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The correct operation of RSNs is essential, and RSNs have to be thoroughly tested. However, due to their inherently sequential structure and complex control dependencies, large parts of RSNs have limited observability and controllability. As a result, certain faults at the interfaces to the instruments, control primitives and scan segments remain undetected by existing test methods. In the paper at hand, Design-for-test (DfT) schemes are developed to overcome the testability problems e.g. by resynthesizing the initial design. A DfT scheme for RSNs is presented, which allows detecting all single stuck-at-faults in RSNs by using existing test generation techniques. The developed scheme analyzes and ensures the testability of all parts of RSNs, which include scan segments, control primitives, and interfaces to the instruments. Therefore, the developed scheme is referred to as a<jats:italic>complete DfT scheme<\/jats:italic>. 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