{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,11]],"date-time":"2025-09-11T19:15:45Z","timestamp":1757618145112,"version":"3.44.0"},"reference-count":22,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T00:00:00Z","timestamp":1747785600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T00:00:00Z","timestamp":1747785600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2025,6]]},"DOI":"10.1007\/s10836-025-06178-2","type":"journal-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:05:43Z","timestamp":1747803943000},"page":"359-371","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Uncertainty-Aware Crosstalk Predictors for Adaptive Reliability in Core Interconnects"],"prefix":"10.1007","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0802-1474","authenticated-orcid":false,"given":"Rezgar","family":"Sadeghi","sequence":"first","affiliation":[]},{"given":"Amirhossein","family":"Ilkhani","sequence":"additional","affiliation":[]},{"given":"AmirHosein","family":"Yazdanpanah","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2025,5,21]]},"reference":[{"key":"6178_CR1","first-page":"216","volume":"61","author":"Z Shirmohammadi","year":"2018","unstructured":"Shirmohammadi Z (2018) OP-Fibo: An efficient Forbidden Pattern Free CAC design. Integr VLSI J 61:216\u2013224","journal-title":"Integr VLSI J"},{"key":"6178_CR2","doi-asserted-by":"crossref","unstructured":"Liang R, El-Wardany M, Shi J, Bozorgzadeh E (2020) Routing-Free Crosstalk Prediction. Proc. IEEE\/ACM Int. Conf. on Computer-Aided Design (ICCAD), San Diego, CA, USA, pp 1\u20139","DOI":"10.1145\/3400302.3415712"},{"key":"6178_CR3","doi-asserted-by":"publisher","unstructured":"Sadeghi R, Navabi Z (2020) Built-In Predictors for Dynamic Crosstalk Avoidance. Proc. IEEE European Test Symposium (ETS), Tallinn, Estonia, pp 1\u20136. https:\/\/doi.org\/10.1109\/ETS48528.2020.9131576","DOI":"10.1109\/ETS48528.2020.9131576"},{"key":"6178_CR4","doi-asserted-by":"publisher","unstructured":"Shirmohammadi Z, Miremadi SG (2017) SDT-free: An efficient crosstalk avoidance coding mechanism considering inductance effects. Proc Int Conf on Computer and Knowledge Engineering (ICCKE), Mashhad, Iran, pp 293\u2013297. https:\/\/doi.org\/10.1109\/ICCKE.2017.8167894.","DOI":"10.1109\/ICCKE.2017.8167894."},{"key":"6178_CR5","doi-asserted-by":"publisher","first-page":"98348","DOI":"10.1109\/ACCESS.2022.3206039","volume":"10","author":"M Taali","year":"2022","unstructured":"Taali M, Shirmohammadi Z, Danish MSS, Khosravy M (2022) JCI-CAC: An Efficient Crosstalk Avoidance Code Considering Joint Capacitive and Inductive Effects. IEEE Access 10:98348\u201398359. https:\/\/doi.org\/10.1109\/ACCESS.2022.3206039","journal-title":"IEEE Access"},{"key":"6178_CR6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-9313-7","volume-title":"Error Control for Network-on-Chip Links","author":"B Fu","year":"2012","unstructured":"Fu B, Ampadu P (2012) Error Control for Network-on-Chip Links. Springer, New York, NY, USA"},{"key":"6178_CR7","doi-asserted-by":"crossref","unstructured":"Kumar UK, Umashankar BS (2007) Improved Hamming Code for Error Detection and Correction. Proc Int Symp on Wireless Pervasive Computing (ISWPC), San Juan, Puerto Rico","DOI":"10.1109\/ISWPC.2007.342654"},{"issue":"4","key":"6178_CR8","doi-asserted-by":"publisher","first-page":"418","DOI":"10.5573\/JSTS.2012.12.4.418","volume":"12","author":"S Cha","year":"2012","unstructured":"Cha S, Yoon H (2012) Efficient Implementation of Single Error Correction and Double Error Detection Code with Check Bit Precomputation for Memories. J Semicond Technol Sci (JSTS) 12(4):418\u2013425","journal-title":"J Semicond Technol Sci (JSTS)"},{"key":"6178_CR9","doi-asserted-by":"crossref","unstructured":"Koopman P, Chakravarty T (2004) Cyclic redundancy code (CRC) polynomial selection for embedded networks. Proc Int Conf on Dependable Systems and Networks (DSN), Florence, Italy, pp 145\u2013154","DOI":"10.1109\/DSN.2004.1311885"},{"issue":"10","key":"6178_CR10","first-page":"3435","volume":"65","author":"E Sarfati","year":"2018","unstructured":"Sarfati E, Frankel B, Birk Y, Wimer S (2018) Accurate Shielded Interconnect Delay Estimation by Reconfigurable Ring Oscillator. IEEE Trans Circ Syst I: Regular Papers 65(10):3435\u20133444","journal-title":"IEEE Trans Circ Syst I: Regular Papers"},{"key":"6178_CR11","unstructured":"Arunachalam R, Acar E, Nassif AR (2003) Optimal shielding\/spacing metrics for low power design. Proc IEEE Computer Society Annual Symp on VLSI (ISVLSI), Tampa, FL, USA"},{"issue":"5","key":"6178_CR12","doi-asserted-by":"publisher","first-page":"821","DOI":"10.1109\/TCAD.2005.855974","volume":"25","author":"M Ghoneima","year":"2006","unstructured":"Ghoneima M, Ismail Y, Khellah M, Tschanz M (2006) Formal Derivation of Optimal Active Shielding for Low-Power On-Chip Buses. IEEE Trans Comput-Aided Des Integr Circ Syst 25(5):821\u2013836","journal-title":"IEEE Trans Comput-Aided Des Integr Circ Syst"},{"key":"6178_CR13","doi-asserted-by":"crossref","unstructured":"Sainz JA, Roca M, Munoz R, Maiz JA, Aguado LA (2000) A crosstalk sensor implementation for measuring interferences in digital CMOS VLSI circuits. Proc On-Line Testing Workshop, pp 45\u201351","DOI":"10.1109\/OLT.2000.856611"},{"issue":"5","key":"6178_CR14","doi-asserted-by":"publisher","first-page":"606","DOI":"10.1109\/92.894165","volume":"8","author":"F Caignet","year":"2000","unstructured":"Caignet F, Delmas-Bendhia S, Sicard E (2000) On the measurement of crosstalk in integrated circuits. IEEE Trans Very Large Scale Integr (VLSI) Syst 8(5):606\u2013609","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Syst"},{"issue":"2","key":"6178_CR15","doi-asserted-by":"publisher","first-page":"306","DOI":"10.1109\/TVLSI.2008.2004548","volume":"17","author":"KS Li","year":"2009","unstructured":"Li KS, Lee C, Su C, Chen JE (2009) A Unified Detection Scheme for Crosstalk Effects in Interconnection Bus. IEEE Trans Very Large Scale Integr (VLSI) Syst 17(2):306\u2013311","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Syst"},{"issue":"2","key":"6178_CR16","doi-asserted-by":"publisher","first-page":"313","DOI":"10.1109\/15.385903","volume":"37","author":"J Cartysse","year":"1995","unstructured":"Cartysse J, Sinnaeve A, Vandecasteele G (1995) Measured crosstalk on chips using specially designed components. IEEE Trans Electromagn Compat 37(2):313\u2013315","journal-title":"IEEE Trans Electromagn Compat"},{"key":"6178_CR17","doi-asserted-by":"crossref","unstructured":"Sadeghi R, Nosrati N, Basharkhah K, Navabi Z (2019) Back-annotation of Interconnect Physical Properties for System-Level Crosstalk Modeling. Proc IEEE European Test Symposium (ETS), Baden-Baden, Germany, pp 1\u20136","DOI":"10.1109\/ETS.2019.8791549"},{"key":"6178_CR18","doi-asserted-by":"crossref","unstructured":"Verma SK, Kaushik BK (2010) Crosstalk and Power Reduction Using Bus Encoding in RC Coupled VLSI Interconnects. Proc Int Conf on Emerging Trends in Engineering and Technology (ICETET), Goa, India, pp 735\u2013740","DOI":"10.1109\/ICETET.2010.36"},{"key":"6178_CR19","doi-asserted-by":"crossref","unstructured":"Sprenger A, Sadeghi-Kohan S, Reimer JD, Hellebrand S (2020) Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study. Proc IEEE Int Symp on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), pp 1\u20136","DOI":"10.1109\/DFT50435.2020.9250922"},{"key":"6178_CR20","unstructured":"International Technology Roadmap for Semiconductors (ITRS) (2012). [Online]. Available: http:\/\/public.itrs.net"},{"issue":"12","key":"6178_CR21","first-page":"1321","volume":"32","author":"M Michael","year":"2003","unstructured":"Michael M, Lloyd JR, Peters L, Mountsier T (2003) Electromigration failure in ultra-fine copper interconnects. J Electron Mat 32(12):1321\u20131327","journal-title":"J Electron Mat"},{"key":"6178_CR22","doi-asserted-by":"publisher","unstructured":"Sadeghi R, Akbari E, Saber MA (2022) On-Chip Training of Crosstalk Predictors to Fit Uncertainties. In: Proceedings\u00a0of the 2022 IEEE European Test Symposium (ETS), Barcelona, Spain, pp 1\u20132. https:\/\/doi.org\/10.1109\/ETS54262.2022.9810362.","DOI":"10.1109\/ETS54262.2022.9810362."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-025-06178-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10836-025-06178-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-025-06178-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,6]],"date-time":"2025-09-06T15:11:20Z","timestamp":1757171480000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10836-025-06178-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,21]]},"references-count":22,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2025,6]]}},"alternative-id":["6178"],"URL":"https:\/\/doi.org\/10.1007\/s10836-025-06178-2","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2025,5,21]]},"assertion":[{"value":"19 November 2024","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"6 May 2025","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"21 May 2025","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors have no relevant financial or non-financial interests to disclose. There are no conflicts of interest or competing interests associated with this work.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflicts of Interest"}}]}}