{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T23:23:42Z","timestamp":1768433022659,"version":"3.49.0"},"reference-count":45,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2011,7,27]],"date-time":"2011-07-27T00:00:00Z","timestamp":1311724800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Intell Manuf"],"published-print":{"date-parts":[[2012,12]]},"DOI":"10.1007\/s10845-011-0570-0","type":"journal-article","created":{"date-parts":[[2011,7,26]],"date-time":"2011-07-26T16:07:15Z","timestamp":1311696435000},"page":"2255-2270","source":"Crossref","is-referenced-by-count":53,"title":["A novel bi-vector encoding genetic algorithm for the simultaneous multiple resources scheduling problem"],"prefix":"10.1007","volume":"23","author":[{"given":"Jei-Zheng","family":"Wu","sequence":"first","affiliation":[]},{"given":"Xin-Chang","family":"Hao","sequence":"additional","affiliation":[]},{"given":"Chen-Fu","family":"Chien","sequence":"additional","affiliation":[]},{"given":"Mitsuo","family":"Gen","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2011,7,27]]},"reference":[{"issue":"3","key":"570_CR1","doi-asserted-by":"crossref","first-page":"985","DOI":"10.1016\/j.ejor.2006.06.060","volume":"187","author":"A. Allahverdi","year":"2008","unstructured":"Allahverdi A., Ng C. T., Cheng T. C. E., Kovalyov M.Y. (2008) A survey of scheduling problems with setup times or costs. European Journal of Operational Research 187(3): 985\u20131032","journal-title":"European Journal of Operational Research"},{"issue":"4","key":"570_CR2","doi-asserted-by":"crossref","first-page":"555","DOI":"10.1016\/j.compchemeng.2010.01.010","volume":"34","author":"O. Baez Senties","year":"2010","unstructured":"Baez Senties O., Azzaro-Pantel Pibouleau C.L., Domenech S. (2010) Multiobjective scheduling for semiconductor manufacturing plants. Computers and Chemical Engineering 34(4): 555\u2013566","journal-title":"Computers and Chemical Engineering"},{"issue":"3","key":"570_CR3","doi-asserted-by":"crossref","first-page":"666","DOI":"10.1016\/j.cor.2010.08.010","volume":"38","author":"J.-Y. Bang","year":"2011","unstructured":"Bang J.-Y., Kim Y.-D. (2011) Scheduling algorithms for a semiconductor probing facility. Computers & Operations Research 38(3): 666\u2013673","journal-title":"Computers & Operations Research"},{"issue":"5","key":"570_CR4","doi-asserted-by":"crossref","first-page":"459","DOI":"10.1002\/nav.20086","volume":"52","author":"F. Barahona","year":"2005","unstructured":"Barahona F., Bermon S., Gunluk O., Hood S. (2005) Robust capacity planning in semiconductor manufacturing. Naval Research Logistics 52(5): 459\u2013468","journal-title":"Naval Research Logistics"},{"issue":"8","key":"570_CR5","doi-asserted-by":"crossref","first-page":"1249","DOI":"10.1109\/21.398686","volume":"25","author":"T.R. Chen","year":"1995","unstructured":"Chen T.R., Chang T.S., Chen C.W., Kao J. (1995) Scheduling for IC sort and test with preemptiveness via Lagrangian relaxation. IEEE Transactions on Systems, Man and Cybernetics 25(8): 1249\u20131256","journal-title":"IEEE Transactions on Systems, Man and Cybernetics"},{"key":"570_CR6","doi-asserted-by":"crossref","first-page":"447","DOI":"10.1007\/s10845-009-0302-x","volume":"22","author":"W. Chen","year":"2011","unstructured":"Chen W., Chien C.-F. (2011) Measuring relative performance of wafer fabrication operations: A case study. Journal of Intelligent Manufacturing 22: 447\u2013457","journal-title":"Journal of Intelligent Manufacturing"},{"issue":"4","key":"570_CR7","doi-asserted-by":"crossref","first-page":"983","DOI":"10.1016\/0360-8352(96)00047-2","volume":"30","author":"R. Cheng","year":"1996","unstructured":"Cheng R., Gen M., Tsujimura Y. (1996) A tutorial survey of job-shop scheduling problems using genetic algorithms\u2013I. representation. Computers & Industrial Engineering 30(4): 983\u2013997","journal-title":"Computers & Industrial Engineering"},{"issue":"2","key":"570_CR8","doi-asserted-by":"crossref","first-page":"343","DOI":"10.1016\/S0360-8352(99)00136-9","volume":"36","author":"R. Cheng","year":"1999","unstructured":"Cheng R., Gen M., Tsujimura Y. (1999) A tutorial survey of job-shop scheduling problems using genetic algorithms, part II: hybrid genetic search strategies. Computers & Industrial Engineering 36(2): 343\u2013364","journal-title":"Computers & Industrial Engineering"},{"issue":"15","key":"570_CR9","doi-asserted-by":"crossref","first-page":"4111","DOI":"10.1080\/00207540601137199","volume":"46","author":"T.-C. Chiang","year":"2008","unstructured":"Chiang T.-C., Shen Y.-S., Fu L.-C. (2008) A new paradigm for rule-based scheduling in the wafer probe centre. International Journal of Production Research 46(15): 4111\u20134133","journal-title":"International Journal of Production Research"},{"issue":"8","key":"570_CR10","doi-asserted-by":"crossref","first-page":"1763","DOI":"10.1080\/00207540500380981","volume":"45","author":"C.-F. Chien","year":"2007","unstructured":"Chien C.-F., Chen C.-H. (2007) Using genetic algorithms (GA) and a coloured timed Petri net (CTPN) for modelling the optimization-based schedule generator of a generic production scheduling system. International Journal of Production Research 45(8): 1763\u20131789","journal-title":"International Journal of Production Research"},{"issue":"5","key":"570_CR11","first-page":"1","volume":"18","author":"C.-F. Chien","year":"2011","unstructured":"Chien C.-F., Hu C. (2011) Total Resource Management Framework: An Empirical Study of Semiconductor Fab. Journal of Quality 18(5): 1\u201326","journal-title":"Journal of Quality"},{"issue":"3","key":"570_CR12","first-page":"193","volume":"15","author":"C.-F. Chien","year":"2008","unstructured":"Chien C.-F., Lin Y.-J., Cheng J.-N. (2008) Construct fuzzy decision tree for mining interrelated semiconductor manufacturing data for yield enhancement. Journal of Quality 15(3): 193\u2013210","journal-title":"Journal of Quality"},{"issue":"4","key":"570_CR13","doi-asserted-by":"crossref","first-page":"704","DOI":"10.1109\/TSM.2003.818955","volume":"16","author":"C.-F. Chien","year":"2003","unstructured":"Chien C.-F., Wu J.-Z. (2003) Analyzing repair decisions in the site imbalance problem of semiconductor test machines. IEEE Transactions on Semiconductor Manufacturing 16(4): 704\u2013711","journal-title":"IEEE Transactions on Semiconductor Manufacturing"},{"issue":"11","key":"570_CR14","doi-asserted-by":"crossref","first-page":"2547","DOI":"10.1080\/0020754031000087256","volume":"41","author":"C.-F. Chien","year":"2003","unstructured":"Chien C.-F., Chang K.-H., Chen C.-P. (2003) Design of a sampling strategy for measuring and compensating for overlay errors in semiconductor manufacturing. International Journal of Production Research 41(11): 2547\u20132561","journal-title":"International Journal of Production Research"},{"issue":"1","key":"570_CR15","doi-asserted-by":"crossref","first-page":"192","DOI":"10.1016\/j.eswa.2006.04.014","volume":"33","author":"C.-F. Chien","year":"2007","unstructured":"Chien C.-F., Wang W.-C., Cheng J.-C. (2007) Data mining for yield enhancement in semiconductor manufacturing and an empirical study. Expert Systems with Applications 33(1): 192\u2013198","journal-title":"Expert Systems with Applications"},{"issue":"2","key":"570_CR16","doi-asserted-by":"crossref","first-page":"496","DOI":"10.1016\/j.ijpe.2010.07.022","volume":"128","author":"C.-F. Chien","year":"2010","unstructured":"Chien C.-F., Chen Y., Peng J. (2010) Manufacturing intelligence for semiconductor demand forecast based on technology diffusion and product life cycle. International Journal of Production Economics 128(2): 496\u2013509","journal-title":"International Journal of Production Economics"},{"issue":"2","key":"570_CR17","doi-asserted-by":"crossref","first-page":"210","DOI":"10.1109\/TSM.2010.2041399","volume":"23","author":"Y. M. Deng","year":"2010","unstructured":"Deng Y. M., Bard J. F., Chacon G. R., Stuber J. (2010) Scheduling back-end operations in semiconductor manufacturing. IEEE Transactions on Semiconductor Manufacturing 23(2): 210\u2013 220","journal-title":"IEEE Transactions on Semiconductor Manufacturing"},{"issue":"2","key":"570_CR18","doi-asserted-by":"crossref","first-page":"215","DOI":"10.1080\/0020754031000118116","volume":"42","author":"K.P. Ellis","year":"2004","unstructured":"Ellis K.P., Lu Y., Bish E.K. (2004) Scheduling of wafer test processes in semiconductor manufacturing. International Journal of Production Research 42(2): 215\u2013242","journal-title":"International Journal of Production Research"},{"issue":"4","key":"570_CR19","doi-asserted-by":"crossref","first-page":"517","DOI":"10.1287\/opre.37.4.517","volume":"37","author":"G. Eppen","year":"1989","unstructured":"Eppen G., Martin R., Schrage L. (1989) A scenario approach to capacity planning. Operations Research 37(4): 517\u2013527","journal-title":"Operations Research"},{"issue":"3","key":"570_CR20","doi-asserted-by":"crossref","first-page":"331","DOI":"10.1007\/s10845-007-0026-8","volume":"18","author":"P. Fattahi","year":"2007","unstructured":"Fattahi P., Saidi Mehrabad M., Jolai F. (2007) Mathematical modeling and heuristic approaches to flexible job shop scheduling problems. Journal of Intelligent Manufacturing 18(3): 331\u2013342","journal-title":"Journal of Intelligent Manufacturing"},{"issue":"4","key":"570_CR21","doi-asserted-by":"crossref","first-page":"523","DOI":"10.1109\/66.806130","volume":"12","author":"T. Freed","year":"1999","unstructured":"Freed T., Leachman R. (1999) Scheduling semiconductor device test operations on multihead testers. IEEE Transactions on Semiconductor Manufacturing 12(4): 523\u2013530","journal-title":"IEEE Transactions on Semiconductor Manufacturing"},{"issue":"21","key":"570_CR22","doi-asserted-by":"crossref","first-page":"5075","DOI":"10.1080\/00207540600818351","volume":"45","author":"T. Freed","year":"2007","unstructured":"Freed T., Doerr K.H., Chang T. (2007) In-house development of scheduling decision support systems: case study for scheduling semiconductor device test operations. International Journal of Production Research 45(21): 5075\u20135093","journal-title":"International Journal of Production Research"},{"key":"570_CR23","volume-title":"Genetic algorithms and engineering design","author":"M. Gen","year":"1997","unstructured":"Gen M., Cheng R. (1997) Genetic algorithms and engineering design. Wiley-Interscience, New York"},{"key":"570_CR24","volume-title":"Genetic algorithms and engineering optimization","author":"M. Gen","year":"2000","unstructured":"Gen M., Cheng R. (2000) Genetic algorithms and engineering optimization. Wiley-interscience, New York"},{"key":"570_CR25","volume-title":"Network models and optimization: Multiobjective genetic algorithm approach","author":"M. Gen","year":"2008","unstructured":"Gen M., Cheng R., Lin L. (2008) Network models and optimization: Multiobjective genetic algorithm approach. Springer, London"},{"issue":"4","key":"570_CR26","doi-asserted-by":"crossref","first-page":"481","DOI":"10.1007\/s10845-008-0150-0","volume":"20","author":"M. Gholami","year":"2009","unstructured":"Gholami M., Zandieh M. (2009) Integrating simulation and genetic algorithm to schedule a dynamic flexible job shop. Journal of Intelligent Manufacturing 20(4): 481\u2013498","journal-title":"Journal of Intelligent Manufacturing"},{"issue":"6","key":"570_CR27","doi-asserted-by":"crossref","first-page":"631","DOI":"10.1007\/s10845-007-0037-5","volume":"18","author":"Y. Kim","year":"2007","unstructured":"Kim Y., Kim J., Shin K. (2007) An asymmetric multileveled symbiotic evolutionary algorithm for integrated FMS scheduling. Journal of Intelligent Manufacturing 18(6): 631\u2013645","journal-title":"Journal of Intelligent Manufacturing"},{"issue":"7","key":"570_CR28","doi-asserted-by":"crossref","first-page":"660","DOI":"10.1080\/095372800432124","volume":"11","author":"Y.-H. Lee","year":"2000","unstructured":"Lee Y.-H., Lee B.-K., Jeong B. (2000) Multi-objective production scheduling of probe process in semiconductor manufacturing. Production Planning & Control 11(7): 660\u2013669","journal-title":"Production Planning & Control"},{"issue":"1","key":"570_CR29","doi-asserted-by":"crossref","first-page":"165","DOI":"10.1057\/jors.2009.182","volume":"62","author":"S.-W. Lin","year":"2010","unstructured":"Lin S.-W., Lee Z.-J., Ying K.-C., Lin R.-H. (2010) Meta-heuristic algorithms for wafer sorting scheduling problems. Journal of the Operational Research Society 62(1): 165\u2013174","journal-title":"Journal of the Operational Research Society"},{"issue":"1","key":"570_CR30","doi-asserted-by":"crossref","first-page":"79","DOI":"10.1080\/0020754032000123588","volume":"42","author":"J.T. Lin","year":"2004","unstructured":"Lin J.T., Wang F.K., Lee W.T. (2004) Capacity-constrained scheduling for a logic IC final test facility. International Journal of Production Research 42(1): 79\u201399","journal-title":"International Journal of Production Research"},{"key":"570_CR31","unstructured":"LINGO (2002) LINGO 8.0. Chicago: LINDO Systems Inc."},{"issue":"3","key":"570_CR32","doi-asserted-by":"crossref","first-page":"257","DOI":"10.1016\/S0925-5273(03)00186-5","volume":"88","author":"W.-L. Pearn","year":"2004","unstructured":"Pearn W.-L., Chung S.-H., Chen A.-Y., Yang M.-H. (2004) A case study on the multistage IC final testing scheduling problem with reentry. International Journal of Production Economics 88(3): 257\u2013267","journal-title":"International Journal of Production Economics"},{"issue":"5","key":"570_CR33","doi-asserted-by":"crossref","first-page":"579","DOI":"10.1023\/B:JIMS.0000037709.69034.46","volume":"15","author":"R. G. Qiu","year":"2004","unstructured":"Qiu R. G., Joshi S., McDonnell P. (2004) An approach to regulating machine sharing in reconfigurable back-end semiconductor manufacturing. Journal of Intelligent Manufacturing 15(5): 579\u2013591","journal-title":"Journal of Intelligent Manufacturing"},{"issue":"4","key":"570_CR34","doi-asserted-by":"crossref","first-page":"569","DOI":"10.1109\/TASE.2007.906341","volume":"4","author":"Y. Song","year":"2007","unstructured":"Song Y., Zhang M. T., Yi J., Zhang L., Zheng L. (2007) Bottleneck station scheduling in semiconductor assembly and test manufacturing using ant colony optimization. IEEE Transactions on Automation Science and Engineering 4(4): 569\u2013578","journal-title":"IEEE Transactions on Automation Science and Engineering"},{"issue":"3","key":"570_CR35","doi-asserted-by":"crossref","first-page":"545","DOI":"10.1016\/S0377-2217(98)00389-0","volume":"120","author":"J. Swaminathan","year":"2000","unstructured":"Swaminathan J. (2000) Tool capacity planning for semiconductor fabrication facilities under demand uncertainty. European Journal of Operational Research 120(3): 545\u2013558","journal-title":"European Journal of Operational Research"},{"issue":"4","key":"570_CR36","doi-asserted-by":"crossref","first-page":"270","DOI":"10.1109\/66.97809","volume":"4","author":"R. Uzsoy","year":"1991","unstructured":"Uzsoy R., Martin-Vega L., Lee C., Leonard P. (1991) Production scheduling algorithms for a semiconductor test facility. IEEE Transactions on Semiconductor Manufacturing 4(4): 270\u2013280","journal-title":"IEEE Transactions on Semiconductor Manufacturing"},{"issue":"14","key":"570_CR37","doi-asserted-by":"crossref","first-page":"3217","DOI":"10.1080\/0020754031000109152","volume":"41","author":"K.-J. Wang","year":"2003","unstructured":"Wang K.-J., Hou T.-C. (2003) Modeling and resolving the joint problem of capacity expansion and allocation with multiple resources and limited budget in semiconductor testing industry. International Journal of Production Research 41(14): 3217\u20133235","journal-title":"International Journal of Production Research"},{"issue":"1","key":"570_CR38","doi-asserted-by":"crossref","first-page":"32","DOI":"10.1016\/j.rcim.2007.05.004","volume":"25","author":"K.-J. Wang","year":"2009","unstructured":"Wang K.-J., Lin Y.-S., Chien C.-F., Chen J.-C. (2009) A fuzzy-knowledge resource-allocation model of the semiconductor final test industry. Robotics and Computer-Integrated Manufacturing 25(1): 32\u201341","journal-title":"Robotics and Computer-Integrated Manufacturing"},{"issue":"1","key":"570_CR39","doi-asserted-by":"crossref","first-page":"327","DOI":"10.1016\/j.ejor.2006.10.037","volume":"184","author":"K.-J. Wang","year":"2008","unstructured":"Wang K.-J., Wang S.-M., Chen J.-C. (2008) A resource portfolio planning model using sampling-based stochastic programming and genetic algorithm. European Journal of Operational Research 184(1): 327\u2013340","journal-title":"European Journal of Operational Research"},{"issue":"1\u20132","key":"570_CR40","first-page":"485","volume":"35","author":"J.-Z. Wu","year":"2008","unstructured":"Wu J.-Z., Chien C.-F. (2008a) Modeling semiconductor testing job scheduling and dynamic testing machine configuration. Expert Systems with Applications 35(1\u20132): 485\u2013496","journal-title":"Expert Systems with Applications"},{"issue":"3","key":"570_CR41","doi-asserted-by":"crossref","first-page":"401","DOI":"10.1007\/s00291-007-0120-5","volume":"30","author":"J.-Z. Wu","year":"2008","unstructured":"Wu J.-Z., Chien C.-F. (2008b) Modeling strategic semiconductor assembly outsourcing decisions based on empirical settings. OR Spectrum 30(3): 401\u2013430","journal-title":"OR Spectrum"},{"issue":"1\u20134","key":"570_CR42","doi-asserted-by":"crossref","first-page":"481","DOI":"10.1016\/0360-8352(94)90339-5","volume":"27","author":"X. F. Yang","year":"1994","unstructured":"Yang X. F., Gen M. (1994) Evolution program for bicriteria transportation problem. Computers & Industrial Engineering 27(1\u20134): 481\u2013484","journal-title":"Computers & Industrial Engineering"},{"issue":"4","key":"570_CR43","doi-asserted-by":"crossref","first-page":"439","DOI":"10.1007\/s10845-008-0191-4","volume":"21","author":"M. T. Y. Yazdani Sabouni","year":"2010","unstructured":"Yazdani Sabouni M. T. Y., Jolai F., Mansouri A. (2010) Heuristics for minimizing total completion time and maximum lateness on identical parallel machines with setup times. Journal of Intelligent Manufacturing 21(4): 439\u2013449","journal-title":"Journal of Intelligent Manufacturing"},{"issue":"6","key":"570_CR44","doi-asserted-by":"crossref","first-page":"731","DOI":"10.1007\/s10845-009-0250-5","volume":"21","author":"M. Zandieh","year":"2010","unstructured":"Zandieh M., Mozaffari E., Gholami M. (2010) A robust genetic algorithm for scheduling realistic hybrid flexible flow line problems. Journal of Intelligent Manufacturing 21(6): 731\u2013743","journal-title":"Journal of Intelligent Manufacturing"},{"issue":"4","key":"570_CR45","doi-asserted-by":"crossref","first-page":"543","DOI":"10.1109\/TASE.2007.905977","volume":"4","author":"M. Zhang","year":"2007","unstructured":"Zhang M., Niu S., Deng S., Zhang Z., Li Q., Zheng L. (2007) Hierarchical capacity planning with reconfigurable kits in global semiconductor assembly and test manufacturing. IEEE Transactions on Automation Science and Engineering 4(4): 543\u2013552","journal-title":"IEEE Transactions on Automation Science and Engineering"}],"container-title":["Journal of Intelligent Manufacturing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10845-011-0570-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10845-011-0570-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10845-011-0570-0","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,31]],"date-time":"2019-05-31T02:11:52Z","timestamp":1559268712000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10845-011-0570-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,7,27]]},"references-count":45,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2012,12]]}},"alternative-id":["570"],"URL":"https:\/\/doi.org\/10.1007\/s10845-011-0570-0","relation":{},"ISSN":["0956-5515","1572-8145"],"issn-type":[{"value":"0956-5515","type":"print"},{"value":"1572-8145","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,7,27]]}}}