{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T07:39:30Z","timestamp":1740123570264,"version":"3.37.3"},"reference-count":30,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T00:00:00Z","timestamp":1688169600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T00:00:00Z","timestamp":1688169600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2023,8]]},"DOI":"10.1007\/s10836-023-06075-6","type":"journal-article","created":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T07:02:09Z","timestamp":1688194929000},"page":"487-500","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["E3C Techniques for Protecting NAND Flash Memories"],"prefix":"10.1007","volume":"39","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9232-2012","authenticated-orcid":false,"given":"Shyue-Kung","family":"Lu","sequence":"first","affiliation":[]},{"given":"Zeng-Long","family":"Tsai","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,7,1]]},"reference":[{"key":"6075_CR1","doi-asserted-by":"crossref","unstructured":"Basak A, Paul S, Park J, Park J, Bhunia S (2013)\u00a0Reconfigurable ECC for Adaptive Protection of Memory. In Proc Int\u2019l Midwest Symp Circuits and Systems (MWSCAS)\u00a0pp. 1085\u20131088","DOI":"10.1109\/MWSCAS.2013.6674841"},{"issue":"1","key":"6075_CR2","doi-asserted-by":"publisher","first-page":"17","DOI":"10.1109\/7298.946456","volume":"1","author":"RC Baumann","year":"2001","unstructured":"Baumann RC (2001) Soft errors in advanced semiconductor devices\u2014Part I: The three radiation sources. IEEE Trans Device Mater Reliab 1(1):17\u201322","journal-title":"IEEE Trans Device and Materials Reliability"},{"issue":"4","key":"6075_CR3","doi-asserted-by":"publisher","first-page":"489","DOI":"10.1109\/JPROC.2003.811702","volume":"91","author":"R Bez","year":"2003","unstructured":"Bez R, Camerlenghi E, Modelli A, Visconti A (2003) Introduction to flash memory. Proc IEEE 91(4):489\u2013502","journal-title":"Proc IEEE"},{"issue":"9","key":"6075_CR4","doi-asserted-by":"publisher","first-page":"1666","DOI":"10.1109\/JPROC.2017.2713127","volume":"105","author":"Y Cai","year":"2017","unstructured":"Cai Y, Ghose S, Haratshc EF, Luo Y, Mutlu O (2017) Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives. Proc IEEE 105(9):1666\u20131704","journal-title":"Proc IEEE"},{"key":"6075_CR5","doi-asserted-by":"crossref","unstructured":"Chen TH, Hsiao YY, Hsing YT, Wu CW (2009)\u00a0An Adaptive-Rate Error Correction Scheme for NAND Flash Memory. In Proc VLSI Test Symp pp. 53\u201358","DOI":"10.1109\/VTS.2009.24"},{"key":"6075_CR6","doi-asserted-by":"crossref","unstructured":"Corcoran PM, Bigioi P, Nanu F (2014)\u00a0Detection and Repair of Flash-eye in Handheld Devices. In Proc IEEE Int\u2019l Conf on Consumer Electronics (ICCE) pp. 213\u2013216","DOI":"10.1109\/ICCE.2014.6775978"},{"issue":"4","key":"6075_CR7","doi-asserted-by":"publisher","first-page":"549","DOI":"10.1109\/TIT.1965.1053825","volume":"11","author":"G Forney","year":"1965","unstructured":"Forney G (1965) On Decoding BCH Codes. IEEE Tran Inf 11(4):549\u2013557","journal-title":"IEEE Tran Information"},{"key":"6075_CR8","doi-asserted-by":"crossref","unstructured":"Ginez O, Portal JM, Aziza H (2008)\u00a0Reliability Issues in Flash Memories: An On-line Diagnosis and Repair Scheme for Word Line Drivers. In Proc Int\u2019l Workshop on Mixed-Signals, Sensors, and Systems Test, pp. 1\u20136","DOI":"10.1109\/IMS3TW.2008.4581627"},{"key":"6075_CR9","doi-asserted-by":"crossref","unstructured":"Ginez O, Portal JM, Aziza H (2009)\u00a0An On-Line Testing Scheme for Repairing Purposes in Flash Memories. In Proc IEEE Int\u2019l Symp Des Diagnostics Electronic Circ Syst (DDECS)\u00a0pp. 213\u2013216","DOI":"10.1109\/DDECS.2009.5012110"},{"key":"6075_CR10","doi-asserted-by":"crossref","unstructured":"Guo J, Chen Z, Wang D, Shao Z, Chen Y (2014)\u00a0DPA: A Data Pattern Aware Error Prevention Technique for NAND Flash Lifetime Extension. In Proc Asia South Pac Design Autom Conf (ASP-DAC)\u00a0pp. 592\u2013597","DOI":"10.1109\/ASPDAC.2014.6742955"},{"key":"6075_CR11","doi-asserted-by":"publisher","first-page":"147","DOI":"10.1002\/j.1538-7305.1950.tb00463.x","volume":"29","author":"RW Hamming","year":"1950","unstructured":"Hamming RW (1950) Error detecting and correcting codes. Bell Syst Tech J 29:147\u2013160","journal-title":"Bell Syst Tech J"},{"issue":"12","key":"6075_CR12","doi-asserted-by":"publisher","first-page":"3348","DOI":"10.1109\/TC.2015.2401028","volume":"64","author":"JW Hsieh","year":"2015","unstructured":"Hsieh JW, Chen CW, Lin HY (2015) Adaptive ECC Scheme for Hybrid SSD\u2019s. IEEE Trans Comp 64(12):3348\u20133361","journal-title":"IEEE Trans Computers"},{"key":"6075_CR13","doi-asserted-by":"crossref","unstructured":"Hsiao YY, Chen CH, Wu CW (2006)\u00a0A Built-In Self-Repair Scheme for NOR-type flash memory. In Proc IEEE VLSI Test Symp (VTS), Berkeley pp. 114\u2013119","DOI":"10.1109\/VTS.2006.5"},{"key":"6075_CR14","doi-asserted-by":"crossref","unstructured":"Hsiao YY, Chen CH, Wu CW (2006)\u00a0A built-in self-repair scheme for NOR-type flash memory. In Proc IEEE VLSI Test Symp (VTS)\u00a0pp. 114\u2013119","DOI":"10.1109\/VTS.2006.5"},{"issue":"8","key":"6075_CR15","doi-asserted-by":"publisher","first-page":"1243","DOI":"10.1109\/TCAD.2010.2049051","volume":"29","author":"YY Hsiao","year":"2010","unstructured":"Hsiao YY, Chen CH, Wu CW (2010) \u201cBuilt-In Self-Repair Schemes for Flash Memories. IEEE Trans Comput Aided Des Integr Circuits Syst\u00a029(8):1243\u20131256","journal-title":"Computer-Aided Design of Integrated Circuits and Systems"},{"key":"6075_CR16","unstructured":"Huang CT, Yeh JC, Shih YY, Huang RF, Wu CW (2005)\u00a0On test and diagnostics of flash memories. In Proc IEEE Asian Test Symp (ATS)\u00a0pp. 260\u2013265"},{"key":"6075_CR17","doi-asserted-by":"publisher","unstructured":"IEEE Computer Society (2019) IEEE Standard for Error Correction Coding of Flash Memory Using Low-Density Parity Check Codes. In IEEE Std 1890-2018, vol., no., pp. 1\u201351, 28 Feb. 2019. https:\/\/doi.org\/10.1109\/IEEESTD.2019.8654228","DOI":"10.1109\/IEEESTD.2019.8654228"},{"key":"6075_CR18","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-5671-8","volume-title":"Reliability, yield, and stress burn-in","author":"W Kuo","year":"1998","unstructured":"Kuo W, Chien WTK, Kim T (1998) Reliability, yield, and stress burn-in. Kluwer Academic Publishers, Boston"},{"key":"6075_CR19","doi-asserted-by":"crossref","unstructured":"Lu SK, Zhong SX, Hashizume M (2016)\u00a0Adaptive ECC Techniques for Yield and Reliability Enhancement of Flash Memories. In Proc IEEE Asian Test Symp (ATS)\u00a0pp. 287\u2013292","DOI":"10.1109\/ATS.2016.64"},{"issue":"1","key":"6075_CR20","doi-asserted-by":"publisher","first-page":"148","DOI":"10.1109\/JPROC.2008.2007477","volume":"97","author":"R Micheloni","year":"2009","unstructured":"Micheloni R, Picca M, Amato S, Schwalm H, Scheppler M, Commodaro S (2009) Non-volatile Memories for Removable Media. Proc IEEE 97(1):148\u2013160","journal-title":"Proc IEEE"},{"key":"6075_CR21","doi-asserted-by":"crossref","unstructured":"Mielke N\u00a0et al (2008) Bit error rate in NAND Flash memories. In Proc IEEE Int\u2019l Reliability Physics Symposium, Phoenix, AZ, USA pp. 9\u201319","DOI":"10.1109\/RELPHY.2008.4558857"},{"issue":"9","key":"6075_CR22","doi-asserted-by":"publisher","first-page":"1725","DOI":"10.1109\/JPROC.2017.2725738","volume":"105","author":"NR Mielke","year":"2017","unstructured":"Mielke NR, Frickey RE, Kalastirsky I, Quan M, Ustinov D, Vasudevan VJ (2017) Reliability of Solid-State Drives Based NAND Flash Memory. Proc IEEE 105(9):1725\u20131750","journal-title":"Proc IEEE"},{"issue":"12","key":"6075_CR23","doi-asserted-by":"publisher","first-page":"4404","DOI":"10.1109\/TCSI.2018.2840350","volume":"65","author":"S Ning","year":"2018","unstructured":"Ning S (2018) Advanced Bit Flip Concatenates BCH Code Demonstrates 0.93% Correctable BER and Faster Decoding on (36 864, 32 768) Emerging Memories. IEEE Trans Circuits and Systems I 65(12):4404\u20134412","journal-title":"IEEE Trans Circuits and Systems I"},{"key":"6075_CR24","unstructured":"Park Y, Lee J, Cho SS, Jin G, Jung E (2014)\u00a0Scaling and Reliability of NAND Flash Devices. In Proc IEEE 52nd Int Reliab Phys Symp (IRPS) pp. 2E.1.1\u20132E.1.4"},{"issue":"11","key":"6075_CR25","doi-asserted-by":"publisher","first-page":"2920","DOI":"10.1109\/JSSC.2013.2280078","volume":"48","author":"S Tanakamaru","year":"2013","unstructured":"Tanakamaru S, Yanagihara Y, Takeuchi K (2013) Error-prediction LDPC and Error-recovery Schemes for Highly Reliable Solid-state Drives (SSDs). IEEE J Solid-State Circuits 48(11):2920\u20132933","journal-title":"IEEE J Solid-State Circuits"},{"issue":"11","key":"6075_CR26","doi-asserted-by":"publisher","first-page":"1942","DOI":"10.1109\/TCAD.2016.2533861","volume":"35","author":"D Wei","year":"2016","unstructured":"Wei D, Deng L, Zhang P, Qiao L, Peng XY (2016) \u201cNRC: A Nibble Remapping Coding Strategy for NAND Flash Reliability Extension. IEEE Trans Comput Aided Des Integr Circuits Syst 35(11):1942\u20131946","journal-title":"Computer-Aided Design of Integrated Circuits and Systems"},{"issue":"6","key":"6075_CR27","doi-asserted-by":"publisher","first-page":"1101","DOI":"10.1109\/TCAD.2006.885828","volume":"26","author":"JC Yeh","year":"2007","unstructured":"Yeh JC, Cheng KL, Chou YF, Wu CW (2007) \u201cFlash memory testing and built-in self-diagnosis with march-like test algorithms. IEEE Trans Comput Aided Des Integr Circuits Syst 26(6):1101\u20131113","journal-title":"Computer-Aided Design of Integrated Circuits and Systems"},{"key":"6075_CR28","doi-asserted-by":"crossref","unstructured":"Yuan L, Liu H, Jia P, Yang Y (2015)\u00a0Reliability-based ECC System for Adaptive Protection of NAND Flash Memories. In Proc 5th Int\u2019l Conf. Commun Syst Netw Technol\u00a0(CSNT)\u00a0pp. 897\u2013902","DOI":"10.1109\/CSNT.2015.23"},{"key":"6075_CR29","doi-asserted-by":"crossref","unstructured":"Zambelli C, Cancelliere G, Riguzzi F, Lamma E, Olivo P, Marelli A, Micheloni R (2017)\u00a0Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization. In Proc Intt\u2019l Memory Workshop (IMW) pp. 1\u20134","DOI":"10.1109\/IMW.2017.7939074"},{"key":"6075_CR30","doi-asserted-by":"crossref","unstructured":"Zhou Y, Wu F, Lu Z, He X, Huang P, Xie C (2018)\u00a0SCORE: A Novel Scheme to Efficiently Cache Overlong ECCs in NAND Flash Memory. ACM Trans Arch Code Opt n15(4):60:1\u201360:25","DOI":"10.1145\/3291052"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-023-06075-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10836-023-06075-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-023-06075-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,30]],"date-time":"2023-09-30T07:12:39Z","timestamp":1696057959000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10836-023-06075-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7,1]]},"references-count":30,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2023,8]]}},"alternative-id":["6075"],"URL":"https:\/\/doi.org\/10.1007\/s10836-023-06075-6","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2023,7,1]]},"assertion":[{"value":"2 January 2023","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"2 June 2023","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"1 July 2023","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors have no relevant financial or non-financial interests to disclose.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of Interest Statement"}}]}}