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To evaluate test sets for the detection of unmodeled defects, <jats:italic>n<\/jats:italic>-detect test sets (which detect all modeled faults at least <jats:italic>n<\/jats:italic> times) have previously been proposed. Unfortunately, <jats:italic>n<\/jats:italic>-detect test sets are often prohibitively long. In this paper, we investigate the ability of shadow flip-flops connected into a MISR (Multiple Input Signature Register) to detect stuck-at faults fortuitously multiple times during scan shift. We explore which flip-flops should be shadowed to increase the value of <jats:italic>n<\/jats:italic> for the least detected stuck-at faults for each circuit studied. We then identify which circuit characteristics are most important for determining the cost of the MISR needed to achieve high values of <jats:italic>n<\/jats:italic>. For example, circuits that contain a few flip-flops with upstream fault cones that cover a large percentage of all faults in the circuit can often achieve high <jats:italic>n<\/jats:italic>-detect coverage fortuitously with a low-cost MISR. This allows a DFT engineer to predict the viability of this MISR-based approach early in the design cycle.<\/jats:p>","DOI":"10.1007\/s10836-023-06060-z","type":"journal-article","created":{"date-parts":[[2023,4,25]],"date-time":"2023-04-25T06:02:35Z","timestamp":1682402555000},"page":"227-243","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift"],"prefix":"10.1007","volume":"39","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4912-4023","authenticated-orcid":false,"given":"Hui","family":"Jiang","sequence":"first","affiliation":[]},{"given":"Fanchen","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Jennifer","family":"Dworak","sequence":"additional","affiliation":[]},{"given":"Kundan","family":"Nepal","sequence":"additional","affiliation":[]},{"given":"Theodore","family":"Manikas","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,4,25]]},"reference":[{"key":"6060_CR1","doi-asserted-by":"crossref","unstructured":"Alves N, Dworak J, Bahar I, Nepal K (2009) Compacting test vector sets via strategic use of implications. 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