{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T07:39:36Z","timestamp":1740123576481,"version":"3.37.3"},"reference-count":21,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2023,3,27]],"date-time":"2023-03-27T00:00:00Z","timestamp":1679875200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,3,27]],"date-time":"2023-03-27T00:00:00Z","timestamp":1679875200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.1007\/s10836-023-06058-7","type":"journal-article","created":{"date-parts":[[2023,3,27]],"date-time":"2023-03-27T05:02:47Z","timestamp":1679893367000},"page":"155-170","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits"],"prefix":"10.1007","volume":"39","author":[{"given":"H.","family":"El Badawi","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6458-5018","authenticated-orcid":false,"given":"F.","family":"Azais","sequence":"additional","affiliation":[]},{"given":"S.","family":"Bernard","sequence":"additional","affiliation":[]},{"given":"M.","family":"Comte","sequence":"additional","affiliation":[]},{"given":"V.","family":"Kerzerho","sequence":"additional","affiliation":[]},{"given":"F.","family":"Lefevre","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,3,27]]},"reference":[{"key":"6058_CR1","first-page":"49","volume-title":"Sensors for built-in alternate RF test","author":"L Abdallah","year":"2010","unstructured":"Abdallah L, Stratigopoulos H-G, Kelma C, Mir S (2010) Sensors for built-in alternate RF test. Proc. IEEE European Test Symposium (ETS), pp 49\u201354"},{"key":"6058_CR2","first-page":"1","volume-title":"True non-intrusive sensors for RF built-in test","author":"L Abdallah","year":"2013","unstructured":"Abdallah L, Stratigopoulos H-G, Mir S (2013) True non-intrusive sensors for RF built-in test. Proc. IEEE International Test Conference (ITC), pp 1\u201310"},{"key":"6058_CR3","first-page":"109","volume-title":"On line monitoring of rf power amplifiers with embedded temperature sensors","author":"J Altet","year":"2012","unstructured":"Altet J, Mateo D, G\u00f3mez D (2012) On line monitoring of rf power amplifiers with embedded temperature sensors. Proc. IEEE International On-Line Testing Symposium (IOLTS), pp 109\u2013113"},{"issue":"11","key":"6058_CR4","doi-asserted-by":"publisher","first-page":"2022","DOI":"10.1109\/TCSI.2016.2598184","volume":"63","author":"M Andraud","year":"2016","unstructured":"Andraud M, Stratigopoulos H-G, Simeu E (2016) One-shot non-intrusive calibration against process variations for analog\/rf circuits. IEEE Trans Circuits Syst I 63(11):2022\u20132035","journal-title":"IEEE Trans Circuits Syst I"},{"key":"6058_CR5","first-page":"1","volume-title":"Reliability enhancement using in-field monitoring and recovery for RF circuits","author":"D Chang","year":"2014","unstructured":"Chang D, Ozev S, Bakkaloglu B, Kiaei S, Afacan E, Dundar G (2014) Reliability enhancement using in-field monitoring and recovery for RF circuits. Proc. IEEE VLSI Test Symposium (VTS), pp 1\u20136"},{"key":"6058_CR6","first-page":"17","volume-title":"Efficient generation of data sets for one-shot statistical calibration of rf\/mm-wave circuits","author":"F Cilici","year":"2019","unstructured":"Cilici F, Leger G, Barragan MJ, Mir S, Lauga-Larroze E, Bourdel S (2019) Efficient generation of data sets for one-shot statistical calibration of rf\/mm-wave circuits. Proc. International Conf. on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), pp 17\u201320"},{"key":"6058_CR7","first-page":"77","volume-title":"Built-in performance monitoring of mixed-signal\/rf front ends using real-time parameter estimation","author":"SK Devarakond","year":"2010","unstructured":"Devarakond SK, Sen S, Banerjee A, Natarajan V, Chatterjee A (2010) Built-in performance monitoring of mixed-signal\/rf front ends using real-time parameter estimation. Proc. IEEE International On-Line Testing Symposium (IOLTS), pp 77\u201382"},{"key":"6058_CR8","first-page":"505","volume-title":"Built-in test of millimeter-wave circuits based on non-intrusive sensors","author":"A Dimakos","year":"2016","unstructured":"Dimakos A, Stratigopoulos H-G, Siligaris A, Mir S, De Foucauld E (2016) Built-in test of millimeter-wave circuits based on non-intrusive sensors. Proc. Design, Automation & Test in Europe Conference (DATE), pp 505\u2013510"},{"key":"6058_CR9","first-page":"1","volume-title":"Use of ensemble methods for indirect test of RF circuits: can it bring benefits?","author":"H El Badawi","year":"2019","unstructured":"El Badawi H, Azais F, Bernard S, Comte M, Kerz\u00e9rho V, Lefevre F (2019) Use of ensemble methods for indirect test of RF circuits: can it bring benefits? Proc. IEEE Latin American Test Symposium (LATS), pp 1\u20136"},{"key":"6058_CR10","first-page":"1","volume-title":"Exploring on-line RF performance monitoring based on the indirect test strategy","author":"H El Badawi","year":"2021","unstructured":"El Badawi H, Aza\u00efs F, Bernard S, Comte M, Kerz\u00e9rho V, Lef\u00e8vre F (2021) Exploring on-line RF performance monitoring based on the indirect test strategy. Proc. IEEE Latin American Test Symposium (LATS), pp 1\u20137"},{"key":"6058_CR11","volume-title":"Ageing of integrated circuits: causes, effects and mitigation techniques","author":"B Halak","year":"2019","unstructured":"Halak B (2019) Ageing of integrated circuits: causes, effects and mitigation techniques. Springer"},{"key":"6058_CR12","first-page":"111","volume-title":"Proc. Joint European Conference on Machine Learning and Knowledge Discovery in Databases","author":"F Horn","year":"2019","unstructured":"Horn F, Pack R, Rieger M (2019) The autofeat python library for automated feature engineering and selection. Proc. Joint European Conference on Machine Learning and Knowledge Discovery in Databases. Springer, pp 111\u2013120"},{"key":"6058_CR13","first-page":"1","volume-title":"A generic methodology for building efficient prediction models in the context of alternate testing","author":"S Larguech","year":"2015","unstructured":"Larguech S, Azais F, Bernard S, Comte M, Kerzerho V, Renovell M (2015) A generic methodology for building efficient prediction models in the context of alternate testing. Proc. IEEE International Mixed-Signal Test Workshop (IMSTW), pp 1\u20136"},{"issue":"4","key":"6058_CR14","doi-asserted-by":"publisher","first-page":"27","DOI":"10.1109\/MCAS.2010.938636","volume":"10","author":"P-I Mak","year":"2010","unstructured":"Mak P-I, Martins RP (2010) High-\/mixed-voltage RF and analog cmos circuits come of age. IEEE Circuits Syst Mag 10(4):27\u201339","journal-title":"IEEE Circuits Syst Mag"},{"key":"6058_CR15","first-page":"1","volume-title":"Analog neural network design for RF built-in self-test","author":"D Maliuk","year":"2010","unstructured":"Maliuk D, Stratigopoulos H-G, Huang H, Makris Y (2010) Analog neural network design for RF built-in self-test. Proc. IEEE International Test Conference (ITC), pp 1\u201310"},{"key":"6058_CR16","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-6163-0","volume-title":"Analog IC reliability in nanometer CMOS","author":"E Maricau","year":"2013","unstructured":"Maricau E, Gielen G (2013) Analog IC reliability in nanometer CMOS. Springer"},{"key":"6058_CR17","first-page":"1042","volume-title":"On-line testing for VLSI","author":"M Nicolaidis","year":"1997","unstructured":"Nicolaidis M (1997) On-line testing for VLSI. Proc. IEEE International Test Conference, p 1042"},{"key":"6058_CR18","first-page":"1","volume-title":"Machine learning applications in IC testing","author":"H Stratigopoulos","year":"2018","unstructured":"Stratigopoulos H (2018) Machine learning applications in IC testing. Proc. IEEE European Test Symposium (ETS), pp 1\u201310"},{"issue":"6","key":"6058_CR19","doi-asserted-by":"publisher","first-page":"1421","DOI":"10.1109\/JSSC.2006.874272","volume":"41","author":"H-G Stratigopoulos","year":"2006","unstructured":"Stratigopoulos H-G, Makris Y (2006) An adaptive checker for the fully differential analog code. IEEE J Solid-State Circuits 41(6):1421\u20131429","journal-title":"IEEE J Solid-State Circuits"},{"issue":"3","key":"6058_CR20","doi-asserted-by":"publisher","first-page":"349","DOI":"10.1109\/43.986428","volume":"21","author":"PN Variyam","year":"2002","unstructured":"Variyam PN, Cherubal S, Chatterjee A (2002) Prediction of analog performance parameters using fast transient testing. IEEE Trans Comput Aided Des Integr Circuits Syst 21(3):349\u2013361","journal-title":"IEEE Trans Comput Aided Des Integr Circuits Syst"},{"issue":"5","key":"6058_CR21","doi-asserted-by":"publisher","first-page":"1018","DOI":"10.1109\/TCSI.2007.895531","volume":"54","author":"R Voorakaranam","year":"2007","unstructured":"Voorakaranam R, Akbay SS, Bhattacharya S, Cherubal S, Chatterjee A (2007) Signature testing of analog and RF circuits: algorithms and methodology. IEEE Trans Circuits Syst I Regul Pap 54(5):1018\u20131031","journal-title":"IEEE Trans Circuits Syst I Regul Pap"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-023-06058-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10836-023-06058-7\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-023-06058-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,27]],"date-time":"2023-06-27T06:27:54Z","timestamp":1687847274000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10836-023-06058-7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3,27]]},"references-count":21,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2023,4]]}},"alternative-id":["6058"],"URL":"https:\/\/doi.org\/10.1007\/s10836-023-06058-7","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2023,3,27]]},"assertion":[{"value":"4 May 2022","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"9 March 2023","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"27 March 2023","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that there is no conflict of interest.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflicts of Interests"}}]}}