{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,24]],"date-time":"2026-02-24T18:04:41Z","timestamp":1771956281737,"version":"3.50.1"},"reference-count":20,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2015,3,20]],"date-time":"2015-03-20T00:00:00Z","timestamp":1426809600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Multimed Tools Appl"],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1007\/s11042-015-2559-8","type":"journal-article","created":{"date-parts":[[2015,3,19]],"date-time":"2015-03-19T03:43:32Z","timestamp":1426736612000},"page":"2655-2666","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":35,"title":["Touch screen defect inspection based on sparse representation in low resolution images"],"prefix":"10.1007","volume":"75","author":[{"given":"Lie-Quan","family":"Liang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Di","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xin","family":"Fu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wu-Jie","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2015,3,20]]},"reference":[{"issue":"1","key":"2559_CR1","doi-asserted-by":"crossref","first-page":"235","DOI":"10.1016\/j.amc.2009.03.011","volume":"213","author":"YG Cen","year":"2009","unstructured":"Cen YG, Cen LH (2009) Explicit construction of high-pass filter sequence for orthogonal multiwavelets[J]. Appl Math Comput 213(1):235\u2013242","journal-title":"Appl Math Comput"},{"issue":"2","key":"2559_CR2","first-page":"326","volume":"33","author":"YG Cen","year":"2011","unstructured":"Cen YG, Cen LH (2011) Sparse representation and reconstruction of signals based on the peak transform[J]. Dianzi Yu Xinxi Xuebao (J Electron Inf Technol) 33(2):326\u2013331","journal-title":"Dianzi Yu Xinxi Xuebao (J Electron Inf Technol)"},{"key":"2559_CR3","doi-asserted-by":"crossref","first-page":"49","DOI":"10.1016\/j.cam.2012.11.018","volume":"244","author":"YG Cen","year":"2013","unstructured":"Cen YG, Cen LH, Chen XF et al (2013) Explicit construction of symmetric compactly supported biorthogonal multiwavelets via group transformations[J]. J Comput Appl Math 244:49\u201366","journal-title":"J Comput Appl Math"},{"key":"2559_CR4","doi-asserted-by":"crossref","unstructured":"Cen Y, Wang F, Zhao R, Cui L, Cen L, Miao Z, Cen Y (2013) Tree-based backtracking orthogonal matching pursuit for sparse signal reconstruction[J]. J Appl Math (2013), http:\/\/dx.doi.org\/ 10.1155\/2013\/864132 (Article ID 864132)","DOI":"10.1155\/2013\/864132"},{"issue":"4","key":"2559_CR5","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1007\/s11432-013-4855-0","volume":"57","author":"YG Cen","year":"2014","unstructured":"Cen YG, Zhao RZ, Miao ZJ, Cen LH, Cui LH (2014) A new approach of conditions on \u03b42s (\u03d5) for s-sparse recovery[J]. Sci China Inf Sci 57(4):1\u20137","journal-title":"Sci China Inf Sci"},{"key":"2559_CR6","unstructured":"Chen XH (2013) Research on touch screen glass defects detection methods based on computer vision, Master degree thesis of the South China University of Technology in Guangzhou, China"},{"issue":"7","key":"2559_CR7","doi-asserted-by":"crossref","first-page":"989","DOI":"10.1016\/j.measurement.2009.02.006","volume":"42","author":"YC Chiou","year":"2009","unstructured":"Chiou YC, Li WC (2009) Flaw detection of cylindrical surfaces in PU-packing by using machine vision technique[J]. Measurement 42(7):989\u20131000","journal-title":"Measurement"},{"issue":"2","key":"2559_CR8","doi-asserted-by":"crossref","first-page":"252","DOI":"10.1179\/1743131X11Y.0000000016","volume":"61","author":"WY Chiu","year":"2013","unstructured":"Chiu WY, Tsai DM (2013) Moving\/motionless foreground object detection using fast statistical background updating[J]. Imaging Sci J 61(2):252\u2013267","journal-title":"Imaging Sci J"},{"key":"2559_CR9","doi-asserted-by":"crossref","unstructured":"Cong Y, Yuan J, Liu J (2011) Sparse reconstruction cost for abnormal event detection [C]. 2011 I.E. Conference on Computer Vision and Pattern Recognition (CVPR). Colorado Springs. 3449\u20133456","DOI":"10.1109\/CVPR.2011.5995434"},{"issue":"3","key":"2559_CR10","doi-asserted-by":"crossref","first-page":"533","DOI":"10.1016\/j.sigpro.2005.05.027","volume":"86","author":"D Donoho","year":"2006","unstructured":"Donoho D, Tsaic Y (2006) Extensions of compressed sensing[J]. Signal Process 86(3):533\u2013548","journal-title":"Signal Process"},{"issue":"11","key":"2559_CR11","doi-asserted-by":"crossref","first-page":"2765","DOI":"10.1109\/TPAMI.2013.57","volume":"35","author":"E Elhamifar","year":"2013","unstructured":"Elhamifar E, Vidal R (2013) Sparse subspace clustering: algorithm, theory, and applications. IEEE Trans Pattern Anal Mach Intell 35(11):2765\u20132781","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"2559_CR12","doi-asserted-by":"crossref","unstructured":"Li D, Liang LQ, Zhang WJ (2014) Defect inspection and extraction of the mobile phone cover glass based on the principal components analysis[J]. Int J Adv Manuf Technol\u00a073:1605\u20131614. doi: 10.1007\/s00170-014-5871-y","DOI":"10.1007\/s00170-014-5871-y"},{"key":"2559_CR13","doi-asserted-by":"crossref","first-page":"1079","DOI":"10.1007\/s00170-011-3248-z","volume":"56","author":"H Liu","year":"2011","unstructured":"Liu H, Chen Y, Peng X, Xie J (2011) A classification method of glass defect based on multiresolution and information fusion[J]. Int J Adv Manuf Technol 56:1079\u20131090","journal-title":"Int J Adv Manuf Technol"},{"issue":"1\u20132","key":"2559_CR14","first-page":"53","volume":"25","author":"CJ Lu","year":"2005","unstructured":"Lu CJ, Tsai DM (2005) Automatic defect inspection for LCDs using singular value decomposition[J]. Int J Adv Manuf Technol 25(1\u20132):53\u201361","journal-title":"Int J Adv Manuf Technol"},{"key":"2559_CR15","doi-asserted-by":"crossref","first-page":"1180","DOI":"10.1007\/s00170-007-1302-7","volume":"39","author":"X Peng","year":"2008","unstructured":"Peng X, Chen Y, Yu W, Zhou Z, Sun G (2008) An online defects inspection method for float glass fabrication based on machine vision[J]. Int J Adv Manuf Technol 39:1180\u20131189","journal-title":"Int J Adv Manuf Technol"},{"issue":"7\u20138","key":"2559_CR16","doi-asserted-by":"crossref","first-page":"756","DOI":"10.1007\/s00170-006-0505-7","volume":"33","author":"HC Shang","year":"2007","unstructured":"Shang HC, Chen YP, Yu WY et al (2007) Online auto-detection method and system of presswork quality[J]. Int J Adv Manuf Technol 33(7\u20138):756\u2013765","journal-title":"Int J Adv Manuf Technol"},{"issue":"6","key":"2559_CR17","doi-asserted-by":"crossref","first-page":"420","DOI":"10.1007\/s001700200172","volume":"20","author":"DM Tsai","year":"2002","unstructured":"Tsai DM, Lin BT (2002) Defect detection of gold-plated surfaces on PCBs using entropy measures[J]. Int J Adv Manuf Technol 20(6):420\u2013428","journal-title":"Int J Adv Manuf Technol"},{"issue":"5","key":"2559_CR18","doi-asserted-by":"crossref","first-page":"312","DOI":"10.1016\/j.rcim.2013.01.009","volume":"29","author":"DM Tsai","year":"2013","unstructured":"Tsai DM, Lin MC (2013) Machine-vision-based identification for wafer tracking in solar cell manufacturing[J]. Robot Comput Integr Manuf 29(5):312\u2013321","journal-title":"Robot Comput Integr Manuf"},{"issue":"1","key":"2559_CR19","doi-asserted-by":"crossref","first-page":"122","DOI":"10.1109\/TII.2012.2209663","volume":"9","author":"DM Tsai","year":"2013","unstructured":"Tsai DM, Wu SC, Chiu WY (2013) Defect detection in solar modules using ICA basis images[J]. IEEE Trans Ind Inf 9(1):122\u2013131","journal-title":"IEEE Trans Ind Inf"},{"key":"2559_CR20","doi-asserted-by":"crossref","unstructured":"Zhao J, Kong QJ, Zhao X, Liu JP, Liu YC (2011) A method for detection and classification of glass defects in low resolution images [C]. 2011 Sixth International Conference on Image and Graphics (ICIG), Hefei: 642\u2013647","DOI":"10.1109\/ICIG.2011.187"}],"container-title":["Multimedia Tools and Applications"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11042-015-2559-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11042-015-2559-8\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11042-015-2559-8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,31]],"date-time":"2019-05-31T23:32:17Z","timestamp":1559345537000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11042-015-2559-8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,3,20]]},"references-count":20,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2016,3]]}},"alternative-id":["2559"],"URL":"https:\/\/doi.org\/10.1007\/s11042-015-2559-8","relation":{},"ISSN":["1380-7501","1573-7721"],"issn-type":[{"value":"1380-7501","type":"print"},{"value":"1573-7721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,3,20]]}}}