{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T10:49:23Z","timestamp":1761562163685,"version":"3.37.3"},"reference-count":33,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2016,10,26]],"date-time":"2016-10-26T00:00:00Z","timestamp":1477440000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2016,12]]},"DOI":"10.1007\/s10836-016-5617-x","type":"journal-article","created":{"date-parts":[[2016,10,26]],"date-time":"2016-10-26T05:29:46Z","timestamp":1477459786000},"page":"735-747","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Optimal Selective Count Compatible Runlength Encoding for SOC Test Data Compression"],"prefix":"10.1007","volume":"32","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5946-5801","authenticated-orcid":false,"given":"Harpreet","family":"Vohra","sequence":"first","affiliation":[]},{"given":"Amardeep","family":"Singh","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2016,10,26]]},"reference":[{"key":"5617_CR1","doi-asserted-by":"crossref","unstructured":"Bayraktaroglu I, Orailoglu A. (2003) Decompression hardware determination for test volume and time reduction through unified test pattern compaction and compression. In: Proceedings IEEE VLSI test symposium (VTS), pp 113\u2013118.","DOI":"10.1109\/VTEST.2003.1197641"},{"issue":"3","key":"5617_CR2","doi-asserted-by":"crossref","first-page":"355","DOI":"10.1109\/43.913754","volume":"20","author":"A Chandra","year":"2001","unstructured":"Chandra A, Chakrabarty K (2001) System-on-a-chip data compression and decompression architecture based on Golomb codes. IEEE Trans Comput Aided Des Integr Circuits Syst 20(3):355\u2013368","journal-title":"IEEE Trans. Comput. Aided Des. Integr. Circuits Syst"},{"issue":"8","key":"5617_CR3","first-page":"1076","volume":"52","author":"A Chandra","year":"2003","unstructured":"Chandra A, Chakrabarty K (2003) Test data compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes. IEEE Trans Commun 52(8):1076\u20131088","journal-title":"IEEE Trans. Commun"},{"issue":"3","key":"5617_CR4","doi-asserted-by":"crossref","first-page":"352","DOI":"10.1109\/TCAD.2002.807895","volume":"22","author":"A Chandra","year":"2003","unstructured":"Chandra A, Chakrabarty K (2003) A unified approach to reduce SoC test data volume, scan power and testing time. IEEE Trans Comput Aided Des Integr Circuits Syst 22(3):352\u2013363","journal-title":"IEEE Trans. Comput. Aided Des. Integr. Circuits Syst"},{"issue":"4","key":"5617_CR5","doi-asserted-by":"crossref","first-page":"644","DOI":"10.1109\/TCAD.2011.2176733","volume":"31","author":"CH Chang","year":"2012","unstructured":"Chang CH, Lee LJ, Tseng WD, Lin RB (2012) 2n pattern run-length for test data compression. IEEE Trans Comput Aided Des Integr Circuits Syst 31(4):644\u2013648","journal-title":"IEEE Trans. Comput. Aided Des. Integr. Circuits Syst"},{"issue":"5","key":"5617_CR6","doi-asserted-by":"crossref","first-page":"327","DOI":"10.1049\/iet-cdt:20070003","volume":"2","author":"AH El-Maleh","year":"2008","unstructured":"El-Maleh AH (2008) Efficient test compression technique based on block merging. IET Comput Digit Tech 2(5):327\u2013335","journal-title":"IET Comput. Digit. Tech"},{"issue":"3","key":"5617_CR7","doi-asserted-by":"crossref","first-page":"155","DOI":"10.1049\/iet-cdt:20070028","volume":"2","author":"AH El-Maleh","year":"2008","unstructured":"El-Maleh AH (2008) Test data compression for system-on-a-chip using extended frequency-directed run-length code. IET Comput Digit Tech 2(3):155\u2013163","journal-title":"IET Comput Digit Tech"},{"key":"5617_CR8","doi-asserted-by":"crossref","unstructured":"Gonciari P.T., Al-Hashimi B.M., Nicolici N.(2002) Improving compression ratio, area overhead, and test application time for system on-a-chip test data compression\/decompression. In: Proceedings IEEE design automation and test in Europe conference and exhibition (DATE), pp 604\u2013611","DOI":"10.1109\/DATE.2002.998363"},{"key":"5617_CR9","doi-asserted-by":"crossref","first-page":"783","DOI":"10.1109\/TCAD.2003.811451","volume":"22","author":"PT Gonciari","year":"2003","unstructured":"Gonciari PT, Hashimi BA, Nicolici N (2003) Variable-length input huffman coding for system-on-a-chip test. IEEE Trans Computer-Aided Design 22:783\u2013796","journal-title":"IEEE Trans Computer-Aided Design"},{"key":"5617_CR10","doi-asserted-by":"crossref","first-page":"59","DOI":"10.1007\/s10836-016-5562-8","volume":"32","author":"Y Haiying","year":"2016","unstructured":"Haiying Y, Kun G, Xun S, Zijian J (2016) Power Efficient test data compression method for SoC using alternating statistical Run-length coding. J Electron Test 32:59\u201368","journal-title":"J. Electron. Test"},{"key":"5617_CR11","doi-asserted-by":"crossref","first-page":"797","DOI":"10.1109\/TCAD.2003.811452","volume":"22","author":"A Jas","year":"2003","unstructured":"Jas A, Ghosh DJ, Ng M-E, Touba NA (2003) An efficient test vector compression scheme using selective Huffman coding. IEEE Trans Comput Aided Des 22:797\u2013806","journal-title":"IEEE Trans Comput Aided Des"},{"key":"5617_CR12","doi-asserted-by":"crossref","unstructured":"Krishna C, Touba N.A. (2002) Reducing test data volume using LFSR reseeding with seed compression. In: Proceedings IEEE international test conference (ITC), pp 321\u2013330.","DOI":"10.1109\/TEST.2002.1041775"},{"issue":"5","key":"5617_CR13","doi-asserted-by":"crossref","first-page":"26","DOI":"10.1109\/MDT.2009.125","volume":"26","author":"S Lee H-H","year":"2009","unstructured":"Lee H-H S, Chakrabarty K (2009) Test challenges for 3D integrated circuits. IEEE Des Test Comput 26(5):26\u201335","journal-title":"IEEE Des. Test Comput"},{"issue":"3","key":"5617_CR14","doi-asserted-by":"crossref","first-page":"374","DOI":"10.4218\/etrij.11.0110.0319","volume":"33","author":"L-J Lee","year":"2011","unstructured":"Lee L-J, Tseng W-D, Lin R-B (2011) An internal pattern run-length methodology for slice encoding. ETRI J 33(3):374\u2013381","journal-title":"ETRI J"},{"issue":"4","key":"5617_CR15","doi-asserted-by":"crossref","first-page":"470","DOI":"10.1145\/944027.944032","volume":"8","author":"L Li","year":"2003","unstructured":"Li L, Chakrabarty K (2003) Test data compression using dictionaries with selective entries and fixed-length indices. ACM Trans Des Autom Electron Syst 8(4):470\u2013490","journal-title":"ACM Trans Des Autom Electron Syst"},{"issue":"6","key":"5617_CR16","doi-asserted-by":"crossref","first-page":"679","DOI":"10.1007\/s10836-010-5183-6","volume":"26","author":"US Mehta","year":"2010","unstructured":"Mehta US, Dasgupta KS, Devashrayee NM (2010) Modified selective Huffman coding for optimization of test data compression, test application time and area overhead. J Electron Test 26(6):679\u2013688","journal-title":"J Electron Test"},{"key":"5617_CR17","unstructured":"Mehta US, Dasgupta KS, Devashrayee N (2010).Hamming Distance Based Reordering and Columnwise Bit Stuffing with Difference Vector: A Better Scheme for Test Data Compression with Run Length Based Codes. In proceeding 23rd International Conference on VLSI Design, pp: 33\u201338"},{"key":"5617_CR18","doi-asserted-by":"crossref","unstructured":"Miyase K, Kajihara S, Reddy SM (2004) Multiple scan tree design with test vector modification. In Proceedings IEEE Asian test symposium (ATS), pp 76\u201381","DOI":"10.1109\/ATS.2004.61"},{"issue":"9","key":"5617_CR19","doi-asserted-by":"crossref","first-page":"1306","DOI":"10.1109\/TCAD.2004.831584","volume":"23","author":"G Mrugalski","year":"2004","unstructured":"Mrugalski G, Rajski J, Tyszer J (2004) Ring generators\u2013new devices for embedded test applications. IEEE Trans Comput Aided Des Integr Circuits Syst 23(9):1306\u20131320","journal-title":"IEEE Trans. Comput. Aided Des. Integr. Circuits Syst"},{"issue":"5","key":"5617_CR20","doi-asserted-by":"crossref","first-page":"776","DOI":"10.1109\/TCAD.2004.826558","volume":"23","author":"J Rajski","year":"2004","unstructured":"Rajski J, Tyszer J, Kassab M, Mukherjee N (2004) Embedded deterministic test. IEEE Trans Comput Aided Des Integr Circuits Syst 23(5):776\u2013792","journal-title":"IEEE Trans. Comput. Aided Des. Integr. Circuits Syst"},{"key":"5617_CR21","doi-asserted-by":"crossref","first-page":"1051","DOI":"10.1007\/s00542-009-0976-1","volume":"6","author":"P Ramm","year":"2010","unstructured":"Ramm P, Armin K, Josef W, Maaike M, Taklo V (2010) 3D system-on-chip technologies for more than moore systems. Microsyst Technol 6:1051\u20131055","journal-title":"Microsyst Technol"},{"key":"5617_CR22","doi-asserted-by":"crossref","unstructured":"Ruan X, Katti R.(2006) An efficient data-independent technique for compressing test vectors in systems-on-a-chip. In: Proceedings IEEE Computer Society Annual Symposium on Emerging VLSI technologies and architectures (ISVLSI), pp 153\u2013158","DOI":"10.1109\/ISVLSI.2006.19"},{"key":"5617_CR23","doi-asserted-by":"crossref","first-page":"499","DOI":"10.1016\/j.vlsi.2013.12.001","volume":"47","author":"S Sivanantham","year":"2014","unstructured":"Sivanantham S, Padmavathy M, Gopakumar G, Mallick PS, Perinbam JRP (2014) Enhancement of test data compression with multistage encoding. J Integ VLSI J 47:499\u2013509","journal-title":"J Integ VLSI J"},{"issue":"6","key":"5617_CR24","doi-asserted-by":"crossref","first-page":"719","DOI":"10.1109\/TVLSI.2005.844311","volume":"13","author":"M Tehranipoor","year":"2005","unstructured":"Tehranipoor M, Nourani M, Chakrabarty K (2005) Nine-coded compression technique for testing embedded cores in SoCs. IEEE Trans Very Large Scale Integ (Vlsi) Syst 13(6):719\u2013731","journal-title":"IEEE Trans Very Large Scale Integ (Vlsi) Syst"},{"issue":"2","key":"5617_CR25","doi-asserted-by":"crossref","first-page":"1640","DOI":"10.1109\/TCAD.2010.2051096","volume":"29","author":"V Tenentes","year":"2010","unstructured":"Tenentes V, Kavousianos X, Kalligeros E (2010) Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores. IEEE Trans Comput Aided Des Integr Circuits Syst 29(2):1640\u20131644","journal-title":"IEEE Trans. Comput. Aided Des. Integr. Circuits Syst"},{"issue":"4","key":"5617_CR26","doi-asserted-by":"crossref","first-page":"294","DOI":"10.1109\/MDT.2006.105","volume":"23","author":"NA Touba","year":"2006","unstructured":"Touba NA (2006) Survey of test vector compression techniques. IEEE Des Test Comput 23(4):294\u2013303","journal-title":"IEEE Des. Test Comput"},{"key":"5617_CR27","doi-asserted-by":"crossref","first-page":"393","DOI":"10.1007\/s10836-009-5138-y","volume":"226","author":"W-D Tseng","year":"2010","unstructured":"Tseng W-D, Lee L-J (2010) Test data compression using multi-dimensional pattern run-length codes. J Electron Test 226:393\u2013400","journal-title":"J. Electron. Test"},{"key":"5617_CR28","unstructured":"Wang L., Wen X, Furukawa H., Hsu F. Lin S.,Tsai S.,Abdel-hafez K.S, Wu S. (2004). Virtual Scan: A new compressed scan technology for test cost reduction. In Proceedings IEEE international test conference (ITC), pp 916\u2013925"},{"key":"5617_CR29","doi-asserted-by":"publisher","first-page":"849","DOI":"10.1007\/s10836-013-5415-7","volume":"29","author":"T Wu","year":"2013","unstructured":"Wu T, Liu H, Liu PJ (2013) Efficient Test compression technique for SoC based on block merging and eight coding. J Electron Test 29:849\u2013859. doi: 10.1007\/s10836-013-5415-7","journal-title":"J. Electron. Test"},{"issue":"8","key":"5617_CR30","doi-asserted-by":"crossref","first-page":"1219","DOI":"10.1109\/TCAD.2014.2314307","volume":"33","author":"JS Yang","year":"2014","unstructured":"Yang JS, Lee J, Touba NA (2014) Utilizing ATE Vector repeat with linear decompressor for test vector compression. IEEE Trans Comput-Aided Des Integ Circuits Syst 33(8):1219\u20131230","journal-title":"IEEE Trans Comput-Aided Des Integ Circuits Syst"},{"issue":"2","key":"5617_CR31","doi-asserted-by":"crossref","first-page":"324","DOI":"10.1109\/TVLSI.2008.2009873","volume":"18","author":"M Yi","year":"2010","unstructured":"Yi M, Liang H, Zhang L, Zhan W (2010) A novel x-ploiting strategy for improving performance of test data compression. IEEE Trans VLSI Syst 18(2):324\u2013329","journal-title":"IEEE Trans VLSI Syst"},{"key":"5617_CR32","doi-asserted-by":"crossref","first-page":"237","DOI":"10.1007\/s10836-014-5441-0","volume":"30","author":"H Yuan","year":"2014","unstructured":"Yuan H, Mei J, Song H, Guo K (2014) Test data compression for system-on-a-chip using count compatible pattern Run-length coding. J Electron Test 30:237\u2013242","journal-title":"J. Electron. Test"},{"key":"5617_CR33","doi-asserted-by":"crossref","first-page":"81","DOI":"10.1016\/j.vlsi.2009.06.001","volume":"43","author":"B Zhou","year":"2010","unstructured":"Zhou B, Y-Zheng Y, Li Z, Zhang J, Wu X, Ke R (2010) A test set embedding approach based on twisted-ring counter with few seeds. Integr VLSI J 43:81\u2013100","journal-title":"Integr. VLSI J"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5617-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-016-5617-x\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5617-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T22:07:24Z","timestamp":1498342044000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-016-5617-x"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10,26]]},"references-count":33,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2016,12]]}},"alternative-id":["5617"],"URL":"https:\/\/doi.org\/10.1007\/s10836-016-5617-x","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2016,10,26]]}}}