{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T16:45:10Z","timestamp":1776530710380,"version":"3.51.2"},"reference-count":23,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2021,3,6]],"date-time":"2021-03-06T00:00:00Z","timestamp":1614988800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2021,3,6]],"date-time":"2021-03-06T00:00:00Z","timestamp":1614988800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2021,4]]},"DOI":"10.1007\/s10836-021-05934-4","type":"journal-article","created":{"date-parts":[[2021,3,6]],"date-time":"2021-03-06T20:02:41Z","timestamp":1615060961000},"page":"225-242","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit"],"prefix":"10.1007","volume":"37","author":[{"given":"H. El","family":"Badawi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6458-5018","authenticated-orcid":false,"given":"F.","family":"Azais","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Bernard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Comte","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Kerzerho","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Lefevre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2021,3,6]]},"reference":[{"key":"5934_CR1","doi-asserted-by":"crossref","unstructured":"Abdallah L, Stratigopoulos H, Kelma C, Mir S (2010) \u201cSensors for built-in alternate RF test\u201d, Proc. IEEE European Test Symposium (ETS), pp. 49\u201354.","DOI":"10.1109\/ETSYM.2010.5512783"},{"key":"5934_CR2","doi-asserted-by":"crossref","unstructured":"Ayari H, Azais F, Bernard S, Comte M, Kerzerho V, Potin O, Renovell M (2012) \u201cMaking predictive analog\/RF alternate test strategy independent of training set size\u201d, Proc. IEEE International Test Conference. (ITC), p. 9","DOI":"10.1109\/TEST.2012.6401560"},{"key":"5934_CR3","doi-asserted-by":"crossref","unstructured":"Ayari H, Azais F, Bernard S, Comte M, Renovell M, Kerzerho V, Potin O, Kelma C (2012) \u201cSmart selection of indirect parameters for DC based alternate RF IC testing\u201d, Proc. IEEE VLSI Test Symposium (VTS), pp. 19\u201324","DOI":"10.1109\/VTS.2012.6231074"},{"key":"5934_CR4","doi-asserted-by":"crossref","unstructured":"Badawi El H, Azais F, Bernard S, Comte M, Kerzerho V, Lefevre F, Gorenflot I (2020) \u201cImplementing indirect test of RF circuits without compromising test quality: a practical case study\u201d, Proc. IEEE Latin-American Test Symposium (LATS), pp. 1\u20136","DOI":"10.1109\/LATS49555.2020.9093666"},{"key":"5934_CR5","doi-asserted-by":"crossref","unstructured":"Barragan MJ, Fiorelli R, Leger G, Rueda A, Huertas JL (2011) \u201cImproving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs\u201d, Proc. IEEE Asian Test Symposium (ATS), pp. 359\u2013364","DOI":"10.1109\/ATS.2011.15"},{"key":"5934_CR6","doi-asserted-by":"crossref","unstructured":"Barragan MJ, Leger G, Cilici F, Lauga-Larroze E, Bourdel S, Mir S (2019) \u201cOn the use of causal feature selection in the context of machine-learning indirect test\u201d, Proc. Design Automation Test Conference (DATE), pp. 276\u2013279","DOI":"10.23919\/DATE.2019.8714798"},{"issue":"1","key":"5934_CR7","first-page":"18","volume":"32","author":"MJ Barragan","year":"2015","unstructured":"Barragan MJ, Leger G (2015) A Procedure for Alternate Test Feature Design and Selection. IEEE Design & Test 32(1):18\u201325","journal-title":"IEEE Design & Test"},{"key":"5934_CR8","doi-asserted-by":"crossref","unstructured":"Dimakos A, Andraud M, Abdallah L, Stratigopoulos H, Simeu E, Mir S (2015) \u201cTest and Calibration of RF Circuits Using Built-in Non-intrusive Sensors\u201d, Proc. IEEE Computer Society Annual Symp. on VLSI (ISVLSI), pp. 627\u2013627","DOI":"10.1109\/ISVLSI.2015.42"},{"key":"5934_CR9","doi-asserted-by":"publisher","first-page":"189","DOI":"10.1007\/s10836-020-05868-3","volume":"36","author":"H El Badawi","year":"2020","unstructured":"El Badawi H, Azais F, Bernard S, Comte M, Kerzerho V, Lefevre F (2020) Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. J Electron Test 36:189\u2013203","journal-title":"J Electron Test"},{"key":"5934_CR10","doi-asserted-by":"crossref","unstructured":"Ellouz S, Gamand P, Kelma C, Vandewiele B, Allard B (2006) \u201cCombining internal probing with artificial neural networks for optimal RFIC testing\u201d, Proc. IEEE International Test Conference (ITC), p. 9","DOI":"10.1109\/TEST.2006.297705"},{"key":"5934_CR11","doi-asserted-by":"crossref","unstructured":"Kupp et al. (2008) \u201cConfidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction\u201d, Proc. IEEE European Test Symposium (ETS), pp. 35\u201340","DOI":"10.1109\/ETS.2008.31"},{"key":"5934_CR12","doi-asserted-by":"crossref","unstructured":"Larguech S, Azais F, Bernard S, Comte M, Kerzerho V, Renovell M (2015) \u201cA Generic Methodology for Building Efficient Prediction Models in the Context of Alternate Testing\u201d, Proc. International Mixed-Signal Test Workshop (IMSTW), p. 6","DOI":"10.1109\/IMS3TW.2015.7177873"},{"key":"5934_CR13","doi-asserted-by":"crossref","unstructured":"Leger G (2015) \u201cCombining adaptive alternate test and multi-site\u201d, Proc. IEEE\/ACM Design, Automation and Test in Europe Conference (DATE), pp. 1389\u20131394","DOI":"10.7873\/DATE.2015.0233"},{"key":"5934_CR14","doi-asserted-by":"crossref","unstructured":"Powell TJ, Pair J, John MSt, Counce D (2000) \u201cDelta Iddq for Testing Reliability\u201d, Proc. IEEE VLSI Test Symposium (VTS), pp. 439\u2013443","DOI":"10.1109\/VTEST.2000.843876"},{"issue":"5","key":"5934_CR15","doi-asserted-by":"publisher","first-page":"695","DOI":"10.1109\/43.277614","volume":"12","author":"AD Singh","year":"1993","unstructured":"Singh AD, Krishna CM (1993) On Optimizing VLSI Testing for Product Quality Using Die-Yield Prediction. IEEE Trans Comput Aided Des Integr Circuits Syst 12(5):695\u2013709","journal-title":"IEEE Trans Comput Aided Des Integr Circuits Syst"},{"key":"5934_CR16","doi-asserted-by":"crossref","unstructured":"Stratigopoulos H (2018)\u201cMachine learning applications in IC testing\u201d, Proc. IEEE European Test Symposium (ETS), p. 10","DOI":"10.1109\/ETS.2018.8400701"},{"issue":"4","key":"5934_CR17","doi-asserted-by":"publisher","first-page":"71","DOI":"10.1109\/MDT.2012.2205480","volume":"29","author":"H Stratigopoulos","year":"2012","unstructured":"Stratigopoulos H, Mir S (2012) Adaptive Alternate Analog Test. IEEE Des Test Comput 29(4):71\u201379","journal-title":"IEEE Des Test Comput"},{"issue":"2","key":"5934_CR18","doi-asserted-by":"publisher","first-page":"339","DOI":"10.1109\/TCAD.2007.907232","volume":"27","author":"H Stratigopoulos","year":"2008","unstructured":"Stratigopoulos H, Makris Y (2008) Error moderation in low-cost machine-learning-based analog\/RF testing. IEEE Trans Comput Aided Des Integr Circuits Syst 27(2):339\u2013351","journal-title":"IEEE Trans Comput Aided Des Integr Circuits Syst"},{"key":"5934_CR19","doi-asserted-by":"crossref","unstructured":"Stratigopoulos H, Mir S, Acar E, Ozev S (2010) \u201cDefect filter for alternate RF test\u201d, Proc. IEEE European Test Symposium (ETS), pp. 265\u2013270","DOI":"10.1109\/ETSYM.2010.5512726"},{"key":"5934_CR20","doi-asserted-by":"crossref","unstructured":"Stratigopoulos H, Mir S, Makris Y (2009) \u201cEnrichment of limited training sets in machine-learning-based analog\/RF test\u201d, Proc. IEEE\/ACM Design, Automation and Test in Europe Conference (DATE), pp. 1668\u20131673","DOI":"10.1109\/DATE.2009.5090931"},{"issue":"3","key":"5934_CR21","doi-asserted-by":"publisher","first-page":"349","DOI":"10.1109\/43.986428","volume":"21","author":"PN Variyam","year":"2002","unstructured":"Variyam PN, Cherubal S, Chatterjee A (2002) Prediction of analog performance parameters using fast transient testing. IEEE Trans Comput Aided Des Integr Circuits Syst 21(3):349\u2013361","journal-title":"IEEE Trans Comput Aided Des Integr Circuits Syst"},{"key":"5934_CR22","unstructured":"Variyam PN, Chatterjee A (1998) \u201cEnhancing test effectiveness for analog circuits using synthesized measurements\u201d, Proc. IEEE VLSI Test Symposium (VTS), pp. 132\u2013137"},{"key":"5934_CR23","doi-asserted-by":"crossref","unstructured":"Yilmaz E, Ozev S (2010) \u201cAdaptive Test Flow for Mixed-Signal Circuits Using Learned Information from Device under Test\u201d, Proc. IEEE International Test Conference (ITC), paper 23.1","DOI":"10.1109\/TEST.2010.5699271"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-021-05934-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10836-021-05934-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-021-05934-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,20]],"date-time":"2022-12-20T12:53:34Z","timestamp":1671540814000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10836-021-05934-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3,6]]},"references-count":23,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2021,4]]}},"alternative-id":["5934"],"URL":"https:\/\/doi.org\/10.1007\/s10836-021-05934-4","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,3,6]]},"assertion":[{"value":"18 October 2020","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"5 February 2021","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"6 March 2021","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}