatsu","sequence":"additional","affiliation":[]},{"given":"Kunihiro","family":"Asada","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2016,4,2]]},"reference":[{"key":"5582_CR1","doi-asserted-by":"crossref","unstructured":"A\u2019ain AKB, Bratt AH, Dorey AP (1995) On the development of power supply voltage control testing technique for analogue circuits. Proc. IEEE 4th Asian Test Symposium, pp. 133\u2013139","DOI":"10.1109\/ATS.1995.485328"},{"key":"5582_CR2","unstructured":"A\u2019ain AKB, Bratt AH, Dorey AP (1996) Testing analogue circuits by AC power supply voltage. Proc. IEEE 9th International Conference on VLSI Design, pp. 238\u2013241"},{"key":"5582_CR3","doi-asserted-by":"crossref","unstructured":"Arabi K (2010) Power noise and its impact of production test and validation of SoC devices. Proc. 28th IEEE VLSI Test Symposium, pp. 285\u2013286","DOI":"10.1109\/VTS.2010.5469550"},{"key":"5582_CR4","doi-asserted-by":"crossref","unstructured":"Basharapandiyan S, Cai Y (2010) Practical active compensation techniques for ATE power supply response for testing of mixed signal data storage SOCs. Proc. IEEE International Test Conference, pp. 1\u20137","DOI":"10.1109\/TEST.2010.5699263"},{"key":"5582_CR5","doi-asserted-by":"crossref","unstructured":"Hao H, McCluskey E (1993) Very-low-voltage testing for weak CMOS logic ICs. Proc. IEEE International Test Conference, pp. 275\u2013284","DOI":"10.1109\/TEST.1993.470686"},{"key":"5582_CR6","doi-asserted-by":"crossref","unstructured":"Huh S, Swaminathan M, Keezer D (2011) Low-noise power delivery network design using power transmission line for mixed-signal testing. Proc. IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop, pp. 53\u201357","DOI":"10.1109\/IMS3TW.2011.36"},{"key":"5582_CR7","unstructured":"Intel (2009) Voltage Regulator Module (VRM) and Enterprise Voltage Regulator-Down (EVRD) 11.1 Design Guidelines"},{"key":"5582_CR8","doi-asserted-by":"crossref","unstructured":"Ishida M, Kusaka T, Nakura T, Komatsu S, Asada K (2014) Statistical silicon results of dynamic power integrity control of ATE for eliminating overkills and underkills. Proc. IEEE International Test Conference, pp. 1\u201310","DOI":"10.1109\/TEST.2014.7035299"},{"key":"5582_CR9","doi-asserted-by":"crossref","unstructured":"Ishida M, Nakura T, Kikkawa T, Kusaka T, Komatsu S, Asada K (2012) Power integrity control of ATE for emulating power supply fluctuations on customer environment. Proc. IEEE International Test Conference, pp. 1\u201310","DOI":"10.1109\/TEST.2012.6401553"},{"key":"5582_CR10","doi-asserted-by":"crossref","unstructured":"Johnson GH (2000) Challenges of high supply currents during VLSI test. Proc. IEEE International Test Conference, pp. 1013\u20131020","DOI":"10.1109\/TEST.2000.894314"},{"key":"5582_CR11","doi-asserted-by":"crossref","unstructured":"Mallet J-P (2002) High current DPS architecture for sort test challenge. Proc. IEEE International Test Conference, pp. 913\u2013922","DOI":"10.1109\/TEST.2002.1041846"},{"key":"5582_CR12","doi-asserted-by":"crossref","unstructured":"Okumura T, Minami F, Shimazaki K, Kuwada K, Hashimoto M (2010) Gate delay estimation in STA under dynamic power supply noise. Proc. 15th Asia and South Pacific Design Automation Conference, pp. 775\u2013780","DOI":"10.1109\/ASPDAC.2010.5419786"},{"issue":"3","key":"5582_CR13","doi-asserted-by":"crossref","first-page":"226","DOI":"10.1109\/MDT.2007.76","volume":"24","author":"J Wang","year":"2007","unstructured":"Wang J, Walker DM, Lu X, Majhi A, Kruseman B, Gronthoud G, Villagra LE, van de Wiel P, Eichenberger S (2007) Modeling power supply noise in delay testing. IEEE Des Test Comput 24(3):226\u2013234","journal-title":"IEEE Des Test Comput"},{"key":"5582_CR14","doi-asserted-by":"crossref","unstructured":"Wang J, Walker DMH, Majhi A, Kruseman B, Gronthoud G, Villagra LE, van de Wiel P, Eichenberger S (2006) Power supply noise in delay testing. Proc. IEEE International Test Conference, pp. 1\u201310","DOI":"10.1109\/TEST.2006.297642"},{"key":"5582_CR15","unstructured":"Yoon C, Park H, Lee W, Shin M, Pak JS, Kim J (2008) Power\/Ground noise immunity test in wireless and high-speed UWB communication system. Proc. IEEE International Symposium on Electromagnetic Compatibility, pp. 1\u20136"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5582-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-016-5582-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5582-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T22:04:48Z","timestamp":1559253888000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-016-5582-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4,2]]},"references-count":15,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2016,6]]}},"alternative-id":["5582"],"URL":"https:\/\/doi.org\/10.1007\/s10836-016-5582-4","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,4,2]]}}}