{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T15:54:22Z","timestamp":1772121262168,"version":"3.50.1"},"reference-count":47,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2008,5,1]],"date-time":"2008-05-01T00:00:00Z","timestamp":1209600000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Software Qual J"],"published-print":{"date-parts":[[2008,12]]},"DOI":"10.1007\/s11219-008-9053-8","type":"journal-article","created":{"date-parts":[[2008,4,30]],"date-time":"2008-04-30T14:10:00Z","timestamp":1209564600000},"page":"543-562","source":"Crossref","is-referenced-by-count":23,"title":["A defect prediction method for software versioning"],"prefix":"10.1007","volume":"16","author":[{"given":"Yomi","family":"Kastro","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ay\u015fe Basar","family":"Bener","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2008,5,1]]},"reference":[{"key":"9053_CR1","volume-title":"Introduction to machine learning","author":"E. Alpaydin","year":"2004","unstructured":"Alpaydin, E. (2004). Introduction to machine learning. Cambridge, MA: MIT Press."},{"key":"9053_CR43","volume-title":"ata mining techniques: For marketing, sales, and customer support","author":"M. J. A. Barry","year":"1997","unstructured":"Barry, M. J. A., & Linoff, G. (1997). Data mining techniques: For marketing, sales, and customer support. New York: John Wiley."},{"key":"9053_CR2","doi-asserted-by":"crossref","DOI":"10.1093\/oso\/9780198538493.001.0001","volume-title":"Neural networks for pattern recognition","author":"C. M. Bishop","year":"1995","unstructured":"Bishop, C. M. (1995). Neural networks for pattern recognition. Oxford: Oxford University Press."},{"issue":"5","key":"9053_CR44","doi-asserted-by":"crossref","first-page":"27","DOI":"10.1109\/MC.2000.841781","volume":"33","author":"B. Boehm","year":"2000","unstructured":"Boehm, B., & Basili, V. R. (2000). Gaining intellectual control of software development. Computer, 33(5), 27\u201333.","journal-title":"Computer"},{"issue":"1","key":"9053_CR3","doi-asserted-by":"crossref","first-page":"135","DOI":"10.1109\/2.962984","volume":"34","author":"B. Boehm","year":"2001","unstructured":"Boehm, B., & Basili, V. (2001). Software defect reduction top 10 list. IEEE Computer, 34(1), 135\u2013137.","journal-title":"IEEE Computer"},{"key":"9053_CR4","doi-asserted-by":"crossref","unstructured":"Boehm, B., Clark, B., Horowitz, E., & Westland, C. (1995). Cost models for future software life cycle processes: COCOMO 2.0. Annals of Software Engineering, Special Volume on Software Process and Product Measurement(1), 57\u201394.","DOI":"10.1007\/BF02249046"},{"issue":"4","key":"9053_CR5","doi-asserted-by":"crossref","first-page":"34","DOI":"10.1109\/52.391826","volume":"12","author":"J. P. Bowen","year":"1995","unstructured":"Bowen, J. P., & Hinchey, M. G. (1995). Seven more myths of formal methods. IEEE Software, 12(4), 34\u201341. doi: 10.1109\/52.391826 .","journal-title":"IEEE Software"},{"issue":"2","key":"9053_CR6","doi-asserted-by":"crossref","first-page":"238","DOI":"10.1109\/32.44387","volume":"16","author":"S. S. Brilliant","year":"1990","unstructured":"Brilliant, S. S., Knight, J. C., & Leveson, N. G. (1990). Analysis of faults in an N-version software experiment. IEEE Transactions on Software Engineering, 16(2), 238\u2013247. doi: 10.1109\/32.44387 .","journal-title":"IEEE Transactions on Software Engineering"},{"key":"9053_CR7","doi-asserted-by":"crossref","DOI":"10.1109\/ICSE.2004.1317470","volume-title":"Finding latent code errors via machine learning over program executions","author":"Y. Brun","year":"2004","unstructured":"Brun, Y., & Ernst, M. (2004). Finding latent code errors via machine learning over program executions. Edinburgh, Scotland: ICSE 2004, 26th International Conference on Software Engineering."},{"key":"9053_CR8","doi-asserted-by":"crossref","unstructured":"Ceylan, E., Kutlubay, O., & Bener, A. (2006). Software Defect Identification Using Machine Learning Techniques. In 32nd Euromicro Conference on Software Engineering and Advanced Applications (Euromicro-SEAA 2006), Crotia.","DOI":"10.1109\/EUROMICRO.2006.56"},{"issue":"4","key":"9053_CR9","doi-asserted-by":"crossref","first-page":"626","DOI":"10.1145\/242223.242257","volume":"28","author":"E. M. Clarke","year":"1996","unstructured":"Clarke, E. M., & Wing, J. M. (1996). Formal methods: state of the art and future directions. ACM Computing Surveys, 28(4), 626\u2013643. doi: 10.1145\/242223.242257 .","journal-title":"ACM Computing Surveys"},{"issue":"4","key":"9053_CR10","doi-asserted-by":"crossref","first-page":"328","DOI":"10.1109\/TSE.2005.52","volume":"31","author":"D. Coppit","year":"2005","unstructured":"Coppit, D., Yang, J., Khurshid, S., Le, W., & Sullivan, K. (2005). Software assurance by bounded exhaustive testing. IEEE Transactions on Software Engineering, 31(4), 328\u2013339. doi: 10.1109\/TSE.2005.52 .","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"5","key":"9053_CR11","doi-asserted-by":"crossref","first-page":"675","DOI":"10.1109\/32.815326","volume":"25","author":"N. Fenton","year":"1999","unstructured":"Fenton, N., & Neil, M. (1999). A critique of software defect prediction models. IEEE Transactions on Software Engineering, 25(5), 675\u2013689. doi: 10.1109\/32.815326 .","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"8","key":"9053_CR12","doi-asserted-by":"crossref","first-page":"797","DOI":"10.1109\/32.879815","volume":"26","author":"N. Fenton","year":"2000","unstructured":"Fenton, N., & Ohlsson, N. (2000). Quantitative analysis of faults and failures in a complex software system. IEEE Transactions on Software Engineering, 26(8), 797\u2013814. doi: 10.1109\/32.879815 .","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"5","key":"9053_CR13","doi-asserted-by":"crossref","first-page":"392","DOI":"10.1109\/TSE.2005.59","volume":"31","author":"A. Gregoriades","year":"2005","unstructured":"Gregoriades, A., & Sutcliffe, A. (2005). Scenario-based assessment of nonfunctional requirements. IEEE Transactions on Software Engineering, 31(5), 392\u2013409. doi: 10.1109\/TSE.2005.59 .","journal-title":"IEEE Transactions on Software Engineering"},{"key":"9053_CR14","doi-asserted-by":"crossref","unstructured":"Groce, P., & Visser, W. (2003). What went wrong: Explaining counterexamples. 10th International SPIN Workshop on Model Checking of Software. Portland, Oregon, pp. 121\u2013135.","DOI":"10.1007\/3-540-44829-2_8"},{"key":"9053_CR15","doi-asserted-by":"crossref","unstructured":"Harrold, M. J. (2000). Testing: A roadmap. Proceedings of the Conference on the Future of Software Engineering, Limerick, Ireland.","DOI":"10.1145\/336512.336532"},{"issue":"3","key":"9053_CR16","doi-asserted-by":"crossref","first-page":"213","DOI":"10.1109\/TSE.2005.38","volume":"31","author":"K. Inoue","year":"2005","unstructured":"Inoue, K., Yokomori, R., Yamamoto, R., Matsushita, M., & Kusumoto, S. (2005). Ranking significance of software components based on use relations. IEEE Transactions on Software Engineering, 31(3), 213\u2013225. doi: 10.1109\/TSE.2005.38 .","journal-title":"IEEE Transactions on Software Engineering"},{"key":"9053_CR17","volume-title":"An introduction to Bayesian networks","author":"F. Jensen","year":"1996","unstructured":"Jensen, F. (1996). An introduction to Bayesian networks. NY: Springer Verlag."},{"issue":"4","key":"9053_CR18","doi-asserted-by":"crossref","first-page":"76","DOI":"10.1109\/MS.2005.95","volume":"22","author":"P. M. Johnson","year":"2005","unstructured":"Johnson, P. M., Kou, H., Paulding, M., Zhang, Q., Kagawa, A., & Yamashita, T. (2005). Improving software development management through software project telemetry. IEEE Software, 22(4), 76\u201385. doi: 10.1109\/MS.2005.95 .","journal-title":"IEEE Software"},{"issue":"3","key":"9053_CR19","doi-asserted-by":"crossref","first-page":"57","DOI":"10.1109\/MS.2005.73","volume":"22","author":"M. Jorgensen","year":"2005","unstructured":"Jorgensen, M. (2005). Practical guidelines for expert-judgment-based software effort estimation. IEEE Software, 22(3), 57\u201363. doi: 10.1109\/MS.2005.73 .","journal-title":"IEEE Software"},{"key":"9053_CR20","doi-asserted-by":"crossref","first-page":"159","DOI":"10.1023\/A:1009876418873","volume":"4","author":"T. M. Khoshgoftaar","year":"1999","unstructured":"Khoshgoftaar, T. M., & Allen, E. B. (1999). A comparative study of ordering and classification of fault-prone software modules. Empirical Software Engineering, 4, 159\u2013186. doi: 10.1023\/A:1009876418873 .","journal-title":"Empirical Software Engineering"},{"issue":"6","key":"9053_CR21","doi-asserted-by":"crossref","first-page":"23","DOI":"10.1109\/MS.2005.149","volume":"22","author":"G. Koru","year":"2005","unstructured":"Koru, G., & Liu, H. (2005). Building defect prediction models in practice. IEEE Software, 22(6), 23\u201329. doi: 10.1109\/MS.2005.149 .","journal-title":"IEEE Software"},{"key":"9053_CR22","doi-asserted-by":"crossref","unstructured":"Kung, D. C., Gao, J., Hsia, F., Wen, F., Toyoshima, Y., & Chen, C. (1994). Change impact identification in object oriented software maintenance. Proceedings of the International Conference on Software Maintenance, pp. 202\u2013211, IEEE Computer Society Press.","DOI":"10.1109\/ICSM.1994.336774"},{"key":"9053_CR23","unstructured":"Menzies, T., DiStefano, J., & Chapman, R. (2004). Assessing predictors of software defects. Proccedings of Workshop on Predictive Software Models, Chicago."},{"key":"9053_CR24","unstructured":"Menzies, T., DiStefano, J. S., Chapman, M., & McGill, K. (2002). Metrics that matter. Proceedings of 27th NASA SEL Workshop on Software Engineering."},{"issue":"1","key":"9053_CR25","doi-asserted-by":"crossref","first-page":"2","DOI":"10.1109\/TSE.2007.256941","volume":"33","author":"T. Menzies","year":"2007","unstructured":"Menzies, T., Greenwald, J., & Frank, A. (2007). Data mining static code attributes to learn defect predictors. IEEE Transactions on Software Engineering, 33(1), 2\u201313. doi: 10.1109\/TSE.2007.256941 .","journal-title":"IEEE Transactions on Software Engineering"},{"key":"9053_CR26","doi-asserted-by":"crossref","unstructured":"Menzies, T., D. Stefano, J. S., & Chapman, M. (2003). Learning early life cycle IV & V quality indicators. Proceedings of Ninth International Software Metrics Symposium.","DOI":"10.1109\/METRIC.2003.1232458"},{"key":"9053_CR27","volume-title":"Machine Learning","author":"T. M. Mitchell","year":"1997","unstructured":"Mitchell, T. M. (1997). Machine Learning. NY: McGrawHill."},{"issue":"6","key":"9053_CR28","first-page":"106","volume":"19","author":"J. Munson","year":"1990","unstructured":"Munson, J., & Khoshgoftaar, T. M. (1990). Regression modelling of software quality: Empirical investigation. Journal of Electronic Materials, 19(6), 106\u2013114.","journal-title":"Journal of Electronic Materials"},{"key":"9053_CR30","doi-asserted-by":"crossref","DOI":"10.1109\/ICSE.2005.1553571","volume-title":"Use of relative code churn measures to predict system defect density","author":"N. Nagappan","year":"2005","unstructured":"Nagappan, N., & Ball, T. (2005a). Use of relative code churn measures to predict system defect density. St. Louis, MO: ICSE 2005."},{"key":"9053_CR29","doi-asserted-by":"crossref","DOI":"10.1109\/ICSE.2005.1553604","volume-title":"Static analysis tools as early indicators of pre-release defect density","author":"N. Nagappan","year":"2005","unstructured":"Nagappan, N., & Ball, T. (2005b). Static analysis tools as early indicators of pre-release defect density. St. Louis, MO: ICSE 2005."},{"key":"9053_CR31","doi-asserted-by":"crossref","DOI":"10.1109\/ISSRE.2005.35","volume-title":"Providing test quality feedback using static source code and automatic test suite metrics","author":"N. Nagappan","year":"2005","unstructured":"Nagappan, N., Williams, L., Osborne, J., Vouk, M., & Abrahamsson, P. (2005). Providing test quality feedback using static source code and automatic test suite metrics. Chicago, IL: International Symposium on Software Reliability Engineering."},{"issue":"4","key":"9053_CR32","doi-asserted-by":"crossref","first-page":"340","DOI":"10.1109\/TSE.2005.49","volume":"31","author":"T. J. Ostrand","year":"2005","unstructured":"Ostrand, T. J., Weyuker, E. J., & Bell, R. M. (2005). Predicting the location and number of faults in large software systems. IEEE Transactions on Software Engineering, 31(4), 340\u2013355. doi: 10.1109\/TSE.2005.49 .","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"1","key":"9053_CR33","doi-asserted-by":"crossref","first-page":"17","DOI":"10.1109\/TSE.2004.1265733","volume":"30","author":"F. Padberg","year":"2004","unstructured":"Padberg, F., Ragg, T., & Schoknecht, R. (2004). Using machine learning for estimating the defect content after an inspection. IEEE Transactions on Software Engineering, 30(1), 17\u201328. doi: 10.1109\/TSE.2004.1265733 .","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"7","key":"9053_CR34","doi-asserted-by":"crossref","first-page":"615","DOI":"10.1109\/TSE.2005.75","volume":"31","author":"P. C. Pendharkar","year":"2005","unstructured":"Pendharkar, P. C., Subramanian, G. H., & Rodger, J. A. (2005). A probabilistic model for predicting software development effort. IEEE Transactions on Software Engineering, 31(7), 615\u2013624. doi: 10.1109\/TSE.2005.75 .","journal-title":"IEEE Transactions on Software Engineering"},{"key":"9053_CR35","doi-asserted-by":"crossref","DOI":"10.1109\/ICSE.2003.1201224","volume-title":"Automated support for classifying software failure reports","author":"D. Podgurski","year":"2003","unstructured":"Podgurski, D., Leaon, P., Francis, P., Masri, W., Minch, M., Jiayang, S., & Wang, B. (2003). Automated support for classifying software failure reports. Portland, Oregon: ICSE 2003."},{"issue":"4","key":"9053_CR45","doi-asserted-by":"crossref","first-page":"355","DOI":"10.1023\/A:1009776104355","volume":"3","author":"A. Porter","year":"2004","unstructured":"Porter, A., & Votta, L. (2004). Comparing detection methods for software requirements inspections: A replication using professional subjects. Empirical Software Engineering, 3(4), 355\u2013379.","journal-title":"Empirical Software Engineering"},{"key":"9053_CR46","unstructured":"Sarle, W. (1996). How many hidden layer should i use. Neural Nets FAQ, http:\/\/www.faqs.org\/faqs\/ai-faq\/neural-nets\/part3\/section-9.html ."},{"issue":"33","key":"9053_CR47","doi-asserted-by":"crossref","first-page":"197","DOI":"10.1016\/0164-1212(94)90011-6","volume":"26","author":"M. Sheppard","year":"1994","unstructured":"Sheppard, M., & Ince, D. C. (1994). A critique of three metrics. The Journal of Systems and Software, 26(33), 197\u2013210.","journal-title":"The Journal of Systems and Software"},{"issue":"2","key":"9053_CR36","doi-asserted-by":"crossref","first-page":"69","DOI":"10.1109\/TSE.2006.1599417","volume":"32","author":"O. Song","year":"2006","unstructured":"Song, O., Sheppard, M., Cartwright, M., & Mair, C. (2006). Software defect association mining and defect correction effort prediction. IEEE Transactions on Software Engineering, 32(2), 69\u201382. doi: 10.1109\/TSE.2006.1599417 .","journal-title":"IEEE Transactions on Software Engineering"},{"key":"9053_CR37","doi-asserted-by":"crossref","first-page":"981","DOI":"10.1109\/72.165599","volume":"3","author":"E. D. Sontag","year":"1992","unstructured":"Sontag, E. D. (1992). Feedback stabilization using two-hidden-layer nets. IEEE Transactions on Neural Networks, 3, 981\u2013990. doi: 10.1109\/72.165599 .","journal-title":"IEEE Transactions on Neural Networks"},{"key":"9053_CR38","unstructured":"Sourceforge. from www.sourceforge.net ."},{"key":"9053_CR39","volume-title":"Applying neural networks: Apractical guide","author":"K. Swingler","year":"1996","unstructured":"Swingler, K. (1996). Applying neural networks: Apractical guide. London: Academic Press."},{"key":"9053_CR40","doi-asserted-by":"crossref","unstructured":"Tahat, L. H., Vaysburg, B., Korel B., & Bader, A. J. (2001). A requirement-based automated black-box test generation. Proceedings of 25th Annual International Computer Software and Applications Conference, Chicago, IL, pp. 489\u2013495.","DOI":"10.1109\/CMPSAC.2001.960658"},{"issue":"2","key":"9053_CR41","doi-asserted-by":"crossref","first-page":"124","DOI":"10.1109\/TDSC.2005.15","volume":"2","author":"K. Vaidyanathan","year":"2005","unstructured":"Vaidyanathan, K., & Trivedi, S. (2005). A comprehensive model for software rejuvenation. IEEE Transactions on Dependable Secure Computing, 2(2), 124\u2013137. doi: 10.1109\/TDSC.2005.15 .","journal-title":"IEEE Transactions on Dependable Secure Computing"},{"key":"9053_CR42","unstructured":"Zhang, D. (2000). Applying machine learning algorithms in software development. The Proceedings of 2000 Monterey Workshop on Modeling Software System Structures, Santa Margherita Ligure, Italy."}],"container-title":["Software Quality Journal"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11219-008-9053-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11219-008-9053-8\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11219-008-9053-8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,25]],"date-time":"2024-02-25T16:21:40Z","timestamp":1708878100000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11219-008-9053-8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,5,1]]},"references-count":47,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2008,12]]}},"alternative-id":["9053"],"URL":"https:\/\/doi.org\/10.1007\/s11219-008-9053-8","relation":{},"ISSN":["0963-9314","1573-1367"],"issn-type":[{"value":"0963-9314","type":"print"},{"value":"1573-1367","type":"electronic"}],"subject":[],"published":{"date-parts":[[2008,5,1]]}}}