{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T07:04:36Z","timestamp":1768287876689,"version":"3.49.0"},"reference-count":37,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1007\/s10836-020-05880-7","type":"journal-article","created":{"date-parts":[[2020,6,6]],"date-time":"2020-06-06T17:02:39Z","timestamp":1591462959000},"page":"327-342","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":11,"title":["An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic"],"prefix":"10.1007","volume":"36","author":[{"given":"Sanjoy","family":"Mitra","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7928-9542","authenticated-orcid":false,"given":"Debaprasad","family":"Das","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2020,6,6]]},"reference":[{"issue":"5","key":"5880_CR1","doi-asserted-by":"publisher","first-page":"597","DOI":"10.1109\/43.998630","volume":"21","author":"A Chandra","year":"2002","unstructured":"Chandra A, Chakrabarty K (2002) Low-power scan testing and test data compression for system-on-a-chip. IEEE Trans Comput Aided Des 21(5):597\u2013604","journal-title":"IEEE Trans Comput Aided Des"},{"issue":"8","key":"5880_CR2","doi-asserted-by":"publisher","first-page":"1076","DOI":"10.1109\/TC.2003.1223641","volume":"52","author":"A Chandra","year":"2003","unstructured":"Chandra A, Chakrabarty K (2003) Test Data Compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes. IEEE Trans Comput 52(8):1076\u20131088","journal-title":"IEEE Trans Comput"},{"key":"5880_CR3","doi-asserted-by":"crossref","unstructured":"Feng J, Li G (2008) A test data compression method for system-on-a- chip. In: Proc of the 4th IEEE International Symposium on Electronic Design Test and Applications, Hong Kong China, pp 270\u2013273","DOI":"10.1109\/DELTA.2008.30"},{"issue":"2","key":"5880_CR4","doi-asserted-by":"publisher","first-page":"64","DOI":"10.1109\/MDT.2009.37","volume":"26","author":"LM Denq","year":"2009","unstructured":"Denq LM, Hsing YT, Wu CW (2009) Hybrid BIST scheme for multiple heterogeneous embedded memories. IEEE Des Test Compu 26(2):64\u201372","journal-title":"IEEE Des Test Compu"},{"issue":"3","key":"5880_CR5","doi-asserted-by":"publisher","first-page":"303","DOI":"10.1109\/TC.2007.70794","volume":"57","author":"M Nourani","year":"2008","unstructured":"Nourani M, Tehranipoor M, Ahmed N (2008) Low-transition test pattern generation for BIST-based applications. IEEE Trans Comput 57(3):303\u2013315","journal-title":"IEEE Trans Comput"},{"issue":"2","key":"5880_CR6","doi-asserted-by":"publisher","first-page":"161","DOI":"10.1109\/TCSII.2007.903794","volume":"55","author":"S Lei","year":"2008","unstructured":"Lei S, Hou X, Shao Z, Liang F (2008) A Class of SIC circuits: theory and application in BIST design. IEEE Transactions on Circuits and Systems II 55(2):161\u2013165","journal-title":"IEEE Transactions on Circuits and Systems II"},{"issue":"4","key":"5880_CR7","doi-asserted-by":"publisher","first-page":"545","DOI":"10.1109\/TC.2007.1007","volume":"56","author":"X Ruan","year":"2006","unstructured":"Ruan X, Katti RS (2006) Data-independent pattern run-length compression for testing embedded cores in SoCs. IEEE Trans Comput 56(4):545\u2013556","journal-title":"IEEE Trans Comput"},{"issue":"3","key":"5880_CR8","doi-asserted-by":"publisher","first-page":"155","DOI":"10.1049\/iet-cdt:20070028","volume":"2","author":"AH EI-Maleh","year":"2008","unstructured":"EI-Maleh AH (2008) Test data compression for system-on-a-chip using extended frequency-directed run-length code. IET Computer and Digital Techniques 2(3):155\u2013163","journal-title":"IET Computer and Digital Techniques"},{"issue":"2","key":"5880_CR9","doi-asserted-by":"publisher","first-page":"143","DOI":"10.1049\/iet-cdt:20080012","volume":"3","author":"AH El-Maleh","year":"2009","unstructured":"El-Maleh AH, Ali MI, Yamani AAA (2009) Reconfigurable broadcast scan compression using relaxation-based test vector decomposition. IET Comput Digital Techniques 3(2):143\u2013161","journal-title":"IET Comput Digital Techniques"},{"issue":"5","key":"5880_CR10","doi-asserted-by":"publisher","first-page":"327","DOI":"10.1049\/iet-cdt:20070003","volume":"2","author":"Ah El Maleh","year":"2008","unstructured":"El Maleh Ah (2008) \u2018Efficient test compression technique based on block merging\u2019. IET Computer Digital Techniques 2(5):327\u2013335","journal-title":"IET Computer Digital Techniques"},{"key":"5880_CR11","doi-asserted-by":"publisher","first-page":"393","DOI":"10.1007\/s10836-009-5138-y","volume":"26","author":"WD Tseng","year":"2010","unstructured":"Tseng WD, Lee LJ (2010) Test data compression using multi-dimensional pattern run-length codes. J Electron Test 26:393\u2013400","journal-title":"J Electron Test"},{"issue":"11","key":"5880_CR12","doi-asserted-by":"publisher","first-page":"2556","DOI":"10.1109\/TCAD.2006.873895","volume":"25","author":"AH EI-Maleh","year":"2006","unstructured":"EI-Maleh AH, Khursheed SS, Sait SM (2006) Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation. IEEE Transactions Computer Aided Design Integrated Circuits Systems 25(11):2556\u20132564","journal-title":"IEEE Transactions Computer Aided Design Integrated Circuits Systems"},{"key":"5880_CR13","unstructured":"Sankaralingam R, Oruganti RR, Touba NA (2000) Static compaction techniques to control scan vector power dissipation. In: Proc of the 18th IEEE VLSI Test Symposium"},{"issue":"8","key":"5880_CR14","doi-asserted-by":"publisher","first-page":"1076","DOI":"10.1109\/TC.2003.1223641","volume":"52","author":"A Chandra","year":"2003","unstructured":"Chandra A, Chakrabarty K (2003) Test data compression and test resource partitioning for system on a chip using frequency directed run length (FDR) codes. IEEE Trans Comput 52(8):1076\u20131088","journal-title":"IEEE Trans Comput"},{"key":"5880_CR15","doi-asserted-by":"crossref","unstructured":"Reddy SM, Pomeranz I, Kajihara S (1996) On the effects of test compaction on defect coverage. In: Proc of the IEEE VLSI Test Symposium, Princeton, NJ, pp 430\u2013435","DOI":"10.1109\/VTEST.1996.510889"},{"issue":"6","key":"5880_CR16","doi-asserted-by":"publisher","first-page":"783","DOI":"10.1109\/TCAD.2003.811451","volume":"22","author":"PT Gonciari","year":"2003","unstructured":"Gonciari PT, Al Hashimi BM, Nicolici N (2003) Variable length input Huffman coding for system on a chip test. IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems 22(6):783\u2013796","journal-title":"IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems"},{"issue":"1","key":"5880_CR17","doi-asserted-by":"publisher","first-page":"91","DOI":"10.1145\/1044111.1044117","volume":"10","author":"A Nourani","year":"2005","unstructured":"Nourani A, Tehranipour MH (2005) RL Huffman encoding for test compression and power reduction in scan applications. ACM Transactions on Design Automation of Electronics Systems 10(1):91\u2013115","journal-title":"ACM Transactions on Design Automation of Electronics Systems"},{"issue":"7","key":"5880_CR18","doi-asserted-by":"publisher","first-page":"767","DOI":"10.1109\/TVLSI.2007.899232","volume":"15","author":"SP Lin","year":"2007","unstructured":"Lin SP, Lee CL, Chen JE, Chen JJ, Luo KL, Wu WC (2007) A Multilayer data copy test data compression scheme for reducing shifting-in power for multiple scan design. IEEE Transactions on Very Large Scale Integrations (VLSI) Systems 15(7):767\u2013776","journal-title":"IEEE Transactions on Very Large Scale Integrations (VLSI) Systems"},{"issue":"2","key":"5880_CR19","doi-asserted-by":"publisher","first-page":"132","DOI":"10.1109\/MDT.2008.55","volume":"25","author":"CW Tzeng","year":"2008","unstructured":"Tzeng CW, Huang SY (2008) UMC scan test methodology exploiting the maximum freedom of multicasting. IEEE Design Test Computers 25(2):132\u2013140","journal-title":"IEEE Design Test Computers"},{"key":"5880_CR20","doi-asserted-by":"crossref","unstructured":"Pradhan MM, Brien EJO, Lam SL, Beausang J (1988) Circular BIST with partial scan. In: Proc of the International Test Conference, Washington, DC: IEEE Piscataway, NJ, USA, 719\u2013729","DOI":"10.1109\/TEST.1988.207857"},{"key":"5880_CR21","unstructured":"Azimipour M, Fathiyan A, Eshghi M (2008) A parallel circular scan architecture using multiple hot decoder. In: Proc of 15th International Conference on Mixed Design, Poznan:, Inst. of Electrical and Electronics Engineering Computer Society, pp 475\u2013480"},{"key":"5880_CR22","doi-asserted-by":"crossref","unstructured":"Zhang L, Mei J, Yan B (2018) New test set compression scheme for circular scan. EURASIP Journal on Embedded Systems, (1), pp 1","DOI":"10.1186\/s13639-018-0085-2"},{"key":"5880_CR23","doi-asserted-by":"crossref","unstructured":"Li K, Kang L, Zhang W, Li B (2008) Comparative analysis of genetic algorithm and ant colony algorithm on solving travelling salesman problem. In: Proc of the IEEE international workshop on semantic computing and systems, Huangshan, China, pp 72\u201375","DOI":"10.1109\/WSCS.2008.11"},{"key":"5880_CR24","doi-asserted-by":"crossref","unstructured":"Arslan B, Orailoglu A (2004) Circular scan: A scan architecture for test cost reduction. In: Proc of the IEEE Design Automation and Test in Europe Conference and Exhibition, Paris, pp 1290\u20131295","DOI":"10.1109\/DATE.2004.1269073"},{"issue":"12","key":"5880_CR25","doi-asserted-by":"publisher","first-page":"1325","DOI":"10.1109\/43.736572","volume":"17","author":"V Dabholkar","year":"1998","unstructured":"Dabholkar V, Chakravarty S, Pomeranz I, Reddy S (1998) Techniques for minimizing power dissipation in scan and combinational circuits during test application. IEEE Transactions on CAD of Integrated Circuits and Systems 17(12):1325\u20131333","journal-title":"IEEE Transactions on CAD of Integrated Circuits and Systems"},{"key":"5880_CR26","doi-asserted-by":"crossref","unstructured":"Girard P, Landrault C, Pravossoudovitch S, Severac D (1998) Reducing power consumption during test application by test vector ordering. In: Proc. of International Symposium on Circuits and Systems, pp 296\u2013299","DOI":"10.1109\/ISCAS.1998.706917"},{"key":"5880_CR27","doi-asserted-by":"crossref","unstructured":"Girard P, Guiller L, Landrault C, Pravossoudovitch S (1999) A Test vector ordering technique for switching activity reduction during test operation. In: Proc of 9th Great Lakes Symposium on VLSI, pp 24\u201327","DOI":"10.1109\/GLSV.1999.757369"},{"key":"5880_CR28","unstructured":"Luo Z, Li X, Li H, Yang S, Min Y (2002) Test Power optimization techniques for CMOS circuits. In: Proc of Asian Test Symposium, pp 332\u2013337"},{"key":"5880_CR29","doi-asserted-by":"publisher","first-page":"43","DOI":"10.1007\/s10836-015-5507-7","volume":"31","author":"H Yuan","year":"2015","unstructured":"Yuan H, Guo K, Sun X, Mei J, Song H (2015) A Power efficient BIST TPG method on don\u2019t care bit based 2-D adjusting and hamming distance based 2-D reordering. J Electron Test 31:43\u201352","journal-title":"J Electron Test"},{"key":"5880_CR30","doi-asserted-by":"publisher","first-page":"59","DOI":"10.1007\/s10836-016-5562-8","volume":"32","author":"H Yuan","year":"2016","unstructured":"Yuan H, Guo K, Sun X, Ju Z (2016) A power efficient test data compression method for SoC using alternating statistical run-length coding. J Electron Test 32:59\u201368","journal-title":"J Electron Test"},{"issue":"9","key":"5880_CR31","doi-asserted-by":"publisher","first-page":"1824","DOI":"10.3923\/itj.2011.1824.1829","volume":"10","author":"Z Liu","year":"2011","unstructured":"Liu Z, Lin XF, Shi Y, Teng H-F (2011) A micro genetic algorithm with Cauchy mutation for mechanical optimization design problems. Inf Technol J 10(9):1824\u20131829","journal-title":"Inf Technol J"},{"issue":"11","key":"5880_CR32","doi-asserted-by":"publisher","first-page":"2105","DOI":"10.3923\/itj.2011.2105.2111","volume":"10","author":"Y Gu","year":"2011","unstructured":"Gu Y, Li Y, Xu J, Liu Y (2011) Novel model based on wavelet transform and GA-fuzzy neural network applied to short time traffic flow prediction. Inf Technol J 10(11):2105\u20132111","journal-title":"Inf Technol J"},{"key":"5880_CR33","doi-asserted-by":"crossref","unstructured":"Lelodar MS (2006) And mizanian: Power aware scan-based testing using genetic algorithm. In: Proc of the Canadian Conference on Electrical and Computer Engineering, pp 1905\u20131908","DOI":"10.1109\/CCECE.2006.277496"},{"issue":"12","key":"5880_CR34","doi-asserted-by":"publisher","first-page":"1786","DOI":"10.3923\/itj.2012.1786.1789","volume":"11","author":"J Shang","year":"2012","unstructured":"Shang J, Zhang L (2012) Ant Colony Optimization and Genetic Algorithm Optimization for test vector reordering. Inf Technol J 11(12):1786\u20131789","journal-title":"Inf Technol J"},{"key":"5880_CR35","doi-asserted-by":"publisher","first-page":"1417","DOI":"10.1016\/j.pnsc.2008.03.028","volume":"18","author":"J Yang","year":"2008","unstructured":"Yang J, Shi P, Marchese M, Liang Y (2008) An ant colony optimization method for generalized TSP problem. Prog Nat Sci 18:1417\u20131422","journal-title":"Prog Nat Sci"},{"key":"5880_CR36","doi-asserted-by":"crossref","unstructured":"Eskandari L, Jafarian A, Rahimloo P, Baleanu D (2019) A modified and enhanced ant colony optimization algorithm for traveling salesman problem. In: Ta\u015f K, Baleanu D, Machado J (eds) Mathematical methods in engineering. Nonlinear systems and complexity, vol 23. Springer, pp 257\u2013265","DOI":"10.1007\/978-3-319-91065-9_13"},{"key":"5880_CR37","doi-asserted-by":"crossref","unstructured":"Azimopour M, Eshghi M, Khademzadh A (2007) A modification to circular- scan architecture to improve test data compression. In: Proc of International conference on advanced computing and communications, Guwahati:, Institute of Electrical and Electronics Engineers Inc, pp 27\u201332","DOI":"10.1109\/ADCOM.2007.32"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-020-05880-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10836-020-05880-7\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-020-05880-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,5]],"date-time":"2021-06-05T23:33:00Z","timestamp":1622935980000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10836-020-05880-7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":37,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2020,6]]}},"alternative-id":["5880"],"URL":"https:\/\/doi.org\/10.1007\/s10836-020-05880-7","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,6]]},"assertion":[{"value":"30 August 2019","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"16 April 2020","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"6 June 2020","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}