{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T03:56:19Z","timestamp":1775447779693,"version":"3.50.1"},"reference-count":30,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2016,9,27]],"date-time":"2016-09-27T00:00:00Z","timestamp":1474934400000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"funder":[{"DOI":"10.13039\/501100001809","name":"the National Natural Science Funds of China","doi-asserted-by":"crossref","award":["51577046, 51607004"],"award-info":[{"award-number":["51577046, 51607004"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"name":"the State Key Program of National Natural Science Foundation of China","award":["51637004"],"award-info":[{"award-number":["51637004"]}]},{"name":"the national key research and development plan \"important scientific instruments and equipment development\"","award":["2016YFF0102200"],"award-info":[{"award-number":["2016YFF0102200"]}]},{"name":"Anhui Provincial Science and Technology Foundation of China","award":["1301022036"],"award-info":[{"award-number":["1301022036"]}]},{"DOI":"10.13039\/501100003995","name":"Anhui Provincial Natural Science Foundation","doi-asserted-by":"crossref","award":["1608085QF157"],"award-info":[{"award-number":["1608085QF157"]}],"id":[{"id":"10.13039\/501100003995","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Key projects of Anhui province university outstanding youth talent support program","award":["gxyqZD2016207"],"award-info":[{"award-number":["gxyqZD2016207"]}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1007\/s10836-016-5616-y","type":"journal-article","created":{"date-parts":[[2016,9,27]],"date-time":"2016-09-27T01:06:03Z","timestamp":1474938363000},"page":"531-540","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":50,"title":["A Novel Approach for Diagnosis of Analog Circuit Fault by Using GMKL-SVM and PSO"],"prefix":"10.1007","volume":"32","author":[{"given":"Chaolong","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Yigang","family":"He","sequence":"additional","affiliation":[]},{"given":"Lifen","family":"Yuan","sequence":"additional","affiliation":[]},{"given":"Wei","family":"He","sequence":"additional","affiliation":[]},{"given":"Sheng","family":"Xiang","sequence":"additional","affiliation":[]},{"given":"Zhigang","family":"Li","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2016,9,27]]},"reference":[{"issue":"1","key":"5616_CR1","doi-asserted-by":"crossref","first-page":"29","DOI":"10.1023\/A:1011141724916","volume":"17","author":"F Aminian","year":"2001","unstructured":"Aminian F, Aminian M (2001) Fault diagnosis of analog circuits using Bayesian neural networks with wavelet transform as preprocessor. J Electron Test 17(1):29\u201336","journal-title":"J Electron Test"},{"key":"5616_CR2","doi-asserted-by":"crossref","unstructured":"Aminian F, Aminian M, Collins Jr. HW (2002) Analog fault diagnosis of actual circuits using neural networks. IEEE Trans Instrum Meas 51(3):544\u2013550","DOI":"10.1109\/TIM.2002.1017726"},{"issue":"5","key":"5616_CR3","doi-asserted-by":"crossref","first-page":"1546","DOI":"10.1109\/TIM.2007.904549","volume":"56","author":"M Aminian","year":"2007","unstructured":"Aminian M, Aminian F (2007) A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Trans Instrum Meas 56(5):1546\u20131554","journal-title":"IEEE Trans Instrum Meas"},{"issue":"5","key":"5616_CR4","doi-asserted-by":"crossref","first-page":"5223","DOI":"10.1016\/j.eswa.2011.11.017","volume":"39","author":"C Arizmendi","year":"2012","unstructured":"Arizmendi C, Vellido A, Romero E (2012) Classification of human brain tumours from MRS data using Discrete Wavelet Transform and Bayesian Neural Networks. Expert Syst Appl 39(5):5223\u20135232","journal-title":"Expert Syst Appl"},{"issue":"5","key":"5616_CR5","doi-asserted-by":"crossref","first-page":"4998","DOI":"10.1016\/j.eswa.2010.09.151","volume":"38","author":"A Chander","year":"2011","unstructured":"Chander A, Chatterjee A, Siarry P (2011) A new social and momentum component adaptive PSO algorithm for image segmentation. Expert Syst Appl 38(5):4998\u20135004","journal-title":"Expert Syst Appl"},{"key":"5616_CR6","doi-asserted-by":"crossref","unstructured":"Chen Y, Gupta MR, Recht B (2009) Learning kernels from indefinite similarities. Proc. 26th Int. Conf. Mach Learn:145\u2013152","DOI":"10.1145\/1553374.1553393"},{"issue":"3","key":"5616_CR7","first-page":"273","volume":"20","author":"C Cortes","year":"1995","unstructured":"Cortes C, Vapnik V (1995) Support-vector networks. Mach Learn 20(3):273\u2013297","journal-title":"Mach Learn"},{"key":"5616_CR8","unstructured":"Cortes C, Mohri M, Rostamizadeh A (2009) L2 regularization for learning kernels. Proc. 25th Conf. Uncertain. Artif Intell:109\u2013116"},{"key":"5616_CR9","doi-asserted-by":"crossref","unstructured":"Eberhart R, Kennedy J (1995) A new optimizer using particle swarm theory. Proc 6th Int Symp Micromachine Human Sci 39\u201343","DOI":"10.1109\/MHS.1995.494215"},{"issue":"4","key":"5616_CR10","doi-asserted-by":"crossref","first-page":"555","DOI":"10.2478\/v10178-011-0054-8","volume":"18","author":"D Grzechca","year":"2011","unstructured":"Grzechca D (2011) Soft fault clustering in analog electronic circuits with the use of self organizing neural network. Metrol Meas Syst 18(4):555\u2013568","journal-title":"Metrol. Meas. Syst."},{"key":"5616_CR11","unstructured":"Grzechca D, Rutkowski J (2009) Fault diagnosis in analog electronic circuits-the SVM approach. Metrol Meas Syst 16(4):583\u2013598"},{"issue":"4","key":"5616_CR12","doi-asserted-by":"crossref","first-page":"379","DOI":"10.1049\/ip-cds:20040495","volume":"151","author":"Y He","year":"2004","unstructured":"He Y, Tan Y, Sun Y (2004) Wavelet neural network approach for fault diagnosis of analogue circuits. Proc. Inst. Elect. Eng.\u2014Circuits, Devices Syst 151(4):379\u2013384","journal-title":"Proc. Inst. Elect. Eng.\u2014Circuits, Devices Syst"},{"issue":"5","key":"5616_CR13","doi-asserted-by":"crossref","first-page":"827","DOI":"10.1109\/TNN.2009.2014229","volume":"20","author":"M Hu","year":"2009","unstructured":"Hu M, Chen Y, Kwok JTY (2009) Building sparse multiple-kernel SVM classifiers. IEEE T Neural Networ 20(5):827\u2013839","journal-title":"IEEE T Neural Networ"},{"issue":"1","key":"5616_CR14","doi-asserted-by":"crossref","first-page":"281","DOI":"10.1016\/j.measurement.2010.10.004","volume":"44","author":"C Jiang","year":"2011","unstructured":"Jiang C, Wang Y (2011) A novel approach of analog circuit fault diagnosis using support vector machines classifier. Measurement 44(1):281\u2013289","journal-title":"Measurement"},{"key":"5616_CR15","unstructured":"Liu J, Chen J, Chen S, Ye J (2009) Learning the optimal neighborhood kernel for classification. Proc. Int. Joint Conf. Artif Intell:1144\u20131149"},{"key":"5616_CR16","unstructured":"Long B, Huang J, Tian S (2008) Least squares support vector machine based analog-circuit fault diagnosis using wavelet transform as pre-processor. Proc Int Conf Commun Circuits Syst 1026\u20131029"},{"key":"5616_CR17","doi-asserted-by":"crossref","unstructured":"Pu\u0142ka A (2011) Two heuristic algorithms for test point selection in analog circuit diagnoses. Metrol Meas Syst 18(1):115\u2013128","DOI":"10.2478\/v10178-011-0011-6"},{"key":"5616_CR18","unstructured":"Rakotomamonjy A, Bach F, Canu S, Grandvalet Y (2008) SimpleMKL. J Mach Learn Res 9(1):2491\u20132521"},{"issue":"3","key":"5616_CR19","doi-asserted-by":"crossref","first-page":"188","DOI":"10.1109\/82.558453","volume":"44","author":"R Spina","year":"1997","unstructured":"Spina R, Upadhyaya S (1997) Linear circuit fault diagnosis using neuromorphic analyzers. IEEE Trans. Circuits Syst. II, Analog Digit. Signal Process 44(3):188\u2013196","journal-title":"IEEE Trans. Circuits Syst. II, Analog Digit. Signal Process"},{"issue":"5","key":"5616_CR20","doi-asserted-by":"crossref","first-page":"576","DOI":"10.1016\/j.compbiomed.2013.01.020","volume":"43","author":"A Subasi","year":"2013","unstructured":"Subasi A (2013) Classification of EMG signals using PSO optimized SVM for diagnosis of neuromuscular disorders. Comput Biol Med 43(5):576\u2013586","journal-title":"Comput Biol Med"},{"issue":"11","key":"5616_CR21","doi-asserted-by":"crossref","first-page":"2631","DOI":"10.1109\/TIM.2008.925009","volume":"57","author":"Y Tan","year":"2008","unstructured":"Tan Y, He Y, Cui C, Qiu G (2008) A novel method for analog fault diagnosis based on neural networks and genetic algorithms. IEEE Trans Instrum Meas 57(11):2631\u20132639","journal-title":"IEEE Trans Instrum Meas"},{"key":"5616_CR22","doi-asserted-by":"crossref","unstructured":"Tsang IWH, Kwok JTY (2006) Efficient hyperkernel learning using second-order cone programming. IEEE Trans Neural Networ 17(1):48\u201358","DOI":"10.1109\/TNN.2005.860848"},{"issue":"10","key":"5616_CR23","doi-asserted-by":"crossref","first-page":"1197","DOI":"10.1049\/iet-gtd.2009.0488","volume":"4","author":"J Upendar","year":"2010","unstructured":"Upendar J, Gupta CP, Singh GK, Ramakrishna G (2010) PSO and ANN-based fault classification for protective relaying. IET Gener Transm Dis 4(10):1197\u20131212","journal-title":"IET Gener Transm Dis"},{"issue":"11","key":"5616_CR24","doi-asserted-by":"crossref","first-page":"5277","DOI":"10.1109\/TIE.2012.2224074","volume":"60","author":"ASS Vasan","year":"2013","unstructured":"Vasan ASS, Long B, Pecht M (2013) Diagnostics and prognostics method for analog electronic circuits. IEEE T Ind Electron 60(11):5277\u20135291","journal-title":"IEEE T Ind Electron"},{"issue":"11","key":"5616_CR25","doi-asserted-by":"crossref","first-page":"2251","DOI":"10.1007\/s11432-010-4077-7","volume":"53","author":"Y Xiao","year":"2010","unstructured":"Xiao Y, He Y (2010) A linear ridgelet network approach for fault diagnosis of analog circuit. Sci China Inf Sci 53(11):2251\u20132264","journal-title":"Sci China Inf Sci"},{"issue":"7","key":"5616_CR26","doi-asserted-by":"crossref","first-page":"1102","DOI":"10.1016\/j.neucom.2010.12.003","volume":"74","author":"Y Xiao","year":"2011","unstructured":"Xiao Y, He Y (2011) A novel approach for analog fault diagnosis based on neural networks and improved kernel PCA. Neurocomputing 74(7):1102\u20131115","journal-title":"Neurocomputing"},{"key":"5616_CR27","doi-asserted-by":"crossref","unstructured":"Yang H, Xu Z, Ye J, King I, Lyu MR (2011) Efficient sparse generalized multiple kernel learning. IEEE Trans Neural Networ 22(3):433\u2013446","DOI":"10.1109\/TNN.2010.2103571"},{"issue":"3","key":"5616_CR28","doi-asserted-by":"crossref","first-page":"586","DOI":"10.1109\/TIM.2009.2025068","volume":"59","author":"L Yuan","year":"2010","unstructured":"Yuan L, He Y, Huang J, Sun Y (2010) A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor. IEEE Trans Instrum Meas 59(3):586\u2013595","journal-title":"IEEE Trans Instrum Meas"},{"issue":"3","key":"5616_CR29","doi-asserted-by":"crossref","first-page":"343","DOI":"10.1007\/s10836-014-5454-8","volume":"30","author":"C Zhang","year":"2014","unstructured":"Zhang C, He Y, Yuan L, Deng F (2014) A Novel Approach for Analog Circuit Fault Prognostics Based on Improved RVM. J Electron Test 30(3):343\u2013356","journal-title":"J Electron Test"},{"issue":"2","key":"5616_CR30","doi-asserted-by":"crossref","first-page":"251","DOI":"10.1515\/mms-2015-0025","volume":"22","author":"C Zhang","year":"2015","unstructured":"Zhang C, He Y, Zuo L, Wang J, He W (2015) A novel approach to diagnosis of analog circuit incipient faults based on KECA and OAO LSSVM. Metrol Meas Syst 22(2):251\u2013262","journal-title":"Metrol. Meas. Syst"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-016-5616-y\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5616-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5616-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T18:52:46Z","timestamp":1498243966000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-016-5616-y"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,9,27]]},"references-count":30,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2016,10]]}},"alternative-id":["5616"],"URL":"https:\/\/doi.org\/10.1007\/s10836-016-5616-y","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,9,27]]}}}