{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,31]],"date-time":"2025-12-31T00:30:31Z","timestamp":1767141031013,"version":"build-2238731810"},"update-to":[{"DOI":"10.1007\/s10836-025-06198-y","type":"correction","label":"Correction","source":"publisher","updated":{"date-parts":[[2025,11,19]],"date-time":"2025-11-19T00:00:00Z","timestamp":1763510400000}}],"reference-count":0,"publisher":"Springer Science and Business Media LLC","issue":"5-6","license":[{"start":{"date-parts":[[2025,11,19]],"date-time":"2025-11-19T00:00:00Z","timestamp":1763510400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,11,19]],"date-time":"2025-11-19T00:00:00Z","timestamp":1763510400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1007\/s10836-025-06207-0","type":"journal-article","created":{"date-parts":[[2025,11,19]],"date-time":"2025-11-19T07:44:07Z","timestamp":1763538247000},"page":"789-789","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Correction: PCB Defects: a Unified Survey of Trends, Detection Techniques, and Limitations Through Systematic Literature Review"],"prefix":"10.1007","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-4637-4062","authenticated-orcid":false,"given":"Shreevatsa","family":"Alawandi","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3610-0332","authenticated-orcid":false,"given":"Kaushik","family":"Mallibhat","sequence":"additional","affiliation":[]},{"given":"Umer","family":"Kudachi","sequence":"additional","affiliation":[]},{"given":"Aishwarya","family":"Beedanal","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2025,11,19]]},"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-025-06207-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10836-025-06207-0","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-025-06207-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T04:13:55Z","timestamp":1766204035000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10836-025-06207-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11,19]]},"references-count":0,"journal-issue":{"issue":"5-6","published-print":{"date-parts":[[2025,12]]}},"alternative-id":["6207"],"URL":"https:\/\/doi.org\/10.1007\/s10836-025-06207-0","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,11,19]]},"assertion":[{"value":"19 November 2025","order":1,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"This content has been made available to all.","name":"free","label":"Free to read"}]}}