{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,10]],"date-time":"2026-01-10T19:10:08Z","timestamp":1768072208927,"version":"3.49.0"},"reference-count":18,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2021,4,1]],"date-time":"2021-04-01T00:00:00Z","timestamp":1617235200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2021,4,1]],"date-time":"2021-04-01T00:00:00Z","timestamp":1617235200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2021,4]]},"DOI":"10.1007\/s10836-021-05938-0","type":"journal-article","created":{"date-parts":[[2021,6,3]],"date-time":"2021-06-03T08:03:01Z","timestamp":1622707381000},"page":"215-223","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":11,"title":["Fault Diagnosis Method of Low Noise Amplifier Based on Support Vector Machine and Hidden Markov Model"],"prefix":"10.1007","volume":"37","author":[{"given":"Lu","family":"Sun","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3928-3223","authenticated-orcid":false,"given":"Yang","family":"Li","sequence":"additional","affiliation":[]},{"given":"Han","family":"Du","sequence":"additional","affiliation":[]},{"given":"Peipei","family":"Liang","sequence":"additional","affiliation":[]},{"given":"Fushun","family":"Nian","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2021,6,3]]},"reference":[{"key":"5938_CR1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-37027-4","volume-title":"Intelligent sensing, instrumentation and measurements","author":"SC Mukhopadhyay","year":"2013","unstructured":"Mukhopadhyay SC (2013) Intelligent sensing, instrumentation and measurements. Springer, Berlin Heidelberg"},{"key":"5938_CR2","doi-asserted-by":"crossref","unstructured":"Vasan A, Long B, Pecht M (2014) Experimental validation of LS SVM based fault identification in analog circuits using frequency features. In Proc. The 6th World Congress on Engineering Asset Management(pp.629\u2013641) .Springer","DOI":"10.1007\/978-1-4471-4993-4_54"},{"key":"5938_CR3","doi-asserted-by":"publisher","first-page":"95","DOI":"10.1007\/s10836-012-5342-z","volume":"29","author":"H Han","year":"2013","unstructured":"Han H, Wang H, Tian S, Zhang N (2013) A new analog circuit fault diagnosis method based on improved mahalanobis distance. J Electron Test 29:95\u2013102. https:\/\/doi.org\/10.1007\/s10836-012-5342-z","journal-title":"J Electron Test"},{"key":"5938_CR4","doi-asserted-by":"publisher","first-page":"124","DOI":"10.1016\/j.ress.2013.02.022","volume":"115","author":"P Tamilselvan","year":"2013","unstructured":"Tamilselvan P, Wang P (2013) Failure diagnosis using deep belief learning based health state classification. Reliability Engineering & System Safety 115:124\u2013135. https:\/\/doi.org\/10.1016\/j.ress.2013.02.022","journal-title":"Reliability Engineering & System Safety"},{"key":"5938_CR5","doi-asserted-by":"publisher","first-page":"169","DOI":"10.1007\/s10836-020-05870-9","volume":"36","author":"S Rathnapriya","year":"2020","unstructured":"Rathnapriya S, Manikandan V (2020) Remaining useful life prediction of analog circuit using improved unscented particle filter. J Electron Test 36:169\u2013181. https:\/\/doi.org\/10.1007\/s10836-020-05870-9","journal-title":"J Electron Test"},{"key":"5938_CR6","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1109\/TIM.2018.2836058","volume":"68","author":"D Binu","year":"2019","unstructured":"Binu D, Kariyappa BS (2019) Ridenn: a new rider optimization algorithm-based neural network for fault diagnosis in analog circuits. Instrumentation and Measurement, IEEE Transactions on Instrumentation and Measurement 68:2\u201326. https:\/\/doi.org\/10.1109\/TIM.2018.2836058","journal-title":"Instrumentation and Measurement, IEEE Transactions on Instrumentation and Measurement"},{"key":"5938_CR7","doi-asserted-by":"publisher","first-page":"60951","DOI":"10.1109\/ACCESS.2020.2982246","volume":"8","author":"Y Li","year":"2020","unstructured":"Li Y, Zhang R, GuoY HP, Zhang M (2020) Nonlinear soft fault diagnosis of analog circuits based on rcca-svm. IEEE Access 8:60951\u201360963. https:\/\/doi.org\/10.1109\/ACCESS.2020.2982246","journal-title":"IEEE Access"},{"key":"5938_CR8","doi-asserted-by":"publisher","first-page":"4220","DOI":"10.1007\/s00034-016-0265-z","volume":"35","author":"Y Deng","year":"2016","unstructured":"Deng Y, Chai G (2016) Soft fault feature extraction in nonlinear analog circuit fault diagnosis. Circuits Systems & Signal Processing 35:4220\u20134248. https:\/\/doi.org\/10.1007\/s00034-016-0265-z","journal-title":"Circuits Systems & Signal Processing"},{"key":"5938_CR9","doi-asserted-by":"publisher","first-page":"569","DOI":"10.2478\/v10178-011-0055-7","volume":"18","author":"J Cui","year":"2011","unstructured":"Cui J, Wang Y (2011) Analog circuit fault classification using improved one-against-one support vector machines. Metrology & Measurement Systems 18:569\u2013582. https:\/\/doi.org\/10.2478\/v10178-011-0055-7","journal-title":"Metrology & Measurement Systems"},{"key":"5938_CR10","doi-asserted-by":"crossref","unstructured":"Okoh C, Roy R, Mehnen J, Redding L (2014) Overview of remaining useful life prediction techniques in through-life engineering services. In Proc. The 6th Conference on Industrial Product Service Systems (pp.158\u2013163)","DOI":"10.1016\/j.procir.2014.02.006"},{"key":"5938_CR11","doi-asserted-by":"crossref","unstructured":"Abidine M B, Fergani B, Menhour I (2019) Activity Recognition from Smartphones Using Hybrid Classifier PCA-SVM-HMM. In Proc. 2019 International Conference on Wireless Networks and Mobile Communications (pp. 1\u20135)","DOI":"10.1109\/WINCOM47513.2019.8942492"},{"key":"5938_CR12","doi-asserted-by":"publisher","unstructured":"Jing Z, Yuzhu H, Weijia C, Polytechnic C (2018) Analog circuit fault diagnosis based on SVM optimized by SCA. Navigation and Control 33: 57\u201364. https:\/\/doi.org\/10.13382\/j.jemi.B1801840","DOI":"10.13382\/j.jemi.B1801840"},{"key":"5938_CR13","first-page":"91","volume":"43","author":"Z Yingrong","year":"2018","unstructured":"Yingrong Z, Wenbo S, Changfeng W, Yao W (2018) Based on improvement of HMM analog circuit fault prognostics model. Fire Control & Command Control 43:91\u2013101","journal-title":"Fire Control & Command Control"},{"key":"5938_CR14","doi-asserted-by":"publisher","unstructured":"Cortes C, Vapnik V (1995) Support vector network. Machine Learning 20: 273\u2013297. https:\/\/doi.org\/10.1007\/BF00994018","DOI":"10.1007\/BF00994018"},{"key":"5938_CR15","first-page":"242","volume":"9","author":"A Balwant","year":"2012","unstructured":"Balwant A, Doye SS (2012) Hidden markov model for speech recognition using modified forward-backward re-estimation algorithm. International Journal of Computer Science Issues 9:242\u2013247","journal-title":"International Journal of Computer Science Issues"},{"key":"5938_CR16","doi-asserted-by":"publisher","first-page":"215","DOI":"10.1016\/j.artint.2009.11.011","volume":"174","author":"SZ Yu","year":"2010","unstructured":"Yu SZ (2010) Hidden semi-Markov models. Artif Intell 174:215\u2013243","journal-title":"Artif Intell"},{"key":"5938_CR17","doi-asserted-by":"publisher","unstructured":"Nose K, Mizuno (2008) A 0.016 mm, 2.4 GHz RF signal quality measurement macro for RF test and diagnosis. IEEE Journal of Solid-State Circuits 43(4):1038\u20131046. https:\/\/doi.org\/10.1109\/jssc.2008.917566","DOI":"10.1109\/jssc.2008.917566"},{"key":"5938_CR18","doi-asserted-by":"publisher","first-page":"110","DOI":"10.4156\/ijiip.vol3.issue1.11","volume":"3","author":"M Ashraf","year":"2012","unstructured":"Ashraf M, Chetty G, Tran D, Sharma D (2012) A New Approach for Constructing Missing Features Values. International Journal of Intelligent Information Processing 3:110\u2013118. https:\/\/doi.org\/10.4156\/ijiip.vol3.issue1.11","journal-title":"International Journal of Intelligent Information Processing"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-021-05938-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10836-021-05938-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-021-05938-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,7,28]],"date-time":"2021-07-28T05:10:22Z","timestamp":1627449022000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10836-021-05938-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,4]]},"references-count":18,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2021,4]]}},"alternative-id":["5938"],"URL":"https:\/\/doi.org\/10.1007\/s10836-021-05938-0","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,4]]},"assertion":[{"value":"29 August 2020","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"7 March 2021","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"3 June 2021","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}