{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,12]],"date-time":"2026-02-12T17:27:46Z","timestamp":1770917266167,"version":"3.50.1"},"reference-count":62,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2024,3,29]],"date-time":"2024-03-29T00:00:00Z","timestamp":1711670400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,3,29]],"date-time":"2024-03-29T00:00:00Z","timestamp":1711670400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Intell Manuf"],"published-print":{"date-parts":[[2025,3]]},"DOI":"10.1007\/s10845-024-02348-9","type":"journal-article","created":{"date-parts":[[2024,3,29]],"date-time":"2024-03-29T15:01:46Z","timestamp":1711724506000},"page":"2177-2192","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["Knowledge distillation-based information sharing for online process monitoring in decentralized manufacturing system"],"prefix":"10.1007","volume":"36","author":[{"given":"Zhangyue","family":"Shi","sequence":"first","affiliation":[]},{"given":"Yuxuan","family":"Li","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6571-0682","authenticated-orcid":false,"given":"Chenang","family":"Liu","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2024,3,29]]},"reference":[{"key":"2348_CR1","doi-asserted-by":"crossref","first-page":"429","DOI":"10.1016\/j.jmsy.2021.12.007","volume":"62","author":"A Al Mamun","year":"2022","unstructured":"Al Mamun, A., Liu, C., Kan, C., & Tian, W. (2022). Securing cyber-physical additive manufacturing systems by in situ process authentication using streamline video analysis. Journal of Manufacturing Systems, 62, 429\u2013440.","journal-title":"Journal of Manufacturing Systems"},{"issue":"11","key":"2348_CR2","doi-asserted-by":"crossref","first-page":"110804","DOI":"10.1115\/1.4047855","volume":"142","author":"JF Arinez","year":"2020","unstructured":"Arinez, J. F., Chang, Q., Gao, R. X., Xu, C., & Zhang, J. (2020). Artificial intelligence in advanced manufacturing: Current status and future outlook. Journal of Manufacturing Science and Engineering, 142(11), 110804.","journal-title":"Journal of Manufacturing Science and Engineering"},{"issue":"11","key":"2348_CR3","doi-asserted-by":"crossref","first-page":"111007","DOI":"10.1115\/1.4054805","volume":"144","author":"MM Bappy","year":"2022","unstructured":"Bappy, M. M., Liu, C., Bian, L., & Tian, W. (2022). Morphological dynamics-based anomaly detection towards in situ layer-wise certification for directed energy deposition processes. Journal of Manufacturing Science and Engineering, 144(11), 111007.","journal-title":"Journal of Manufacturing Science and Engineering"},{"issue":"7","key":"2348_CR4","doi-asserted-by":"crossref","first-page":"579","DOI":"10.1080\/0740817X.2015.1122254","volume":"48","author":"K Bastani","year":"2016","unstructured":"Bastani, K., Rao, P. K., & Kong, Z. (2016). An online sparse estimation-based classification approach for real-time monitoring in advanced manufacturing processes from heterogeneous sensor data. IIE Transactions, 48(7), 579\u2013598.","journal-title":"IIE Transactions"},{"key":"2348_CR5","doi-asserted-by":"crossref","unstructured":"Cho, J.H. & Hariharan, B. (2019). On the efficacy of knowledge distillation. In Proceedings of the IEEE\/CVF international conference on computer vision.","DOI":"10.1109\/ICCV.2019.00489"},{"issue":"8","key":"2348_CR6","doi-asserted-by":"crossref","first-page":"2277","DOI":"10.1007\/s10845-021-01775-2","volume":"33","author":"N Ge","year":"2022","unstructured":"Ge, N., Li, G., Zhang, L., & Liu, Y. (2022). Failure prediction in production line based on federated learning: An empirical study. Journal of Intelligent Manufacturing, 33(8), 2277\u20132294.","journal-title":"Journal of Intelligent Manufacturing"},{"key":"2348_CR7","doi-asserted-by":"crossref","first-page":"517","DOI":"10.1016\/j.addma.2018.04.005","volume":"21","author":"C Gobert","year":"2018","unstructured":"Gobert, C., Reutzel, E. W., Petrich, J., Nassar, A. R., & Phoha, S. (2018). Application of supervised machine learning for defect detection during metallic powder bed fusion additive manufacturing using high resolution imaging. Additive Manufacturing, 21, 517\u2013528.","journal-title":"Additive Manufacturing"},{"issue":"6","key":"2348_CR8","doi-asserted-by":"crossref","first-page":"1789","DOI":"10.1007\/s11263-021-01453-z","volume":"129","author":"J Gou","year":"2021","unstructured":"Gou, J., Yu, B., Maybank, S. J., & Tao, D. (2021). Knowledge distillation: A survey. International Journal of Computer Vision, 129(6), 1789\u20131819.","journal-title":"International Journal of Computer Vision"},{"key":"2348_CR9","doi-asserted-by":"crossref","first-page":"162","DOI":"10.1016\/j.jmsy.2021.05.005","volume":"60","author":"S Guo","year":"2021","unstructured":"Guo, S., Chen, M., Abolhassani, A., Kalamdani, R., & Guo, W. G. (2021). Identifying manufacturing operational conditions by physics-based feature extraction and ensemble clustering. Journal of Manufacturing Systems, 60, 162\u2013175.","journal-title":"Journal of Manufacturing Systems"},{"key":"2348_CR10","doi-asserted-by":"crossref","unstructured":"Haghnegahdar, L., Joshi, S. S., & Dahotre, N. B. (2022). From IoT-based cloud manufacturing approach to intelligent additive manufacturing: Industrial Internet of Things\u2014An overview. The International Journal of Advanced Manufacturing Technology, 1\u201318.","DOI":"10.1007\/s00170-021-08436-x"},{"key":"2348_CR11","unstructured":"Hinton, G., Vinyals, O., & Dean, J. (2015). Distilling the knowledge in a neural network, 2 (7). arXiv preprint arXiv:1503.02531."},{"key":"2348_CR12","doi-asserted-by":"crossref","first-page":"103509","DOI":"10.1016\/j.compind.2021.103509","volume":"132","author":"TT Huong","year":"2021","unstructured":"Huong, T. T., Bac, T. P., Long, D. M., Luong, T. D., Dan, N. M., Thang, B. D., & Tran, K. P. (2021). Detecting cyberattacks using anomaly detection in industrial control systems: A Federated Learning approach. Computers in Industry, 132, 103509.","journal-title":"Computers in Industry"},{"issue":"3\u20134","key":"2348_CR13","doi-asserted-by":"crossref","first-page":"989","DOI":"10.1007\/s00170-022-10771-6","volume":"125","author":"SR Kandavalli","year":"2023","unstructured":"Kandavalli, S. R., Khan, A. M., Iqbal, A., Jamil, M., Abbas, S., Laghari, R. A., & Cheok, Q. (2023). Application of sophisticated sensors to advance the monitoring of machining processes: Analysis and holistic review. The International Journal of Advanced Manufacturing Technology, 125(3\u20134), 989\u20131014.","journal-title":"The International Journal of Advanced Manufacturing Technology"},{"key":"2348_CR14","unstructured":"Kone\u010dn\u00fd, J., McMahan, H. B., Yu, F. X., Richt\u00e1rik, P., Suresh, A. T., & Bacon, D. (2016). Federated learning: Strategies for improving communication efficiency. arXiv preprint arXiv:1610.05492."},{"issue":"19","key":"2348_CR15","doi-asserted-by":"crossref","first-page":"6674","DOI":"10.3390\/s21196674","volume":"21","author":"W Kwon","year":"2021","unstructured":"Kwon, W., Jin, Y., & Lee, S. J. (2021). Uncertainty-aware knowledge distillation for collision identification of collaborative robots. Sensors, 21(19), 6674.","journal-title":"Sensors"},{"key":"2348_CR16","doi-asserted-by":"crossref","first-page":"11","DOI":"10.1016\/j.mfglet.2016.05.002","volume":"8","author":"J Lee","year":"2016","unstructured":"Lee, J., Bagheri, B., & Jin, C. (2016). Introduction to cyber manufacturing. Manufacturing Letters, 8, 11\u201315.","journal-title":"Manufacturing Letters"},{"key":"2348_CR17","doi-asserted-by":"crossref","first-page":"357","DOI":"10.1016\/j.jmsy.2020.10.013","volume":"57","author":"J Lee","year":"2020","unstructured":"Lee, J., Lee, Y. C., & Kim, J. T. (2020). Fault detection based on one-class deep learning for manufacturing applications limited to an imbalanced database. Journal of Manufacturing Systems, 57, 357\u2013366.","journal-title":"Journal of Manufacturing Systems"},{"key":"2348_CR18","doi-asserted-by":"crossref","first-page":"32","DOI":"10.1016\/j.eswa.2018.01.027","volume":"99","author":"K Li","year":"2018","unstructured":"Li, K., Zhou, T., Liu, B.-H., & Li, H. (2018). A multi-agent system for sharing distributed manufacturing resources. Expert Systems with Applications, 99, 32\u201343.","journal-title":"Expert Systems with Applications"},{"key":"2348_CR19","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1080\/00207543.2022.2131930","volume":"61","author":"Y Li","year":"2023","unstructured":"Li, Y., Hu, F., Liu, Y., Ryan, M., & Wang, R. (2023). A hybrid model compression approach via knowledge distillation for predicting energy consumption in additive manufacturing. International Journal of Production Research, 61, 1\u201323.","journal-title":"International Journal of Production Research"},{"issue":"4","key":"2348_CR20","doi-asserted-by":"crossref","first-page":"3338","DOI":"10.1109\/TASE.2021.3118635","volume":"19","author":"Y Li","year":"2022","unstructured":"Li, Y., Shi, Z., Liu, C., Tian, W., Kong, Z., & Williams, C. B. (2022a). Augmented time regularized generative adversarial network (ATR-GAN) for data augmentation in online process anomaly detection. IEEE Transactions on Automation Science and Engineering, 19(4), 3338\u20133355.","journal-title":"IEEE Transactions on Automation Science and Engineering"},{"issue":"1","key":"2348_CR21","doi-asserted-by":"crossref","first-page":"285","DOI":"10.1109\/TASE.2022.3148977","volume":"20","author":"Y Li","year":"2022","unstructured":"Li, Y., Yan, H., & Jin, R. (2022b). Multi-task learning with latent variation decomposition for multivariate responses in a manufacturing network. IEEE Transactions on Automation Science and Engineering, 20(1), 285\u2013295.","journal-title":"IEEE Transactions on Automation Science and Engineering"},{"key":"2348_CR22","doi-asserted-by":"crossref","unstructured":"Liu, C., Kan, C., & Tian, W. (2020). An online side channel monitoring approach for cyber-physical attack detection of additive manufacturing. In International manufacturing science and engineering conference. American Society of Mechanical Engineers.","DOI":"10.1115\/MSEC2020-8503"},{"issue":"11","key":"2348_CR23","first-page":"1215","volume":"53","author":"C Liu","year":"2021","unstructured":"Liu, C., Kong, Z., Babu, S., Joslin, C., & Ferguson, J. (2021). An integrated manifold learning approach for high-dimensional data feature extractions and its applications to online process monitoring of additive manufacturing. IISE Transactions, 53(11), 1215\u20131230.","journal-title":"IISE Transactions"},{"key":"2348_CR24","doi-asserted-by":"crossref","first-page":"75","DOI":"10.1016\/j.jmsy.2019.04.002","volume":"51","author":"C Liu","year":"2019","unstructured":"Liu, C., Law, A. C. C., Roberson, D., & Kong, Z. J. (2019a). Image analysis-based closed loop quality control for additive manufacturing with fused filament fabrication. Journal of Manufacturing Systems, 51, 75\u201386.","journal-title":"Journal of Manufacturing Systems"},{"key":"2348_CR25","doi-asserted-by":"crossref","first-page":"570","DOI":"10.1016\/j.jmapro.2018.08.038","volume":"35","author":"J Liu","year":"2018","unstructured":"Liu, J., Hu, Y., Wu, B., & Wang, Y. (2018). An improved fault diagnosis approach for FDM process with acoustic emission. Journal of Manufacturing Processes, 35, 570\u2013579.","journal-title":"Journal of Manufacturing Processes"},{"issue":"2","key":"2348_CR26","doi-asserted-by":"crossref","first-page":"109","DOI":"10.1080\/24725854.2018.1478169","volume":"51","author":"J Liu","year":"2019","unstructured":"Liu, J., Liu, C., Bai, Y., Rao, P., Williams, C. B., & Kong, Z. (2019b). Layer-wise spatial modeling of porosity in additive manufacturing. IISE Transactions, 51(2), 109\u2013123.","journal-title":"IISE Transactions"},{"issue":"9","key":"2348_CR27","doi-asserted-by":"crossref","first-page":"2509","DOI":"10.1007\/s00170-016-8628-y","volume":"87","author":"M Liukkonen","year":"2016","unstructured":"Liukkonen, M., & Tsai, T.-N. (2016). Toward decentralized intelligence in manufacturing: Recent trends in automatic identification of things. The International Journal of Advanced Manufacturing Technology, 87(9), 2509\u20132531.","journal-title":"The International Journal of Advanced Manufacturing Technology"},{"issue":"10","key":"2348_CR28","doi-asserted-by":"crossref","first-page":"1345","DOI":"10.1109\/TKDE.2009.191","volume":"22","author":"SJ Pan","year":"2009","unstructured":"Pan, S. J., & Yang, Q. (2009). A survey on transfer learning. IEEE Transactions on Knowledge and Data Engineering, 22(10), 1345\u20131359.","journal-title":"IEEE Transactions on Knowledge and Data Engineering"},{"key":"2348_CR29","doi-asserted-by":"crossref","first-page":"54","DOI":"10.1016\/j.neunet.2019.01.012","volume":"113","author":"GI Parisi","year":"2019","unstructured":"Parisi, G. I., Kemker, R., Part, J. L., Kanan, C., & Wermter, S. (2019). Continual lifelong learning with neural networks: A review. Neural Networks, 113, 54\u201371.","journal-title":"Neural Networks"},{"key":"2348_CR30","doi-asserted-by":"crossref","unstructured":"Phuong, M., & Lampert, C. H. (2019). Distillation-based training for multi-exit architectures. In Proceedings of the IEEE\/CVF international conference on computer vision.","DOI":"10.1109\/ICCV.2019.00144"},{"key":"2348_CR31","unstructured":"Powers, D. M. (2020) Evaluation: from precision, recall and F-measure to ROC, informedness, markedness and correlation. arXiv preprint arXiv:2010.16061."},{"key":"2348_CR32","doi-asserted-by":"crossref","first-page":"114","DOI":"10.1016\/j.addma.2017.11.009","volume":"19","author":"L Scime","year":"2018","unstructured":"Scime, L., & Beuth, J. (2018). Anomaly detection and classification in a laser powder bed additive manufacturing process using a trained computer vision algorithm. Additive Manufacturing, 19, 114\u2013126.","journal-title":"Additive Manufacturing"},{"key":"2348_CR33","doi-asserted-by":"crossref","unstructured":"Shi, Z., Li, Y., Liu, C. (2022). Knowledge Distillation-enabled Multi-stage Incremental Learning for Online Process Monitoring in Advanced Manufacturing. In 2022 IEEE International Conference on Data Mining Workshops (ICDMW). IEEE.","DOI":"10.1109\/ICDMW58026.2022.00154"},{"key":"2348_CR34","doi-asserted-by":"crossref","first-page":"1815","DOI":"10.1007\/s10845-021-01879-9","volume":"34","author":"Z Shi","year":"2023","unstructured":"Shi, Z., Mamun, A. A., Kan, C., Tian, W., & Liu, C. (2023a). An LSTM-autoencoder based online side channel monitoring approach for cyber-physical attack detection in additive manufacturing. Journal of Intelligent Manufacturing, 34, 1815\u20131831.","journal-title":"Journal of Intelligent Manufacturing"},{"key":"2348_CR35","unstructured":"Shi, Z., Xie, T., Liu, C., & Li, Y. (2023b). Pseudo replay-based class continual learning for online new category anomaly detection in additive manufacturing. arXiv preprint arXiv:2312.02491."},{"issue":"7","key":"2348_CR36","doi-asserted-by":"crossref","first-page":"071004","DOI":"10.1115\/1.4063859","volume":"24","author":"Z Shi","year":"2024","unstructured":"Shi, Z., Oskolkov, B., Tian, W., Kan, C., & Liu, C. (2024). Sensor data protection through integration of blockchain and camouflaged encryption in cyber-physical manufacturing systems. Journal of Computing and Information Science in Engineering, 24(7), 071004.","journal-title":"Journal of Computing and Information Science in Engineering"},{"key":"2348_CR37","unstructured":"Shukla, N., & Dey, A. (2023). Mixed-type wafer classification for low memory devices using knowledge distillation. arXiv preprint arXiv:2303.13974."},{"issue":"23","key":"2348_CR38","doi-asserted-by":"crossref","first-page":"6917","DOI":"10.1080\/00207543.2016.1192302","volume":"54","author":"JS Srai","year":"2016","unstructured":"Srai, J. S., Kumar, M., Graham, G., Phillips, W., Tooze, J., Ford, S., Beecher, P., Raj, B., Gregory, M., & Tiwari, M. K. (2016). Distributed manufacturing: Scope, challenges and opportunities. International Journal of Production Research, 54(23), 6917\u20136935.","journal-title":"International Journal of Production Research"},{"issue":"2","key":"2348_CR39","doi-asserted-by":"crossref","first-page":"107","DOI":"10.1080\/07408170903019150","volume":"42","author":"T Sukchotrat","year":"2009","unstructured":"Sukchotrat, T., Kim, S. B., & Tsung, F. (2009). One-class classification-based control charts for multivariate process monitoring. IIE Transactions, 42(2), 107\u2013120.","journal-title":"IIE Transactions"},{"key":"2348_CR40","doi-asserted-by":"publisher","DOI":"10.1115\/1.4042786","author":"H Taheri","year":"2019","unstructured":"Taheri, H., Koester, L. W., Bigelow, T. A., Faierson, E. J., & Bond, L. J. (2019). In situ additive manufacturing process monitoring with an acoustic technique: clustering performance evaluation using K-means algorithm. Journal of Manufacturing Science and Engineering. https:\/\/doi.org\/10.1115\/1.4042786","journal-title":"Journal of Manufacturing Science and Engineering"},{"issue":"1","key":"2348_CR41","doi-asserted-by":"crossref","first-page":"283","DOI":"10.1007\/s10845-021-01793-0","volume":"33","author":"H Tercan","year":"2022","unstructured":"Tercan, H., Deibert, P., & Meisen, T. (2022). Continual learning of neural networks for quality prediction in production using memory aware synapses and weight transfer. Journal of Intelligent Manufacturing, 33(1), 283\u2013292.","journal-title":"Journal of Intelligent Manufacturing"},{"issue":"7","key":"2348_CR42","doi-asserted-by":"crossref","first-page":"88","DOI":"10.3390\/computers10070088","volume":"10","author":"C-W Tien","year":"2021","unstructured":"Tien, C.-W., Huang, T.-Y., Chen, P.-C., & Wang, J.-H. (2021). Using autoencoders for anomaly detection and transfer learning in IoT. Computers, 10(7), 88.","journal-title":"Computers"},{"issue":"1","key":"2348_CR43","doi-asserted-by":"crossref","first-page":"127","DOI":"10.1109\/TASE.2016.2598094","volume":"15","author":"MS Tootooni","year":"2016","unstructured":"Tootooni, M. S., Rao, P. K., Chou, C.-A., & Kong, Z. J. (2016). A spectral graph theoretic approach for monitoring multivariate time series data from complex dynamical processes. IEEE Transactions on Automation Science and Engineering, 15(1), 127\u2013144.","journal-title":"IEEE Transactions on Automation Science and Engineering"},{"key":"2348_CR44","doi-asserted-by":"crossref","first-page":"105683","DOI":"10.1016\/j.asoc.2019.105683","volume":"85","author":"G Wang","year":"2019","unstructured":"Wang, G., Ledwoch, A., Hasani, R. M., Grosu, R., & Brintrup, A. (2019a). A generative neural network model for the quality prediction of work in progress products. Applied Soft Computing, 85, 105683.","journal-title":"Applied Soft Computing"},{"issue":"6","key":"2348_CR45","doi-asserted-by":"crossref","first-page":"3048","DOI":"10.1109\/TPAMI.2021.3055564","volume":"44","author":"L Wang","year":"2021","unstructured":"Wang, L., & Yoon, K.-J. (2021). Knowledge distillation and student-teacher learning for visual intelligence: A review and new outlooks. IEEE Transactions on Pattern Analysis and Machine Intelligence, 44(6), 3048\u20133068.","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"key":"2348_CR46","doi-asserted-by":"crossref","first-page":"107466","DOI":"10.1016\/j.triboint.2022.107466","volume":"169","author":"M Wang","year":"2022","unstructured":"Wang, M., Yang, L., Zhao, Z., & Guo, Y. (2022). Intelligent prediction of wear location and mechanism using image identification based on improved Faster R-CNN model. Tribology International, 169, 107466.","journal-title":"Tribology International"},{"issue":"1","key":"2348_CR47","doi-asserted-by":"crossref","first-page":"413","DOI":"10.1016\/j.cirp.2020.04.074","volume":"69","author":"P Wang","year":"2020","unstructured":"Wang, P., & Gao, R. X. (2020). Transfer learning for enhanced machine fault diagnosis in manufacturing. CIRP Annals, 69(1), 413\u2013416.","journal-title":"CIRP Annals"},{"issue":"6","key":"2348_CR48","doi-asserted-by":"crossref","first-page":"2734","DOI":"10.1109\/TIM.2019.2926688","volume":"69","author":"Y-B Wang","year":"2019","unstructured":"Wang, Y.-B., Chang, D.-G., Qin, S.-R., Fan, Y.-H., Mu, H.-B., & Zhang, G.-J. (2019b). Separating multi-source partial discharge signals using linear prediction analysis and isolation forest algorithm. IEEE Transactions on Instrumentation and Measurement, 69(6), 2734\u20132742.","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"issue":"2","key":"2348_CR49","doi-asserted-by":"crossref","first-page":"876","DOI":"10.1109\/JBHI.2021.3092835","volume":"26","author":"Z Wang","year":"2021","unstructured":"Wang, Z., & Yao, B. (2021). Multi-branching temporal convolutional network for sepsis prediction. IEEE Journal of Biomedical and Health Informatics, 26(2), 876\u2013887.","journal-title":"IEEE Journal of Biomedical and Health Informatics"},{"key":"2348_CR50","doi-asserted-by":"crossref","unstructured":"Xie, Q., Luong, M.-T., Hovy, E., & Le, Q. V. (2020). Self-training with noisy student improves imagenet classification. In Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition.","DOI":"10.1109\/CVPR42600.2020.01070"},{"issue":"2","key":"2348_CR51","doi-asserted-by":"crossref","first-page":"2022","DOI":"10.1109\/TIE.2021.3057030","volume":"69","author":"Q Xu","year":"2021","unstructured":"Xu, Q., Chen, Z., Wu, K., Wang, C., Wu, M., & Li, X. (2021). KDnet-RUL: A knowledge distillation framework to compress deep neural networks for machine remaining useful life prediction. IEEE Transactions on Industrial Electronics, 69(2), 2022\u20132032.","journal-title":"IEEE Transactions on Industrial Electronics"},{"issue":"5","key":"2348_CR52","first-page":"464","volume":"54","author":"H Yan","year":"2022","unstructured":"Yan, H., Grasso, M., Paynabar, K., & Colosimo, B. M. (2022). Real-time detection of clustered events in video-imaging data with applications to additive manufacturing. IISE Transactions, 54(5), 464\u2013480.","journal-title":"IISE Transactions"},{"issue":"5","key":"2348_CR53","doi-asserted-by":"crossref","first-page":"526","DOI":"10.1080\/00224065.2021.1903822","volume":"53","author":"H Yan","year":"2021","unstructured":"Yan, H., Sergin, N. D., Brenneman, W. A., Lange, S. J., & Ba, S. (2021). Deep multistage multi-task learning for quality prediction of multistage manufacturing systems. Journal of Quality Technology, 53(5), 526\u2013544.","journal-title":"Journal of Quality Technology"},{"key":"2348_CR54","doi-asserted-by":"crossref","unstructured":"Yang, C., Xie, L., Qiao, S., & YuilleA. L. (2019). Training deep neural networks in generations: A more tolerant teacher educates better students. In Proceedings of the AAAI Conference on Artificial Intelligence.","DOI":"10.1609\/aaai.v33i01.33015628"},{"key":"2348_CR55","doi-asserted-by":"crossref","unstructured":"Yang, Z., Lu, Y., Li, S., Li, J., Ndiaye, Y., Yang, H., & Krishnamurty, S. (2021). In-process data fusion for process monitoring and control of metal additive manufacturing. In International design engineering technical conferences and computers and information in engineering conference. American Society of Mechanical Engineers.","DOI":"10.1115\/DETC2021-71813"},{"key":"2348_CR56","doi-asserted-by":"crossref","first-page":"760","DOI":"10.1016\/j.mfglet.2023.08.108","volume":"35","author":"E Yangue","year":"2023","unstructured":"Yangue, E., Ye, Z., Kan, C., & Liu, C. (2023). Integrated deep learning-based online layer-wise surface prediction of additive manufacturing. Manufacturing Letters, 35, 760\u2013769.","journal-title":"Manufacturing Letters"},{"key":"2348_CR57","doi-asserted-by":"publisher","DOI":"10.1115\/1.4037891","author":"B Yao","year":"2018","unstructured":"Yao, B., Imani, F., Sakpal, A. S., Reutzel, E., & Yang, H. (2018). Multifractal analysis of image profiles for the characterization and detection of defects in additive manufacturing. Journal of Manufacturing Science and Engineering. https:\/\/doi.org\/10.1115\/1.4037891","journal-title":"Journal of Manufacturing Science and Engineering"},{"key":"2348_CR58","doi-asserted-by":"crossref","first-page":"210","DOI":"10.1016\/j.jmsy.2021.09.002","volume":"61","author":"Z Ye","year":"2021","unstructured":"Ye, Z., Liu, C., Tian, W., & Kan, C. (2021). In situ point cloud fusion for layer-wise monitoring of additive manufacturing. Journal of Manufacturing Systems, 61, 210\u2013222.","journal-title":"Journal of Manufacturing Systems"},{"issue":"1","key":"2348_CR59","doi-asserted-by":"crossref","first-page":"204","DOI":"10.1002\/qre.2392","volume":"35","author":"J Yu","year":"2019","unstructured":"Yu, J., Zheng, X., & Wang, S. (2019). Stacked denoising autoencoder-based feature learning for out-of-control source recognition in multivariate manufacturing process. Quality and Reliability Engineering International, 35(1), 204\u2013223.","journal-title":"Quality and Reliability Engineering International"},{"key":"2348_CR60","doi-asserted-by":"crossref","unstructured":"Zhang, Y., Xiang, T., Hospedales, T. M., & Lu, H. (2018). Deep mutual learning. In Proceedings of the IEEE conference on computer vision and pattern recognition.","DOI":"10.1109\/CVPR.2018.00454"},{"issue":"12","key":"2348_CR61","doi-asserted-by":"crossref","first-page":"5586","DOI":"10.1109\/TKDE.2021.3070203","volume":"34","author":"Y Zhang","year":"2021","unstructured":"Zhang, Y., & Yang, Q. (2021). A survey on multi-task learning. IEEE Transactions on Knowledge and Data Engineering, 34(12), 5586\u20135609.","journal-title":"IEEE Transactions on Knowledge and Data Engineering"},{"issue":"35","key":"2348_CR62","first-page":"1","volume":"2023","author":"J Zhao","year":"2023","unstructured":"Zhao, J., Qian, X., Zhang, Y., Shan, D., Liu, X., Coleman, S., & Kerr, D. (2023). A knowledge distillation-based multi-scale relation-prototypical network for cross-domain few-shot defect classification. Journal of Intelligent Manufacturing, 2023(35), 1\u201317.","journal-title":"Journal of Intelligent Manufacturing"}],"container-title":["Journal of Intelligent Manufacturing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10845-024-02348-9.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10845-024-02348-9\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10845-024-02348-9.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,25]],"date-time":"2025-02-25T14:17:37Z","timestamp":1740493057000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10845-024-02348-9"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3,29]]},"references-count":62,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2025,3]]}},"alternative-id":["2348"],"URL":"https:\/\/doi.org\/10.1007\/s10845-024-02348-9","relation":{},"ISSN":["0956-5515","1572-8145"],"issn-type":[{"value":"0956-5515","type":"print"},{"value":"1572-8145","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,3,29]]},"assertion":[{"value":"26 July 2023","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"9 February 2024","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"29 March 2024","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Competing interest"}}]}}