{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,10]],"date-time":"2026-01-10T01:33:34Z","timestamp":1768008814587,"version":"3.49.0"},"reference-count":56,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"funder":[{"DOI":"10.13039\/501100010909","name":"Young Scientists Fund","doi-asserted-by":"publisher","award":["61702052"],"award-info":[{"award-number":["61702052"]}],"id":[{"id":"10.13039\/501100010909","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100010909","name":"Young Scientists Fund","doi-asserted-by":"publisher","award":["61504013"],"award-info":[{"award-number":["61504013"]}],"id":[{"id":"10.13039\/501100010909","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100010909","name":"Young Scientists Fund","doi-asserted-by":"publisher","award":["61804037"],"award-info":[{"award-number":["61804037"]}],"id":[{"id":"10.13039\/501100010909","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Scientific\u00a0Research\u00a0Fund\u00a0of Hunan\u00a0Provincial\u00a0Education\u00a0Department","award":["18A137"],"award-info":[{"award-number":["18A137"]}]},{"name":"Scientific\u00a0Research\u00a0Fund\u00a0of Hunan\u00a0Provincial\u00a0Education\u00a0Department","award":["17B011"],"award-info":[{"award-number":["17B011"]}]},{"DOI":"10.13039\/501100004735","name":"Natural Science Foundation of\u00a0Hunan Province","doi-asserted-by":"crossref","award":["2020JJ4622"],"award-info":[{"award-number":["2020JJ4622"]}],"id":[{"id":"10.13039\/501100004735","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100004735","name":"Natural Science Foundation of\u00a0Hunan Province","doi-asserted-by":"publisher","award":["2019JJ50648"],"award-info":[{"award-number":["2019JJ50648"]}],"id":[{"id":"10.13039\/501100004735","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2020,8]]},"DOI":"10.1007\/s10836-020-05898-x","type":"journal-article","created":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T21:02:12Z","timestamp":1596315732000},"page":"469-483","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":15,"title":["Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults"],"prefix":"10.1007","volume":"36","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4375-3187","authenticated-orcid":false,"given":"Shuo","family":"Cai","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Binyong","family":"He","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weizheng","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peng","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fei","family":"Yu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lairong","family":"Yin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bo","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"name":"Member, IEEE","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2020,8,1]]},"reference":[{"key":"5898_CR1","first-page":"614","volume-title":"\u201cMASkIt:Soft error rate estimation for combinational circuits,\u201d in Proc","author":"M Anglada","year":"2016","unstructured":"Anglada M, Canal R, Arag\u00f3n JL, Gonz\u00e1lez A (2016) \u201cMASkIt:Soft error rate estimation for combinational circuits,\u201d in Proc. IEEE International Conference on Computer Design, Scottsdale, AZ, USA, pp 614\u2013621"},{"key":"5898_CR2","doi-asserted-by":"publisher","unstructured":"Anglada M, Canal R, Arag\u00f3n JL, Gonz\u00e1lez A (2018) Fast and accurate SER estimation for large combinational blocks in early stages of the design. IEEE Trans Sustain Comput:1\u201315. https:\/\/doi.org\/10.1109\/TSUSC.2018.2886640","DOI":"10.1109\/TSUSC.2018.2886640"},{"issue":"8","key":"5898_CR3","doi-asserted-by":"crossref","first-page":"506","DOI":"10.1016\/j.mejo.2010.06.002","volume":"41","author":"H Asadi","year":"2010","unstructured":"Asadi H, Tahoori MB (2010) Soft error modeling and remediation techniques in ASIC designs. Microelectron J 41(8):506\u2013522","journal-title":"Microelectron J"},{"key":"5898_CR4","doi-asserted-by":"crossref","first-page":"1215","DOI":"10.1016\/j.microrel.2011.12.031","volume":"52","author":"H Asadi","year":"2012","unstructured":"Asadi H, Tahoori MB, Fazeli M, Miremadi SG (2012) Efficient algorithms to accurately compute derating factors of digital circuits. Microelectron Reliab 52:1215\u20131226","journal-title":"Microelectron Reliab"},{"issue":"3","key":"5898_CR5","doi-asserted-by":"crossref","first-page":"1836","DOI":"10.1109\/TNS.2013.2260357","volume":"60","author":"JD Black","year":"2013","unstructured":"Black JD, Dodd PE, Warren KM (2013) Physics of multiple-node charge collection and impacts on single-event characterization and soft error rate prediction. IEEE Trans Nucl Sci 60(3):1836\u20131851","journal-title":"IEEE Trans Nucl Sci"},{"key":"5898_CR6","unstructured":"F. Brglez and H. Fujiwara, \u201cA neutral netlist of 10 combinational benchmark circuits and a target translator in fortran,\u201d in Proc. IEEE International Symposium on Circuits and Systems, Kyoto, Japan, 1985, pp. 663\u2013698"},{"key":"5898_CR7","first-page":"1929","volume-title":"\u201cCombinational profiles of sequential benchmark circuits,\u201d in Proc","author":"F Brglez","year":"1989","unstructured":"Brglez F, Bryan D, Kozminski K (1989) \u201cCombinational profiles of sequential benchmark circuits,\u201d in Proc. IEEE International Symposium on Circuits and Systems, Portland, OR, USA, pp 1929\u20131934"},{"issue":"7","key":"5898_CR8","first-page":"1","volume":"14","author":"S Cai","year":"2017","unstructured":"Cai S, Yu F, Wang WZ, Liu TQ, Liu P, Wang W (2017) Reliability evaluation of logic circuits based on transient faults propagation metrics. IEICE Electron Exp 14(7):1\u20137","journal-title":"IEICE Electron Exp"},{"issue":"2","key":"5898_CR9","doi-asserted-by":"crossref","first-page":"163","DOI":"10.1007\/s10836-019-05791-2","volume":"35","author":"S Cai","year":"2019","unstructured":"Cai S, Wang WZ, Yu F, He BY (2019) Single event transient propagation probabilities analysis for nanometer CMOS circuits. J Electron Testing - Theory Appl 35(2):163\u2013172","journal-title":"J Electron Testing - Theory Appl"},{"issue":"6","key":"5898_CR10","doi-asserted-by":"crossref","first-page":"1109","DOI":"10.1109\/TCAD.2018.2834425","volume":"38","author":"XB Cao","year":"2019","unstructured":"Cao XB, Xiao LY, Li J, Zhang RS, Liu SS, Wang JX (2019) A layout-based soft error vulnerability estimation approach for combinational circuits considering single event multiple transients (SEMTs). IEEE Trans Comput-Aided Design Int Circ Syst 38(6):1109\u20131122","journal-title":"IEEE Trans Comput-Aided Design Int Circ Syst"},{"issue":"5","key":"5898_CR11","doi-asserted-by":"crossref","first-page":"1338","DOI":"10.3390\/s20051338","volume":"20","author":"D Cao","year":"2020","unstructured":"Cao D, Jiang YC, Wang J, Ji BF, Alfarraj O, Tolba A, Ma XM, Liu YH (2020) ARNS: adaptive relay-node selection method for message broadcasting in the internet of vehicles. Sensors 20(5):1338\u20131355","journal-title":"Sensors"},{"issue":"6","key":"5898_CR12","doi-asserted-by":"crossref","first-page":"3512","DOI":"10.1109\/TNS.2014.2365546","volume":"61","author":"I Chatterjee","year":"2014","unstructured":"Chatterjee I, Narasimham B, Mahatme NN, Bhuva BL, Reed RA, Schrimpf RD, Wang JK, Vedula N, Bartz B, Monzel C (2014) Impact of technology scaling on SRAM soft error rates. IEEE Trans Nucl Sci 61(6):3512\u20133518","journal-title":"IEEE Trans Nucl Sci"},{"key":"5898_CR13","first-page":"1125","volume-title":"\u201cITC\u201999 benchmark circuits-Preliminary results,\u201d in Proc","author":"S Davidson","year":"1999","unstructured":"Davidson S (1999) \u201cITC\u201999 benchmark circuits-Preliminary results,\u201d in Proc. International Test Conference, Atlantic, NJ, USA, pp 1125\u20131130"},{"issue":"3","key":"5898_CR14","doi-asserted-by":"crossref","first-page":"583","DOI":"10.1109\/TNS.2003.813129","volume":"50","author":"P Dodd","year":"2003","unstructured":"Dodd P, Massengill L (2003) Basic mechanisms and modeling of single-event upset in digital microelectronics. IEEE Trans Nucl Sci 50(3):583\u2013602","journal-title":"IEEE Trans Nucl Sci"},{"issue":"1","key":"5898_CR15","first-page":"48","volume":"65","author":"Y Du","year":"2016","unstructured":"Du Y, Chen S (2016) A novel layout-based single event transient injection approach to evaluate the soft error rate of large combinational circuits in complimentary metal-oxide-semiconductor bulk technology. IEEE Trans Reliab 65(1):48\u2013255","journal-title":"IEEE Trans Reliab"},{"issue":"6","key":"5898_CR16","doi-asserted-by":"crossref","first-page":"1586","DOI":"10.1109\/TCAD.2015.2422845","volume":"34","author":"M Ebrahimi","year":"2015","unstructured":"Ebrahimi M, Evans A, Tahoori MB, Costenaro E, Alexandrescu D, Chandra V, Seyyedi R (2015) Comprehensive analysis of sequential and combinational soft errors in an embedded processor. IEEE Trans Comput-Aided Design Int Circ Syst 34(6):1586\u20131599","journal-title":"IEEE Trans Comput-Aided Design Int Circ Syst"},{"issue":"3","key":"5898_CR17","doi-asserted-by":"crossref","first-page":"367","DOI":"10.1109\/TCAD.2015.2459053","volume":"35","author":"M Ebrahimi","year":"2016","unstructured":"Ebrahimi M, Asadi H, Bishnoi R, Tahoori MB (2016) Layout-based modeling and mitigation of multiple event transients. IEEE Trans Comput-Aided Des Int Circ Syst 35(3):367\u2013379","journal-title":"IEEE Trans Comput-Aided Des Int Circ Syst"},{"issue":"6","key":"5898_CR18","doi-asserted-by":"crossref","first-page":"570","DOI":"10.1049\/iet-cdt.2008.0133","volume":"3","author":"AH El-Maleh","year":"2009","unstructured":"El-Maleh AH, Al-Hashimi BM, Melouki A, Khan F (2009) Defect tolerant N2-transistor structure for reliable nanoelectronic designs. IET Comput Digit Tech 3(6):570\u2013580","journal-title":"IET Comput Digit Tech"},{"key":"5898_CR19","first-page":"797","volume-title":"\u201cA fast analytical approach to multi-cycle soft error rate estimation of sequential circuits,\u201d in Proc","author":"M Fazeli","year":"2010","unstructured":"Fazeli M, Miremadi S, Asadi H, Tahoori M (2010) \u201cA fast analytical approach to multi-cycle soft error rate estimation of sequential circuits,\u201d in Proc. 13th Euromicro conference on digital system design: architectures, Methods and Tools, Lille, France, pp 797\u2013800"},{"issue":"9","key":"5898_CR20","first-page":"1422","volume":"48","author":"D Franco","year":"2008","unstructured":"Franco D, Vasconcelos M, Naviner L, Naviner JF (2008) Signal probability for reliability evaluation of logic circuits. Microelectron Reliab 48(9):1422\u20131429","journal-title":"Microelectron Reliab"},{"key":"5898_CR21","first-page":"265","volume-title":"\u201cReliability of logic circuits under multiple simultaneous faults,\u201d in Proc","author":"D Franco","year":"2008","unstructured":"Franco D, Vasconcelos M, Naviner L, Naviner JF (2008) \u201cReliability of logic circuits under multiple simultaneous faults,\u201d in Proc. IEEE International Midwest Symposium on Circuits and Systems, Knoxville, TN, USA, pp 265\u2013268"},{"key":"5898_CR22","first-page":"6C.3.1","volume-title":"\u201cImpact of cell distance and well-contact density on neutron-induced multiple cell upsets,\u201d in Proc","author":"J Furuta","year":"2013","unstructured":"Furuta J, Kobayashi K, Onodera H (2013) \u201cImpact of cell distance and well-contact density on neutron-induced multiple cell upsets,\u201d in Proc. IEEE International Reliability Physics Symposium, Anaheim, CA, USA, pp 6C.3.1\u20136C.3.4"},{"key":"5898_CR23","first-page":"104","volume-title":"\u201cAccurate calculation of SET propagation probability for hardening\u201d in Proc","author":"S Gangadhar","year":"2012","unstructured":"Gangadhar S, Tragoudas S (2012) \u201cAccurate calculation of SET propagation probability for hardening\u201d in Proc. IEEE International Symposium on Defect & Fault Tolerance in VLSI & Nanotechnology Systems, Austin, TX, USA, pp 104\u2013108"},{"issue":"4","key":"5898_CR24","doi-asserted-by":"crossref","first-page":"2048","DOI":"10.1109\/TNS.2008.916063","volume":"55","author":"D Giot","year":"2008","unstructured":"Giot D, Roche P, Gasiot G, Autran JL, Harboe-Sorensen R (2008) Heavy ion testing and 3-D simulations of multiple cell upset in 65nm standard SRAMs. IEEE Trans Nucl Sci 55(4):2048\u20132054","journal-title":"IEEE Trans Nucl Sci"},{"issue":"2","key":"5898_CR25","doi-asserted-by":"crossref","first-page":"468","DOI":"10.1016\/j.microrel.2010.07.154","volume":"51","author":"J Han","year":"2011","unstructured":"Han J, Chen H, Boykin E, Fortes J (2011) Reliability evaluation of logic circuits using probabilistic gate models. Microelectron Reliab 51(2):468\u2013476","journal-title":"Microelectron Reliab"},{"issue":"2","key":"5898_CR26","doi-asserted-by":"crossref","first-page":"256","DOI":"10.1109\/TVLSI.2013.2239318","volume":"22","author":"KH Huang","year":"2014","unstructured":"Huang KH, Hu Y, Li XW (2014) Reliability-oriented placement and routing algorithm for SRAM-based FPGAs. IEEE Trans Very Large Scale Int Syst 22(2):256\u2013269","journal-title":"IEEE Trans Very Large Scale Int Syst"},{"issue":"5","key":"5898_CR27","doi-asserted-by":"crossref","first-page":"1217","DOI":"10.1109\/TC.2014.2315633","volume":"64","author":"W Ibrahim","year":"2015","unstructured":"Ibrahim W, Shousha M, Chinneck JW (2015) Accurate and efficient estimation of logic circuits reliability bounds. IEEE Trans Comput 64(5):1217\u20131229","journal-title":"IEEE Trans Comput"},{"key":"5898_CR28","doi-asserted-by":"crossref","first-page":"141","DOI":"10.1016\/j.microrel.2016.03.006","volume":"60","author":"D Kachave","year":"2016","unstructured":"Kachave D, Sengupta A (2016) Integrating physical level design and high level synthesis for simultaneous multi-cycle transient and multiple transient fault resiliency of application specific datapath processors. Microelectron Reliab 60:141\u2013152","journal-title":"Microelectron Reliab"},{"key":"5898_CR29","first-page":"282","volume-title":"\u201cAccurate reliability evaluation and enhancement via probabilistic transfer matrices,\u201d in Proc","author":"S Krishnaswamy","year":"2005","unstructured":"Krishnaswamy S, Viamontes GF, Markov IL, Hayes JP (2005) \u201cAccurate reliability evaluation and enhancement via probabilistic transfer matrices,\u201d in Proc. Design, Automation and Test in Europe Conference, Munich, Germany, pp 282\u2013287"},{"issue":"1","key":"5898_CR30","doi-asserted-by":"crossref","first-page":"8","DOI":"10.1145\/1297666.1297674","volume":"13","author":"S Krishnaswamy","year":"2008","unstructured":"Krishnaswamy S, Viamontes GF, Markov IL, Hayes JP (2008) Probabilistic transfer matrices in symbolic reliability analysis of logic circuits. ACM Trans Des Autom Electron Syst 13(1):8","journal-title":"ACM Trans Des Autom Electron Syst"},{"issue":"3","key":"5898_CR31","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1145\/3035496","volume":"22","author":"J Li","year":"2017","unstructured":"Li J, Draper J (2017) Accelerated soft-error-rate(SER) estimation for combinational and sequential circuits. ACM Trans Des Autom Electron Syst 22(3):1\u201357","journal-title":"ACM Trans Des Autom Electron Syst"},{"issue":"3","key":"5898_CR32","doi-asserted-by":"crossref","first-page":"687","DOI":"10.1109\/TR.2012.2209249","volume":"61","author":"BJ Liu","year":"2012","unstructured":"Liu BJ, Cai L (2012) Reliability evaluation for single event transients on digital circuits. IEEE Trans Reliab 61(3):687\u2013691","journal-title":"IEEE Trans Reliab"},{"issue":"12","key":"5898_CR33","doi-asserted-by":"crossref","first-page":"2933","DOI":"10.1109\/TNS.2017.2772267","volume":"64","author":"BJ Liu","year":"2017","unstructured":"Liu BJ, Cai L (2017) Monte Carlo reliability model for single-event transient on combinational circuits. IEEE Trans Nucl Sci 64(12):2933\u20132937","journal-title":"IEEE Trans Nucl Sci"},{"key":"5898_CR34","first-page":"767","volume-title":"\u201cMARS-C: Modeling and reduction of soft errors in combinational circuits,\u201d in Proc","author":"N Miskov-Zivanov","year":"2006","unstructured":"Miskov-Zivanov N, Marculescu D (2006) \u201cMARS-C: Modeling and reduction of soft errors in combinational circuits,\u201d in Proc. Design Automation Conference, San Francisco, CA, USA, pp 767\u2013772"},{"key":"5898_CR35","first-page":"1436","volume-title":"\u201cSoft error rate analysis for sequential circuits,\u201d in Proc","author":"N Miskov-Zivanov","year":"2007","unstructured":"Miskov-Zivanov N, Marculescu D (2007) \u201cSoft error rate analysis for sequential circuits,\u201d in Proc. Design, Automation and Test in Europe Conference, Nice, France, pp 1436\u20131441"},{"issue":"10","key":"5898_CR36","doi-asserted-by":"crossref","first-page":"1614","DOI":"10.1109\/TCAD.2010.2061131","volume":"29","author":"N Miskov-Zivanov","year":"2010","unstructured":"Miskov-Zivanov N, Marculescu D (2010) Multiple transient faults in combinational and sequential circuits: a systematic approach. IEEE Trans Comput-Aided Design Int Circ Syst 29(10):1614\u20131627","journal-title":"IEEE Trans Comput-Aided Design Int Circ Syst"},{"key":"5898_CR37","first-page":"1","volume-title":"\u201cEfficient computation of combinational circuits reliability based on probabilistic transfer matrix,\u201d in Proc","author":"L Naviner","year":"2014","unstructured":"Naviner L, Liu KK, Cai H, Naviner JF (2014) \u201cEfficient computation of combinational circuits reliability based on probabilistic transfer matrix,\u201d in Proc. IEEE International Conference on IC Design & Technology, Austin, TX, USA, pp 1\u20134"},{"issue":"3","key":"5898_CR38","doi-asserted-by":"crossref","first-page":"405","DOI":"10.1109\/TDMR.2005.855790","volume":"5","author":"M Nicolaidis","year":"2005","unstructured":"Nicolaidis M (2005) Design for soft error mitigation. IEEE Trans Device Mater Reliab 5(3):405\u2013418","journal-title":"IEEE Trans Device Mater Reliab"},{"issue":"6","key":"5898_CR39","doi-asserted-by":"crossref","first-page":"2768","DOI":"10.1109\/TNS.2011.2168239","volume":"58","author":"S Pagliarini","year":"2011","unstructured":"Pagliarini S, Kastensmidt F, Entrena L, Lindoso A, Millan E (2011) Analyzing the impact of single-event-induced charge sharing in complex circuits. IEEE Trans Nucl Sci 58(6):2768\u20132775","journal-title":"IEEE Trans Nucl Sci"},{"key":"5898_CR40","first-page":"59","volume-title":"\u201cEvaluating circuit reliability under probabilistic gate-level fault models,\u201d in Proc","author":"KN Patel","year":"2003","unstructured":"Patel KN, Markov IL, Hayes JP (2003) \u201cEvaluating circuit reliability under probabilistic gate-level fault models,\u201d in Proc. International Workshop on Logic and Synthesis, Laguna Beach, CA, USA, pp 59\u201364"},{"issue":"2","key":"5898_CR41","doi-asserted-by":"crossref","first-page":"194","DOI":"10.1109\/TNANO.2004.834192","volume":"4","author":"Y Qi","year":"2005","unstructured":"Qi Y, Gao JB, Fortes J (2005) Markov chains and probabilistic computation - a general framework for multiplexed nanoelectronic systems. IEEE Trans Nanotechnol 4(2):194\u2013205","journal-title":"IEEE Trans Nanotechnol"},{"issue":"6","key":"5898_CR42","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1142\/S0218126614500911","volume":"23","author":"R Rajaei","year":"2014","unstructured":"Rajaei R, Tabandeh M, Fazeli M (2014) Soft error rate estimation for combinational logic in presence of single event multiple transients. J Circ Syst Comput 23(6):1\u201320","journal-title":"J Circ Syst Comput"},{"issue":"6","key":"5898_CR43","doi-asserted-by":"crossref","first-page":"291","DOI":"10.1007\/s10836-016-5583-3","volume":"32","author":"M Raji","year":"2016","unstructured":"Raji M, Ghavami B (2016) A fast statistical soft error rate estimation method for nano-scale combinational circuits. J Electron Testing - Theory Appl 32(6):291\u2013305","journal-title":"J Electron Testing - Theory Appl"},{"issue":"6","key":"5898_CR44","first-page":"311","volume":"9","author":"M Raji","year":"2015","unstructured":"Raji M, Pedram H, Ghavami B (2015) Soft error rate estimation of combinational circuits based on vulnerability analysis. IET Circ Syst 9(6):311\u2013320","journal-title":"IET Circ Syst"},{"issue":"3","key":"5898_CR45","doi-asserted-by":"crossref","first-page":"468","DOI":"10.1109\/TCAD.2007.891036","volume":"26","author":"RR Rao","year":"2007","unstructured":"Rao RR, Chopra K, Blaau DT, Sylvester DM (2007) Computing the soft error rate of a combinational logic circuit using parameterized descriptors. IEEE Trans Comput-Aided Design Int Circ Syst 26(3):468\u2013479","journal-title":"IEEE Trans Comput-Aided Design Int Circ Syst"},{"issue":"5","key":"5898_CR46","doi-asserted-by":"crossref","first-page":"511","DOI":"10.1023\/B:JETT.0000042515.67579.c1","volume":"20","author":"MS Reorda","year":"2004","unstructured":"Reorda MS, Violante M (2004) A new approach to the analysis of single event transients in VLSI circuits. J Electron Testing - Theory Appl 20(5):511\u2013521","journal-title":"J Electron Testing - Theory Appl"},{"issue":"5","key":"5898_CR47","doi-asserted-by":"crossref","first-page":"1059","DOI":"10.1109\/TCAD.2019.2907922","volume":"39","author":"MR Rohanipoor","year":"2020","unstructured":"Rohanipoor MR, Ghavami B, Raji M (2020) Improving combinational circuit reliability against multiple event transients via a partition and restructuring approach. IEEE Trans Comput-Aided Design Int Circ Syst 39(5):1059\u20131072","journal-title":"IEEE Trans Comput-Aided Design Int Circ Syst"},{"key":"5898_CR48","first-page":"352","volume-title":"\u201cMultiple transient faults in logic: an issue for next generation ics?\u201d in Proc","author":"D Rossi","year":"2005","unstructured":"Rossi D, Omana M, Toma F, Metra C (2005) \u201cMultiple transient faults in logic: an issue for next generation ics?\u201d in Proc. IEEE International Symposium on Defect & Fault Tolerance in VLSI & Nanotechnology Systems, Monterey, CA, USA, pp 352\u2013360"},{"key":"5898_CR49","first-page":"107","volume-title":"\u201cGate input reconfiguration for combating soft errors in combinational circuits,\u201d in Proc","author":"W Sootkaneung","year":"2010","unstructured":"Sootkaneung W, Saluja KK (2010) \u201cGate input reconfiguration for combating soft errors in combinational circuits,\u201d in Proc. International Conference on Dependable Systems & Networks Workshops, Washington, DC, USA, pp 107\u2013112"},{"issue":"1","key":"5898_CR50","doi-asserted-by":"crossref","first-page":"137","DOI":"10.1109\/TDSC.2009.29","volume":"8","author":"F Wang","year":"2011","unstructured":"Wang F, Xie Y (2011) Soft error rate analysis for combinational logic using an accurate electrical masking model. IEEE Trans Depend Sec Comput 8(1):137\u2013146","journal-title":"IEEE Trans Depend Sec Comput"},{"key":"5898_CR51","doi-asserted-by":"crossref","first-page":"22206","DOI":"10.1109\/ACCESS.2019.2898447","volume":"7","author":"WZ Wang","year":"2019","unstructured":"Wang WZ, Wang JC, Wang W, Liu P, Cai S (2019) A secure DFT architecture protecting crypto chips against scan-based attacks. IEEE Access 7:22206\u201322213","journal-title":"IEEE Access"},{"issue":"6","key":"5898_CR52","doi-asserted-by":"crossref","first-page":"1978","DOI":"10.1109\/TVLSI.2017.2655079","volume":"25","author":"AB Yan","year":"2017","unstructured":"Yan AB, Huang ZF, Yi MX, Xu XM, Ouyang YM, Liang HG (2017) Double-node-upset-resilient latch design for nanoscale CMOS technology. IEEE Trans Very Large Scale Int Syst 25(6):1978\u20131982","journal-title":"IEEE Trans Very Large Scale Int Syst"},{"key":"5898_CR53","doi-asserted-by":"crossref","first-page":"843","DOI":"10.1007\/s11277-019-06888-9","volume":"111","author":"F Yu","year":"2020","unstructured":"Yu F, Gao L, Liu L, Qian S, Cai S, Song Y (2020) A 1 V, 0.53 ns, 59 \u03bcW current comparator using standard 0.18\u03bcm CMOS technology. Wirel Pers Commun 111:843\u2013851","journal-title":"Wirel Pers Commun"},{"issue":"3","key":"5898_CR54","doi-asserted-by":"crossref","first-page":"979","DOI":"10.1108\/COMPEL-06-2014-0137","volume":"34","author":"H Zandevakili","year":"2015","unstructured":"Zandevakili H, Mahani A, Saneei M (2015) An accurate and fast reliability analysis method for combinational circuits. Int J Comput Math Electric Electron Eng 34(3):979\u2013995","journal-title":"Int J Comput Math Electric Electron Eng"},{"issue":"8","key":"5898_CR55","first-page":"2129","volume":"64","author":"GI Zebrev","year":"2017","unstructured":"Zebrev GI, Galimov AM (2017) Compact modeling and simulation of heavy ion-induced soft error rate in space environment: principles and validation. IEEE Trans Nucl Sci 64(8):2129\u20132135","journal-title":"IEEE Trans Nucl Sci"},{"issue":"10","key":"5898_CR56","doi-asserted-by":"crossref","first-page":"2140","DOI":"10.1109\/TCAD.2005.862738","volume":"25","author":"M Zhang","year":"2006","unstructured":"Zhang M, Shanbhag NR (2006) A soft-error-rate-analysis methodology. IEEE Trans Comput-Aided Design Int Circ Syst 25(10):2140\u20132155","journal-title":"IEEE Trans Comput-Aided Design Int Circ Syst"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-020-05898-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10836-020-05898-x\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-020-05898-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,7,31]],"date-time":"2021-07-31T23:35:06Z","timestamp":1627774506000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10836-020-05898-x"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,8]]},"references-count":56,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2020,8]]}},"alternative-id":["5898"],"URL":"https:\/\/doi.org\/10.1007\/s10836-020-05898-x","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,8]]},"assertion":[{"value":"1 February 2020","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"22 July 2020","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"1 August 2020","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}