{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T22:00:42Z","timestamp":1766268042085},"reference-count":35,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2016,11,8]],"date-time":"2016-11-08T00:00:00Z","timestamp":1478563200000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"funder":[{"name":"Technology Foundation Program of National Defense","award":["Z132014B002"],"award-info":[{"award-number":["Z132014B002"]}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2016,12]]},"DOI":"10.1007\/s10836-016-5620-2","type":"journal-article","created":{"date-parts":[[2016,11,8]],"date-time":"2016-11-08T01:42:16Z","timestamp":1478569336000},"page":"661-679","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":15,"title":["Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances"],"prefix":"10.1007","volume":"32","author":[{"given":"Yiqian","family":"Cui","sequence":"first","affiliation":[]},{"given":"Junyou","family":"Shi","sequence":"additional","affiliation":[]},{"given":"Zili","family":"Wang","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2016,11,8]]},"reference":[{"key":"5620_CR1","doi-asserted-by":"crossref","first-page":"59","DOI":"10.1007\/BF00137565","volume":"9","author":"A Abderrahman","year":"1996","unstructured":"Abderrahman A, Kaminska B, Cerny E (1996) Optimization-based multifrequency test generation for analog circuits. J Electron Test 9:59\u201373","journal-title":"J Electron Test"},{"key":"5620_CR2","doi-asserted-by":"crossref","first-page":"2175","DOI":"10.1109\/TIM.2007.908152","volume":"56","author":"P Bilski","year":"2007","unstructured":"Bilski P, Wojciechowski JM (2007) Automated diagnostics of analog systems using fuzzy logic approach. IEEE Trans Instrum Meas 56:2175\u20132185","journal-title":"IEEE Trans Instrum Meas"},{"key":"5620_CR3","doi-asserted-by":"crossref","first-page":"73","DOI":"10.1016\/S0263-2241(01)00049-5","volume":"32","author":"M Catelani","year":"2002","unstructured":"Catelani M, Fort A, Alippi C (2002) A fuzzy approach for soft fault detection in analog circuits. Measurement 32:73\u201383","journal-title":"Measurement"},{"key":"5620_CR4","doi-asserted-by":"crossref","first-page":"65","DOI":"10.1002\/cta.180","volume":"30","author":"YH Chang","year":"2002","unstructured":"Chang YH (2002) Frequency\u2013domain grouping robust fault diagnosis for analog circuits with uncertainties. Int J Circuit Theory Applications 30:65\u201386","journal-title":"Int J Circuit Theory Applications"},{"key":"5620_CR5","doi-asserted-by":"crossref","first-page":"192","DOI":"10.1016\/j.ress.2014.09.015","volume":"133","author":"Y Cui","year":"2015","unstructured":"Cui Y, Shi J, Wang Z (2015) An analytical model of electronic fault diagnosis on extension of the dependency theory. Reliab Eng Syst Saf 133:192\u2013202","journal-title":"Reliab Eng Syst Saf"},{"key":"5620_CR6","unstructured":"Frank E, Witten IH (1998) Generating accurate rule stes without global optimization. Proceedings of the 15th Internatinal Conference Machine Learning (ICML '98), 144--151"},{"key":"5620_CR7","doi-asserted-by":"crossref","first-page":"117","DOI":"10.1109\/TCSII.2006.884112","volume":"54","author":"T Golonek","year":"2007","unstructured":"Golonek T, Rutkowski J (2007) Genetic-algorithm-based method for optimal analog test points selection. IEEE Trans Circuits Syst II: Express Briefs 54:117\u2013121","journal-title":"IEEE Trans Circuits Syst II: Express Briefs"},{"key":"5620_CR8","doi-asserted-by":"crossref","first-page":"523","DOI":"10.1109\/TCS.1979.1084665","volume":"26","author":"W Hochwald","year":"1979","unstructured":"Hochwald W, Bastian JD (1979) A DC approach for analog fault dictionary determination. IEEE Trans Circuits Syst 26:523\u2013529","journal-title":"IEEE Trans Circuits Syst"},{"key":"5620_CR9","first-page":"769","volume":"14","author":"D Horn","year":"2001","unstructured":"Horn D, Gottlieb A (2001a) The method of quantum clustering. Adv Neural Inf Proces Syst 14:769\u2013776","journal-title":"Adv Neural Inf Proces Syst"},{"key":"5620_CR10","doi-asserted-by":"crossref","unstructured":"Horn D, Gottlieb A (2001b) Algorithm for data clustering in pattern recognition problems based on quantum mechanics. Phys Rev Lett 88(1):261--268","DOI":"10.1103\/PhysRevLett.88.018702"},{"key":"5620_CR11","unstructured":"K.B. Irani, (1993) Multi-interval discretization of continuous-valued attributes for classification learning, Proc. 13th International Joint Conference on Artificial Intelligence, pp. 1022\u20131027"},{"key":"5620_CR12","doi-asserted-by":"crossref","first-page":"1634","DOI":"10.1109\/TIM.2009.2021643","volume":"59","author":"R Jiang","year":"2010","unstructured":"Jiang R, Wang H, Tian S, Long B (2010) Multidimensional fitness function DPSO algorithm for analog test point selection. IEEE Trans Instrum Meas 59:1634\u20131641","journal-title":"IEEE Trans Instrum Meas"},{"key":"5620_CR13","doi-asserted-by":"crossref","first-page":"491","DOI":"10.1007\/s10470-012-9987-4","volume":"75","author":"H Lei","year":"2013","unstructured":"Lei H, Qin K (2013) Quantum-inspired evolutionary algorithm for analog test point selection. Analog Integr Circ Sig Process 75:491\u2013498","journal-title":"Analog Integr Circ Sig Process"},{"key":"5620_CR14","doi-asserted-by":"crossref","first-page":"371","DOI":"10.1007\/s10470-014-0273-5","volume":"79","author":"H Lei","year":"2014","unstructured":"Lei H, Qin K (2014) Greedy randomized adaptive search procedure for analog test point selection. Analog Integr Circ Sig Process 79:371\u2013383","journal-title":"Analog Integr Circ Sig Process"},{"key":"5620_CR15","doi-asserted-by":"crossref","first-page":"185","DOI":"10.1007\/s10470-015-0565-4","volume":"84","author":"H Lei","year":"2015","unstructured":"Lei H, Qin K (2015) A general method for analog test point selection using multi-frequency analysis. Analog Integr Circ Sig Process 84:185","journal-title":"Analog Integr Circ Sig Process"},{"key":"5620_CR16","doi-asserted-by":"crossref","first-page":"149","DOI":"10.1002\/cta.4490130205","volume":"13","author":"P Lin","year":"1985","unstructured":"Lin P, Elcherif Y (1985) Analogue circuits fault dictionary\u2014new approaches and implementation. Int J Circuit Theory Applications 13:149\u2013172","journal-title":"Int J Circuit Theory Applications"},{"key":"5620_CR17","doi-asserted-by":"crossref","unstructured":"Manetti S, Piccirilli M, Liberatore A (1990) Automatic test point selection for linear analog network fault diagnosis, Proc. IEEE international symposium on circuits and systems, pp. 25\u201328","DOI":"10.1109\/ISCAS.1990.111904"},{"key":"5620_CR18","doi-asserted-by":"crossref","first-page":"317","DOI":"10.1016\/j.microrel.2010.01.006","volume":"50","author":"M Pecht","year":"2010","unstructured":"Pecht M, Jaai R (2010) A prognostics and health management roadmap for information and electronics-rich systems. Microelectron Reliab 50:317\u2013323","journal-title":"Microelectron Reliab"},{"key":"5620_CR19","doi-asserted-by":"crossref","unstructured":"Pinjala KK, Kim BC (2003) An approach for selection of test points for analog fault diagnosis. Proc. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 287\u2013294","DOI":"10.1109\/DFTVS.2003.1250123"},{"key":"5620_CR20","doi-asserted-by":"crossref","first-page":"1289","DOI":"10.1109\/19.893273","volume":"49","author":"V Prasad","year":"2000","unstructured":"Prasad V, Babu N (2000) Selection of test nodes for analog fault diagnosis in dictionary approach. IEEE Trans Instrum Meas 49:1289\u20131297","journal-title":"IEEE Trans Instrum Meas"},{"key":"5620_CR21","unstructured":"Ram RB, Moorthy VP, Devarajan N (2009) Fuzzy based time domain analysis approach for fault diagnosis of analog electronic circuits, Proc. IEEE International Conference on Control, Automation, Communication and Energy Conservation, pp. 1\u20136"},{"key":"5620_CR22","doi-asserted-by":"crossref","unstructured":"Sheppard JW, Butcher SG (2007) A formal analysis of fault diagnosis with D-matrices. J Electron Test 23:309\u2013322","DOI":"10.1007\/s10836-006-0628-7"},{"key":"5620_CR23","doi-asserted-by":"crossref","first-page":"131","DOI":"10.1007\/s101150050007","volume":"2","author":"JA Starzyk","year":"2000","unstructured":"Starzyk JA, Nelson DE, Sturtz K (2000) A mathematical foundation for improved reduct generation in information systems. Knowl Inf Syst 2:131\u2013146","journal-title":"Knowl Inf Syst"},{"key":"5620_CR24","doi-asserted-by":"crossref","first-page":"754","DOI":"10.1109\/TIM.2004.827085","volume":"53","author":"J Starzyk","year":"2004","unstructured":"Starzyk J, Liu D, Liu Z-H, Nelson DE, Rutkowski JO (2004) Entropy-based optimum test points selection for analog fault dictionary techniques. IEEE Trans Instrum Meas 53:754\u2013761","journal-title":"IEEE Trans Instrum Meas"},{"key":"5620_CR25","doi-asserted-by":"crossref","first-page":"406","DOI":"10.1109\/TIM.1987.6312710","volume":"1001","author":"GN Stenbakken","year":"1987","unstructured":"Stenbakken GN, Souders TM (1987) Test-point selection and testability measures via QR factorization of linear models. IEEE Trans Instrum Meas 1001:406\u2013410","journal-title":"IEEE Trans Instrum Meas"},{"key":"5620_CR26","doi-asserted-by":"crossref","first-page":"1041","DOI":"10.1002\/cta.770","volume":"40","author":"M Tadeusiewicz","year":"2012","unstructured":"Tadeusiewicz M, Ha\u0142gas S, Korzybski M (2012) Multiple catastrophic fault diagnosis of analog circuits considering the component tolerances. Int J Circuit Theory Applications 40:1041\u20131052","journal-title":"Int J Circuit Theory Applications"},{"key":"5620_CR27","doi-asserted-by":"crossref","unstructured":"Van Spaandonk J, Kevenaar TA, (1996) Iterative test-point selection for analog circuits. Proceedings of 14th VLSI Test Symposium, 1996., IEEE, pp. 66\u201371","DOI":"10.1109\/VTEST.1996.510837"},{"key":"5620_CR28","doi-asserted-by":"crossref","first-page":"222","DOI":"10.1109\/TCAPT.2006.870387","volume":"29","author":"NM Vichare","year":"2006","unstructured":"Vichare NM, Pecht MG (2006) Prognostics and health management of electronics. IEEE Trans Compon Packag Technol 29:222\u2013229","journal-title":"IEEE Trans Compon Packag Technol"},{"key":"5620_CR29","doi-asserted-by":"crossref","first-page":"2118","DOI":"10.1109\/TCSI.2005.853266","volume":"52","author":"P Wang","year":"2005","unstructured":"Wang P, Yang S (2005) A new diagnosis approach for handling tolerance in analog and mixed-signal circuits by using fuzzy math. IEEE Trans Circuits Syst I: Regular Papers 52:2118\u20132127","journal-title":"IEEE Trans Circuits Syst I: Regular Papers"},{"key":"5620_CR30","doi-asserted-by":"crossref","first-page":"2145","DOI":"10.1109\/TIM.2008.2006725","volume":"58","author":"C Yang","year":"2009","unstructured":"Yang C, Tian S, Long B (2009) Application of heuristic graph search to test-point selection for analog fault dictionary techniques. IEEE Trans Instrum Meas 58:2145\u20132158","journal-title":"IEEE Trans Instrum Meas"},{"key":"5620_CR31","doi-asserted-by":"crossref","first-page":"349","DOI":"10.1007\/s10470-009-9369-8","volume":"63","author":"C Yang","year":"2010","unstructured":"Yang C, Tian S, Long B, Chen F (2010) A test points selection method for analog fault dictionary techniques. Analog Integr Circ Sig Process 63:349\u2013357","journal-title":"Analog Integr Circ Sig Process"},{"key":"5620_CR32","doi-asserted-by":"crossref","first-page":"176","DOI":"10.1109\/TIM.2010.2050356","volume":"60","author":"C Yang","year":"2011","unstructured":"Yang C, Tian S, Long B, Chen F (2011) Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis. IEEE Trans Instrum Meas 60:176\u2013185","journal-title":"IEEE Trans Instrum Meas"},{"key":"5620_CR33","doi-asserted-by":"crossref","first-page":"435","DOI":"10.1007\/s10470-014-0469-8","volume":"82","author":"D Zhao","year":"2015","unstructured":"Zhao D, He Y (2015a) A new test points selection method for analog fault dictionary techniques. Analog Integr Circ Sig Process 82:435\u2013448","journal-title":"Analog Integr Circ Sig Process"},{"key":"5620_CR34","doi-asserted-by":"crossref","unstructured":"Zhao D, He Y (2015b) Chaotic binary bat algorithm for analog test point selection. Analog Integr Circ Sig Process:1\u201314","DOI":"10.1007\/s10470-015-0548-5"},{"key":"5620_CR35","doi-asserted-by":"crossref","unstructured":"Zhao D, He Y (2015) A new test point selection method for analog circuit. J Electron Test 31:53\u201366","DOI":"10.1007\/s10836-015-5506-8"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5620-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-016-5620-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-016-5620-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,15]],"date-time":"2019-09-15T06:46:15Z","timestamp":1568529975000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-016-5620-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11,8]]},"references-count":35,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2016,12]]}},"alternative-id":["5620"],"URL":"https:\/\/doi.org\/10.1007\/s10836-016-5620-2","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,11,8]]}}}