{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:50:34Z","timestamp":1761648634149,"version":"3.37.3"},"reference-count":14,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2019,4,12]],"date-time":"2019-04-12T00:00:00Z","timestamp":1555027200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"funder":[{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"crossref","award":["No.HIT.KISTP.201404"],"award-info":[{"award-number":["No.HIT.KISTP.201404"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Harbin science and innovation research special fund","award":["2015RAXXJ003"],"award-info":[{"award-number":["2015RAXXJ003"]}]},{"name":"Special found for development of Shenzhen strategic emerging industries","award":["JCYJ20150625142543456"],"award-info":[{"award-number":["JCYJ20150625142543456"]}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1007\/s10836-019-05794-z","type":"journal-article","created":{"date-parts":[[2019,4,12]],"date-time":"2019-04-12T04:05:16Z","timestamp":1555041916000},"page":"413-420","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":8,"title":["Low Delay 3-Bit Burst Error Correction Codes"],"prefix":"10.1007","volume":"35","author":[{"given":"Jiaqiang","family":"Li","sequence":"first","affiliation":[]},{"given":"Pedro","family":"Reviriego","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1486-6377","authenticated-orcid":false,"given":"Liyi","family":"Xiao","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2019,4,12]]},"reference":[{"key":"5794_CR1","doi-asserted-by":"publisher","first-page":"124","DOI":"10.1147\/rd.282.0124","volume":"28","author":"CL Chen","year":"1984","unstructured":"Chen CL, Hsiao MY (1984) Error-correcting codes for semiconductor memory applications: a state-of-the-art review. IBM J Res Dev 28:124\u2013134. \n                    https:\/\/doi.org\/10.1147\/rd.282.0124","journal-title":"IBM J Res Dev"},{"doi-asserted-by":"publisher","unstructured":"Dutta A, Touba NA (2007) Multiple bit upset tolerant memory using a selective cycle avoidance based SEC-DED-DAEC Code. In: Proceedings of the IEEE VLSI test symmposium, pp 349\u2013354. \n                    https:\/\/doi.org\/10.1109\/VTS.2007.40","key":"5794_CR2","DOI":"10.1109\/VTS.2007.40"},{"key":"5794_CR3","doi-asserted-by":"publisher","DOI":"10.1002\/0471792748","volume-title":"Code design for dependable systems: theory and practical application","author":"E Fujiwara","year":"2006","unstructured":"Fujiwara E (2006) Code design for dependable systems: theory and practical application. Wiley, New Jersey"},{"key":"5794_CR4","doi-asserted-by":"publisher","first-page":"2791","DOI":"10.1109\/TNS.2012.2224373","volume":"59","author":"R Harada","year":"2012","unstructured":"Harada R, Abe S, Fuketa H, Uemura T, Hashimoto M, Watanabe Y (2012) Angular dependency of neutron-induced multiple cell upsets in 65-nm 10T subthreshold SRAM. IEEE Trans Nucl Sci 59:2791\u20132795. \n                    https:\/\/doi.org\/10.1109\/TNS.2012.2224373","journal-title":"IEEE Trans Nucl Sci"},{"key":"5794_CR5","doi-asserted-by":"publisher","first-page":"395","DOI":"10.1147\/rd.144.0395","volume":"14","author":"MY Hsiao","year":"1970","unstructured":"Hsiao MY (1970) A class of optimal minimum odd-weight-column SEC-DED codes. IBM J Res Dev 14:395\u2013401. \n                    https:\/\/doi.org\/10.1147\/rd.144.0395","journal-title":"IBM J Res Dev"},{"key":"5794_CR6","doi-asserted-by":"publisher","first-page":"1527","DOI":"10.1109\/TED.2010.2047907","volume":"57","author":"E Ibe","year":"2010","unstructured":"Ibe E, Taniguchi H, Yahagi Y, Shimbo K, Toba T (2010) Impact of scaling on neutron-induced soft error in SRAMs from a 250 nm to a 22 nm design rule. IEEE Trans Electron Dev 57:1527\u20131538. \n                    https:\/\/doi.org\/10.1109\/TED.2010.2047907","journal-title":"IEEE Trans Electron Dev"},{"key":"5794_CR7","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6715-2","volume-title":"Dependability in electronic systems","author":"N Kanekawa","year":"2011","unstructured":"Kanekawa N, Ibe E, Suga T, Uematsu Y (2011) Dependability in electronic systems. Springer, New York"},{"key":"5794_CR8","doi-asserted-by":"publisher","first-page":"221","DOI":"10.1109\/TVLSI.2017.2766361","volume":"26","author":"J Li","year":"2018","unstructured":"Li J, Reviriego P, Xiao L, Argyrides C, Li J (2018) Extending 3-bit burst error-correction codes with quadruple adjacent error correction. IEEE Trans Very Large Scale Integr Syst (VLSI) 26:221\u2013229. \n                    https:\/\/doi.org\/10.1109\/TVLSI.2017.2766361","journal-title":"IEEE Trans Very Large Scale Integr Syst (VLSI)"},{"key":"5794_CR9","doi-asserted-by":"publisher","first-page":"1912","DOI":"10.1109\/TNS.2016.2547963","volume":"63","author":"A Neale","year":"2016","unstructured":"Neale A, Sachdev M (2016) Neutron radiation induced soft error rates for an adjacent-ECC protected SRAM in 28 nm CMOS. IEEE Trans Nucl Sci 63:1912\u20131917. \n                    https:\/\/doi.org\/10.1109\/TNS.2016.2547963","journal-title":"IEEE Trans Nucl Sci"},{"key":"5794_CR10","doi-asserted-by":"publisher","first-page":"2124","DOI":"10.1109\/TNS.2010.2042818","volume":"57","author":"P Reviriego","year":"2010","unstructured":"Reviriego P, Maestro JA, Baeg S, Wen S, Wong R (2010) Protection of memories suffering MCUs through the selection of the optimal interleaving distance. IEEE Trans Nucl Sci 57:2124\u20132128. \n                    https:\/\/doi.org\/10.1109\/TNS.2010.2042818","journal-title":"IEEE Trans Nucl Sci"},{"key":"5794_CR11","doi-asserted-by":"publisher","first-page":"1603","DOI":"10.1109\/TVLSI.2015.2465846","volume":"24","author":"P Reviriego","year":"2016","unstructured":"Reviriego P, Liu S, Xiao L, Maestro JA (2016) An efficient single and double-adjacent error correcting parallel decoder for the (24,12) extended golay code. IEEE Trans Very Large Scale Integr Syst (VLSI) 24:1603\u20131606. \n                    https:\/\/doi.org\/10.1109\/TVLSI.2015.2465846","journal-title":"IEEE Trans Very Large Scale Integr Syst (VLSI)"},{"key":"5794_CR12","doi-asserted-by":"publisher","first-page":"2332","DOI":"10.1109\/TVLSI.2014.2357476","volume":"23","author":"L Saiz-Adalid","year":"2015","unstructured":"Saiz-Adalid L, Reviriego P, Gil P, Pontarelli S, Maestro JA (2015) MCU tolerance in SRAMs through low-redundancy triple adjacent error correction. IEEE Trans Very Large Scale Integr (VLSI) Syst 23:2332\u20132336. \n                    https:\/\/doi.org\/10.1109\/TVLSI.2014.2357476","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Syst"},{"key":"5794_CR13","doi-asserted-by":"publisher","first-page":"310","DOI":"10.1109\/55.843160","volume":"21","author":"S Satoh","year":"2000","unstructured":"Satoh S, Tosaka Y, Wender SA (2000) Geometric effect of multiple-bit soft errors induced by cosmic ray neutrons on DRAM\u2019s. IEEE Electron Dev Lett 21:310\u2013312. \n                    https:\/\/doi.org\/10.1109\/55.843160","journal-title":"IEEE Electron Dev Lett"},{"doi-asserted-by":"publisher","unstructured":"Tsiligiannis G et al (2013) Multiple-cell-upsets on a commercial 90nm SRAM in dynamic mode. In: Proceedings of the 14th European conference on radiation and its effects on components and systems (RADECS). \n                    https:\/\/doi.org\/10.1109\/RADECS.2013.6937429","key":"5794_CR14","DOI":"10.1109\/RADECS.2013.6937429"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-019-05794-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-019-05794-z\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-019-05794-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,4,10]],"date-time":"2020-04-10T23:10:18Z","timestamp":1586560218000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-019-05794-z"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4,12]]},"references-count":14,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2019,6]]}},"alternative-id":["5794"],"URL":"https:\/\/doi.org\/10.1007\/s10836-019-05794-z","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2019,4,12]]},"assertion":[{"value":"22 December 2018","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"29 March 2019","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"12 April 2019","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}