{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T07:39:42Z","timestamp":1740123582274,"version":"3.37.3"},"reference-count":21,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["2124453"],"award-info":[{"award-number":["2124453"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100011039","name":"Intelligence Advanced Research Projects Activity","doi-asserted-by":"publisher","award":["W911NF-17-9-0001"],"award-info":[{"award-number":["W911NF-17-9-0001"]}],"id":[{"id":"10.13039\/100011039","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100005144","name":"Qualcomm","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100005144","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007140","name":"Synopsys","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007140","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2024,10]]},"DOI":"10.1007\/s10836-024-06141-7","type":"journal-article","created":{"date-parts":[[2024,10,24]],"date-time":"2024-10-24T13:02:52Z","timestamp":1729774972000},"page":"595-602","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Test Modules for Enhanced Testability of Single Flux Quantum Integrated Circuits"],"prefix":"10.1007","volume":"40","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6934-3322","authenticated-orcid":false,"given":"Abdelrahman G.","family":"Qoutb","sequence":"first","affiliation":[]},{"given":"Jamil","family":"Kawa","sequence":"additional","affiliation":[]},{"given":"Eby G.","family":"Friedman","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2024,10,24]]},"reference":[{"issue":"3","key":"6141_CR1","doi-asserted-by":"publisher","first-page":"760","DOI":"10.1109\/TASC.2010.2096792","volume":"21","author":"OA Mukhanov","year":"2011","unstructured":"Mukhanov OA (2011) Energy-efficient single flux quantum technology. IEEE Trans Appl Supercond 21(3):760\u2013769","journal-title":"IEEE Trans Appl Supercond"},{"issue":"2","key":"6141_CR2","doi-asserted-by":"publisher","first-page":"3212","DOI":"10.1109\/77.783712","volume":"9","author":"W Chen","year":"1999","unstructured":"Chen W, Rylyakov A, Patel V, Lukens J, Likharev K (1999) Rapid single flux quantum T-flip flop operating up to 770 GHz. IEEE Trans Appl Superconductivity 9(2):3212\u20133215","journal-title":"IEEE Trans Appl Superconductivity"},{"issue":"2","key":"6141_CR3","doi-asserted-by":"publisher","first-page":"024004.1","DOI":"10.1088\/2058-9565\/aaa3a0","volume":"3","author":"R McDermott","year":"2018","unstructured":"McDermott R, Vavilov MG, Plourde BLT, Wilhelm FK, Liebermann PJ, Mukhanov OA, Ohki TA (2018) Quantum-classical interface based on single flux quantum digital logic. Quantum Sci Technol 3(2):024004.1-024004.18","journal-title":"Quantum Sci Technol"},{"doi-asserted-by":"crossref","unstructured":"Krylov G, Friedman EG (2022) Single Flux Quantum Integrated Circuit Design. Springer","key":"6141_CR4","DOI":"10.1007\/978-3-030-76885-0"},{"doi-asserted-by":"crossref","unstructured":"Krylov G, Jabbari T, Friedman EG (2024) Single Flux Quantum Integrated Circuit Design, 2nd edn. Springer","key":"6141_CR5","DOI":"10.1007\/978-3-031-47475-0"},{"key":"6141_CR6","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TASC.2016.2519388","volume":"26","author":"SK Tolpygo","year":"2016","unstructured":"Tolpygo SK, Bolkhovsky V, Weir TJ, Wynn A, Oates DE, Johnson LM, Gouker MA (2016) Advanced fabrication processes for superconducting very large-scale integrated circuits. IEEE Trans Appl Supercond 26:1\u201310","journal-title":"IEEE Trans Appl Supercond"},{"issue":"4","key":"6141_CR7","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TASC.2017.2669585","volume":"27","author":"VK Semenov","year":"2017","unstructured":"Semenov VK, Polyakov YA, Tolpygo SK (2017) AC-biased shift registers as fabrication process benchmark circuits and flux trapping diagnostic tool. IEEE Trans Appl Supercond 27(4):1\u20139","journal-title":"IEEE Trans Appl Supercond"},{"unstructured":"Bushnell M, Agrawal V (2004) Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, vol 17. Springer Science & Business Media","key":"6141_CR8"},{"issue":"5","key":"6141_CR9","first-page":"1","volume":"29","author":"G Krylov","year":"2019","unstructured":"Krylov G, Friedman EG (2019) Globally asynchronous, locally synchronous clocking and shared interconnect for large-scale SFQ systems. IEEE Trans Appl Supercond 29(5):1\u20135","journal-title":"IEEE Trans Appl Supercond"},{"issue":"5","key":"6141_CR10","first-page":"1","volume":"31","author":"T Jabbari","year":"2021","unstructured":"Jabbari T, Krylov G, Kawa J, Friedman EG (2021) Splitter trees in single flux quantum circuits. IEEE Trans Appl Supercond 31(5):1\u20136","journal-title":"IEEE Trans Appl Supercond"},{"issue":"8","key":"6141_CR11","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TASC.2017.2759239","volume":"27","author":"G Krylov","year":"2017","unstructured":"Krylov G, Friedman EG (2017) Design for testability of SFQ circuits. IEEE Trans Appl Supercond 27(8):1\u20137","journal-title":"IEEE Trans Appl Supercond"},{"doi-asserted-by":"crossref","unstructured":"Krylov G, Friedman EG (2017) \u201cTest Point Insertion for RSFQ Circuits,\u201d Proceedings of the IEEE International Symposium on Circuits and Systems, pp 1\u20134","key":"6141_CR12","DOI":"10.1109\/ISCAS.2017.8050794"},{"doi-asserted-by":"crossref","unstructured":"Goldstein LH, Thigpen EL (1980) \u201cSCOAP: Sandia Controllability\/Observability Analysis Program,\u201d Proceedings of the ACM\/IEEE Design Automation Conference, pp 190\u2013196","key":"6141_CR13","DOI":"10.1145\/800139.804528"},{"issue":"3","key":"6141_CR14","doi-asserted-by":"publisher","first-page":"72","DOI":"10.1109\/54.785838","volume":"16","author":"M Hansen","year":"1999","unstructured":"Hansen M, Yalcin H, Hayes J (1999) Unveiling the ISCAS-85 benchmarks: a case study in reverse engineering. IEEE Des Test Comput 16(3):72\u201380","journal-title":"IEEE Des Test Comput"},{"doi-asserted-by":"crossref","unstructured":"Tsai H-C, Cheng K, Lin C-J, Bhawmik S (1997) \u201cA Hybrid Algorithm for Test Point Selection for Scan-Based BIST,\u201d Proceedings of the ACM\/IEEE Design Automation Conference, pp 478\u2013483","key":"6141_CR15","DOI":"10.1145\/266021.266205"},{"doi-asserted-by":"crossref","unstructured":"Ma Y, Ren H, Khailany B, Sikka H, Luo L, Natarajan K, Yu B (2019) \u201cHigh Performance Graph ConvolutionaI Networks with Applications in Testability Analysis,\u201d Proceedings of the ACM\/IEEE Design Automation Conference, pp 1\u20136","key":"6141_CR16","DOI":"10.1145\/3316781.3317838"},{"key":"6141_CR17","first-page":"1","volume":"25","author":"SK Tolpygo","year":"2015","unstructured":"Tolpygo SK, Bolkhovsky V, Weir TJ, Galbraith CJ, Johnson LM, Gouker MA, Semenov VK (2015) Inductance of circuit structures for MIT LL superconductor electronics fabrication process with 8 Niobium layers. IEEE Trans Appl Supercond 25:1\u20135","journal-title":"IEEE Trans Appl Supercond"},{"issue":"2","key":"6141_CR18","doi-asserted-by":"publisher","first-page":"247","DOI":"10.1023\/A:1007903527533","volume":"16","author":"K Gaj","year":"1997","unstructured":"Gaj K, Friedman EG, Feldman MJ (1997) Timing of multi-gigahertz rapid single flux quantum digital circuits. J VLSI Signal Process Syst 16(2):247\u2013276","journal-title":"J VLSI Signal Process Syst"},{"issue":"5","key":"6141_CR19","doi-asserted-by":"publisher","first-page":"665","DOI":"10.1109\/5.929649","volume":"89","author":"EG Friedman","year":"2001","unstructured":"Friedman EG (2001) Clock distribution networks in synchronous digital integrated circuits. Proc IEEE 89(5):665\u2013692","journal-title":"Proc IEEE"},{"issue":"2","key":"6141_CR20","doi-asserted-by":"publisher","first-page":"286","DOI":"10.1109\/92.502201","volume":"4","author":"JL Neves","year":"1996","unstructured":"Neves JL, Friedman EG (1996) Design methodology for synthesizing clock distribution networks exploiting nonzero localized clock skew. IEEE Trans Very Large Scale Integration (VLSI) Syst 4(2):286\u2013291","journal-title":"IEEE Trans Very Large Scale Integration (VLSI) Syst"},{"doi-asserted-by":"crossref","unstructured":"Touba N, McCluskey E (1996) \u201cTest Point Insertion Based on Path Tracing,\u201d Proceedings of IEEE VLSI Test Symposium, pp 2\u20138","key":"6141_CR21","DOI":"10.1109\/VTEST.1996.510828"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-024-06141-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10836-024-06141-7\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-024-06141-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,2]],"date-time":"2024-12-02T03:04:57Z","timestamp":1733108697000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10836-024-06141-7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10]]},"references-count":21,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2024,10]]}},"alternative-id":["6141"],"URL":"https:\/\/doi.org\/10.1007\/s10836-024-06141-7","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2024,10]]},"assertion":[{"value":"23 October 2023","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"13 September 2024","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"24 October 2024","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that they have no known competing fnancial interests or personal relationships that could have appeared to influence the work reported in this paper.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of Interest"}}]}}