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Periodic Deterministic Logic Built-In Self-Test (DLBIST) is often used to meet these demands. For automotive applications, DLBIST must operate reliably despite temperature variations, including those caused by ambient changes and self-heating in FinFET transistors. A test set effective for all temperatures typically requires a large volume, which can make DLBIST impractical. This paper proposes a robust DLBIST scheme which applies multiple voltages during power-on and power-off tests and the optimal or adapted voltage during periodic tests in system operation. If distributed sensors for on-chip temperature are available for DVFS control, they can be exploited for an adaptive DLBIST scheme. During the periodic test phase, the BIST Control Unit (BCU) dynamically selects and applies the pre-generated test set corresponding to the current operating voltage and measured temperature. This adaptive selection ensures that testing conditions precisely match the real operating points. If temperature sensors are not available, testing at the so-called Zero Temperature Coefficient (ZTC) voltage is one alternative, which is the voltage where the temperature-induced variability is minimized. This makes periodic DLBIST a feasible solution for in-field self-testing, even in cases where on-chip temperature sensors are not available.<\/jats:p>","DOI":"10.1007\/s10836-026-06243-4","type":"journal-article","created":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T04:07:27Z","timestamp":1783656447000},"page":"405-416","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Robust Adaptive DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage"],"prefix":"10.1007","volume":"42","author":[{"given":"Hanieh","family":"Jafarzadeh","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Florian","family":"Klemme","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hussam","family":"Amrouch","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sybille","family":"Hellebrand","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hans-Joachim","family":"Wunderlich","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2026,7,10]]},"reference":[{"key":"6243_CR1","unstructured":"Synopsys (2024) Testmax xlbist. 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The images or other third party material in this article are included in the article\u2019s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article\u2019s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit\n                      \n                      .","order":3,"name":"Ethics","group":{"name":"EthicsHeading","label":"Open Access"}},{"value":"The authors declare no competing interests.","order":4,"name":"Ethics","group":{"name":"EthicsHeading","label":"Competing interests"}}]}}