{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,9]],"date-time":"2026-07-09T16:10:41Z","timestamp":1783613441554,"version":"3.55.0"},"reference-count":16,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2010,2,9]],"date-time":"2010-02-09T00:00:00Z","timestamp":1265673600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Multimed Tools Appl"],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1007\/s11042-010-0472-8","type":"journal-article","created":{"date-parts":[[2010,2,8]],"date-time":"2010-02-08T08:40:51Z","timestamp":1265618451000},"page":"147-157","source":"Crossref","is-referenced-by-count":29,"title":["Fabric defect detection using local contrast deviations"],"prefix":"10.1007","volume":"52","author":[{"given":"Meihong","family":"Shi","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Rong","family":"Fu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yong","family":"Guo","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shixian","family":"Bai","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bugao","family":"Xu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2010,2,9]]},"reference":[{"issue":"4","key":"472_CR1","first-page":"36","volume":"27","author":"JJ Chen","year":"2006","unstructured":"Chen JJ, Xie CP (2006) Fabric detection technique based on neural network. Tex Res J 27(4):36\u201339","journal-title":"Tex Res J"},{"key":"472_CR2","doi-asserted-by":"crossref","first-page":"203","DOI":"10.1016\/S0031-3203(01)00188-1","volume":"35","author":"D Chetverikov","year":"2002","unstructured":"Chetverikov D, Hanbury A (2002) Finding defects in texture using regularity and local orientation. Pattern Recogn 35:203\u2013218","journal-title":"Pattern Recogn"},{"key":"472_CR3","doi-asserted-by":"crossref","first-page":"803","DOI":"10.1109\/34.85670","volume":"3\u20138","author":"FS Cohen","year":"1991","unstructured":"Cohen FS, Fan Z, Attali S (1991) Automated inspection of textile fabrics using textural models. IEEE Trans Pattern Anal Mach Intell 3\u20138:803\u2013808","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"issue":"2","key":"472_CR4","doi-asserted-by":"crossref","first-page":"317","DOI":"10.1080\/00405000008659509","volume":"91","author":"A Conci","year":"2000","unstructured":"Conci A, Procenca CB (2000) A comparison between image-processing approaches to textile inspection. J Textile Inst 91(2):317\u2013323","journal-title":"J Textile Inst"},{"key":"472_CR5","first-page":"32","volume-title":"Engineering analysis and application based on wavelet transform","author":"Y Fusheng","year":"2000","unstructured":"Fusheng Y (2000) Engineering analysis and application based on wavelet transform. Science, Beijing, pp 32\u201369"},{"issue":"11","key":"472_CR6","doi-asserted-by":"crossref","first-page":"3140","DOI":"10.1117\/1.601054","volume":"35","author":"WJ Jasper","year":"1996","unstructured":"Jasper WJ, Gamier SJ, Potlapalli H (1996) Texture characterization and defect detection using adaptive wavelets. Opt Eng 35(11):3140\u20133149","journal-title":"Opt Eng"},{"issue":"1","key":"472_CR7","doi-asserted-by":"crossref","first-page":"348","DOI":"10.1109\/TIE.1930.896476","volume":"55","author":"A Kumar","year":"2008","unstructured":"Kumar A (2008) Computer-vision-based fabric defect detection: a survey. IEEE Trans Ind Electron 55(1):348\u2013363","journal-title":"IEEE Trans Ind Electron"},{"issue":"2","key":"472_CR8","doi-asserted-by":"crossref","first-page":"425","DOI":"10.1109\/28.993164","volume":"38","author":"A Kumar","year":"2002","unstructured":"Kumar A, Pang GKH (2002) Defect detection in textured materials using Gabor filters. IEEE Trans Ind Appl 38(2):425\u2013440","journal-title":"IEEE Trans Ind Appl"},{"issue":"3","key":"472_CR9","doi-asserted-by":"crossref","first-page":"238","DOI":"10.1177\/004051750307300307","volume":"73","author":"CF Kuo","year":"2003","unstructured":"Kuo CF, Lee CJ, Tsai CC (2003) Using a neural network to identify fabric defects in dynamic cloth inspection. Tex Res J 73(3):238\u2013244","journal-title":"Tex Res J"},{"issue":"4","key":"472_CR10","first-page":"82","volume":"27","author":"LQ Li","year":"2001","unstructured":"Li LQ, Huang XB (2001) Woven fabric defect detection with features based on adaptive wavelets. J DongHua Univ 27(4):82\u201387","journal-title":"J DongHua Univ"},{"issue":"4","key":"472_CR11","first-page":"118","volume":"28","author":"LQ Li","year":"2002","unstructured":"Li LQ, Huang XB (2002) Recent studies on image-based automatic fabric inspection system. J DongHua Univ 28(4):118\u2013122","journal-title":"J DongHua Univ"},{"issue":"A5","key":"472_CR12","doi-asserted-by":"crossref","first-page":"1484","DOI":"10.1093\/ietfec\/e89-a.5.1484","volume":"89","author":"R Meylani","year":"2006","unstructured":"Meylani R (2006) 2-D iteratively reweighted least squares lattice algorithm and its application to defect detection in textured images. EIEICE Trans Fundam Electron Communi Computer Sci E 89(A5):1484\u20131494","journal-title":"EIEICE Trans Fundam Electron Communi Computer Sci E"},{"issue":"1","key":"472_CR13","doi-asserted-by":"crossref","first-page":"121","DOI":"10.1016\/j.patcog.2006.05.023","volume":"40","author":"OG Sezer","year":"2007","unstructured":"Sezer OG, ErtEE A, Eril A (2007) Using perceptual relation of regularity and anisotropy in the texture with independent components for defect detection. IEEE Pattern Recogn 40(1):121\u2013133","journal-title":"IEEE Pattern Recogn"},{"key":"472_CR14","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1155\/2008\/783898","volume":"1155","author":"F Tajeripour","year":"2008","unstructured":"Tajeripour F, Kabir E, Sheikhi A (2008) Fabric defect detection using modified local binary patterns. EURASIP J Adv Signal Process 1155:1\u201312","journal-title":"EURASIP J Adv Signal Process"},{"key":"472_CR15","unstructured":"Workgroup on Texture Analysis of DFG. TILDA Textile Texture Database: http:\/\/lmb.informatik.uni-freiburg.de\/research\/dfg-texture\/tilda"},{"issue":"1","key":"472_CR16","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1177\/004051759506500101","volume":"65","author":"YF Zhang","year":"1995","unstructured":"Zhang YF, Bresee RR (1995) Fabric defect detection and classification using image analysis. Tex Res J 65(1):1\u20139","journal-title":"Tex Res J"}],"container-title":["Multimedia Tools and Applications"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11042-010-0472-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11042-010-0472-8\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11042-010-0472-8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,31]],"date-time":"2019-05-31T23:27:54Z","timestamp":1559345274000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11042-010-0472-8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,2,9]]},"references-count":16,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2011,3]]}},"alternative-id":["472"],"URL":"https:\/\/doi.org\/10.1007\/s11042-010-0472-8","relation":{},"ISSN":["1380-7501","1573-7721"],"issn-type":[{"value":"1380-7501","type":"print"},{"value":"1573-7721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,2,9]]}}}