{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T06:22:53Z","timestamp":1766211773978,"version":"3.48.0"},"reference-count":31,"publisher":"Springer Science and Business Media LLC","issue":"5-6","license":[{"start":{"date-parts":[[2025,11,25]],"date-time":"2025-11-25T00:00:00Z","timestamp":1764028800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,11,25]],"date-time":"2025-11-25T00:00:00Z","timestamp":1764028800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"funder":[{"name":"National Hi-Tech Project, China","award":["WDZC20215250117"],"award-info":[{"award-number":["WDZC20215250117"]}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1007\/s10836-025-06205-2","type":"journal-article","created":{"date-parts":[[2025,11,25]],"date-time":"2025-11-25T04:55:03Z","timestamp":1764046503000},"page":"587-602","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["SD2CI: A Structure-driven Approach for Detecting Silent Data Corruption Instructions"],"prefix":"10.1007","volume":"41","author":[{"given":"Na","family":"Yang","sequence":"first","affiliation":[]},{"given":"Shuhao","family":"Jiang","sequence":"additional","affiliation":[]},{"given":"Yun","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Qing","family":"Miao","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2025,11,25]]},"reference":[{"issue":"5","key":"6205_CR1","doi-asserted-by":"publisher","first-page":"1002","DOI":"10.1109\/TNS.2021.3059174","volume":"68","author":"JC Michael","year":"2021","unstructured":"Michael JC, Rebekah AA, Edward PW, Hak SK, Raymond LL, Kenneth AL, Jonathan AP (2021) Single-event transient case study for system-level radiation effects analysis. IEEE Trans Nucl Sci 68(5):1002\u20131007","journal-title":"IEEE Trans Nucl Sci"},{"issue":"2","key":"6205_CR2","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/3382132","volume":"17","author":"C Kalra","year":"2020","unstructured":"Kalra C, Previlon F, Rubin N, Kaeli D (2020) ArmorAll: Compiler-based resilience targeting GPU applications. ACM Trans Architect Code Optim 17(2):1\u201324","journal-title":"ACM Trans Architect Code Optim"},{"key":"6205_CR3","doi-asserted-by":"crossref","unstructured":"Nosrati N, Nosrati M, Navabi Z (2020) MLC: a machine learning based checker for soft error detection in embedded processors. In: Proceeding of IEEE international symposium on on-line testing and robust system. pp 1\u20135","DOI":"10.1109\/IOLTS56730.2022.9897309"},{"issue":"1","key":"6205_CR4","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1109\/T-ED.1979.19370","volume":"26","author":"TC May","year":"1979","unstructured":"May TC, Woods MY (1979) Alpha-particle-induced soft errors in dynamic memories. IEEE Trans Electron Devices 26(1):2\u20139","journal-title":"IEEE Trans Electron Devices"},{"issue":"6","key":"6205_CR5","doi-asserted-by":"publisher","first-page":"2742","DOI":"10.1109\/23.556861","volume":"43","author":"E Normand","year":"1996","unstructured":"Normand E (1996) Single event upset at ground level. IEEE Trans Nucl Sci 43(6):2742\u20132750","journal-title":"IEEE Trans Nucl Sci"},{"key":"6205_CR6","doi-asserted-by":"crossref","unstructured":"Ma JC, Huang SL, Duan ZT, Tang L, Wang LY (2023) SLOGAN: SDC probability estimation using structured graph attention network. In: Proceeding of Asia and South Pacific design automation conference. pp 296\u2013301","DOI":"10.1145\/3566097.3567910"},{"key":"6205_CR7","unstructured":"Dixit HD, Pendharkar S, Beadon M, Mason C, Chakravarthy T, Muthiah B, Sankar S Silent data corruption at scale. arXiv:2102.11245"},{"issue":"2","key":"6205_CR8","first-page":"1","volume":"15","author":"MK Andrew","year":"2021","unstructured":"Andrew MK, Michael JW (2021) The impact of terrestrial radiation on FPGAs in data centers. ACM Trans Reconfigurable Technol Syst 15(2):1\u201321","journal-title":"ACM Trans Reconfigurable Technol Syst"},{"key":"6205_CR9","unstructured":"Xilinx (2023) Device reliability report (UG116). https:\/\/www.xilinx.com"},{"key":"6205_CR10","doi-asserted-by":"crossref","unstructured":"Peter HH, Rama G, David EC (2021) That don\u2019t count. In: Workshop on hot topics in operating systems. pp 9\u201316","DOI":"10.1145\/3458336.3465297"},{"key":"6205_CR11","doi-asserted-by":"crossref","unstructured":"Wang SB, Zhang GY, Wei JY, Wang Y, Wu JS, Luo QC (2023) Understanding silent data corruption in a large production CPU population. In: Proceeding of symposium on operating systems principles. pp 216\u2013230","DOI":"10.1145\/3600006.3613149"},{"key":"6205_CR12","doi-asserted-by":"crossref","unstructured":"Rahman MH, Shamji A, Guo SJ, Li GP (2021) PEPPA-X: Finding program test inputs to bound silent data corruption vulnerability in HPC applications. In: Proceeding of ACM international conference for high performance computing, networking, storage and analysis. pp 1\u201314","DOI":"10.1145\/3458817.3476147"},{"issue":"11","key":"6205_CR13","doi-asserted-by":"publisher","first-page":"3072","DOI":"10.1109\/TC.2023.3285094","volume":"72","author":"P George","year":"2023","unstructured":"George P, Dimitris G (2023) Silent data corruptions: microarchitectural perspective. IEEE Trans Comput 72(11):3072\u20133085","journal-title":"IEEE Trans Comput"},{"issue":"1","key":"6205_CR14","doi-asserted-by":"publisher","first-page":"63","DOI":"10.1109\/24.994913","volume":"50","author":"N Oh","year":"2002","unstructured":"Oh N, Shirvani PP, McCluskey EJ (2002) Error detection by duplicated instructions in super-scalar processors. IEEE Trans Reliab 50(1):63\u201375","journal-title":"IEEE Trans Reliab"},{"key":"6205_CR15","doi-asserted-by":"publisher","first-page":"303","DOI":"10.1007\/s10836-022-06005-y","volume":"28","author":"JC Ma","year":"2022","unstructured":"Ma JC, Duan ZZ, Tang L (2022) Deep soft error propagation modeling using graph attention network. J Electron Test 28:303\u2013319","journal-title":"J Electron Test"},{"key":"6205_CR16","doi-asserted-by":"crossref","unstructured":"Anwer AR, Li GP, Pattabiraman K (2020) GPU-Trident: efficient modeling of error propagation in GPU programs. In: Proceedings of IEEE international conference for high performance computing. pp 1\u201314","DOI":"10.1109\/SC41405.2020.00092"},{"key":"6205_CR17","doi-asserted-by":"crossref","unstructured":"Kalra C, Previlon F, Li XY, Rubin N, Kaeli D (2018) PRISM: predicting resilience of GPU applications using statistical methods. In: Proceeding of international conference for high performance computing, networking, storage and analysis. pp 1\u201314","DOI":"10.1109\/SC.2018.00072"},{"issue":"1","key":"6205_CR18","doi-asserted-by":"publisher","first-page":"195","DOI":"10.1145\/3200691.3178502","volume":"53","author":"M Harshitha","year":"2018","unstructured":"Harshitha M, Kathryn M (2018) DisCVar: discovering critical variables using algorithmic differentiation for transient faults. ACM SIGPLAN Notices 53(1):195\u2013206","journal-title":"ACM SIGPLAN Notices"},{"key":"6205_CR19","first-page":"679","volume":"69","author":"G Abich","year":"2022","unstructured":"Abich G, Garibotti R, Reis R, Ost L (2022) The impact of soft errors in memory units of edge devices executing convolutional neural networks. IEEE Trans Circ Syst 69:679\u2013683","journal-title":"IEEE Trans Circ Syst"},{"key":"6205_CR20","doi-asserted-by":"crossref","unstructured":"Mahmoud A, Hari SKS, Christopher WF, Sarita VA, Sakr C, Shanbhag N, Molchanov P, Michael BS, Tsai T, Stephen WK (2021) Optimizing selective protection for CNN resilience. In: Proceeding of IEEE International Symposium on Software Reliability Engineering (ISSRE). pp 127\u2013138","DOI":"10.1109\/ISSRE52982.2021.00025"},{"key":"6205_CR21","doi-asserted-by":"crossref","unstructured":"Fang B, Lu QN, Pattabiraman K, Ripeanu M, Gurumurthi S (2016) ePVF: an enhanced program vulnerability factor methodology for cross-layer resilience analysis. In: Proceeding of internation conference on dependable systems and networks. pp 168\u2013179","DOI":"10.1109\/DSN.2016.24"},{"issue":"4","key":"6205_CR22","doi-asserted-by":"publisher","first-page":"69","DOI":"10.1109\/MM.2022.3163122","volume":"42","author":"MB Sullivan","year":"2022","unstructured":"Sullivan MB, Saxena NR, Connor MO, Lee D, Racunas P, Hukerikar TT, Hari SKS, Keckler W, Clara S (2022) Characterizing and mitigating soft errors in GPU DRAM. IEEE Micro 42(4):69\u201377","journal-title":"IEEE Micro"},{"key":"6205_CR23","doi-asserted-by":"crossref","unstructured":"Zhang YD, Jung CH (2022) Featherweight soft error resilience for GPUs. In: Proceeding of IEEE\/ACM international symposium on microarchitecture. pp 245\u2013262","DOI":"10.1109\/MICRO56248.2022.00030"},{"key":"6205_CR24","doi-asserted-by":"crossref","unstructured":"Khalid A, Izzeldin IM, Younis MY (2021) The impact of the soft errors in convolutional neural network on GPUs: Alexnet as case study. In: Proceeding of internation learning and technology conference. pp 89\u201394","DOI":"10.1016\/j.procs.2021.02.012"},{"key":"6205_CR25","doi-asserted-by":"crossref","unstructured":"Yang N, Wang Y (2020) Predicting the silent data corruption vulnerability of instructions in programs. In: Proceeding of IEEE international conference on parallel and distributed systems. pp 862\u2013869","DOI":"10.1109\/ICPADS47876.2019.00127"},{"issue":"1","key":"6205_CR26","doi-asserted-by":"publisher","first-page":"30","DOI":"10.1109\/TC.2020.2980541","volume":"70","author":"LS Yang","year":"2021","unstructured":"Yang LS, Nie B, Jog A, Smirni E (2021) Practical resilience analysis of GPGPU applications in the presence of single- and multi-bit faults. IEEE Trans Comput 70(1):30\u201344","journal-title":"IEEE Trans Comput"},{"issue":"1","key":"6205_CR27","doi-asserted-by":"publisher","first-page":"288","DOI":"10.1109\/TDSC.2020.2991136","volume":"19","author":"F Previlon","year":"2022","unstructured":"Previlon F, Kalra C, Tiwari D, Kaeli D (2022) Characterizing and exploiting soft error vulnerability phase behavior in GPU applications. IEEE Trans Dependable Secure Comput 19(1):288\u2013300","journal-title":"IEEE Trans Dependable Secure Comput"},{"key":"6205_CR28","doi-asserted-by":"crossref","unstructured":"Ma JC, Wang Y, Zhou L, Hu C, Wang H (2015) SDCInfer: inference of silent data corruption causing instructions. In: Proceeding of IEEE international conference on software engineering and service science. pp 228\u2013232","DOI":"10.1109\/ICSESS.2015.7339043"},{"key":"6205_CR29","doi-asserted-by":"crossref","unstructured":"Yue HS, Wei XH, Li GL, Zhao JP, Jiang N, Tan JWJ (2021) G-SEPM: building an accurate and efficient soft error prediction model for GPGPUs. In: Proceeding of international conference for high performance computing, networking, storage and analysis. pp 1\u201314","DOI":"10.1145\/3458817.3476170"},{"key":"6205_CR30","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1016\/j.sysarc.2023.103024","volume":"145","author":"XH Wei","year":"2023","unstructured":"Wei XH, Zhou CB, Yue HS, Zhou JT (2023) TC-SEPM: characterizing soft error resilience of CNNs on tensor cores from program and microarchitecture perspectives. J Syst Architect 145:1\u201314","journal-title":"J Syst Architect"},{"issue":"4","key":"6205_CR31","doi-asserted-by":"publisher","first-page":"1","DOI":"10.3390\/electronics12040805","volume":"12","author":"N Yang","year":"2023","unstructured":"Yang N, Wang Y (2023) A checkpointing recovery approach for soft errors based on detector locations. Electronics 12(4):1\u201318","journal-title":"Electronics"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-025-06205-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10836-025-06205-2","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-025-06205-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T04:13:56Z","timestamp":1766204036000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10836-025-06205-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11,25]]},"references-count":31,"journal-issue":{"issue":"5-6","published-print":{"date-parts":[[2025,12]]}},"alternative-id":["6205"],"URL":"https:\/\/doi.org\/10.1007\/s10836-025-06205-2","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2025,11,25]]},"assertion":[{"value":"20 January 2025","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"13 October 2025","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"25 November 2025","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The author declares that there is no conflict of interest regarding the publication of this article.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflicts of interest"}}]}}