{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,19]],"date-time":"2025-10-19T15:48:44Z","timestamp":1760888924133},"reference-count":37,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2014,6,18]],"date-time":"2014-06-18T00:00:00Z","timestamp":1403049600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Software Qual J"],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1007\/s11219-014-9242-6","type":"journal-article","created":{"date-parts":[[2014,6,19]],"date-time":"2014-06-19T10:37:43Z","timestamp":1403174263000},"page":"423-452","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":9,"title":["Fault domain-based testing in imperfect situations: a heuristic approach and case studies"],"prefix":"10.1007","volume":"23","author":[{"given":"Fevzi","family":"Belli","sequence":"first","affiliation":[]},{"given":"Mutlu","family":"Beyaz\u0131t","sequence":"additional","affiliation":[]},{"given":"Andre Takeshi","family":"Endo","sequence":"additional","affiliation":[]},{"given":"Aditya","family":"Mathur","sequence":"additional","affiliation":[]},{"given":"Adenilso","family":"Simao","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2014,6,18]]},"reference":[{"key":"9242_CR1","doi-asserted-by":"crossref","unstructured":"Belli, F. (2001). Finite-state testing and analysis of graphical user interfaces. In The 12th international symposium on software reliability engineering (ISSRE 2001) (pp. 34\u201343).","DOI":"10.1109\/ISSRE.2001.989456"},{"key":"9242_CR2","doi-asserted-by":"crossref","unstructured":"Belli, F., & Beyaz\u0131t, M. (2010). A formal framework for mutation testing. In The 4th international conference on secure software integration and reliability improvement (SSIRI 2010) (pp. 121\u2013130).","DOI":"10.1109\/SSIRI.2010.23"},{"key":"9242_CR3","doi-asserted-by":"crossref","unstructured":"Bj\u00f6rklund, H. (2005). State verification. In M. Broy, B. Jonsson, J. P. Katoen, M. Leucker, & A. Pretschner (Eds.), Model-based testing of reactive systems (pp. 69\u201386). Lecture Notes in Computer Science, Vol. 3472, 659 p., ISBN 978-3-540-26278-7. New York: Springer.","DOI":"10.1007\/11498490_4"},{"issue":"3","key":"9242_CR4","doi-asserted-by":"crossref","first-page":"178","DOI":"10.1109\/TSE.1978.231496","volume":"4","author":"TS Chow","year":"1978","unstructured":"Chow, T. S. (1978). Testing software design modeled by finite-state machines. IEEE Transactions on Software Engineering, 4(3), 178\u2013187.","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"12","key":"9242_CR5","doi-asserted-by":"crossref","first-page":"1286","DOI":"10.1016\/j.infsof.2010.07.001","volume":"52","author":"R Dorofeeva","year":"2010","unstructured":"Dorofeeva, R., El-Fakih, K., Maag, S., Cavalli, A. R., & Yevtushenko, N. (2010). FSM-based conformance testing methods: A survey annotated with experimental evaluation. Information and Software Technology, 52(12), 1286\u20131297.","journal-title":"Information and Software Technology"},{"key":"9242_CR6","doi-asserted-by":"crossref","unstructured":"Dorofeeva, R., El-Fakih, K., & Yevtushenko, N. (2005). An improved conformance testing method. In Formal techniques for networked and distributed systems (FORTE 2005) (pp. 204\u2013218).","DOI":"10.1007\/11562436_16"},{"issue":"6","key":"9242_CR7","doi-asserted-by":"crossref","first-page":"1045","DOI":"10.1016\/j.infsof.2013.01.001","volume":"55","author":"AT Endo","year":"2013","unstructured":"Endo, A. T., & Simao, A. S. (2013). Evaluating test suite characteristics, cost, and effectiveness of FSM-based testing methods. Information and Software Technology, 55(6), 1045\u20131062.","journal-title":"Information and Software Technology"},{"key":"9242_CR8","doi-asserted-by":"crossref","unstructured":"Fabbri, S. C. P. F., Delamaro, M. E., Maldonado, J. C., & Masiero, P. C. (1994). Mutation analysis testing for finite state machines. In The 5th international symposium on software reliability engineering (ISSRE 1994) (pp. 220\u2013229).","DOI":"10.1109\/ISSRE.1994.341378"},{"issue":"6","key":"9242_CR9","doi-asserted-by":"crossref","first-page":"591","DOI":"10.1109\/32.87284","volume":"17","author":"S Fujiwara","year":"1991","unstructured":"Fujiwara, S., Bochmann, G. V., Khendek, F., Amalou, M., & Ghedamsi, A. (1991). Test selection based on finite state models. IEEE Transactions on Software Engineering, 17(6), 591\u2013603.","journal-title":"IEEE Transactions on Software Engineering"},{"key":"9242_CR10","doi-asserted-by":"crossref","unstructured":"Gargantini, A. (2005). Conformance testing. In M. Broy, B. Jonsson, J. P. Katoen, M. Leucker, & A. Pretschner (Eds.), Model-based testing of reactive systems (pp. 87\u2013111). Lecture Notes in Computer Science, Vol. 3472, 659 p., ISBN 978-3-540-26278-7. New York: Springer.","DOI":"10.1007\/11498490_5"},{"key":"9242_CR11","volume-title":"Introduction to the theory of finite-state machines","author":"A Gill","year":"1962","unstructured":"Gill, A. (1962). Introduction to the theory of finite-state machines. Hill: McGraw."},{"issue":"6","key":"9242_CR12","doi-asserted-by":"crossref","first-page":"551","DOI":"10.1109\/T-C.1970.222975","volume":"19","author":"G Gonenc","year":"1970","unstructured":"Gonenc, G. (1970). A method for design of fault detection experiments. IEEE Transactions on Computers, 19(6), 551\u2013558.","journal-title":"IEEE Transactions on Computers"},{"issue":"3","key":"9242_CR13","doi-asserted-by":"crossref","first-page":"350","DOI":"10.1109\/PGEC.1965.264140","volume":"14","author":"A Grasselli","year":"1965","unstructured":"Grasselli, A., & Luccio, F. (1965). A method for minimizing the number of internal states in incompletely specified sequential networks. IEEE Transactions on Electronic Computers, EC, 14(3), 350\u2013359.","journal-title":"IEEE Transactions on Electronic Computers, EC"},{"key":"9242_CR14","unstructured":"Hennie, F. C. (1964). Fault detecting experiments for sequential circuits. In The annual IEEE symposium on foundations of computer science (pp. 95\u2013110)."},{"issue":"10","key":"9242_CR15","first-page":"1330","volume":"53","author":"RM Hierons","year":"2004","unstructured":"Hierons, R. M. (2004). Testing from a nondeterministic finite state machine using adaptive state counting. IEEE Transactions on Software Engineering, 53(10), 1330\u20131342.","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"2","key":"9242_CR16","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1145\/1459352.1459354","volume":"41","author":"RM Hierons","year":"2009","unstructured":"Hierons, R. M., Bogdanov, K., Bowen, J. P., Cleaveland, R., Derrick, J., Dick, J., et al. (2009). Using formal specifications to support testing. ACM Computing Surveys, 41(2), 1\u201376.","journal-title":"ACM Computing Surveys"},{"issue":"5","key":"9242_CR17","doi-asserted-by":"crossref","first-page":"618","DOI":"10.1109\/TC.2006.80","volume":"55","author":"RM Hierons","year":"2006","unstructured":"Hierons, R. M., & Ural, H. (2006). Optimizing the length of checking sequences. IEEE Transactions on Computers, 55(5), 618\u2013629.","journal-title":"IEEE Transactions on Computers"},{"issue":"1\u20132","key":"9242_CR18","doi-asserted-by":"crossref","first-page":"7","DOI":"10.1023\/B:EMSE.0000013513.48963.1b","volume":"9","author":"N Juristo","year":"2004","unstructured":"Juristo, N., Moreno, A. M., & Vegas, S. (2004). Reviewing 25\u00a0years of testing technique experiments. Empirical Software Engineering, 9(1\u20132), 7\u201344.","journal-title":"Empirical Software Engineering"},{"key":"9242_CR19","doi-asserted-by":"crossref","unstructured":"Krichen, M. (2005). State identification. In M. Broy, B. Jonsson, J. P. Katoen, M. Leucker, & A. Pretschner (Eds.), Model-based testing of reactive systems (pp. 35\u201367). Lecture Notes in Computer Science, Vol. 3472, 659 p., ISBN 978-3-540-26278-7. New York: Springer.","DOI":"10.1007\/11498490_3"},{"issue":"1","key":"9242_CR20","doi-asserted-by":"crossref","first-page":"21","DOI":"10.1016\/S0164-1212(01)00132-7","volume":"62","author":"R Lai","year":"2002","unstructured":"Lai, R. (2002). A survey of communication protocol testing. Journal of Systems and Software, 62(1), 21\u201346.","journal-title":"Journal of Systems and Software"},{"issue":"8","key":"9242_CR21","doi-asserted-by":"crossref","first-page":"1090","DOI":"10.1109\/5.533956","volume":"84","author":"D Lee","year":"1996","unstructured":"Lee, D., & Yannakakis, M. (1996). Principles and methods of testing finite state machines\u2014a survey. Proceedings of the IEEE, 84(8), 1090\u20131123.","journal-title":"Proceedings of the IEEE"},{"key":"9242_CR22","doi-asserted-by":"crossref","unstructured":"Luo, G., Petrenko, A., & Bochmann, G. V. (1995). Selecting test sequences for partially-specified nondeterministic finite state machines. In The 7th IFIP WG 6.1 international workshop on protocol test systems (IWPTS 94) (pp. 95\u2013110).","DOI":"10.1007\/978-0-387-34883-4_6"},{"issue":"5","key":"9242_CR23","doi-asserted-by":"crossref","first-page":"1045","DOI":"10.1002\/j.1538-7305.1955.tb03788.x","volume":"34","author":"GH Mealy","year":"1955","unstructured":"Mealy, G. H. (1955). A method for synthesizing sequential circuits. Bell System Technical Journal, 34(5), 1045\u20131079.","journal-title":"Bell System Technical Journal"},{"key":"9242_CR24","first-page":"129","volume":"34","author":"EF Moore","year":"1956","unstructured":"Moore, E. F. (1956). Gedanken-experiments on sequential machines. Automata Studies, Annals of Mathematics Series, 34, 129\u2013153.","journal-title":"Automata Studies, Annals of Mathematics Series"},{"key":"9242_CR25","doi-asserted-by":"crossref","unstructured":"Pena, J. M., & Oliveira, L. (1998). A new algorithm for the reduction of incompletely specified finite state machines. In The international conference on computer-aided design (ICCAD 1998) (pp.482-489).","DOI":"10.1145\/288548.289075"},{"issue":"9","key":"9242_CR26","doi-asserted-by":"crossref","first-page":"1154","DOI":"10.1109\/TC.2005.152","volume":"54","author":"A Petrenko","year":"2005","unstructured":"Petrenko, A., & Yevtushenko, N. (2005). Testing from partial deterministic FSM specifications. IEEE Transactions on Computers, 54(9), 1154\u20131165.","journal-title":"IEEE Transactions on Computers"},{"key":"9242_CR27","doi-asserted-by":"crossref","unstructured":"Petrenko, A., & Yevtushenko, N. (2014). Adaptive testing of nondeterministic systems with FSM. In The 15th international symposium on high-assurance systems engineering (HASE) (pp. 224\u2013228).","DOI":"10.1109\/HASE.2014.39"},{"issue":"12","key":"9242_CR28","doi-asserted-by":"crossref","first-page":"911","DOI":"10.1016\/0140-3664(96)81589-1","volume":"18","author":"A Rezaki","year":"1995","unstructured":"Rezaki, A., & Ural, H. (1995). Construction of checking sequences based on characterization sets. Computer Communications, 18(12), 911\u2013920.","journal-title":"Computer Communications"},{"key":"9242_CR29","doi-asserted-by":"crossref","unstructured":"Sandberg, S. (2005). Homing and synchronizing sequences. In M. Broy, B. Jonsson, J. P. Katoen, M. Leucker, & A. Pretschner (Eds.), Model-based testing of reactive systems (pp. 5\u201333). Lecture Notes in Computer Science, Vol. 3472, 659 p., ISBN 978-3-540-26278-7. New York: Springer.","DOI":"10.1007\/11498490_2"},{"issue":"4","key":"9242_CR30","doi-asserted-by":"crossref","first-page":"413","DOI":"10.1109\/32.16602","volume":"15","author":"DP Sidhu","year":"1989","unstructured":"Sidhu, D. P., & Leung, T. K. (1989). Formal methods for protocol testing: A detailed study. IEEE Transactions on Software Engineering, 15(4), 413\u2013426.","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"8","key":"9242_CR31","doi-asserted-by":"crossref","first-page":"1023","DOI":"10.1109\/TC.2010.17","volume":"59","author":"A Simao","year":"2010","unstructured":"Simao, A., & Petrenko, A. (2010). Checking completeness of tests for finite state machines. IEEE Transactions on Computers, 59(8), 1023\u20131032.","journal-title":"IEEE Transactions on Computers"},{"issue":"2","key":"9242_CR32","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1049\/iet-sen.2008.0018","volume":"3","author":"A Simao","year":"2008","unstructured":"Simao, A., Petrenko, A., & Maldonado, J. C. (2008). Comparing finite state machine test coverage criteria. IET Software, 3(2), 91\u2013105.","journal-title":"IET Software"},{"key":"9242_CR33","doi-asserted-by":"crossref","unstructured":"Simao, A., Petrenko, A., & Yevtushenko, N. (2009). Generating reduced tests for FSMs with extra states. In International conference on testing of software and communication systems (TESTCOM) (pp. 129\u2013145).","DOI":"10.1007\/978-3-642-05031-2_9"},{"key":"9242_CR34","volume-title":"Practical model-based testing: A tools approach","author":"M Utting","year":"2006","unstructured":"Utting, M., & Legeard, B. (2006). Practical model-based testing: A tools approach. San Francisco, CA: Morgan Kaufmann Publishers Inc."},{"key":"9242_CR35","first-page":"653","volume":"9","author":"MP Vasilevskii","year":"1973","unstructured":"Vasilevskii, M. P. (1973). Failure diagnosis of automata. Cybernetics and Systems Analysis, 9, 653\u2013665.","journal-title":"Cybernetics and Systems Analysis"},{"issue":"1","key":"9242_CR36","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1109\/TSE.2003.1166585","volume":"29","author":"F Zhang","year":"2003","unstructured":"Zhang, F., & Cheung, T. (2003). Optimal transfer trees and distinguishing trees for testing observable nondeterministic finite-state machines. IEEE Transactions on Software Engineering, 29(1), 1\u201314.","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"4","key":"9242_CR37","doi-asserted-by":"crossref","first-page":"366","DOI":"10.1145\/267580.267590","volume":"29","author":"H Zhu","year":"1997","unstructured":"Zhu, H., Hall, P. A. V., & May, J. H. R. (1997). Software unit test coverage and adequacy. ACM Computing Surveys, 29(4), 366\u2013427.","journal-title":"ACM Computing Surveys"}],"container-title":["Software Quality Journal"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11219-014-9242-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11219-014-9242-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11219-014-9242-6","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T10:10:41Z","timestamp":1559383841000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11219-014-9242-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6,18]]},"references-count":37,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2015,9]]}},"alternative-id":["9242"],"URL":"https:\/\/doi.org\/10.1007\/s11219-014-9242-6","relation":{},"ISSN":["0963-9314","1573-1367"],"issn-type":[{"value":"0963-9314","type":"print"},{"value":"1573-1367","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,6,18]]}}}