{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T16:30:16Z","timestamp":1764174616946,"version":"3.37.3"},"reference-count":56,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2019,2]]},"DOI":"10.1007\/s10836-019-05778-z","type":"journal-article","created":{"date-parts":[[2019,2,4]],"date-time":"2019-02-04T04:03:18Z","timestamp":1549252998000},"page":"9-27","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["Fault Tolerant Soft-Core Processor Architecture Based on Temporal Redundancy"],"prefix":"10.1007","volume":"35","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0638-2639","authenticated-orcid":false,"given":"Paulo R. C.","family":"Villa","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rodrigo","family":"Travessini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Roger C.","family":"Goerl","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fabian L.","family":"Vargas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eduardo A.","family":"Bezerra","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2019,2,4]]},"reference":[{"key":"5778_CR1","unstructured":"Aeroflex Gaisler: GRLIB IP Library (2015a) \n                    http:\/\/www.gaisler.com\/index.php\/products\/ipcores\/soclibrary"},{"key":"5778_CR2","unstructured":"Aeroflex Gaisler: LEON3 Processor (2015b) \n                    http:\/\/www.gaisler.com\/index.php\/products\/processors\/leon3"},{"key":"5778_CR3","unstructured":"Aeroflex Gaisler: LEON3FT-RTAX Fault-tolerant Processor (2015c) \n                    http:\/\/www.gaisler.com\/index.php\/products\/components\/leon3ft-rtax"},{"issue":"1","key":"5778_CR4","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1166\/jctn.2018.7119","volume":"15","author":"FSM Alkhafaji","year":"2018","unstructured":"Alkhafaji FSM, Hasan WZW, Isa MM, Sulaiman N (2018) Robotic controller: ASIC versus FPGA - a review. J Comput Theor Nanosci 15(1):1\u201325","journal-title":"J Comput Theor Nanosci"},{"key":"5778_CR5","unstructured":"Altera Tech. (2013) White paper: Introduction to single-event upsets"},{"key":"5778_CR6","doi-asserted-by":"publisher","unstructured":"Argyrides C, Pradhan DK, Kocak T (2011) Matrix Codes for Reliable and Cost Efficient Memory Chips, vol 19. \n                    https:\/\/doi.org\/10.1109\/TVLSI.2009.2036362\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/5352255\/","DOI":"10.1109\/TVLSI.2009.2036362"},{"issue":"1","key":"5778_CR7","doi-asserted-by":"publisher","first-page":"11","DOI":"10.1109\/TDSC.2004.2","volume":"1","author":"A Avizienis","year":"2004","unstructured":"Avizienis A, Laprie JC, Randell B, Landwehr C (2004) Basic concepts and taxonomy of dependable and secure computing. IEEE Trans Dependable Secure Comput 1(1):11\u201333. \n                    https:\/\/doi.org\/10.1109\/TDSC.2004.2\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/lpdocs\/epic03\/wrapper.htm?arnumber=1335465","journal-title":"IEEE Trans Dependable Secure Comput"},{"issue":"02","key":"5778_CR8","doi-asserted-by":"publisher","first-page":"C02,088","DOI":"10.1088\/1748-0221\/11\/02\/C02088","volume":"11","author":"SHI Barboza","year":"2016","unstructured":"Barboza SHI, Bregant M, Chambert V, Espagnon B, Herrera HDH, Mahmood SM, Moraes D, Munhoz MG, No\u0117l G, Pilyar a et al (2016) SAMPA chip: a new ASIC for the ALICE TPC and MCH upgrades. J Instrum 11(02):C02,088","journal-title":"J Instrum"},{"key":"5778_CR9","doi-asserted-by":"publisher","unstructured":"Barnaby HJ (2006) Total-Ionizing-Dose Effects in Modern CMOS Technologies, vol 53. \n                    https:\/\/doi.org\/10.1109\/TNS.2006.885952\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/4033191\/","DOI":"10.1109\/TNS.2006.885952"},{"key":"5778_CR10","volume-title":"Reconfigurable field programmable gate arrays for mission-critical applications","author":"N Battezzati","year":"2010","unstructured":"Battezzati N, Sterpone L, Violante M (2010) Reconfigurable field programmable gate arrays for mission-critical applications. Springer, Berlin. \n                    https:\/\/books.google.com.br\/books?hl=en&lr=&id=iVScPZCgp_EC&oi=fnd&pg=PP5&dq=reconfigurable+field+programmable+gate+arrays+for+mission-critical+applications&ots=fjBZtSQupc&sig=jx3fKoLJ61msyfpPwqZJVTtT5lo"},{"key":"5778_CR11","doi-asserted-by":"publisher","unstructured":"Baumann R (2003) Impact of Single-Event Upsets in Deep-Submicron Silicon Technology. \n                    https:\/\/doi.org\/10.1557\/mrs2003.38\n                    \n                  . \n                    http:\/\/journals.cambridge.org\/abstract_S0883769400017516","DOI":"10.1557\/mrs2003.38"},{"issue":"2","key":"5778_CR12","doi-asserted-by":"publisher","first-page":"373","DOI":"10.1007\/s11390-015-1530-5","volume":"30","author":"C Bernardeschi","year":"2015","unstructured":"Bernardeschi C, Cassano L, Domenici A (2015) SRAM-based FPGA Systems for Safety-Critical Applications: A Survey on Design Standards and Proposed Methodologies. J Comput Sci Technol 30(2):373\u2013390. \n                    https:\/\/doi.org\/10.1007\/s11390-015-1530-5","journal-title":"J Comput Sci Technol"},{"key":"5778_CR13","doi-asserted-by":"crossref","unstructured":"Bouhali M, Shamani F, Dahmane ZE, Belaidi A, Nurmi J (2017) FPGA applications in unmanned aerial vehicles - a review. In: Wong S, Beck AC, Bertels K, Carro L (eds) Proceedings of Applied reconfigurable computing. Springer International Publishing, Cham, pp 217\u2013228","DOI":"10.1007\/978-3-319-56258-2_19"},{"key":"5778_CR14","doi-asserted-by":"publisher","unstructured":"Castro HdS, da Silveira JAN, Coelho AAP, e Silva FGA, Magalhaes PdS, de Lima OA (2016) A correction code for multiple cells upsets in memory devices for space applications. In: Proceedings of 2016 14th IEEE International New Circuits and Systems Conference (NEWCAS). IEEE, pp 1\u20134. \n                    https:\/\/doi.org\/10.1109\/NEWCAS.2016.7604783\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/7604783\/","DOI":"10.1109\/NEWCAS.2016.7604783"},{"key":"5778_CR15","doi-asserted-by":"publisher","unstructured":"Cetin E, Diessel O, Li T, Ambrose JA, Fisk T, Parameswaran S, Dempster AG (2016) Overview and Investigation of SEU Detection and Recovery Approaches for FPGA-Based Heterogeneous Systems. In: Proceedings of the FPGAs and Parallel Architectures for Aerospace Applications. Springer International Publishing, Cham, pp 33\u201346. \n                    https:\/\/doi.org\/10.1007\/978-3-319-14352-1_3","DOI":"10.1007\/978-3-319-14352-1_3"},{"key":"5778_CR16","doi-asserted-by":"publisher","unstructured":"de Oliveira AB, Tambara LA, Kastensmidt FL (2017) Applying lockstep in dual-core ARM Cortex-A9 to mitigate radiation-induced soft errors. In: Proceedings of the 2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS). IEEE, pp 1\u20134. \n                    https:\/\/doi.org\/10.1109\/LASCAS.2017.7948063\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/7948063\/","DOI":"10.1109\/LASCAS.2017.7948063"},{"key":"5778_CR17","unstructured":"EEJournal: The Biggest SoC\/FPGAs (2017). \n                    https:\/\/www.eejournal.com\/article\/the-biggest-socfpgas\/"},{"key":"5778_CR18","doi-asserted-by":"publisher","unstructured":"Ferlini F, da Silva FA, Bezerra E, Lettnin DV (2012) Non-intrusive fault tolerance in soft processors through circuit duplication. In: Proceedings of 2012 13th Latin American Test Workshop (LATW). IEEE, pp 1\u20136. \n                    https:\/\/doi.org\/10.1109\/LATW.2012.6261264\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/lpdocs\/epic03\/wrapper.htm?arnumber=6261264","DOI":"10.1109\/LATW.2012.6261264"},{"key":"5778_CR19","doi-asserted-by":"publisher","unstructured":"Friend RB, Arroyo C, Hansen J (2016) Big Missions, Small Solutions Advances and Innovation in Architecture and Technology for Small Satellites. In: Proceedings of the AIAA SPACE 2016. American Institute of Aeronautics and Astronautics, Reston, Virginia. \n                    https:\/\/doi.org\/10.2514\/6.2016-5229","DOI":"10.2514\/6.2016-5229"},{"key":"5778_CR20","unstructured":"Glein R (2014) BRAM radiation sensor for a Self-Adaptative SEU mitigation. In: Proceedings of the Space FPGA users workshop"},{"key":"5778_CR21","volume-title":"Software-implemented hardware fault tolerance","author":"O Goloubeva","year":"2006","unstructured":"Goloubeva O, Rebaudengo M, Reorda M, Violante M (2006) Software-implemented hardware fault tolerance. Springer, Berlin. \n                    https:\/\/books.google.com.br\/books?hl=en&lr=&id=qX9GAAAAQBAJ&oi=fnd&pg=PA1&dq=software+implemented+hardware+fault-tolerance&ots=owaXCAdHzD&sig=G5Ql7eRDVfTwvyZRIrP4zYxQsw8"},{"key":"5778_CR22","doi-asserted-by":"publisher","unstructured":"Guthaus MR, Ringenberg JS, Ernst D, Austin TM, Mudge T, Brown RB (2001) Mibench: a free, commercially representative embedded benchmark suite. In: Proceedings of 2001 IEEE international workshop workload characterization, WWC\u201901. IEEE Computer Society, Washington, pp 3\u201314. \n                    https:\/\/doi.org\/10.1109\/WWC.2001.15","DOI":"10.1109\/WWC.2001.15"},{"key":"5778_CR23","doi-asserted-by":"publisher","unstructured":"Guzman-Miranda H, Aguirre M, Tombs J (2009) Noninvasive Fault Classification, Robustness and Recovery Time Measurement in Microprocessor-Type Architectures Subjected to Radiation-Induced Errors, vol 58. \n                    https:\/\/doi.org\/10.1109\/TIM.2009.2014603\n                    \n                  \n                           \n                    https:\/\/doi.org\/10.1109\/TIM.2009.2014603\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/4787115\/","DOI":"10.1109\/TIM.2009.2014603 10.1109\/TIM.2009.2014603"},{"key":"5778_CR24","unstructured":"Guzma\u0307n D, Rowland D, Uribe P, Nieves T (2011) A Low Power Processors for Cubesat Missions. In: Proceedings of the 8th annual cubesat developer\u2019s workshop 2011"},{"key":"5778_CR25","doi-asserted-by":"publisher","unstructured":"Henkel J, Bauer L, Dutt N, Gupta P, Nassif S, Shafique M, Tahoori M, Wehn N (2013) Reliable On-chip Systems in the Nano-era: Lessons Learnt and Future Trends. In: Proceedings of the 50th annual design automation conference, DAC\u201913. ACM, New York, pp 99:1\u201399:10. \n                    https:\/\/doi.org\/10.1145\/2463209.2488857","DOI":"10.1145\/2463209.2488857"},{"issue":"4","key":"5778_CR26","doi-asserted-by":"publisher","first-page":"1927","DOI":"10.1109\/TNS.2011.2128881","volume":"58","author":"FL Kastensmidt","year":"2011","unstructured":"Kastensmidt FL, Fonseca ECP, Vaz RG, Goncalez OL, Chipana R, Wirth GI (2011) TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in Propagation-Delay Degradation. IEEE Trans Nuclear Sci 58(4):1927\u20131934. \n                    https:\/\/doi.org\/10.1109\/TNS.2011.2128881\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/lpdocs\/epic03\/wrapper.htm?arnumber=5752883","journal-title":"IEEE Trans Nuclear Sci"},{"issue":"1","key":"5778_CR27","doi-asserted-by":"publisher","first-page":"519","DOI":"10.1109\/TNS.2016.2635028","volume":"64","author":"AM Keller","year":"2017","unstructured":"Keller AM, Wirthlin MJ (2017) Benefits of Complementary SEU Mitigation for the LEON3 Soft Processor on SRAM-Based FPGAs. IEEE Trans Nuclear Sci 64(1):519\u2013528. \n                    https:\/\/doi.org\/10.1109\/TNS.2016.2635028\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/7763831\/","journal-title":"IEEE Trans Nuclear Sci"},{"issue":"1-4","key":"5778_CR28","doi-asserted-by":"publisher","first-page":"127","DOI":"10.1007\/s11214-013-9993-6","volume":"179","author":"CA Kletzing","year":"2013","unstructured":"Kletzing CA, Kurth WS, Acuna M, MacDowall RJ, Torbert RB, Averkamp T, Bodet D, Bounds SR, Chutter M, Connerney J, Crawford D, Dolan JS, Dvorsky R, Hospodarsky GB, Howard J, Jordanova V, Johnson RA, Kirchner DL, Mokrzycki B, Needell G, Odom J, Mark D, Pfaff R, Phillips JR, Piker CW, Remington SL, Rowland D, Santolik O, Schnurr R, Sheppard D, Smith CW, Thorne RM, Tyler J (2013) The electric and magnetic field instrument suite and integrated science (EMFISIS) on RBSP. Space Sci Rev 179(1-4):127\u2013181. \n                    https:\/\/doi.org\/10.1007\/s11214-013-9993-6","journal-title":"Space Sci Rev"},{"key":"5778_CR29","volume-title":"Fault-tolerant systems","author":"I Koren","year":"2010","unstructured":"Koren I, Krishna C (2010) Fault-tolerant systems. Morgan Kaufmann, San Mateo. \n                    https:\/\/books.google.com.br\/books?hl=en&lr=&id=oPjbo4Wvp8C&oi=fnd&pg=PR11&dq=fault+tolerant+systems+koren&ots=RYPEQBzbyA&sig=pMKkYxL70ahe4U4U3hTKWLlrR3Y"},{"key":"5778_CR30","doi-asserted-by":"publisher","unstructured":"Lesage L, Mejias B, Lobelle M (2011) A software based approach to eliminate all SEU effects from mission critical programs. In: Proceedings of the 2011 12th European Conference on Radiation and Its Effects on Components and Systems. IEEE, pp 467\u2013472. \n                    https:\/\/doi.org\/10.1109\/RADECS.2011.6131353\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/6131353\/","DOI":"10.1109\/RADECS.2011.6131353"},{"issue":"4","key":"5778_CR31","doi-asserted-by":"publisher","first-page":"647","DOI":"10.1109\/TC.2016.2606378","volume":"66","author":"T Li","year":"2017","unstructured":"Li T, Shafique M, Ambrose JA, Henkel J, Parameswaran S (2017) Fine-Grained Checkpoint Recovery for Application-Specific Instruction-Set Processors. IEEE Trans Comput 66(4):647\u2013660. \n                    https:\/\/doi.org\/10.1109\/TC.2016.2606378\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/7562290\/","journal-title":"IEEE Trans Comput"},{"issue":"1","key":"5778_CR32","doi-asserted-by":"publisher","first-page":"374","DOI":"10.1109\/TNS.2016.2636574","volume":"64","author":"A Lindoso","year":"2017","unstructured":"Lindoso A, Entrena L, Garcia-Valderas M, Parra L (2017) A Hybrid Fault-Tolerant LEON3 Soft Core Processor Implemented in Low-End SRAM FPGA. IEEE Trans Nuclear Sci 64(1):374\u2013381. \n                    https:\/\/doi.org\/10.1109\/TNS.2016.2636574\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/7776886\/","journal-title":"IEEE Trans Nuclear Sci"},{"key":"5778_CR33","doi-asserted-by":"publisher","unstructured":"Martins VMG, Villa PRC, Neto HCC, Bezerra E (2015) A TMR Strategy with Enhanced Dependability Features Based on a Partial Reconfiguration Flow. In: Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI. IEEE, pp 161\u2013166. \n                    https:\/\/doi.org\/10.1109\/ISVLSI.2015.84\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/lpdocs\/epic03\/wrapper.htm?arnumber=7309556\n                    \n                  \n                           \n                    http:\/\/ieeexplore.ieee.org\/document\/7309556\/","DOI":"10.1109\/ISVLSI.2015.84"},{"key":"5778_CR34","unstructured":"Microsemi Inc. (2017) ProASIC3 FPGA. \n                    https:\/\/www.microsemi.com\/products\/fpga-soc\/fpga\/proasic3-overview"},{"key":"5778_CR35","unstructured":"Microsemi Inc. (2018) Power Estimators and Calculators. \n                    https:\/\/www.microsemi.com\/products\/fpga-soc\/design-resources\/power-calculator"},{"key":"5778_CR36","doi-asserted-by":"publisher","unstructured":"Mogollon J, Guzman-Miranda H, Napoles J, Barrientos J, Aguirre M (2011) FTUNSHADES2: A novel platform for early evaluation of robustness against SEE. In: Proceedings of the 2011 12th European Conference on Radiation and Its Effects on Components and Systems. IEEE, pp 169\u2013174. \n                    https:\/\/doi.org\/10.1109\/RADECS.2011.6131392\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/6131392\/","DOI":"10.1109\/RADECS.2011.6131392"},{"key":"5778_CR37","doi-asserted-by":"publisher","unstructured":"Norton CD, Werne TA, Pingree PJ, Geier S (2009) An evaluation of the Xilinx Virtex-4 FPGA for on-board processing in an advanced imaging system. In: Proceedings of the 2009 IEEE Aerospace conference. IEEE, pp 1\u20139. \n                    https:\/\/doi.org\/10.1109\/AERO.2009.4839460\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/abstract\/document\/4839460\/","DOI":"10.1109\/AERO.2009.4839460"},{"key":"5778_CR38","unstructured":"Petkov M (2003) The effects of space environments on electronic components. In: JPL Technical Report Server 1992+. \n                    https:\/\/trs.jpl.nasa.gov\/handle\/2014\/7193"},{"key":"5778_CR39","doi-asserted-by":"publisher","unstructured":"Ragel R, Parameswaran S (2012) Reli: Hardware\/software Checkpoint and Recovery scheme for embedded processors. In: Proceedings of the 2012 Design, Automation & Test in Europe Conference &Exhibition (DATE). IEEE, pp 875\u2013880. \n                    https:\/\/doi.org\/10.1109\/DATE.2012.6176621\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/lpdocs\/epic03\/wrapper.htm?arnumber=6176621","DOI":"10.1109\/DATE.2012.6176621"},{"key":"5778_CR40","doi-asserted-by":"publisher","unstructured":"Reorda M, Violante M, Meinhardt C, Reis R (2009) A low-cost SEE mitigation solution for soft-processors embedded in Systems on Programmable Chips. In: 2009 Design, Automation & Test in Europe Conference & Exhibition, pp 352\u2013357. \n                    https:\/\/doi.org\/10.1109\/DATE.2009.5090687\n                    \n                  . \n                    http:\/\/dl.acm.org\/citation.cfm?id=1874620.1874704","DOI":"10.1109\/DATE.2009.5090687"},{"issue":"4","key":"5778_CR41","doi-asserted-by":"publisher","first-page":"853","DOI":"10.1109\/TII.2015.2431223","volume":"11","author":"JJ Rodriguez-Andina","year":"2015","unstructured":"Rodriguez-Andina JJ, Valdes-Pena MD, Moure MJ (2015) Advanced Features and Industrial Applications of FPGAs\u2014A Review. IEEE Trans Ind Inf 11(4):853\u2013864. \n                    https:\/\/doi.org\/10.1109\/TII.2015.2431223\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/7104117\/","journal-title":"IEEE Trans Ind Inf"},{"key":"5778_CR42","doi-asserted-by":"publisher","unstructured":"Sabena D, Sterpone L, Scholzel M, Koal T, Vierhaus HT, Wong S, Glein R, Rittner F, Stender C, Porrmann M, Hagemeyer J (2014) Reconfigurable high performance architectures: How much are they ready for safety-critical applications? In: Proceedings of the 2014 19th IEEE European Test Symposium (ETS). IEEE, pp 1\u20138. \n                    https:\/\/doi.org\/10.1109\/ETS.2014.6847820\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/lpdocs\/epic03\/wrapper.htm?arnumber=6847820","DOI":"10.1109\/ETS.2014.6847820"},{"issue":"2","key":"5778_CR43","doi-asserted-by":"publisher","first-page":"34","DOI":"10.1145\/2671181","volume":"47","author":"F Siegle","year":"2015","unstructured":"Siegle F, Vladimirova T, Ilstad J, Emam O (2015) Mitigation of radiation effects in SRAM-based FPGAs for space applications. ACM Comput Surv 47(2):34. \n                    https:\/\/doi.org\/10.1145\/2671181\n                    \n                  . Article 37","journal-title":"ACM Comput Surv"},{"key":"5778_CR44","unstructured":"Siewiorek D, Swarz R (2017) Reliable computer systems: Design and evaluatuion. Digital Press"},{"key":"5778_CR45","doi-asserted-by":"crossref","unstructured":"Li T, Ambrose JA, Parameswaran S (2016) ReCoRD: Reducing Register Traffic for Checkpointing in Embedded Processors. In: Proceedings of the 2016 Conference on Design, Automation & Test in Europe, DATE\u201916. EDA Consortium, San Jose, pp 582\u2013587. \n                    http:\/\/dl.acm.org\/citation.cfm?id=2971808.2971945\n                    \n                  , \n                    http:\/\/ieeexplore.ieee.org\/xpls\/abs_all.jsp?arnumber=7459379","DOI":"10.3850\/9783981537079_0191"},{"issue":"02","key":"5778_CR46","doi-asserted-by":"publisher","first-page":"107","DOI":"10.1557\/mrs2003.36","volume":"28","author":"HH Tang","year":"2003","unstructured":"Tang HH, Olsson N (2003) Single-Event Upsets in Microelectronics. MRS Bullet 28(02):107\u2013110. \n                    http:\/\/journals.cambridge.org\/abstract_S0883769400017498","journal-title":"MRS Bullet"},{"key":"5778_CR47","doi-asserted-by":"publisher","unstructured":"Torrens G (2017) FPGA-SRAM Soft Error Radiation Hardening. In: Field - Programmable Gate Array. InTech. \n                    https:\/\/doi.org\/10.5772\/66195\n                    \n                  \n                           \n                    https:\/\/doi.org\/10.5772\/66195\n                    \n                  . \n                    http:\/\/www.intechopen.com\/books\/field-programmable-gate-array\/fpga-sram-soft-error-radiation-hardening","DOI":"10.5772\/66195 10.5772\/66195"},{"key":"5778_CR48","doi-asserted-by":"publisher","unstructured":"Travessini R, Villa PRC, Vargas F, Bezerra E (2018) Processor core profiling for SEU effect analysis. In: Proceedings of the 2018 IEEE 19th Latin-American Test Symposium (LATS). IEEE, pp 1\u20136. \n                    https:\/\/doi.org\/10.1109\/LATW.2018.8347235\n                    \n                  . \n                    https:\/\/ieeexplore.ieee.org\/document\/8347235\/","DOI":"10.1109\/LATW.2018.8347235"},{"key":"5778_CR49","unstructured":"U.S. State Department (2018) Directorate of Defense Trade Controls. \n                    http:\/\/pmddtc.state.gov\/index.html"},{"key":"5778_CR50","doi-asserted-by":"publisher","unstructured":"Velazco R, Fouillat P, Reis R (eds) (2007) Radiation Effects on Embedded Systems. Springer, Netherlands. \n                    https:\/\/doi.org\/10.1007\/978-1-4020-5646-8","DOI":"10.1007\/978-1-4020-5646-8"},{"key":"5778_CR51","doi-asserted-by":"publisher","unstructured":"Villa P, Bezerra E, Goerl R, Poehls L, Vargas F, Medina N, Added N, De Aguiar V, MacChione E, Aguirre F, Da Silveira M (2017a) Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID. In: Proceedings of the 2017 11th international workshop on the electromagnetic compatibility of integrated circuits, EMCCompo 2017. \n                    https:\/\/doi.org\/10.1109\/EMCCompo.2017.7998076","DOI":"10.1109\/EMCCompo.2017.7998076"},{"key":"5778_CR52","doi-asserted-by":"publisher","unstructured":"Villa PRC, Goerl RC, Vargas F, Poehls LB, Medina NH, Added N, de Aguiar VAP, Macchione ELA, Aguirre F, da Silveira MAG, Bezerra E Analysis of single-event upsets in a Microsemi ProAsic3E FPGA. In: Proceedings of the 2017 18th IEEE Latin American Test Symposium (LATS). (2017b), pp 1\u20134. IEEE. \n                    https:\/\/doi.org\/10.1109\/LATW.2017.7906772\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/7906772\/","DOI":"10.1109\/LATW.2017.7906772"},{"key":"5778_CR53","doi-asserted-by":"publisher","unstructured":"Villa PRC, Travessini R, Vargas F, Bezerra E (2018) Processor checkpoint recovery for transient faults in critical applications. In: proceedings of the 2018 IEEE 19th Latin-American Test Symposium (LATS). IEEE, pp 1\u20136. \n                    https:\/\/doi.org\/10.1109\/LATW.2018.8349674\n                    \n                  . \n                    https:\/\/ieeexplore.ieee.org\/document\/8349674\/","DOI":"10.1109\/LATW.2018.8349674"},{"key":"5778_CR54","doi-asserted-by":"publisher","unstructured":"Violante M, Meinhardt C, Reis R, Reorda MS (2011) A Low-Cost Solution for Deploying Processor Cores in Harsh Environments, vol 58. \n                    https:\/\/doi.org\/10.1109\/TIE.2011.2134054\n                    \n                  . \n                    http:\/\/ieeexplore.ieee.org\/document\/5740344\/","DOI":"10.1109\/TIE.2011.2134054"},{"key":"5778_CR55","unstructured":"Wilson DS (2011) Cubesat Flight Software Development. In: Proceedings of the 2011 workshop on spacecraft flight software (FSW11). Baltimore"},{"issue":"2","key":"5778_CR56","first-page":"171","volume":"1","author":"H Ziade","year":"2004","unstructured":"Ziade H, Ayoubi RA, Velazco R, et al (2004) A survey on fault injection techniques. Int Arab J Inf Technol 1(2):171\u2013186","journal-title":"Int Arab J Inf Technol"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-019-05778-z\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-019-05778-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-019-05778-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,2,3]],"date-time":"2020-02-03T19:29:47Z","timestamp":1580758187000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-019-05778-z"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,2]]},"references-count":56,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2019,2]]}},"alternative-id":["5778"],"URL":"https:\/\/doi.org\/10.1007\/s10836-019-05778-z","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2019,2]]},"assertion":[{"value":"29 June 2018","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"22 January 2019","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"4 February 2019","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}