{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T06:22:53Z","timestamp":1766211773052,"version":"3.48.0"},"reference-count":22,"publisher":"Springer Science and Business Media LLC","issue":"5-6","license":[{"start":{"date-parts":[[2025,10,6]],"date-time":"2025-10-06T00:00:00Z","timestamp":1759708800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,10,6]],"date-time":"2025-10-06T00:00:00Z","timestamp":1759708800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"funder":[{"name":"Natural Science Foundation of Chongqing CSTC","award":["CSTB2022NSCQ-MSX1389"],"award-info":[{"award-number":["CSTB2022NSCQ-MSX1389"]}]},{"name":"China University Research Innovation Fund-Heterogeneous Intelligent Computing Special Project","award":["2024HY025"],"award-info":[{"award-number":["2024HY025"]}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1007\/s10836-025-06200-7","type":"journal-article","created":{"date-parts":[[2025,10,6]],"date-time":"2025-10-06T08:12:06Z","timestamp":1759738326000},"page":"603-613","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Chebyshev-based Algorithm: Achieving Fast ADC Static Parameter Testing Using a Low-precision Signal Source"],"prefix":"10.1007","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-0262-443X","authenticated-orcid":false,"given":"Jun","family":"Yuan","sequence":"first","affiliation":[]},{"given":"Liangrui","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Yuyang","family":"Zhang","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2025,10,6]]},"reference":[{"issue":"S2","key":"6200_CR1","first-page":"16","volume":"39","author":"HW Luo","year":"2020","unstructured":"Luo HW, Liu JS, Yu YT (2020) Current status and key technologies of VLSI testing. Electron Prod Reliab Environ Test 39(S2):16\u201320","journal-title":"Electron Prod Reliab Environ Test"},{"key":"6200_CR2","doi-asserted-by":"publisher","first-page":"483","DOI":"10.1109\/NSSMIC.1996.591036","volume":"1","author":"JB Simoes","year":"1996","unstructured":"Simoes JB, Loureiro CFM, Landeck J, Correia CMBA (1996) A new method for testing the effective number of bits of analog to digital convert- ers. IEEE Nucl Sci Symp Conf Rec 1:483\u2013486. https:\/\/doi.org\/10.1109\/NSSMIC.1996.591036","journal-title":"IEEE Nucl Sci Symp Conf Rec"},{"key":"6200_CR3","unstructured":"Song ZY (2016) MATLAB digital signal processing 85 practical cases: introduction to advanced. Beijing University of Aeronautics and Astronautics"},{"key":"6200_CR4","doi-asserted-by":"publisher","unstructured":"IEEE Std 1241TM-2010 (2011) IEEE standard for terminology and test methods for analog-to-digital converters. IEEE, New York, NY, USA, pp 1\u2013139. https:\/\/doi.org\/10.1109\/IEEESTD. 2011.5692956","DOI":"10.1109\/IEEESTD"},{"key":"6200_CR5","doi-asserted-by":"publisher","unstructured":"IEEE Std 1658\u20132011 (2012) IEEE standard for terminology and test methods of digital-to-analog converter devices. IEEE, New York, NY, USA, pp 1\u2013126. https:\/\/doi.org\/10.1109\/IEEESTD. 2012.6152113","DOI":"10.1109\/IEEESTD"},{"key":"6200_CR6","unstructured":"Agarwal P, Kumar S, Singh SP (2019) Closed form solutions of various window functions in fractional fourier transform domain. 2019 6th International Conference on Computing for Sustainable Global Development (INDIACom). IEEE, pp 64\u201368"},{"key":"6200_CR7","doi-asserted-by":"publisher","first-page":"361","DOI":"10.1016\/j.measurement.2006.06.016","volume":"40","author":"D Belega","year":"2007","unstructured":"Belega D, Ciugudean M, Stoiciu D (2007) Choice of the cosine- class windows for ADC dynamic testing by spectral analysis. Measurement 40:361\u2013371. https:\/\/doi.org\/10.1016\/j.measurement.2006.06.016","journal-title":"Measurement"},{"key":"6200_CR8","doi-asserted-by":"publisher","unstructured":"Sato K, Ishida T, Okamoto T, Ichikawa T, Wei J, Nakatani T, Zhao Y, Katayama S, Yamamoto S, Kuwana A, Hatayama K, Kobayashi H (2021) Revisit to accurate ADC testing with incoherent sampling using proper sinusoidal signal and sampling frequencies. 2021 IEEE International Test Conference (ITC). IEEE, pp 284\u2013288. https:\/\/doi.org\/10.1109\/ITC50571. 2021.00038","DOI":"10.1109\/ITC50571"},{"issue":"14","key":"6200_CR9","doi-asserted-by":"publisher","first-page":"2125","DOI":"10.3390\/electronics11142125","volume":"11","author":"J Jiang","year":"2022","unstructured":"Jiang J, Li J, Zhang D, Hu C, Peng X, Sun N, Wang S, Zhang Z, Cui W (2022) Research on analog-to-digital converter (ADC) dynamic parameter method based on the sinusoidal test signal. Electronics 11(14):2125. https:\/\/doi.org\/10.3390\/electronics11142125","journal-title":"Electronics"},{"issue":"21","key":"6200_CR10","doi-asserted-by":"publisher","first-page":"8170","DOI":"10.3390\/s22218170","volume":"22","author":"X Peng","year":"2022","unstructured":"Peng X, Li J, Zhang D, Hu C, Sun N, Jiang J (2022) High-precision ADC spectrum testing under non-coherent sampling conditions. Sensors (Basel) 22(21):8170. https:\/\/doi.org\/10.3390\/s22218170","journal-title":"Sensors (Basel)"},{"issue":"6","key":"6200_CR11","doi-asserted-by":"publisher","first-page":"1451","DOI":"10.1109\/TIM.2013.2292273","volume":"63","author":"L Xu","year":"2013","unstructured":"Xu L, Sudani SK, Chen D (2013) Efficient spectral testing with clipped and noncoherently sampled data. IEEE Trans Instrum Meas 63(6):1451\u20131460. https:\/\/doi.org\/10.1109\/TIM.2013.2292273","journal-title":"IEEE Trans Instrum Meas"},{"key":"6200_CR12","doi-asserted-by":"publisher","unstructured":"Sudani S, Xu L, Chen D (2013) Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping. 2013 IEEE International Test Conference (ITC). IEEE, pp 1\u201310. https:\/\/doi.org\/10.1109\/TEST.2013.6651920","DOI":"10.1109\/TEST.2013.6651920"},{"issue":"07","key":"6200_CR13","doi-asserted-by":"publisher","first-page":"755","DOI":"10.13382\/j.jemi.2014.07.011","volume":"28","author":"Q He","year":"2014","unstructured":"He Q, Huang P, Yu Z (2014) The method for testing dynamic parameters of high-speed ADCs based on average spectrum. J Electron Meas Instrum 28(07):755\u2013762. https:\/\/doi.org\/10.13382\/j.jemi.2014.07.011","journal-title":"J Electron Meas Instrum"},{"issue":"1","key":"6200_CR14","doi-asserted-by":"publisher","first-page":"6","DOI":"10.1088\/0957-0233\/9\/1\/002","volume":"9","author":"JB Simoes","year":"1998","unstructured":"Simoes JB, Loureiro CFM, Landeck J, Carlos MBA, Correia (1998) Testing high- resolution digitizers using conventional signal sources. Meas Sci Technol 9(1):6. https:\/\/doi.org\/10.1088\/0957-0233\/9\/1\/002","journal-title":"Meas Sci Technol"},{"issue":"3","key":"6200_CR15","doi-asserted-by":"publisher","first-page":"123","DOI":"10.1109\/MSP.2007.361611","volume":"24","author":"E Jacobsen","year":"2007","unstructured":"Jacobsen E, Kootsookos P (2007) Fast, accurate frequency estimators [DSP tips & tricks]. IEEE Signal Process Mag 24(3):123\u2013125. https:\/\/doi.org\/10.1109\/MSP.2007.361611","journal-title":"IEEE Signal Process Mag"},{"key":"6200_CR16","doi-asserted-by":"publisher","unstructured":"Lu M (2013) An enhanced procedure for calculating dynamic properties of high-performance DAC on ATE. Proc.2013 IEEE International Test Conference (ITC). IEEE, pp 1\u201310. https:\/\/doi.org\/10.1109\/TEST.2013.6651877","DOI":"10.1109\/TEST.2013.6651877"},{"key":"6200_CR17","doi-asserted-by":"publisher","unstructured":"Yang Y (2022) A windowed interpolation algorithm for high-pre- cision ADC spectrum testing. Advances in Natural Computation, Fuzzy Systems and Knowledge Discovery: Proceedings of the ICNC-FSKD 2021. Springer International Publishing, pp 69\u201378. https:\/\/doi.org\/10.1007\/978-3-030-89698-0_8","DOI":"10.1007\/978-3-030-89698-0_8"},{"key":"6200_CR18","doi-asserted-by":"publisher","unstructured":"P\u00e1lf V, Koll\u00e1r I (2013) Acceleration of the ADC test with sine- wave ft. Proc IEEE Trans Instrum Meas 62(5):880\u2013888. https:\/\/doi.org\/10.1109\/TIM.2013.2243500","DOI":"10.1109\/TIM.2013.2243500"},{"issue":"11","key":"6200_CR19","doi-asserted-by":"publisher","first-page":"3015","DOI":"10.1109\/TIM.2013.2267473","volume":"62","author":"SK Sudani","year":"2013","unstructured":"Sudani SK, Chen D (2013) FIRE: a fundamental identification and replacement method for accurate spectral test without requiring coherence. Proc IEEE Trans Instrum Meas 62(11):3015\u20133025. https:\/\/doi.org\/10.1109\/TIM.2013.2267473","journal-title":"Proc IEEE Trans Instrum Meas"},{"key":"6200_CR20","doi-asserted-by":"publisher","unstructured":"Sudani S, Wu M, Chen D (2011) A novel robust and accurate spectral testing method for non-coherent sampling. 2011 IEEE International Test Conference. IEEE, pp 1\u201310. https:\/\/doi.org\/10.1109\/TEST.2011.6139176","DOI":"10.1109\/TEST.2011.6139176"},{"key":"6200_CR21","doi-asserted-by":"publisher","unstructured":"J\u00e1n \u0160aliga, Koll\u00e1r Istv\u00e1n, Michaeli L, Bu\u0161a J\u00e1n, Lipt\u00e1k J (2013) Tam\u00e1s Virosztek A comparison of least squares and maximum likelihood methods using sine fitting in ADC testing. Proc Meas 46(10):4362\u20134368. https:\/\/doi.org\/10.1016\/j.measurement.2013.05.004","DOI":"10.1016\/j.measurement.2013.05.004"},{"key":"6200_CR22","doi-asserted-by":"publisher","unstructured":"Wu M, Chen D (2011) A faster method for accurate spectral testing without requiring coherent sampling. 2011 IEEE International Instrumentation and Measurement Technology Conference. IEEE, pp 1\u20136. https:\/\/doi.org\/10.1109\/IMTC.2011.5944273","DOI":"10.1109\/IMTC.2011.5944273"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-025-06200-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10836-025-06200-7","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-025-06200-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T04:13:53Z","timestamp":1766204033000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10836-025-06200-7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,6]]},"references-count":22,"journal-issue":{"issue":"5-6","published-print":{"date-parts":[[2025,12]]}},"alternative-id":["6200"],"URL":"https:\/\/doi.org\/10.1007\/s10836-025-06200-7","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2025,10,6]]},"assertion":[{"value":"28 February 2025","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"16 September 2025","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"6 October 2025","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that they have no known conflict of interests that could have appeared to infuence the work reported in this study.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}]}}